William D. Nix, Ph.D. - Publications

Affiliations: 
Materials Science and Engineering Stanford University, Palo Alto, CA 
Area:
materials science
Website:
http://engineering.stanford.edu/profile/nix

191 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2019 Gan LT, Yang R, Traylor R, Cai W, Nix WD, Fan JA. High-Throughput Growth of Microscale Gold Bicrystals for Single-Grain-Boundary Studies. Advanced Materials (Deerfield Beach, Fla.). e1902189. PMID 31197897 DOI: 10.1002/adma.201902189  1
2018 Zhang K, Pitner XB, Yang R, Nix WD, Plummer JD, Fan JA. Single-crystal metal growth on amorphous insulating substrates. Proceedings of the National Academy of Sciences of the United States of America. PMID 29311332 DOI: 10.1073/pnas.1717882115  0.36
2015 Lee SW, Lee HW, Ryu I, Nix WD, Gao H, Cui Y. Kinetics and fracture resistance of lithiated silicon nanostructure pairs controlled by their mechanical interaction. Nature Communications. 6: 7533. PMID 26112834 DOI: 10.1038/ncomms8533  1
2015 Berla LA, Lee SW, Cui Y, Nix WD. Mechanical behavior of electrochemically lithiated silicon Journal of Power Sources. 273: 41-51. DOI: 10.1016/j.jpowsour.2014.09.073  1
2015 Lee SW, Ryu I, Nix WD, Cui Y. Fracture of crystalline germanium during electrochemical lithium insertion Extreme Mechanics Letters. 2: 15-19. DOI: 10.1016/j.eml.2015.01.009  1
2015 Ryu I, Cai W, Nix WD, Gao H. Stochastic behaviors in plastic deformation of face-centered cubic micropillars governed by surface nucleation and truncated source operation Acta Materialia. 95: 176-183. DOI: 10.1016/j.actamat.2015.05.032  1
2015 Ryu I, Cai W, Nix WD, Gao H. Anisotropic Size-Dependent Plasticity in Face-Centered Cubic Micropillars Under Torsion Jom. DOI: 10.1007/s11837-015-1692-1  1
2015 Bennett KC, Berla LA, Nix WD, Borja RI. Instrumented nanoindentation and 3D mechanistic modeling of a shale at multiple scales Acta Geotechnica. 10. DOI: 10.1007/s11440-014-0363-7  1
2014 Sebastiani M, Eberl C, Bemporad E, Korsunsky AM, Nix WD, Carassiti F. Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale Surface and Coatings Technology. 251: 151-161. DOI: 10.1016/j.surfcoat.2014.04.019  1
2014 Berla LA, Lee SW, Ryu I, Cui Y, Nix WD. Robustness of amorphous silicon during the initial lithiation/delithiation cycle Journal of Power Sources. 258: 253-259. DOI: 10.1016/j.jpowsour.2014.02.032  1
2014 Ryu I, Lee SW, Gao H, Cui Y, Nix WD. Microscopic model for fracture of crystalline Si nanopillars during lithiation Journal of Power Sources. 255: 274-282. DOI: 10.1016/j.jpowsour.2013.12.137  1
2014 Cai W, Sills RB, Barnett DM, Nix WD. Modeling a distribution of point defects as misfitting inclusions in stressed solids Journal of the Mechanics and Physics of Solids. 66: 154-171. DOI: 10.1016/j.jmps.2014.01.015  1
2013 McDowell MT, Lee SW, Nix WD, Cui Y. 25th anniversary article: Understanding the lithiation of silicon and other alloying anodes for lithium-ion batteries. Advanced Materials (Deerfield Beach, Fla.). 25: 4966-85. PMID 24038172 DOI: 10.1002/adma.201301795  1
2013 McDowell MT, Lee SW, Harris JT, Korgel BA, Wang C, Nix WD, Cui Y. In situ TEM of two-phase lithiation of amorphous silicon nanospheres. Nano Letters. 13: 758-64. PMID 23323680 DOI: 10.1021/nl3044508  1
