Yawei Jin, Ph.D.

Affiliations: 
2006 North Carolina State University, Raleigh, NC 
Area:
Electronics and Electrical Engineering
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Doug Barlage grad student 2006 NCSU
 (Simulation methodology to compare emerging technologies for alternatives to silicon gigascale logic device.)
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Publications

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Jin Y, Zeng C, Ma L, et al. (2007) Analytical threshold voltage model with TCAD simulation verification for design and evaluation of tri-gate MOSFETs Solid-State Electronics. 51: 347-353
Ma L, Jin Y, Zeng C, et al. (2006) TCAD Modeling and Simulation of Sub-100nm Gate Length Silicon and GaN based SOI MOSFETs Mrs Proceedings. 913
Jin Y, Ma L, Zeng C, et al. (2006) Structure and Process Parameter Optimization for Sub-10nm Gate Length Fully Depleted N-Type SOI MOSFETs by TCAD Modeling and Simulation Mrs Proceedings. 913
Saripalli Y, Zeng C, Jin Y, et al. (2005) Low Temperature Selected Area Re-Growth of Ohmic Contacts for III-N FETs Mrs Proceedings. 892
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