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Aycan Yurtsever, Ph.D. - Publications

Affiliations: 
2008 Cornell University, Ithaca, NY, United States 
Area:
Condensed Matter Physics, Optics Physics, Materials Science Engineering
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12 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2015 Yurtsever A. Nanoscale Probes in Ultrafast Transmission Electron Microscopy Microscopy and Microanalysis. 21: 1413-1414. DOI: 10.1017/S1431927615007849  0.413
2014 Yurtsever A, Couillard M, Hyun JK, Muller DA. Thickness measurements using photonic modes in monochromated electron energy-loss spectroscopy. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20: 723-30. PMID 24612729 DOI: 10.1017/S1431927614000245  0.547
2014 Yurtsever A. Visualizing the Optically Induced Near-fields of Nanoplasmonics with Ultrafast Transmission Electron Microscopy Microscopy and Microanalysis. 20: 1586-1587. DOI: 10.1017/S1431927614009660  0.383
2012 Yurtsever A, van der Veen RM, Zewail AH. Subparticle ultrafast spectrum imaging in 4D electron microscopy. Science (New York, N.Y.). 335: 59-64. PMID 22223801 DOI: 10.1126/science.1213504  0.334
2010 Couillard M, Yurtsever A, Muller DA. Interference effects on guided Cherenkov emission in silicon from perpendicular, oblique, and parallel boundaries Physical Review B - Condensed Matter and Materials Physics. 81. DOI: 10.1103/Physrevb.81.195315  0.571
2008 Yurtsever A, Couillard M, Muller DA. Formation of guided Cherenkov radiation in silicon-based nanocomposites. Physical Review Letters. 100: 217402. PMID 18518632 DOI: 10.1103/Physrevlett.100.217402  0.503
2008 Couillard M, Yurtsever A, Muller DA. Competition between bulk and interface plasmonic modes in valence electron energy-loss spectroscopy of ultrathinSiO2gate stacks Physical Review B. 77. DOI: 10.1103/Physrevb.77.085318  0.594
2007 Yurtsever A, Couillard M, Muller D. Surface Guided Modes and Accurate Thickness Measurements by Monochromated Fast Electrons Microscopy and Microanalysis. 13. DOI: 10.1017/S143192760707835X  0.564
2007 Couillard M, Yurtsever A, Muller D. Competition between Interface and Bulk Modes in Valence EELS of Thin Films Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607073758  0.484
2006 Yurtsever A, Weyland M, Muller DA. Three-dimensional imaging of nonspherical silicon nanoparticles embedded in silicon oxide by plasmon tomography Applied Physics Letters. 89: 151920. DOI: 10.1063/1.2360906  0.479
2006 Yurtsever A, Weyland M, Muller D. 3-D Imaging of Non-Spherical Silicon Nanoparticles Embedded in Silicon Oxide by Plasmon Tomography Microscopy and Microanalysis. 12: 532-533. DOI: 10.1017/S1431927606068309  0.459
2006 Weyland M, Yurtsever A, Ercius P, Muller D. Uncovering Nanoscale Chemical Variations in the Third Dimension; Electron Tomography in the Analytical Mode Microscopy and Microanalysis. 12: 1388-1389. DOI: 10.1017/S1431927606065147  0.58
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