2013 Nix WD. Metallic thin films: Stresses and mechanical properties Metallic Films For Electronic, Optical and Magnetic Applications: Structure, Processing and Properties. 353-421. DOI: 10.1533/9780857096296.2.353  1
2013 Min Han S, Feng G, Young Jung J, Joon Jung H, Groves JR, Nix WD, Cui Y. Critical-temperature/Peierls-stress dependent size effects in body centered cubic nanopillars Applied Physics Letters. 102. DOI: 10.1063/1.4776658  1
2013 Ryu I, Nix WD, Cai W. Plasticity of bcc micropillars controlled by competition between dislocation multiplication and depletion Acta Materialia. 61: 3233-3241. DOI: 10.1016/j.actamat.2013.02.011  1
2012 McDowell MT, Ryu I, Lee SW, Wang C, Nix WD, Cui Y. Studying the kinetics of crystalline silicon nanoparticle lithiation with in situ transmission electron microscopy. Advanced Materials (Deerfield Beach, Fla.). 24: 6034-41. PMID 22945804 DOI: 10.1002/adma.201202744  1
2012 Lee SW, McDowell MT, Berla LA, Nix WD, Cui Y. Fracture of crystalline silicon nanopillars during electrochemical lithium insertion. Proceedings of the National Academy of Sciences of the United States of America. 109: 4080-5. PMID 22371565 DOI: 10.1073/pnas.1201088109  1
2012 Lee SW, Nix WD. Size dependence of the yield strength of fcc and bcc metallic micropillars with diameters of a few micrometers Philosophical Magazine. 92: 1238-1260. DOI: 10.1080/14786435.2011.643250  1
2012 Lee SW, Berla LA, McDowell MT, Nix WD, Cui Y. Reaction front evolution during electrochemical lithiation of crystalline silicon nanopillars Israel Journal of Chemistry. 52: 1118-1123. DOI: 10.1002/ijch.201200077  1
2011 McDowell MT, Lee SW, Ryu I, Wu H, Nix WD, Choi JW, Cui Y. Novel size and surface oxide effects in silicon nanowires as lithium battery anodes. Nano Letters. 11: 4018-25. PMID 21827158 DOI: 10.1021/nl202630n  1
2011 Yao Y, McDowell MT, Ryu I, Wu H, Liu N, Hu L, Nix WD, Cui Y. Interconnected silicon hollow nanospheres for lithium-ion battery anodes with long cycle life. Nano Letters. 11: 2949-54. PMID 21668030 DOI: 10.1021/nl201470j  1
2011 Lee SW, Mordehai D, Rabkin E, Nix WD. Effects of focused-ion-beam irradiation and prestraining on the mechanical properties of FCC Au microparticles on a sapphire substrate Journal of Materials Research. 26: 1653-1661. DOI: 10.1557/jmr.2011.221  1
2011 Lee SW, Aubry S, Nix WD, Cai W. Dislocation junctions and jogs in a free-standing FCC thin film Modelling and Simulation in Materials Science and Engineering. 19. DOI: 10.1088/0965-0393/19/2/025002  1
2011 Nix WD, Lee SW. Micro-pillar plasticity controlled by dislocation nucleation at surfaces Philosophical Magazine. 91: 1084-1096. DOI: 10.1080/14786435.2010.502141  1
2011 Han SM, Guyer EP, Nix WD. Extracting thin film hardness of extremely compliant films on stiff substrates Thin Solid Films. 519: 3221-3224. DOI: 10.1016/j.tsf.2010.12.167  1
2011 Ryu I, Choi JW, Cui Y, Nix WD. Size-dependent fracture of Si nanowire battery anodes Journal of the Mechanics and Physics of Solids. 59: 1717-1730. DOI: 10.1016/j.jmps.2011.06.003  1
2011 Mordehai D, Lee SW, Backes B, Srolovitz DJ, Nix WD, Rabkin E. Size effect in compression of single-crystal gold microparticles Acta Materialia. 59: 5202-5215. DOI: 10.1016/j.actamat.2011.04.057  1
2010 Berla LA, Allen AM, Han SM, Nix WD. A physically based model for indenter tip shape calibration for nanoindentation Journal of Materials Research. 25: 735-745. DOI: 10.1557/JMR.2010.0098  1
