Martin V. Holt, Ph.D. - Publications

Affiliations: 
2002 University of Illinois, Urbana-Champaign, Urbana-Champaign, IL 
Area:
Condensed Matter Physics

42 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2016 Tilka JA, Park J, Ahn Y, Pateras A, Sampson KC, Savage DE, Prance JR, Simmons CB, Coppersmith SN, Eriksson MA, Lagally MG, Holt MV, Evans PG. Combining experiment and optical simulation in coherent X-ray nanobeam characterization of Si/SiGe semiconductor heterostructures Journal of Applied Physics. 120. DOI: 10.1063/1.4955043  0.4
2016 Park J, Ahn Y, Tilka JA, Sampson KC, Savage DE, Prance JR, Simmons CB, Lagally MG, Coppersmith SN, Eriksson MA, Holt MV, Evans PG. Electrode-stress-induced nanoscale disorder in Si quantum electronic devices Apl Materials. 4. DOI: 10.1063/1.4954054  0.4
2015 Hruszkewycz SO, Holt MV, Allain M, Chamard V, Polvino SM, Murray CE, Fuoss PH. Efficient modeling of Bragg coherent x-ray nanobeam diffraction. Optics Letters. 40: 3241-4. PMID 26176439 DOI: 10.1364/Ol.40.003241  0.4
2015 McElhinny KM, Gopalakrishnan G, Savage DE, Silva-Martínez JC, Lagally MG, Holt MV, Evans PG. Fabrication of flat SiGe heterostructure nanomembrane windows via strain-relief patterning Journal of Physics D: Applied Physics. 48. DOI: 10.1088/0022-3727/48/1/015306  0.4
2014 Holt MV, Hruszkewycz SO, Murray CE, Holt JR, Paskiewicz DM, Fuoss PH. Strain imaging of nanoscale semiconductor heterostructures with x-ray Bragg projection ptychography. Physical Review Letters. 112: 165502. PMID 24815657 DOI: 10.1103/Physrevlett.112.165502  0.4
2014 Paskiewicz DM, Savage DE, Holt MV, Evans PG, Lagally MG. Nanomembrane-based materials for Group IV semiconductor quantum electronics. Scientific Reports. 4: 4218. PMID 24573089 DOI: 10.1038/Srep04218  0.4
2014 Hruszkewycz SO, Holt MV, Maser J, Murray CE, Highland MJ, Folkman CM, Fuoss PH. Coherent Bragg nanodiffraction at the hard X-ray Nanoprobe beamline. Philosophical Transactions. Series a, Mathematical, Physical, and Engineering Sciences. 372: 20130118. PMID 24470418 DOI: 10.1098/Rsta.2013.0118  0.4
2014 Lummen TT, Gu Y, Wang J, Lei S, Xue F, Kumar A, Barnes AT, Barnes E, Denev S, Belianinov A, Holt M, Morozovska AN, Kalinin SV, Chen LQ, Gopalan V. Thermotropic phase boundaries in classic ferroelectrics. Nature Communications. 5: 3172. PMID 24445840 DOI: 10.1038/Ncomms4172  0.4
2014 D'Aquila K, Phatak C, Holt MV, Stripe BD, Tong S, Park WI, Hong S, Petford-Long AK. Bipolar resistance switching in Pt/CuOx/Pt via local electrochemical reduction Applied Physics Letters. 104. DOI: 10.1063/1.4883398  0.4
2013 Gopalakrishnan G, Holt MV, McElhinny KM, Spalenka JW, Czaplewski DA, Schülli TU, Evans PG. Thermal diffuse scattering as a probe of large-wave-vector phonons in silicon nanostructures. Physical Review Letters. 110: 205503. PMID 25167426 DOI: 10.1103/Physrevlett.110.205503  0.4
2013 Wang K, Rosenmann D, Holt M, Winarski R, Hla SW, Rose V. An easy-to-implement filter for separating photo-excited signals from topography in scanning tunneling microscopy. The Review of Scientific Instruments. 84: 063704. PMID 23822349 DOI: 10.1063/1.4811652  0.4
2013 Czaplewski DA, Holt MV, Ocola LE. The range and intensity of backscattered electrons for use in the creation of high fidelity electron beam lithography patterns. Nanotechnology. 24: 305302. PMID 23817998 DOI: 10.1088/0957-4484/24/30/305302  0.4
2013 Hruszkewycz SO, Highland MJ, Holt MV, Kim D, Folkman CM, Thompson C, Tripathi A, Stephenson GB, Hong S, Fuoss PH. Imaging local polarization in ferroelectric thin films by coherent X-ray bragg projection ptychography Physical Review Letters. 110. DOI: 10.1103/PhysRevLett.110.177601  0.4
