☰

Nathaniel A. Dodds, Ph.D. - Publications

Affiliations: 
2012 Electrical Engineering Vanderbilt University, Nashville, TN 
Area:
Electronics and Electrical Engineering, Aerospace Engineering
Tree Info Similar researchers PubMed Report error

14 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Goley PS, Dodds NA, Frounchi M, Tzintzarov GN, Nowlin RN, Cressler JD. Response of Waveguide-Integrated Germanium-on-Silicon p-i-n Photodiodes to Neutron Displacement Damage Ieee Transactions On Nuclear Science. 67: 296-304. DOI: 10.1109/Tns.2019.2949584  0.308
2018 Wang P, Sternberg AL, Kozub JA, Zhang EX, Dodds NA, Jordan SL, Fleetwood DM, Reed RA, Schrimpf RD. Analysis of TPA Pulsed-Laser-Induced Single-Event Latchup Sensitive-Area Ieee Transactions On Nuclear Science. 65: 502-509. DOI: 10.1109/Tns.2017.2781199  0.472
2017 Gerardin S, Bagatin M, Paccagnella A, Visconti A, Bonanomi M, Calabrese M, Chiavarone L, Ferlet-Cavrois V, Schwank JR, Shaneyfelt MR, Dodds N, Trinczek M, Blackmore E. Upsets in Erased Floating Gate Cells With High-Energy Protons Ieee Transactions On Nuclear Science. 64: 421-426. DOI: 10.1109/Tns.2016.2636830  0.389
2015 Khachatrian A, Roche NJH, Dodds NA, McMorrow D, Warner JH, Buchner SP, Reed RA. The Impact of Metal Line Reflections on Through-Wafer TPA SEE Testing Ieee Transactions On Nuclear Science. 62: 2452-2457. DOI: 10.1109/Tns.2015.2500731  0.325
2015 Dodds NA, Dodd PE, Shaneyfelt MR, Sexton FW, Martinez MJ, Black JD, Marshall PW, Reed RA, McCurdy MW, Weller RA, Pellish JA, Rodbell KP, Gordon MS. New Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle Ieee Transactions On Nuclear Science. 62: 2822-2829. DOI: 10.1109/Tns.2015.2488588  0.425
2015 Dodds NA, Martinez MJ, Dodd PE, Shaneyfelt MR, Sexton FW, Black JD, Lee DS, Swanson SE, Bhuva BL, Warren KM, Reed RA, Trippe J, Sierawski BD, Weller RA, Mahatme N, et al. The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate Ieee Transactions On Nuclear Science. DOI: 10.1109/Tns.2015.2486763  0.565
2014 Dodds NA, Schwank JR, Shaneyfelt MR, Dodd PE, Doyle BL, Trinczek M, Blackmore EW, Rodbell KP, Reed RA, Pellish JA, LaBel KA, Marshall PW, Swanson SE, Vizkelethy G, Deusen SBV, et al. Outstanding conference paper award 2014 IEEE nuclear and space radiation effects conference Ieee Transactions On Nuclear Science. 61. DOI: 10.1109/Tns.2014.2372833  0.398
2014 Pellish JA, Marshall PW, Rodbell KP, Gordon MS, Label KA, Schwank JR, Dodds NA, Castaneda CM, Berg MD, Kim HS, Phan AM, Seidleck CM. Criticality of low-energy protons in single-event effects testing of highly-scaled technologies Ieee Transactions On Nuclear Science. 61: 2896-2903. DOI: 10.1109/Tns.2014.2369171  0.503
2014 Dodds NA, Schwank JR, Shaneyfelt MR, Dodd PE, Doyle BL, Trinczek M, Blackmore EW, Rodbell KP, Gordon MS, Reed RA, Pellish JA, LaBel KA, Marshall PW, Swanson SE, Vizkelethy G, et al. Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam Ieee Transactions On Nuclear Science. 61: 2904-2914. DOI: 10.1109/Tns.2014.2364953  0.466
2011 Clemens MA, Sierawski BD, Warren KM, Mendenhall MH, Dodds NA, Weller RA, Reed RA, Dodd PE, Shaneyfelt MR, Schwank JR, Wender SA, Baumann RC. The effects of neutron energy and high-Z materials on single event upsets and multiple cell upsets Ieee Transactions On Nuclear Science. 58: 2591-2598. DOI: 10.1109/Tns.2011.2171716  0.566
2011 Auden EC, Weller RA, Mendenhall MH, Reed RA, Schrimpf RD, King MP, Dodds NA, Arpin LA, Asai M. High energy electron-induced transients in a shielded focal plane array Ieee Transactions On Nuclear Science. 58: 899-905. DOI: 10.1109/Tns.2011.2129531  0.302
2011 Gadlage MJ, Ahlbin JR, Bhuva BL, Hooten NC, Dodds NA, Reed RA, Massengill LW, Schrimpf RD, Vizkelethy G. Alpha-particle and focused-ion-beam-induced single-event transient measurements in a bulk 65-nm CMOS technology Ieee Transactions On Nuclear Science. 58: 1093-1097. DOI: 10.1109/Tns.2011.2112378  0.543
2010 Clemens MA, Hooten NC, Ramachandran V, Dodds NA, Weller RA, Mendenhall MH, Reed RA, Dodd PE, Shaneyfelt MR, Schwank JR, Blackmore EW. The effect of high-Z materials on proton-induced charge collection Ieee Transactions On Nuclear Science. 57: 3212-3218. DOI: 10.1109/Tns.2010.2079333  0.305
2009 Dodds NA, Reed RA, Mendenhall MH, Weller RA, Clemens MA, Dodd PE, Shaneyfelt MR, Vizkelethy G, Schwank JR, Ferlet-Cavrois V, Adams JH, Schrimpf RD, King MP. Charge generation by secondary particles from nuclear reactions in BEOL materials Ieee Transactions On Nuclear Science. 56: 3172-3179. DOI: 10.1109/Tns.2009.2034160  0.366
Show low-probability matches.