2010 Hopcroft MA, Nix WD, Kenny TW. What is the Young's modulus of silicon? Journal of Microelectromechanical Systems. 19: 229-238. DOI: 10.1109/JMEMS.2009.2039697  1
2010 Han SM, Bozorg-Grayeli T, Groves JR, Nix WD. Size effects on strength and plasticity of vanadium nanopillars Scripta Materialia. 63: 1153-1156. DOI: 10.1016/j.scriptamat.2010.08.011  1
2010 Lee SW, Nix WD. Geometrical analysis of 3D dislocation dynamics simulations of FCC micro-pillar plasticity Materials Science and Engineering A. 527: 1903-1910. DOI: 10.1016/j.msea.2009.11.020  1
2010 Budiman AS, Hau-Riege CS, Baek WC, Lor C, Huang A, Kim HS, Neubauer G, Pak J, Besser PR, Nix WD. Electromigration-induced plastic deformation in Cu interconnects: Effects on current density exponent, n, and implications for em reliability assessment Journal of Electronic Materials. 39: 2483-2488. DOI: 10.1007/s11664-010-1356-4  1
2009 Wright WJ, Nix WD. Storage and loss stiffnesses and moduli as determined by dynamic nanoindentation Journal of Materials Research. 24: 863-871. DOI: 10.1557/jmr.2009.0112  1
2009 Feng G, Qu S, Huang Y, Nix WD. A quantitative analysis for the stress field around an elastoplastic indentation/contact Journal of Materials Research. 24: 704-718. DOI: 10.1557/jmr.2009.0097  1
2009 Nix WD. Yielding and strain hardening in metallic thin films on substrates: An edge dislocation climb model Mathematics and Mechanics of Solids. 14: 207-219. DOI: 10.1177/1081286508092612  1
2009 Sukharev V, Kteyan A, Zschech E, Nix WD. Microstructure effect on EM-induced degradations in dual inlaid copper interconnects Ieee Transactions On Device and Materials Reliability. 9: 87-97. DOI: 10.1109/TDMR.2008.2011642  1
2009 Weinberger CR, Aubry S, Lee SW, Nix WD, Cai W. Modelling dislocations in a free-standing thin film Modelling and Simulation in Materials Science and Engineering. 17. DOI: 10.1088/0965-0393/17/7/075007  1
2009 Marshall AF, Goldthorpe IA, Koto M, McIntyre PC, Zhu J, Peng H, Barnett DM, Nix WD, Cui Y. Nanowires for energy applications: Fundamental growth studies Microscopy and Microanalysis. 15: 144-145. DOI: 10.1017/S1431927609094641  1
2009 Han SM, Phillips MA, Nix WD. Study of strain softening behavior of Al-Al3Sc multilayers using microcompression testing Acta Materialia. 57: 4473-4490. DOI: 10.1016/j.actamat.2009.06.007  1
2009 Lee SW, Han SM, Nix WD. Uniaxial compression of fcc Au nanopillars on an MgO substrate: The effects of prestraining and annealing Acta Materialia. 57: 4404-4415. DOI: 10.1016/j.actamat.2009.06.002  1
2009 Budiman AS, Besser PR, Hau-Riege CS, Marathe A, Joo YC, Tamura N, Patel JR, Nix WD. Electromigration-induced plasticity: Texture correlation and implications for reliability assessment Journal of Electronic Materials. 38: 379-391. DOI: 10.1007/s11664-008-0602-5  1
2009 Nix WD. Exploiting new opportunities in materials research by remembering and applying old lessons Mrs Bulletin. 34: 82-91.  1
2008 Zhu J, Peng H, Marshall AF, Barnett DM, Nix WD, Cui Y. Formation of chiral branched nanowires by the Eshelby Twist. Nature Nanotechnology. 3: 477-81. PMID 18685634 DOI: 10.1038/nnano.2008.179  1
2008 Hemker KJ, Nix WD. Nanoscale deformation: seeing is believing. Nature Materials. 7: 97-8. PMID 18219327 DOI: 10.1038/nmat2103  1
