Dug Young Kim

Affiliations: 
Physics Department Yonsei University, Seoul, South Korea 
Google:
"Dug Kim"
Mean distance: (not calculated yet)
 
BETA: Related publications

Publications

You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Hu J, Wei Q, Kong Y, et al. (2019) Higher Order Transport of Intensity Equation Methods: Comparisons and Their Hybrid Application for Noise Adaptive Phase Imaging Ieee Photonics Journal. 11: 1-14
Hwang W, Kim D, Lee S, et al. (2019) Analysis of biexponential decay signals in the analog mean-delay fluorescence lifetime measurement method Optics Communications. 443: 136-143
Ji YY, So BH, Kim DY. (2019) High-speed time-domain characterization method for polygon scanners Measurement. 135: 278-286
Tayebi B, Han JH, Sharif F, et al. (2017) Compact single-shot four-wavelength quantitative phase microscopy with polarization- and frequency-division demultiplexing. Optics Express. 25: 20172-20182
Lee H, Jeon P, Kim D. (2017) 3D image distortion problem in digital in-line holographic microscopy and its effective solution. Optics Express. 25: 21969-21980
Ji YY, So BH, Hwang WS, et al. (2017) Accurate time-domain angular jitter measurements for a high-speed polygon scanner Proceedings of Spie. 10070: 1007010
Lee HJ, Jeon PJ, Kim JW, et al. (2017) An accurate algorithm to find the axial position of an object in lens-free inline digital holography Proceedings of Spie. 10127
Hwang WS, Kim DE, Kim JW, et al. (2017) The effect of bit number and sampling rate of a digitizer on least-square multi exponential decay analysis in fluorescence lifetime imaging Proceedings of Spie. 10076
Tayebi B, Sharif F, Jafarfard MR, et al. (2015) Double-field-of-view, quasi-common-path interferometer using Fourier domain multiplexing. Optics Express. 23: 26825-26833
Tayebi B, Jafarfard MR, Sharif F, et al. (2015) Large step-phase measurement by a reduced-phase triple-illumination interferometer. Optics Express. 23: 11264-71
See more...