Jay E. Locklear, Ph.D. - Publications
Affiliations: | 2006 | Texas A & M University, College Station, TX, United States |
Area:
Analytical ChemistryYear | Citation | Score | |||
---|---|---|---|---|---|
2011 | Verkhoturov SV, Eller MJ, Della-Negra S, Rickman RD, Locklear JE, Schweikert EA. Statistics of electron and ion emission from single massive cluster impacts Surface and Interface Analysis. 43: 49-52. DOI: 10.1002/Sia.3568 | 0.669 | |||
2008 | Li Z, Verkhoturov SV, Locklear JE, Schweikert EA. Secondary ion mass spectrometry with C60+ and Au4004+ projectiles: Depth and nature of secondary ion emission from multilayer assemblies International Journal of Mass Spectrometry. 269: 112-117. DOI: 10.1016/J.Ijms.2007.09.018 | 0.678 | |||
2006 | Locklear JE, Guillermier C, Verkhoturov SV, Schweikert EA. Matrix-enhanced cluster-SIMS Applied Surface Science. 252: 6624-6627. DOI: 10.1016/j.apsusc.2006.02.206 | 0.607 | |||
2006 | Verkhoturov SV, Rickman RD, Guillermier C, Hager GJ, Locklear JE, Schweikert EA. Molecular ion emission from single large cluster impacts Applied Surface Science. 252: 6490-6493. DOI: 10.1016/j.apsusc.2006.02.196 | 0.416 | |||
2004 | Locklear JE, Verkhoturov SV, Schweikert EA. Coincidental emission of molecular ions from keV carbon cluster impacts International Journal of Mass Spectrometry. 238: 59-64. DOI: 10.1016/j.ijms.2004.08.002 | 0.712 | |||
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