James M. LeBeau, Ph.D.

Affiliations: 
2010 Materials University of California, Santa Barbara, Santa Barbara, CA, United States 
Area:
Materials Science Engineering
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"James LeBeau"

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Susanne Stemmer grad student 2010 UC Santa Barbara
 (Quantitative scanning transmission electron microscopy.)
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Publications

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Kumar A, Baker JN, Bowes PC, et al. (2020) Atomic-resolution electron microscopy of nanoscale local structure in lead-based relaxor ferroelectrics. Nature Materials
Chen X, Hauwiller MR, Kumar A, et al. (2020) Expanding the Dimensions of a Small, Two-Dimensional Diffraction Detector. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-6
Jo SS, Li Y, Singh A, et al. (2020) Formation of large-area MoS2 thin films by oxygen-catalyzed sulfurization of Mo thin films Journal of Vacuum Science and Technology. 38: 13405
Penn AN, Koohfar S, Kumah DP, et al. (2020) On the redistribution of charge in La0.7Sr0.3CrO3/La0.7Sr0.3MnO3 multilayer thin films Aip Advances. 10: 045113
Eldred TB, Abdelhamid M, Reynolds JG, et al. (2020) Observing relaxation in device quality InGaN templates by TEM techniques Applied Physics Letters. 116: 102104
Penn A, Koohfar S, Kumah D, et al. (2020) A STEM-EELS Investigation of La0.7Sr0.3CrO3/La0.7Sr0.3MnO3 Multilayer Thin Films Microscopy and Microanalysis. 1-3
Matveyev Y, Mikheev V, Negrov D, et al. (2019) Polarization-dependent electric potential distribution across nanoscale ferroelectric HfZrO in functional memory capacitors. Nanoscale
Li F, Cabral MJ, Xu B, et al. (2019) Giant piezoelectricity of Sm-doped Pb(MgNb)O-PbTiO single crystals. Science (New York, N.Y.). 364: 264-268
Trappen R, Grutter AJ, Huang C, et al. (2019) Effect of oxygen stoichiometry on the magnetization profiles and negative magnetization in LSMO thin films Journal of Applied Physics. 126: 105301
Houston Dycus J, Washiyama S, Eldred TB, et al. (2019) The role of transient surface morphology on composition control in AlGaN layers and wells Applied Physics Letters. 114: 031602
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