2013 Holt JR, Madan A, Harley ECT, Stoker MW, Pinto T, Schepis DJ, Adam TN, Murray CE, Bedell SW, Holt M. Observation of semiconductor device channel strain using in-line high resolution X-ray diffraction Journal of Applied Physics. 114. DOI: 10.1063/1.4824819  0.4
2013 Gopalakrishnan G, Czaplewski DA, McElhinny KM, Holt MV, Silva-Martínez JC, Evans PG. Edge-induced flattening in the fabrication of ultrathin freestanding crystalline silicon sheets Applied Physics Letters. 102. DOI: 10.1063/1.4789553  0.4
2013 Murray CE, Polvino SM, Noyan IC, Cai Z, Maser J, Holt M. Probing strain at the nanoscale with X-ray diffraction in microelectronic materials induced by stressor elements Thin Solid Films. 530: 85-90. DOI: 10.1016/J.Tsf.2012.05.043  0.4
2012 Winarski RP, Holt MV, Rose V, Fuesz P, Carbaugh D, Benson C, Shu D, Kline D, Stephenson GB, McNulty I, Maser J. A hard X-ray nanoprobe beamline for nanoscale microscopy. Journal of Synchrotron Radiation. 19: 1056-60. PMID 23093770 DOI: 10.1107/S0909049512036783  0.4
2012 Hruszkewycz SO, Holt MV, Murray CE, Bruley J, Holt J, Tripathi A, Shpyrko OG, McNulty I, Highland MJ, Fuoss PH. Quantitative nanoscale imaging of lattice distortions in epitaxial semiconductor heterostructures using nanofocused X-ray Bragg projection ptychography. Nano Letters. 12: 5148-54. PMID 22998744 DOI: 10.1021/Nl303201W  0.4
2011 Jo JY, Chen P, Sichel RJ, Baek SH, Smith RT, Balke N, Kalinin SV, Holt MV, Maser J, Evans-Lutterodt K, Eom CB, Evans PG. Structural consequences of ferroelectric nanolithography. Nano Letters. 11: 3080-4. PMID 21728277 DOI: 10.1021/Nl2009873  0.4
2011 Hruszkewycz SO, Holt MV, Tripathi A, Maser J, Fuoss PH. Framework for three-dimensional coherent diffraction imaging by focused beam x-ray Bragg ptychography. Optics Letters. 36: 2227-9. PMID 21685975 DOI: 10.1364/Ol.36.002227  0.4
2011 Qazilbash MM, Tripathi A, Schafgans AA, Kim BJ, Kim HT, Cai Z, Holt MV, Maser JM, Keilmann F, Shpyrko OG, Basov DN. Nanoscale imaging of the electronic and structural transitions in vanadium dioxide Physical Review B - Condensed Matter and Materials Physics. 83. DOI: 10.1103/Physrevb.83.165108  0.4
2011 Hruszkewycz SO, Folkman CM, Highland MJ, Holt MV, Baek SH, Streiffer SK, Baldo P, Eom CB, Fuoss PH. X-ray nanodiffraction of tilted domains in a poled epitaxial BiFeO 3 thin film Applied Physics Letters. 99. DOI: 10.1063/1.3665627  0.4
2011 Klug JA, Holt MV, Premnath RN, Joshi-Imre A, Hong S, Katiyar RS, Bedzyk MJ, Auciello O. Elastic relaxation and correlation of local strain gradients with ferroelectric domains in (001) BiFeO3 nanostructures Applied Physics Letters. 99. DOI: 10.1063/1.3605594  0.4
2011 Strachan JP, Medeiros-Ribeiro G, Yang JJ, Zhang MX, Miao F, Goldfarb I, Holt M, Rose V, Williams RS. Spectromicroscopy of tantalum oxide memristors Applied Physics Letters. 98. DOI: 10.1063/1.3599589  0.4
2011 Murray CE, Ying A, Polvino SM, Noyan IC, Holt M, Maser J. Nanoscale silicon-on-insulator deformation induced by stressed liner structures Journal of Applied Physics. 109. DOI: 10.1063/1.3579421  0.4
2010 Ying A, Osting B, Noyan IC, Murray CE, Holt M, Maser J. Modeling of kinematic diffraction from a thin silicon film illuminated by a coherent, focused X-ray nanobeam Journal of Applied Crystallography. 43: 587-595. DOI: 10.1107/S0021889810008459  0.4
2010 Hruszkewycz SO, Holt MV, Proffit DL, Highland MJ, Imre A, Maser J, Eastman JA, Bai GR, Fuoss PH. Bragg coherent diffraction imaging of epitaxial nanostructures using focused hard X-ray ptychography Aip Conference Proceedings. 1365: 235-238. DOI: 10.1063/1.3625347  0.4
