Year |
Citation |
Score |
2011 |
Chen PPT, Downes JE, Fernandes AJ, Butcher KSA, Wintrebert-Fouquet M, Wuhrer R, Phillips MR. Effects of crystallinity and chemical variation on apparent band-gap shift in polycrystalline indium nitride Thin Solid Films. 519: 1831-1836. DOI: 10.1016/J.Tsf.2010.10.013 |
0.561 |
|
2008 |
Martin C, Butcher KSA, Wintrebert-Fouquet M, Fernandes A, Dabbs T, Chen PPT, Carmen R. Modeling and experimental analysis of RPCVD based nitride film growth Proceedings of Spie - the International Society For Optical Engineering. 6894. DOI: 10.1117/12.762537 |
0.362 |
|
2008 |
Wintrebert-Fouquet M, Butcher KSA, Guy IL, Zheng Z. Piezoelectric coefficient of InN films prepared by radio-frequency sputtering Thin Solid Films. 516: 7267-7270. DOI: 10.1016/J.Tsf.2007.08.009 |
0.483 |
|
2007 |
JongWah JW, Butcher KS, Wintrebert-Fouquet M, Dawes JM, Ferris JM. Optical and electronic properties of diatoms Optics Infobase Conference Papers. DOI: 10.1364/Fio.2007.Jsua43 |
0.305 |
|
2007 |
Butcher KSA, Fernandes AJ, Chen PPT, Wintrebert-Fouquet M, Timmers H, Shrestha SK, Hirshy H, Perks RM, Usher BF. The nature of nitrogen related point defects in common forms of InN Journal of Applied Physics. 101. DOI: 10.1063/1.2736654 |
0.475 |
|
2007 |
Wintrebert-Fouquet M, Butcher KSA, Chen PPT, Wuhrer R. Nitride film growth morphology using remote plasma enhanced chemical vapor deposition Physica Status Solidi (C) Current Topics in Solid State Physics. 4: 2285-2288. DOI: 10.1002/Pssc.200674728 |
0.538 |
|
2006 |
Chen PPT, Butcher KSA, Wintrebert-Fouquet M, Wuhrer R, Phillips MR, Prince KE, Timmers H, Shrestha SK, Usher BF. Apparent band-gap shift in InN films grown by remote-plasma-enhanced CVD Journal of Crystal Growth. 288: 241-246. DOI: 10.1016/J.Jcrysgro.2005.12.005 |
0.522 |
|
2006 |
Timmers H, Butcher KSA, Shrestha SK, Chen PPT, Wintrebert-Fouquet M, Dogra R. Compositional and structural characterization of indium nitride using swift ions Journal of Crystal Growth. 288: 236-240. DOI: 10.1016/J.Jcrysgro.2005.12.004 |
0.465 |
|
2006 |
Butcher KSA, Hirshy H, Perks RM, Wintrebert-Fouquet M, Chen PPT. Stoichiometry effects and the Moss-Burstein effect for InN Physica Status Solidi (a) Applications and Materials Science. 203: 66-74. DOI: 10.1002/Pssa.200563504 |
0.471 |
|
2005 |
Chen PPT, Butcher KSA, Wintrebert-Fouquet M, Prince KE. Properties of InN grown by remote plasma enhanced chemical vapour deposition Conference On Optoelectronic and Microelectronic Materials and Devices, Proceedings, Commad. 85-88. DOI: 10.1109/COMMAD.2004.1577498 |
0.421 |
|
2005 |
Shrestha SK, Timmers H, Butcher KSA, Wintrebert-Fouquet M, Chen PPT. Nitrogen depletion of indium nitride films during Elastic Recoil Detection analysis Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 234: 291-307. DOI: 10.1016/J.Nimb.2005.01.022 |
0.487 |
|
2005 |
Butcher KSA, Ferris JM, Phillips MR, Wintrebert-Fouquet M, Jong Wah JW, Jovanovic N, Vyverman W, Chepurnov VA. A luminescence study of porous diatoms Materials Science and Engineering C. 25: 658-663. DOI: 10.1016/J.Msec.2005.06.049 |
0.372 |
|
2005 |
Scott K, Butcher A, Wintrebert-Fouquet M, Chen PPT, Wuhrer R, Phillips MR. Revisiting electrochromism in InN Physica Status Solidi C: Conferences. 2: 2293-2296. DOI: 10.1002/Pssc.200461560 |
0.476 |
|
2005 |
Scott K, Butcher A, Wintrebert-Fouquet M, Chen PPT, Prince KE, Timmers H, Shrestha SK, Shubina TV, Ivanov SV, Wuhrer R, Phillips MR, Monemar B. Non-stoichiometry and non-homogeneity in InN Physica Status Solidi C: Conferences. 2: 2263-2266. DOI: 10.1002/Pssc.200461387 |
0.49 |
|
2005 |
