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Robert J. Hocken - Publications

Affiliations: 
Mechanical Engineering (PhD) University of North Carolina, Charlotte, Charlotte, NC, United States 
Area:
Mechanical Engineering
Website:
https://mees.charlotte.edu/directory/robert-j-hocken
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55 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2012 Fesperman R, Ozturk O, Hocken R, Ruben S, Tsao TC, Phipps J, Lemmons T, Brien J, Caskey G. Multi-scale Alignment and Positioning System - MAPS Precision Engineering. 36: 517-537. DOI: 10.1016/J.Precisioneng.2012.03.002  0.735
2012 Ni K, Hocken RJ. Dimensional metrology of plasmonic nanolithography machine Proceedings - Aspe 2012 Summer Topical Meeting: Precision Engineering and Mechatronics Supporting the Semiconductor Industry. 53: 42-44.  0.304
2012 Torralba M, Valenzuela M, Acero R, Yagüe-Fabra JA, Albajez JA, Aguilar JJ, Hocken RJ. Error budgeting as a tool for the design of a 2D moving platform with nanometer resolution Proceedings of the 12th International Conference of the European Society For Precision Engineering and Nanotechnology, Euspen 2012. 1: 202-205.  0.309
2011 Ramu P, Yagüe JA, Hocken RJ, Miller J. Development of a parametric model and virtual machine to estimate task specific measurement uncertainty for a five-axis multi-sensor coordinate measuring machine Precision Engineering. 35: 431-439. DOI: 10.1016/J.Precisioneng.2011.01.003  0.36
2010 Amin-Shahidi D, Ljubicic D, Overcash J, Hocken R, Trumper D. High-Accuracy Atomic-Force-Microscope Head For Dimensional Metrology Ifac Proceedings Volumes. 43: 227-231. DOI: 10.3182/20100913-3-Us-2015.00111  0.379
2010 Ruben SD, Tsao TC, Hocken RJ, Fesperman R, Ozturk O, Brien J, Caskey G. Mechatronics and control of a precision motion stage for nano-manufacturing Proceedings of the Asme Dynamic Systems and Control Conference 2009, Dscc2009. 803-810. DOI: 10.1115/DSCC2009-2761  0.369
2010 Overcash JL, Hocken RJ, Amin-Shahidi D, Trumper DL, Schattenburg ML. Measurements using the high accuracy atomic force microscope and the sub-atomic measuring machine Proceedings - Aspe 2010 Annual Meeting. 50: 254-257.  0.302
2010 Wang W, Hocken RJ, Zhu Z, Chen Z. A piezodriven three dimensional micropositioning stage for nano-manufacturing 10th International Symposium On Measurement and Quality Control 2010, Ismqc 2010. 563-566.  0.31
2009 Edward K, Farahi F, Hocken R. Hybrid shear force feedback/scanning quantitative phase microscopy applied to subsurface imaging. Optics Express. 17: 18408-18. PMID 20372571 DOI: 10.1364/Oe.17.018408  0.302
2009 Buice ES, Otten D, Yang RH, Smith ST, Hocken RJ, Trumper DL. Design evaluation of a single-axis precision controlled positioning stage Precision Engineering. 33: 418-424. DOI: 10.1016/J.Precisioneng.2008.11.001  0.767
2009 Mazzeo AD, Stein AJ, Trumper DL, Hocken RJ. Atomic force microscope for accurate dimensional metrology Precision Engineering. 33: 135-149. DOI: 10.1016/J.Precisioneng.2008.04.007  0.382
2009 De Aquino Silva JB, Hocken RJ, Miller JA, Caskey GW, Ramu P. Approach for uncertainty analysis and error evaluation of four-axis co-ordinate measuring machines International Journal of Advanced Manufacturing Technology. 41: 1130-1139. DOI: 10.1007/S00170-008-1552-Z  0.351
2009 Teo CS, Smith ST, Yang H, Hocken RJ, Buice ES, Otten D. Controller strategies for an ultra-high precision stage Proceedings of the 9th International Conference of the European Society For Precision Engineering and Nanotechnology, Euspen 2009. 1: 220-223.  0.769
2008 Buice ES, Smith ST, Hocken RJ, Trumper DL, Otten D. Performance evaluation of ultra-precision motion controlled positioning stage Key Engineering Materials. 381: 497-500. DOI: 10.4028/Www.Scientific.Net/Kem.381-382.497  0.778
2008 Hocken RJ, Fesperman R, Overcash J, Ozturk O, Stroup C. Engineering nanotechnology: The top down approach Key Engineering Materials. 381: 3-6. DOI: 10.4028/Www.Scientific.Net/Kem.381-382.3  0.77
2008 Ellis JD, Smith ST, Hocken RJ. Alignment uncertainties in ideal indentation styli Precision Engineering. 32: 207-214. DOI: 10.1016/J.Precisioneng.2007.08.004  0.321
2008 Ozturk O, Fesperman RR, Hocken RJ. Design of multi-scale alignment and positioning system Proceedings of the 10th Anniversary International Conference of the European Society For Precision Engineering and Nanotechnology, Euspen 2008. 1: 416-419.  0.768
