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H K. Wickramasinghe - Publications

Affiliations: 
Electrical and Computer Engineering - Ph.D. University of California, Irvine, Irvine, CA 
Area:
Electronics and Electrical Engineering, Nanotechnology
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77 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Almajhadi MA, Uddin SMA, Wickramasinghe HK. Observation of nanoscale opto-mechanical molecular damping as the origin of spectroscopic contrast in photo induced force microscopy. Nature Communications. 11: 5691. PMID 33173026 DOI: 10.1038/s41467-020-19067-3  0.362
2018 Tamma VA, Beecher LM, Shumaker-Parry JS, Wickramasinghe HK. Detecting stimulated Raman responses of molecules in plasmonic gap using photon induced forces. Optics Express. 26: 31439-31453. PMID 30650729 DOI: 10.1364/Oe.26.031439  0.368
2018 Zeng J, Darvishzadeh-Varcheie M, Albooyeh M, Rajaei M, Kamandi M, Veysi M, Potma EO, Capolino F, Wickramasinghe HK. Exclusive Magnetic Excitation Enabled by Structured Light Illumination in a Nanoscale Mie Resonator. Acs Nano. PMID 30516951 DOI: 10.1021/Acsnano.8B05778  0.316
2018 Almajhadi M, Wickramasinghe HK. Contrast and imaging performance in photo induced force microscopy. Optics Express. 25: 26923-26938. PMID 29092175 DOI: 10.1364/OE.25.026923  0.443
2016 Nowak D, Morrison W, Wickramasinghe HK, Jahng J, Potma E, Wan L, Ruiz R, Albrecht TR, Schmidt K, Frommer J, Sanders DP, Park S. Nanoscale chemical imaging by photoinduced force microscopy. Science Advances. 2: e1501571. PMID 27051870 DOI: 10.1126/Sciadv.1501571  0.417
2015 Jahng J, Fishman DA, Park S, Nowak DB, Morrison WA, Wickramasinghe HK, Potma EO. Linear and Nonlinear Optical Spectroscopy at the Nanoscale with Photoinduced Force Microscopy. Accounts of Chemical Research. PMID 26449563 DOI: 10.1021/Acs.Accounts.5B00327  0.497
2015 Huang F, Tamma VA, Mardy Z, Burdett J, Wickramasinghe HK. Imaging Nanoscale Electromagnetic Near-Field Distributions Using Optical Forces. Scientific Reports. 5: 10610. PMID 26073331 DOI: 10.1038/srep10610  0.441
2015 Guclu C, Tamma VA, Wickramasinghe HK, Capolino F. Photoinduced magnetic force between nanostructures Physical Review B - Condensed Matter and Materials Physics. 92. DOI: 10.1103/Physrevb.92.235111  0.355
2015 Jahng J, Brocious J, Fishman DA, Yampolsky S, Nowak D, Huang F, Apkarian VA, Wickramasinghe HK, Potma EO. Ultrafast pump-probe force microscopy with nanoscale resolution Applied Physics Letters. 106. DOI: 10.1063/1.4913853  0.387
2014 Jahng J, Brocious J, Fishman DA, Huang F, Li X, Tamma VA, Wickramasinghe HK, Potma EO. Gradient and scattering forces in photoinduced force microscopy Physical Review B - Condensed Matter and Materials Physics. 90. DOI: 10.1103/Physrevb.90.155417  0.368
2011 Wickramasinghe HK, Rajapaksa I. Experimental and theoretical study of the new image force microscopy principle Materials Research Society Symposium Proceedings. 1318: 137-148. DOI: 10.1557/Opl.2011.283  0.718
2010 Rajapaksa I, Uenal K, Wickramasinghe HK. Image force microscopy of molecular resonance: A microscope principle. Applied Physics Letters. 97. PMID 20859536 DOI: 10.1063/1.3480608  0.716
2006 Unal K, Frommer J, Wickramasinghe HK. Ultrafast molecule sorting and delivery by atomic force microscopy Applied Physics Letters. 88. DOI: 10.1063/1.2195777  0.311
2000 Abraham DW, Chainer TJ, Etzold KF, Wickramasinghe HK. Thermal proximity imaging of hard-disk substrates Ieee Transactions On Magnetics. 36: 3997-4004. DOI: 10.1109/20.914353  0.408
2000 Wickramasinghe HK. Progress in scanning probe microscopy Acta Materialia. 48: 347-358. DOI: 10.1016/S1359-6454(99)00303-1  0.438