Kuball M, Pomeroy JW, Wintrebert-Fouquet M, Butcher KSA, Lu H, Schaff WJ, Shubina TV, Ivanov SV, Vasson A, Leymarie J. Resonant Raman spectroscopy on InN Physica Status Solidi (a) Applications and Materials Science. 202: 763-767. DOI: 10.1002/Pssa.200461305 |
0.473 |
|
2004 |
Alexandrov D, Scott K, Butcher A, Wintrebert-Fouquet M. Energy band gaps of InN containing oxygen and of the inxAl 1-xN interface layer formed during InN film growth Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 22: 954-961. DOI: 10.1116/1.1633767 |
0.435 |
|
2004 |
Butcher KSA, Wintrebert-Fouquet M, Chen PPT, Tansley TL, Dou H, Shrestha SK, Timmers H, Kuball M, Prince KE, Bradby JE. Nitrogen-rich indium nitride Journal of Applied Physics. 95: 6124-6128. DOI: 10.1063/1.1711173 |
0.493 |
|
2004 |
Shrestha SK, Butcher KSA, Wintrebert-Fouquet M, Timmers H. Reliable ERD analysis of group-III nitrides despite severe nitrogen depletion Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 219: 686-692. DOI: 10.1016/J.Nimb.2004.01.143 |
0.487 |
|
2004 |
Wintrebert-Fouquet M, Butcher KSA, Chen PPT. InN grown by remote plasma-enhanced chemical vapor deposition Journal of Crystal Growth. 269: 134-138. DOI: 10.1016/J.Jcrysgro.2004.05.043 |
0.533 |
|
2004 |
Alexandrov D, Butcher KSA, Wintrebert-Fouquet M. Absorption and photoluminescence features caused by defects in InN Journal of Crystal Growth. 269: 77-86. DOI: 10.1016/J.Jcrysgro.2004.05.036 |
0.451 |
|
2004 |
Guy IL, Zheng Z, Wintrebert-Fouquet M, Butcher KSA, Chen P, Tansley TL. Piezoelectricity in indium nitride Journal of Crystal Growth. 269: 72-76. DOI: 10.1016/J.Jcrysgro.2004.05.035 |
0.413 |
|
2004 |
Kuball M, Pomeroy JW, Wintrebert-Fouquet M, Butcher KSA, Lu H, Schaff WJ. A Raman spectroscopy study of InN Journal of Crystal Growth. 269: 59-65. DOI: 10.1016/J.Jcrysgro.2004.05.034 |
0.524 |
|
2004 |
Shrestha SK, Timmers H, Scott Butcher KSA, Wintrebert-Fouquet M. Accurate stoichiometric analysis of polycrystalline indium nitride films with elastic recoil detection Current Applied Physics. 4: 237-240. DOI: 10.1016/J.Cap.2003.11.018 |
0.556 |
|
2003 |
Butcher KSA, Wintrebert-Fouquet M, Chen PPT, Timmers H, Shrestha SK. Detailed analysis of absorption data for indium nitride Materials Science in Semiconductor Processing. 6: 351-354. DOI: 10.1016/J.Mssp.2003.07.004 |
0.407 |
|
2003 |
Wintrebert-Fouquet M, Butcher KSA, Motlan. High sensitivity, high resolution X-ray photoelectron analysis of InN Physica Status Solidi C: Conferences. 2785-2789. DOI: 10.1002/Pssc.200303438 |
0.364 |
|
2002 |
Wintrebert-Fouquet M, Butcher KSA, Lam SKH. Comparisons of gallium nitride and indium nitride properties after CF4/Argon reactive ion etching Materials Research Society Symposium - Proceedings. 743: 267-272. DOI: 10.1557/Proc-743-L3.55 |
0.515 |
|
2002 |
Butcher KSA, Wintrebert-Fouquet M, Motlan, Shrestha SK, Timmers H, Prince KE, Tansley TL. A study of indium nitride films grown under conditions resulting in apparent band-gaps from 0.7 eV to 2.3 eV Materials Research Society Symposium - Proceedings. 743: 707-712. DOI: 10.1557/Proc-743-L11.23 |
0.509 |
|
2002 |
Scott K, Butcher A, Wintrebert-Fouquet M, Chen PPT, Tansley TL, Srikeaw S. High mobility nitrides Materials Research Society Symposium - Proceedings. 693: 341-346. DOI: 10.1557/Proc-693-I6.9.1 |
0.489 |
|
2002 |
Wintrebert-Fouquet M, Butcher KSA, Motlan. Optical and electrical properties of InN grown by radio-frequency sputtering Conference On Optoelectronic and Microelectronic Materials and Devices, Proceedings, Commad. 2002: 83-86. DOI: 10.1109/COMMAD.2002.1237198 |
0.447 |
|
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