Year |
Citation |
Score |
2024 |
Nguyen KX, Jiang Y, Lee CH, Kharel P, Zhang Y, van der Zande AM, Huang PY. Achieving sub-0.5-angstrom-resolution ptychography in an uncorrected electron microscope. Science (New York, N.Y.). 383: 865-870. PMID 38386746 DOI: 10.1126/science.adl2029 |
0.773 |
|
2023 |
Babu AV, Zhou T, Kandel S, Bicer T, Liu Z, Judge W, Ching DJ, Jiang Y, Veseli S, Henke S, Chard R, Yao Y, Sirazitdinova E, Gupta G, Holt MV, et al. Deep learning at the edge enables real-time streaming ptychographic imaging. Nature Communications. 14: 7059. PMID 37923741 DOI: 10.1038/s41467-023-41496-z |
0.324 |
|
2023 |
Millsaps W, Schwartz J, Di ZW, Jiang Y, Hovden R. Autonomous Electron Tomography Reconstruction with Machine Learning. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. PMID 37639314 DOI: 10.1093/micmic/ozad083 |
0.766 |
|
2023 |
Schwartz J, Di ZW, Jiang Y, Cho MG, Qian Y, Gu J, Rozeveld S, Ercius P, Fessler JA, Xu T, Scott M, Hovden R. Measuring 3D Chemistry at 1 nm Resolution with Fused Multi-Modal Electron Tomography. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 29: 1394-1395. PMID 37613713 DOI: 10.1093/micmic/ozad067.717 |
0.777 |
|
2023 |
Jiang Y, Cao MC, Chen Z, Han Y. Optimizing Parameters for High-resolution and Low-dose Electron Ptychography. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 29: 284-285. PMID 37613141 DOI: 10.1093/micmic/ozad067.131 |
0.67 |
|
2023 |
Zhang XS, Chen Z, Shao YT, Jiang Y, Ray A, Muller DA. Achieving Super Resolution Ptychography with a Quadrant Detector. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 29: 291-292. PMID 37613078 DOI: 10.1093/micmic/ozad067.134 |
0.405 |
|
2023 |
Millsaps W, Schwartz J, Di ZW, Jiang Y, Hovden R. Autonomous Electron Tomography Reconstruction Using Bayesian Optimization. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 29: 1915-1916. PMID 37612960 DOI: 10.1093/micmic/ozad067.989 |
0.747 |
|
2023 |
Manassa J, Schwartz J, Jiang Y, Zheng H, Fessler JA, Wendy Di Z, Hovden R. Dose Requirements for Fused Multi-Modal Electron Tomography. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 29: 1968-1969. PMID 37612919 DOI: 10.1093/micmic/ozad067.1019 |
0.738 |
|
2022 |
Chen Z, Turgut E, Jiang Y, Nguyen KX, Stolt MJ, Jin S, Ralph DC, Fuchs GD, Muller DA. Lorentz electron ptychography for imaging magnetic textures beyond the diffraction limit. Nature Nanotechnology. PMID 36316543 DOI: 10.1038/s41565-022-01224-y |
0.765 |
|
2022 |
Deng J, Yao Y, Jiang Y, Chen S, Mooney TM, Klug JA, Marin FS, Roehrig C, Yue K, Preissner C, Cai Z, Lai B, Vogt S. High-resolution ptychographic imaging enabled by high-speed multi-pass scanning. Optics Express. 30: 26027-26042. PMID 36236801 DOI: 10.1364/OE.460232 |
0.334 |
|
2022 |
Schwartz J, Harris C, Pietryga J, Zheng H, Kumar P, Visheratina A, Kotov NA, Major B, Avery P, Ercius P, Ayachit U, Geveci B, Muller DA, Genova A, Jiang Y, et al. Real-time 3D analysis during electron tomography using tomviz. Nature Communications. 13: 4458. PMID 35915070 DOI: 10.1038/s41467-022-32046-0 |
0.799 |
|
2022 |
Cao MC, Chen Z, Jiang Y, Han Y. Automatic parameter selection for electron ptychography via Bayesian optimization. Scientific Reports. 12: 12284. PMID 35854039 DOI: 10.1038/s41598-022-16041-5 |
0.689 |
|
2021 |