1999 O'Boyle MP, Hwang TT, Wickramasinghe HK. Atomic force microscopy of work functions on the nanometer scale Applied Physics Letters. 74: 2641-2642.  0.326
1996 Martin Y, Zenhausern F, Wickramasinghe HK. Scattering spectroscopy of molecules at nanometer resolution Applied Physics Letters. 68: 2475-2477. DOI: 10.1063/1.115825  0.461
1995 Zenhausern F, Martin Y, Wickramasinghe HK. Scanning interferometric apertureless microscopy: optical imaging at 10 angstrom resolution. Science (New York, N.Y.). 269: 1083-5. PMID 17755529 DOI: 10.1126/Science.269.5227.1083  0.48
1994 Zenhausern F, O'Boyle MP, Wickramasinghe HK. Apertureless near-field optical microscope Applied Physics Letters. 65: 1623-1625. DOI: 10.1063/1.112931  0.375
1994 Martin Y, Wickramasinghe HK. Method for imaging sidewalls by atomic force microscopy Applied Physics Letters. 64: 2498-2500. DOI: 10.1063/1.111578  0.416
1993 Nonnenmacher M, Vaez‐Iravani M, Wickramasinghe HK. Force microscopy with actively stabilized differential fiber detection mechanism Journal of Vacuum Science and Technology. 11: 758-762. DOI: 10.1116/1.578343  0.403
1992 Nonnenmacher M, Wickramasinghe HK. Scanning probe microscopy of thermal conductivity and subsurface properties Applied Physics Letters. 61: 168-170. DOI: 10.1063/1.108207  0.4
1992 Nonnenmacher M, Wickramasinghe HK. Optical absorption spectroscopy by scanning force microscopy Ultramicroscopy. 42: 351-354. DOI: 10.1016/0304-3991(92)90291-Q  0.526
1992 Nonnenmacher M, O'Boyle M, Wickramasinghe HK. Surface investigations with a Kelvin probe force microscope Ultramicroscopy. 42: 268-273. DOI: 10.1016/0304-3991(92)90278-R  0.452
1992 Ghosh AP, Dove DB, Wickramasinghe HK, Stowell RM, Roessler K. Application of atomic-force microscopy to phase-shift masks Proceedings of Spie - the International Society For Optical Engineering. 1673: 255-265.  0.355
1991 Abraham DW, Williams C, Slinkman J, Wickramasinghe HK. Lateral dopant profiling in semiconductors by force microscopy using capacitive detection Journal of Vacuum Science & Technology B. 9: 703-706. DOI: 10.1116/1.585536  0.473
1991 Weaver JMR, Wickramasinghe HK. Semiconductor characterization by scanning force microscope surface photovoltage microscopy Journal of Vacuum Science & Technology B. 9: 1562-1565. DOI: 10.1116/1.585424  0.468
1991 Nonnenmacher M, O'Boyle MP, Wickramasinghe HK. Kelvin probe force microscopy Applied Physics Letters. 58: 2921-2923. DOI: 10.1063/1.105227  0.498
1990 Williams CC, Slinkman J, Hough WP, Wickramasinghe HK. Lateral dopant profiling on a 100 nm scale by scanning capacitance microscopy Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 895-898. DOI: 10.1116/1.576936  0.46
1990 Wickramasinghe HK. Scanning probe microscopy: Current status and future trends Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 363-368. DOI: 10.1116/1.576397  0.458
1990 Williams CC, Wickramasinghe HK. Microscopy of chemical-potential variations on an atomic scale Nature. 344: 317-319. DOI: 10.1038/344317A0  0.474
1990 Slinkman JA, Williams CC, Abraham DW, Wickramasinghe HK. Lateral dopant profiling in MOS structures on a 100 nm scale using scanning capacitance microscopy Technical Digest - International Electron Devices Meeting. 73-76.  0.346
1990 Martin Y, Abraham DW, Hobbs PCD, Wickramasinghe HK. Magnetic force microscopy. A short review Proceedings - the Electrochemical Society. 90: 115-124.  0.357
1989 Williams CC, Wickramasinghe HK. Absolute optical ranging with 200-nm resolution. Optics Letters. 14: 542-4. PMID 19752890 DOI: 10.1364/Ol.14.000542  0.377
