Xiaofang Gao, Ph.D.

Affiliations: 
2002 University of Central Florida, Orlando, FL, United States 
Area:
Electronics and Electrical Engineering
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"Xiaofang Gao"
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Juin J. Liou grad student 2002 University of Central Florida
 (Modeling and simulation of electrostatic discharge (ESD) in MOS devices and circuits.)
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Publications

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Gao X, Liou JJ, Wong W, et al. (2003) An improved electrostatic discharge protection structure for reducing triggering voltage and parasitic capacitance Solid-State Electronics. 47: 1105-1110
Gao X, Liou JJ, Bernier J, et al. (2003) Optimization of on-chip ESD protection structures for minimal parasitic capacitance Microelectronics Reliability. 43: 725-733
Gao X, Liou JJ, Bernier J, et al. (2002) An improved model for substrate current of submicron MOSFETs Solid-State Electronics. 46: 1395-1398
Liou JJ, Shireen R, Ortiz-Conde A, et al. (2002) Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs Microelectronics Reliability. 42: 343-347
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