Year |
Citation |
Score |
2023 |
Nolan G, Han E, Nahid SM, van der Zande AM, Schleife A, Huang P. Imaging Charged Domain Walls in van der Waals Ferroelectric α-In2Se3 via 4D-STEM. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 29: 1644-1645. PMID 37613773 DOI: 10.1093/micmic/ozad067.846 |
0.522 |
|
2023 |
Han E, Nahid SM, Rakib T, Nolan G, Ferrari PF, Hossain MA, Schleife A, Nam S, Ertekin E, van der Zande AM, Huang PY. Bend-Induced Ferroelectric Domain Walls in α-InSe. Acs Nano. PMID 37057994 DOI: 10.1021/acsnano.3c01311 |
0.566 |
|
2022 |
Yang SJ, Jung JH, Lee E, Han E, Choi MY, Jung D, Choi S, Park JH, Oh D, Noh S, Kim KJ, Huang PY, Hwang CC, Kim CJ. Wafer-Scale Programmed Assembly of One-Atom-Thick Crystals. Nano Letters. PMID 35119873 DOI: 10.1021/acs.nanolett.1c04139 |
0.601 |
|
2021 |
Yu J, Han E, Hossain MA, Watanabe K, Taniguchi T, Ertekin E, van der Zande AM, Huang PY. Designing the Bending Stiffness of 2D Material Heterostructures. Advanced Materials (Deerfield Beach, Fla.). e2007269. PMID 33491821 DOI: 10.1002/adma.202007269 |
0.598 |
|
2020 |
Kim S, Annevelink EJ, Han E, Yu J, Huang PY, Ertekin E, van der Zande AM. Stochastic stress jumps due to soliton dynamics in two-dimensional van der Waals interfaces. Nano Letters. PMID 31944113 DOI: 10.1021/Acs.Nanolett.9B04619 |
0.594 |
|
2019 |
Han E, Yu J, Annevelink E, Son J, Kang DA, Watanabe K, Taniguchi T, Ertekin E, Huang PY, van der Zande AM. Author Correction: Ultrasoft slip-mediated bending in few-layer graphene. Nature Materials. PMID 31811280 DOI: 10.1038/S41563-019-0578-Y |
0.575 |
|
2019 |
Han E, Yu J, Annevelink E, Son J, Kang DA, Watanabe K, Taniguchi T, Ertekin E, Huang PY, van der Zande AM. Ultrasoft slip-mediated bending in few-layer graphene. Nature Materials. PMID 31712745 DOI: 10.1038/S41563-019-0529-7 |
0.629 |
|
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