1989 Williams CC, Slinkman J, Hough WP, Wickramasinghe HK. Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy Applied Physics Letters. 55: 1662-1664. DOI: 10.1063/1.102312  0.428
1989 Hobbs PCD, Abraham DW, Wickramasinghe HK. Magnetic force microscopy with 25 nm resolution Applied Physics Letters. 55: 2357-2359. DOI: 10.1063/1.102017  0.484
1989 Wickramasinghe HK. Scanned-probe microscopes Scientific American. 261: 98-105. DOI: 10.1038/Scientificamerican1089-98  0.431
1989 Weaver JMR, Walpita LM, Wickramasinghe HK. Optical absorption microscopy and spectroscopy with nanometre resolution Nature. 342: 783-785. DOI: 10.1038/342783A0  0.486
1988 Hobbs PCD, Wickramasinghe HK. Metrology with an atomic force microscope Proceedings of Spie - the International Society For Optical Engineering. 921: 146-150. DOI: 10.1117/12.968362  0.412
1988 Hobbs PCD, Martin Y, Williams CC, Wickramasinghe HK. Atomic force microscope: Implementations Proceedings of Spie - the International Society For Optical Engineering. 897: 26-31. DOI: 10.1117/12.944504  0.392
1988 Abraham DW, Williams CC, Wickramasinghe HK. Differential scanning tunnelling microscopy Journal of Microscopy. 152: 599-604. DOI: 10.1111/J.1365-2818.1988.Tb01426.X  0.47
1988 Abraham DW, Williams CC, Wickramasinghe HK. Measurement of in-plane magnetization by force microscopy Applied Physics Letters. 53: 1446-1448. DOI: 10.1063/1.99964  0.398
1988 Abraham DW, Williams CC, Wickramasinghe HK. Noise reduction technique for scanning tunneling microscopy Applied Physics Letters. 53: 1503-1505. DOI: 10.1063/1.99940  0.386
1988 Martin Y, Rugar D, Wickramasinghe HK. High-resolution magnetic imaging of domains in TbFe by force microscopy Applied Physics Letters. 52: 244-246. DOI: 10.1063/1.99482  0.442
1988 Martin Y, Abraham DW, Wickramasinghe HK. High-resolution capacitance measurement and potentiometry by force microscopy Applied Physics Letters. 52: 1103-1105. DOI: 10.1063/1.99224  0.388
1988 Wickramasinghe HK, Martin Y. High‐resolution magnetic imaging by force microscopy (invited) (abstract) Journal of Applied Physics. 63: 2948. DOI: 10.1063/1.340911  0.438
1988 Abraham DW, Williams CC, Wickramasinghe HK. High-resolution force microscopy of in-plane magnetization Journal of Microscopy. 152: 863-869. DOI: 10.1007/978-94-011-1812-5_34  0.411
1987 Martin Y, Wickramasinghe HK. Magnetic imaging by "force microscopy" with 1000 Å resolution Applied Physics Letters. 50: 1455-1457. DOI: 10.1063/1.97800  0.44
1987 Martin Y, Williams CC, Wickramasinghe HK. Atomic force microscope-force mapping and profiling on a sub 100-Å scale Journal of Applied Physics. 61: 4723-4729. DOI: 10.1063/1.338807  0.447
1986 Williams CC, Wickramasinghe HK. Scanning thermal profiler Applied Physics Letters. 49: 1587-1589. DOI: 10.1063/1.97288  0.37
1986 Williams CC, Wickramasinghe HK. Optical ranging by wavelength multiplexed interferometry Journal of Applied Physics. 60: 1900-1903. DOI: 10.1063/1.337239  0.418
1985 See CW, Iravani MV, Wickramasinghe HK. Scanning differential phase contrast optical microscope: application to surface studies. Applied Optics. 24: 2373-9. PMID 18223893 DOI: 10.1364/Ao.24.002373  0.389
1985 Iravani MV, Wickramasinghe HK. Scattering matrix approach to thermal wave propagation in layered structures Journal of Applied Physics. 58: 122-131. DOI: 10.1063/1.335713  0.379
1983 Wickramasinghe HK. Scanning acoustic microscopy: Review of recent developments Proceedings of Spie - the International Society For Optical Engineering. 368: 52. DOI: 10.1117/12.934325  0.41
1983 Wickramasinghe HK. Scanning acoustic microscopy: a review Journal of Microscopy. 129: 63-73. DOI: 10.1111/J.1365-2818.1983.Tb04161.X  0.381