Chen Z, Jiang Y, Shao YT, Holtz ME, Odstrčil M, Guizar-Sicairos M, Hanke I, Ganschow S, Schlom DG, Muller DA. Electron ptychography achieves atomic-resolution limits set by lattice vibrations. Science (New York, N.Y.). 372: 826-831. PMID 34016774 DOI: 10.1126/science.abg2533 |
0.771 |
|
2020 |
Schwartz J, Zheng H, Hanwell M, Jiang Y, Hovden R. Dynamic compressed sensing for real-time tomographic reconstruction. Ultramicroscopy. 219: 113122. PMID 33091708 DOI: 10.1017/S1431927620021674 |
0.765 |
|
2020 |
Chen Z, Odstrcil M, Jiang Y, Han Y, Chiu MH, Li LJ, Muller DA. Mixed-state electron ptychography enables sub-angstrom resolution imaging with picometer precision at low dose. Nature Communications. 11: 2994. PMID 32533001 DOI: 10.1038/S41467-020-16688-6 |
0.773 |
|
2019 |
Schwartz J, Jiang Y, Wang Y, Aiello A, Bhattacharya P, Yuan H, Mi Z, Bassim N, Hovden R. Removing Stripes, Scratches, and Curtaining with Nonrecoverable Compressed Sensing. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-6. PMID 30867078 DOI: 10.1017/S1431927619000254 |
0.733 |
|
2018 |
Jiang Y, Chen Z, Han Y, Deb P, Gao H, Xie S, Purohit P, Tate MW, Park J, Gruner SM, Elser V, Muller DA. Electron ptychography of 2D materials to deep sub-ångström resolution. Nature. 559: 343-349. PMID 30022131 DOI: 10.1038/S41586-018-0298-5 |
0.762 |
|
2017 |
Cao MC, Han Y, Chen Z, Jiang Y, Nguyen KX, Turgut E, Fuchs GD, Muller DA. Theory and practice of electron diffraction from single atoms and extended objects using an EMPAD. Microscopy (Oxford, England). PMID 29409049 DOI: 10.1093/Jmicro/Dfx123 |
0.768 |
|
2017 |
Jiang Y, Padgett E, Hovden R, Muller DA. Sampling limits for electron tomography with sparsity-exploiting reconstructions. Ultramicroscopy. 186: 94-103. PMID 29277084 DOI: 10.1016/J.Ultramic.2017.12.010 |
0.766 |
|
2016 |
Levin BD, Padgett E, Chen CC, Scott MC, Xu R, Theis W, Jiang Y, Yang Y, Ophus C, Zhang H, Ha DH, Wang D, Yu Y, Abruña HD, Robinson RD, et al. Nanomaterial datasets to advance tomography in scanning transmission electron microscopy. Scientific Data. 3: 160041. PMID 27272459 DOI: 10.1038/Sdata.2016.41 |
0.73 |
|
2015 |
He K, Xin HL, Zhao K, Yu X, Nordlund D, Weng TC, Li J, Jiang Y, Cadigan CA, Richards RM, Doeff MM, Yang XQ, Stach EA, Li J, Lin F, et al. Transitions from near-surface to interior redox upon lithiation in conversion electrode materials. Nano Letters. 15: 1437-44. PMID 25633328 DOI: 10.1021/Nl5049884 |
0.441 |
|
2015 |
Hovden R, Jiang Y, Xin HL, Kourkoutis LF. Periodic artifact reduction in Fourier transforms of full field atomic resolution images. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 21: 436-41. PMID 25597865 DOI: 10.1017/S1431927614014639 |
0.778 |
|
2014 |
Hovden R, Ercius P, Jiang Y, Wang D, Yu Y, Abruña HD, Elser V, Muller DA. Breaking the Crowther limit: combining depth-sectioning and tilt tomography for high-resolution, wide-field 3D reconstructions. Ultramicroscopy. 140: 26-31. PMID 24636875 DOI: 10.1016/J.Ultramic.2014.01.013 |
0.799 |
|
2013 |
Sai H, Tan KW, Hur K, Asenath-Smith E, Hovden R, Jiang Y, Riccio M, Muller DA, Elser V, Estroff LA, Gruner SM, Wiesner U. Hierarchical porous polymer scaffolds from block copolymers. Science (New York, N.Y.). 341: 530-4. PMID 23908232 DOI: 10.1126/Science.1238159 |
0.739 |
|
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