2008 Ozturk O, Brien JF, Hocken RJ. Damping and homing in a nanoimprinting machine Proceedings - Aspe Spring Topical Meeting On Precision Mechanical Design and Mechatronics For Sub-50nm Semiconductor Equipment, Aspe 2008. 43: 70-73.  0.625
2008 Lemmons TD, Fesperman RR, Ozturk O, Hocken RJ. Fabrication of fused silica optical quality pin chuck using a wet etching process Proceedings of the 23rd Annual Meeting of the American Society For Precision Engineering, Aspe 2008 and the 12th Icpe.  0.74
2008 Buice ES, Smith ST, Hocken RJ. Experimental evaluation of a dual-axis ultra-precision positioning stage for probe studies Proceedings of the 10th Anniversary International Conference of the European Society For Precision Engineering and Nanotechnology, Euspen 2008. 1: 368-371.  0.74
2008 Ozturk O, Fesperman RR, Caskey GW, Hocken RJ. Multi-scale alignment positioning system for NIL Proceedings of the 23rd Annual Meeting of the American Society For Precision Engineering, Aspe 2008 and the 12th Icpe.  0.775
2007 Woody BA, Smith KS, Hocken RJ, Miller JA. A technique for enhancing machine tool accuracy by transferring the metrology reference from the machine tool to the workpiece Journal of Manufacturing Science and Engineering, Transactions of the Asme. 129: 636-643. DOI: 10.1115/1.2716718  0.365
2007 Pereira PH, Hocken RJ. Characterization and compensation of dynamic errors of a scanning coordinate measuring machine Precision Engineering. 31: 22-32. DOI: 10.1016/J.Precisioneng.2006.01.006  0.36
2007 Overcash JL, Stroup CG, Hocken RJ. Recent developments and upgrades in-progress of a precision six degree-of-freedom magnetically suspended measuring instrument Proceedings of the 22nd Annual Aspe Meeting, Aspe 2007.  0.318
2007 Buice ES, Smith ST, Overcash JL, Hocken RJ. Encounters in assembly of ultra-precision machines Proceedings of the 7th International Conference European Society For Precision Engineering and Nanotechnology, Euspen 2007. 2: 37-40.  0.719
2007 Buice ES, Smith ST, Hocken RJ, Trumper DL, Otten D. A versatile, long-range, positioning system for mechanical probe studies Proceedings of the 22nd Annual Aspe Meeting, Aspe 2007.  0.708
2006 Bauza MB, Woody SC, Smith ST, Hocken RJ. Development of a rapid profilometer with an application to roundness gauging Precision Engineering. 30: 406-413. DOI: 10.1016/J.Precisioneng.2005.12.001  0.763
2006 Buice ES, Yang H, Smith ST, Hocken RJ, Seugling RM. Evaluation of a novel UHMWPE bearing for applications in precision slideways Precision Engineering. 30: 185-191. DOI: 10.1016/J.Precisioneng.2005.07.003  0.716
2006 Bauza MB, Woody SC, Smith ST, Hocken RJ. Ultraprecision microscale hole scanning metrology Proceedings of the 21st Annual Aspe Meeting, Aspe 2006.  0.692
2006 Buice ES, Yang H, Otten D, Smith ST, Hocken RJ, Trumper DL, Seugling RM. A comparison of drive mechanisms for precision motion controlled stages Proceedings of the 6th International Conference European Society For Precision Engineering and Nanotechnology, Euspen 2006. 1: 325-328.  0.747
2006 Buice ES, Yang H, Smith ST, Hocken RJ, Trumper DL, Otten D, Seugling RM. Controller strategy for a 6 DOF piezoelectric translation stage Proceedings of the 6th International Conference European Society For Precision Engineering and Nanotechnology, Euspen 2006. 1: 176-179.  0.733
2006 Buice ES, Otten D, Yang H, Smith ST, Hocken RJ, Trumper DL, Seugling RM. Control of a 2 DOF long-range and 6 DOF short-range stages for nanometer positioning Proceedings of the 21st Annual Aspe Meeting, Aspe 2006.  0.729
2005 Bauza MB, Hocken RJ, Smith ST, Woody SC. Development of a virtual probe tip with an application to high aspect ratio microscale features Review of Scientific Instruments. 76. DOI: 10.1063/1.2052027  0.751
2005 Hocken RJ, Chakraborty N, Brown C. Optical metrology of surfaces Cirp Annals - Manufacturing Technology. 54: 705-719. DOI: 10.1016/S0007-8506(07)60025-0  0.349
2005 Buice ES, Yang H, Smith ST, Hocken RJ, Seugling RM, Trumper DL, Otten D. Early testing of a coarse/fine precision motion control system Proceedings of the 20th Annual Aspe Meeting, Aspe 2005.  0.697
2005 Bauza MB, Woody SC, Hocken RJ, Smith ST. Development of high aspect ratio microscale force probes Proceedings of the 20th Annual Aspe Meeting, Aspe 2005.  0.724