1983 Smith IR, Wickramasinghe HK, Farnell GW, Jen CK. Confocal surface acoustic wave microscopy Applied Physics Letters. 42: 411-413. DOI: 10.1063/1.93958  0.391
1983 Wickramasinghe HK, Martin Y, Spear DAH, Ash EA. OPTICAL HETERODYNE TECHNIQUES FOR PHOTOACOUSTIC AND PHOTOTHERMAL DETECTION Journal De Physique (Paris), Colloque. 44. DOI: 10.1051/Jphyscol:1983629  0.384
1983 Faridian F, Wickramasinghe HK. SIMULTANEOUS SCANNING OPTICAL AND ACOUSTIC MICROSCOPY Electronics Letters. 19: 159-160. DOI: 10.1049/El:19830111  0.473
1982 Smith IR, Wickramasinghe HK. Dichromatic Differential Phase Contrast Microscopy Ieee Transactions On Sonics and Ultrasonics. 29: 321-326. DOI: 10.1109/T-Su.1982.31361  0.468
1982 Sinclair DA, Smith IR, Wickramasinghe HK. Recent developments in scanning acoustic microscopy Radio and Electronic Engineer. 52: 479-493. DOI: 10.1049/Ree.1982.0070  0.495
1982 WICKRAMASINGHE HK, AMERI S, SEE CW. DIFFERENTIAL PHASE CONTRAST OPTICAL MICROSCOPE WITH 1 A-DEPTH RESOLUTION Electron Lett. 973-975. DOI: 10.1049/El:19820668  0.35
1982 SMITH IR, WICKRAMASINGHE HK. SAW ATTENUATION MEASUREMENT IN THE ACOUSTIC MICROSCOPE Electron Lett. 955-956. DOI: 10.1049/El:19820656  0.302
1982 Wickramasinghe HK, Martin Y, Ball S, Ash EA. THERMODISPLACEMENT IMAGING OF CURRENT IN THIN-FILM CIRCUITS Electronics Letters. 18: 700-701. DOI: 10.1049/El:19820476  0.374
1982 Smith IR, Wickramasinghe HK. DIFFERENTIAL PHASE CONTRAST IN THE ACOUSTIC MICROSCOPE Electronics Letters. 18: 92-94. DOI: 10.1049/El:19820063  0.337
1981 Wickramasinghe HK. Recent progress in scanning acoustic microscopy Physics in Technology. 12: 111-113. DOI: 10.1088/0305-4624/12/3/I04  0.531
1981 Wickramasinghe HK. Mechanically scanned B-scan system for acoustic microscopy of solids Applied Physics Letters. 39: 305-307. DOI: 10.1063/1.92723  0.476
1980 Heiserman J, Quate CF, Wickramasinghe HK. Acoustic microscopy in biophysics. Advances in Biological and Medical Physics. 17: 325-64. PMID 7457230 DOI: 10.1016/B978-0-12-005217-2.50014-2  0.362
1980 Petts CR, Wickramasinghe HK. ACOUSTIC MICROSCOPY IN GASES Electronics Letters. 16: 9-11. DOI: 10.1049/El:19800008  0.345
1979 Quate CF, Atalar A, Wickramasinghe HK. Acoustic microscopy with mechanical scanning—a review Proceedings of the Ieee. 67: 1092-1114. DOI: 10.1109/PROC.1979.11406  0.344
1979 Wickramasinghe HK. Contrast and imaging performance in the scanning acoustic microscope Journal of Applied Physics. 50: 664-672. DOI: 10.1063/1.326027  0.453
1978 Wickramasinghe HK, Bray RC, Jipson V, Quate CF, Salcedo JR. Photoacoustics on a microscopic scale Applied Physics Letters. 33: 923-925. DOI: 10.1063/1.90219  0.411
1978 Wickramasinghe HK. Contrast in reflection acoustic microscopy Electronics Letters. 14: 305-306. DOI: 10.1049/El:19780207  0.384
1977 Atalar A, Quate CF, Wickramasinghe HK. Phase imaging in reflection with the acoustic microscope Applied Physics Letters. 31: 791-793. DOI: 10.1063/1.89551  0.368
1977 Wickramasinghe HK, Yeack C. Nonlinear imaging of an edge in the scanning acoustic microscope Journal of Applied Physics. 48: 4951-4954. DOI: 10.1063/1.323624  0.417
1977 Wickramasinghe HK, Heiserman J. IMAGE ENHANCEMENT IN THE SCANNING ACOUSTIC MICROSCOPE USING ANALOGUE FILTERS Electronics Letters. 13: 776-777. DOI: 10.1049/El:19770549  0.437
1976 Wickramasinghe HK, Hall M. Phase imaging with the scanning acoustic microscope Electronics Letters. 12: 637-638. DOI: 10.1049/El:19760489  0.444
1973 Thomson JK, Wickramasinghe HK, Ash EA. A Fabry-Perot acoustic surface vibration detector - Application to acoustic holography Journal of Physics D: Applied Physics. 6: 677-687. DOI: 10.1088/0022-3727/6/6/310  0.395
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