2010 Heinonen O, Siegert M, Roelofs A, Petford-Long AK, Holt M, D'Aquila K, Li W. Correlating structural and resistive changes in Ti:NiO resistive memory elements Applied Physics Letters. 96. DOI: 10.1063/1.3355546  0.4
2009 Maser J, Holt MV, Winarski RP, Volker RV, Stephenson GB, Fuesz P. The hard X-ray nanoprobe beamline at argonne national laboratory Optics Infobase Conference Papers. DOI: 10.1364/Fio.2009.Fthm4  0.4
2008 Hong H, Xu R, Alatas A, Holt M, Chiang TC. Central peak and narrow component in x-ray scattering measurements near the displacive phase transition in SrTiO3 Physical Review B - Condensed Matter and Materials Physics. 78. DOI: 10.1103/Physrevb.78.104121  0.4
2008 Kang HC, Yan H, Winarski RP, Holt MV, Maser J, Liu C, Conley R, Vogt S, MacRander AT, Stephenson GB. Focusing of hard x-rays to 16 nanometers with a multilayer Laue lens Applied Physics Letters. 92. DOI: 10.1063/1.2912503  0.4
2007 Holt M, Sutton M, Zschack P, Hong H, Chiang TC. Dynamic fluctuations and static speckle in critical X-ray scattering from SrTiO3. Physical Review Letters. 98: 065501. PMID 17358954 DOI: 10.1103/PhysRevLett.98.065501  0.48
2007 Shu D, Maser J, Holt M, Winarski R, Preissner C, Smolyanitskiy A, Lai B, Vogt S, Stephenson GB. Optomechanical design of a hard X-ray nanoprobe instrument with nanometer-scale active vibration control Aip Conference Proceedings. 879: 1321-1324. DOI: 10.1063/1.2436307  0.4
2007 Shu D, Maser J, Holt M, Winarski R, Preissner C, Lai B, Vogt S, Stephenson GB. A robot-based detector manipulator system for a hard X-ray nanoprobe instrument Nuclear Instruments and Methods in Physics Research, Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 582: 159-161. DOI: 10.1016/J.Nima.2007.08.097  0.4
2005 Shu D, Maser J, Holt M, Lai B, Vogt S, Wang Y, Preissner C, Han Y, Tieman B, Winarski R, Smolyanitskiy A, Stephenson GB. Design and test of a differential Scanning stage system for an x-ray nanoprobe instrument Proceedings of Spie - the International Society For Optical Engineering. 5877: 1-13. DOI: 10.1117/12.617723  0.4
2004 Wong J, Wall M, Schwartz AJ, Xu R, Holt M, Hong H, Zschack P, Chiang T-. Imaging phonons in a fcc Pu-Ga alloy by thermal diffuse x-ray scattering Applied Physics Letters. 84: 3747-3749. DOI: 10.1063/1.1737482  0.44
2003 Hong H, Wei CM, Chou MY, Wu Z, Basile L, Chen H, Holt M, Chiang TC. Alternating layer and island growth of Pb on Si by spontaneous quantum phase separation. Physical Review Letters. 90: 076104. PMID 12633252 DOI: 10.1103/Physrevlett.90.076104  0.48
2002 Holt M, Czoschke P, Hong H, Zschack P, Birnbaum HK, Chiang T-. Phonon dispersions in niobium determined by x-ray transmission scattering Physical Review B. 66: 64303. DOI: 10.1103/Physrevb.66.064303  0.44
2001 Holt M, Zschack P, Hong H, Chou MY, Chiang TC. X-ray studies of phonon softening in tise2. Physical Review Letters. 86: 3799-802. PMID 11329327 DOI: 10.1103/Physrevlett.86.3799  0.48
2000 Holt M, Chiang TC. Holt and chiang reply Physical Review Letters. 84: 3734-3734. PMID 11019192 DOI: 10.1103/Physrevlett.84.3734  0.48
2000 Thorpe AN, Senftle FE, Holt M, Grant J, Lowe W, Anderson H, Williams E, Monkres C, Barkatt A. Magnetization, micro-x-ray fluorescence, and transmission electron microscopy studies of low concentrations of nanoscale Fe3O4 particles in epoxy resin Journal of Materials Research. 15: 2488-2493. DOI: 10.1557/Jmr.2000.0357  0.4
1999 Holt M, Wu Z, Hong H, Zschack P, Jemian P, Tischler J, Chen H, Chiang TC. Determination of Phonon Dispersions from X-Ray Transmission Scattering: The Example of Silicon Physical Review Letters. 83: 3317-3319. DOI: 10.1103/Physrevlett.83.3317  0.48
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