W N. Lennard
Affiliations: | The University of Western Ontario (Canada) |
Area:
Molecular Physics, Astronomy and AstrophysicsGoogle:
"W Lennard"Mean distance: 6987.5
Children
Sign in to add trainee| Clinton H. Sheehan | grad student | 2000 | The University of Western Ontario (Canada) |
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Publications
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| Setoodehnia K, Chen AA, Kahl D, et al. (2013) Nuclear structure of 30S and its implications for nucleosynthesis in classical novae Physical Review C - Nuclear Physics. 87 |
| Shakhvorostov D, Lennard WN, Norton PR. (2012) Analytical solution for depth scale calculations in Rutherford backscattering spectrometry Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 272: 18-22 |
| Liu J, Wu X, Lennard WN, et al. (2010) Surface-directed spinodal decomposition in the pseudobinary alloy (HfO 2)x(SiO2)1-x Journal of Applied Physics. 107 |
| Liu J, Wu X, Lennard WN, et al. (2009) Structure of hafnium silicate films formed by atomic layer deposition Ecs Transactions. 25: 163-172 |
| Liu J, Lennard WN, Goncharova LV, et al. (2009) Atomic layer deposition of hafnium silicate thin films using tetrakis(diethylamido)hafnium and Tris(2-methyl-2-butoxy)silanol Journal of the Electrochemical Society. 156 |
| Liu J, Wu X, Lennard WN, et al. (2009) Surface-directed spinodal decomposition in hafnium silicate thin films Physical Review B - Condensed Matter and Materials Physics. 80 |
| Li YR, Shakhvorostov D, Pereira G, et al. (2009) A novel method for quantitative determination of ultra-low wear rates of materials, part I: On steels Tribology Letters. 33: 143-152 |
| Harmer SL, Goncharova LV, Kolarova R, et al. (2007) Surface structure of sphalerite studied by medium energy ion scattering and XPS Surface Science. 601: 352-361 |
| Todd ADW, Lennard WN, Magee CW, et al. (2006) An ion-implanted standard for 11B Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 242: 572-575 |
| Liu J, Lennard WN, Lee JK. (2006) Range of Er ions in amorphous Si Applied Surface Science. 253: 937-943 |