Rick C. Shi, Ph.D.

Affiliations: 
2000 Carnegie Mellon University, Pittsburgh, PA 
Area:
Electricity and Magnetism Physics
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Jian-Gang (Jimmy) Zhu grad student 2000 Carnegie Mellon
 (High data rate degradation and medium thermal stability in ultra-high density magnetic recording.)
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Publications

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Shi RC, Zhu JG, Lal B, et al. (1999) Understanding overwrite for high speed magnetic recording Ieee Transactions On Magnetics. 35: 2532-2534
Shi RC, Zhu J, Schuelke R. (1999) Impact Of Write Current Wave Form On High Frequency Magnetic Recording Journal of Applied Physics. 85: 5864-5866
Shi RC, Zhu JG, Schuelke R. (1999) Impact of write current wave form on high frequency magnetic recording Journal of Applied Physics. 85: 5864-5866
Zhu J, Lin X, Shi RC, et al. (1998) Magnetic force microscopy image restoration technique for removing tip dependence Journal of Applied Physics. 83: 6223-6225
Zhu JG, Lin X, Shi RC, et al. (1998) Magnetic force microscopy image restoration technique for removing tip dependence Journal of Applied Physics. 83: 6223-6225
Kong L, Shi RC, Krauss PR, et al. (1997) Writing Bits of Longitudinal Quantized Magnetic Disk Using Magnetic Force Microscope Tip Japanese Journal of Applied Physics. 36: 5109-5111
Chou SY, Shi RC, Kong L. (1997) Effects of nanoscale trenches and mesas patterned in a substrate on domain structures of magnetic films and ion applications in magnetic disk tracking (abstract) Journal of Applied Physics. 81: 4673-4673
Jia YQ, Kong L, Shi RC, et al. (1997) Effects Of Sample Size And Field Orientation On Pseudo-Hall Voltage In Micronscale Nickel Thin-Film Squares Journal of Applied Physics. 81: 5475-5477
Kong L, Shi RC, Krauss PR, et al. (1997) Writing bits of longitudinal quantized magnetic disk using magnetic force microscope tip Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 36: 5109-5111
Jia YQ, Kong L, Shi RC, et al. (1997) Effects of sample size and field orientation on pseudo-hall voltage in micronscale nickel thin-film squares Journal of Applied Physics. 81: 5475-5477
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