2005 Yang H, Buice ES, Smith ST, Hocken RJ, Fagan TJ, Trumper DL, Otten D, Seugling RM. Design and performance evaluation of a coarse/fine precision motion control system Euspen 2005 - Proceedings of the 5th International Conference of the European Society For Precision Engineering and Nanotechnology. 373-376.  0.764
2004 Mayes TW, Riley MS, Edward K, Fesperman R, Suraktar A, Shahid U, Williams S, Hocken RJ. Phase imaging in the near field Cirp Annals - Manufacturing Technology. 53: 483-486. DOI: 10.1016/S0007-8506(07)60745-8  0.748
2002 Phan JV, Hocken R, Smith ST, Keanini RG. Simultaneous measurement of spatially separated forces using a dual-cantilever resonance-based touch sensor Review of Scientific Instruments. 73: 318. DOI: 10.1063/1.1431439  0.336
2001 Peters J, Bryan JB, Estler WT, Evans C, Kunzmann H, Lucca DA, Sartori S, Sato H, Thwaite EG, Vanherck P, Hocken RJ, Peklenik J, Pfeifer T, Trumpold H, Vorburger TV. Contribution of CIRP to the development of metrology and surface quality evaluation during the last fifty years Cirp Annals - Manufacturing Technology. 50: 471-488. DOI: 10.1016/S0007-8506(07)62996-5  0.331
2001 Hocken RJ, Trumper DL, Wang C. Dynamics and control of the UNCC/MIT sub-atomic measuring machine Cirp Annals - Manufacturing Technology. 50: 373-376. DOI: 10.1016/S0007-8506(07)62143-X  0.45
2000 Gao W, Hocken RJ, Patten JA, Lovingood J. Force measurement in a nanomachining instrument Review of Scientific Instruments. 71: 4325-4329. DOI: 10.1063/1.1319976  0.366
2000 Keanini R, Phan S, Smith S, Hocken R. Resonance based pressure measurement and anemometry for high temperature flows: Design principles and preliminary results International Communications in Heat and Mass Transfer. 27: 273-284. DOI: 10.1016/S0735-1933(00)00108-1  0.315
2000 Holmes M, Hocken R, Trumper D. The long-range scanning stage: a novel platform for scanned-probe microscopy Precision Engineering-Journal of the International Societies For Precision Engineering and Nanotechnology. 24: 191-209. DOI: 10.1016/S0141-6359(99)00044-6  0.501
2000 Gao W, Hocken RJ, Patten JA, Lovingood J, Lucca DA. Construction and testing of a nanomachining instrument Precision Engineering. 24: 320-328. DOI: 10.1016/S0141-6359(00)00042-8  0.422
2000 Gao W, Hocken RJ, Patten JA, Lovingood J. Experiments using a nano-machining instrument for nano-cutting brittle materials Cirp Annals - Manufacturing Technology. 49: 439-442. DOI: 10.1016/S0007-8506(07)62984-9  0.4
1998 Lucca DA, Chou P, Hocken RJ. Effect of tool edge geometry on the nanometric cutting of Ge Cirp Annals - Manufacturing Technology. 47: 475-x92. DOI: 10.1016/S0007-8506(07)62878-9  0.346
1997 Boudreau BD, Raja J, Hocken RJ, Patterson SR, Patten J. Thermal imaging with near-field microscopy Review of Scientific Instruments. 68: 3096-3098. DOI: 10.1063/1.1148248  0.326
1997 Wilhelm RG, Srinivasan N, Farabaugh F, Hocken R. Part Form Errors Predicted from Machine Tool Performance Measurements Cirp Annals. 46: 471-474. DOI: 10.1016/S0007-8506(07)60868-3  0.325
1996 Evans CJ, Hocken RJ, Estler WT. Self-Calibration: Reversal, Redundancy, Error Separation, and 'Absolute Testing' Cirp Annals - Manufacturing Technology. 45: 617-634. DOI: 10.1016/S0007-8506(07)60515-0  0.321
1996 Miller JA, Hocken R, Smith ST, Harb S. X-ray calibrated tunneling system utilizing a dimensionally stable nanometer positioner Precision Engineering-Journal of the International Societies For Precision Engineering and Nanotechnology. 18: 95-102. DOI: 10.1016/0141-6359(96)00037-2  0.389
1996 Badami VG, Smith ST, Raja J, Hocken RJ. A portable three-dimensional stylus profile measuring instrument Precision Engineering. 18: 147-156. DOI: 10.1016/0141-6359(95)00071-2  0.437
1993 Williams ME, Trumper DL, Hocken R. Magnetic bearing stage for photolithography Cirp Annals-Manufacturing Technology. 42: 607-610. DOI: 10.1016/S0007-8506(07)62520-7  0.38
1990 Miller JA, Hocken RJ. Scanning tunneling microscopy bit making on highly oriented pyrolytic graphite: Initial results Journal of Applied Physics. 68: 905-907. DOI: 10.1063/1.346732  0.319
1979 Moldover MR, Sengers JV, Gammon RW, Hocken RJ. Gravity effects in fluids near the gas-liquid critical point Reviews of Modern Physics. 51: 79-99. DOI: 10.1103/Revmodphys.51.79  0.467
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