2008 Feng G, Budiman AS, Nix WD, Tamura N, Patel JR. Indentation size effects in single crystal copper as revealed by synchrotron x-ray microdiffraction Journal of Applied Physics. 104. DOI: 10.1063/1.2966297  1
2008 Berla LA, Joo YC, Nix WD. A model for power law creep controlled hillock growth Materials Science and Engineering A. 488: 594-600. DOI: 10.1016/j.msea.2007.11.049  1
2008 Budiman AS, Han SM, Greer JR, Tamura N, Patel JR, Nix WD. A search for evidence of strain gradient hardening in Au submicron pillars under uniaxial compression using synchrotron X-ray microdiffraction Acta Materialia. 56: 602-608. DOI: 10.1016/j.actamat.2007.10.031  1
2007 Budiman AS, Hau-Riege CS, Besser PR, Marathe A, Joo YC, Tamura N, Patel JR, Nix WD. Plasticity-amplified diffusivity: Dislocation cores as fast diffusion paths in CU interconnects Annual Proceedings - Reliability Physics (Symposium). 122-127. DOI: 10.1109/RELPHY.2007.369880  1
2007 Morusupalli RR, Nix WD, Patel JR. Comparison of line stress predictions with measured electromigration failure times Ieee International Integrated Reliability Workshop Final Report. 124-127. DOI: 10.1109/IRWS.2007.4469237  1
2007 Budiman AS, Hau-Riege CS, Besser PR, Marathe A, Joo YC, Tamura N, Patel JR, Nix WD. Electromigration-induced plasticity and texture in Cu interconnects Aip Conference Proceedings. 945: 56-65. DOI: 10.1063/1.2815784  1
2007 Kteyan A, Sukharev V, Meyer MA, Zschech E, Nix WD. Microstructure effect on EM-induced degradations in dual-inlaid copper interconnects Aip Conference Proceedings. 945: 42-55. DOI: 10.1063/1.2815783  1
2007 Sukharev V, Zschech E, Nix WD. A model for electromigration-induced degradation mechanisms in dual-inlaid copper interconnects: Effect of microstructure Journal of Applied Physics. 102. DOI: 10.1063/1.2775538  1
2007 Nix WD, Greer JR, Feng G, Lilleodden ET. Deformation at the nanometer and micrometer length scales: Effects of strain gradients and dislocation starvation Thin Solid Films. 515: 3152-3157. DOI: 10.1016/j.tsf.2006.01.030  1
2007 Zhang F, Saha R, Huang Y, Nix WD, Hwang KC, Qu S, Li M. Indentation of a hard film on a soft substrate: Strain gradient hardening effects International Journal of Plasticity. 23: 25-43. DOI: 10.1016/j.ijplas.2006.02.011  1
2007 Hwang SJ, Nix WD, Joo YC. A model for hillock growth in Al thin films controlled by plastic deformation Acta Materialia. 55: 5297-5301. DOI: 10.1016/j.actamat.2007.05.046  1
2007 Feng G, Qu S, Huang Y, Nix WD. An analytical expression for the stress field around an elastoplastic indentation/contact Acta Materialia. 55: 2929-2938. DOI: 10.1016/j.actamat.2006.12.030  1
2007 Yoon MS, Ko MK, Kim OH, Park YB, Nix WD, Joo YC. In-situ observation of electromigration in eutectic SnPb solder lines: Atomic migration and Hillock formation Journal of Electronic Materials. 36: 562-567. DOI: 10.1007/s11664-007-0102-z  1
2007 Wright WJ, Maloney AR, Nix WD. An improved analysis for viscoelastic damping in dynamic nanoindentation International Journal of Surface Science and Engineering. 1: 274-292.  1
2006 Greer JR, Nix WD. Nanoscale gold pillars strengthened through dislocation starvation Physical Review B - Condensed Matter and Materials Physics. 73. DOI: 10.1103/PhysRevB.73.245410  1
2006 Budiman AS, Nix WD, Tamura N, Valek BC, Gadre K, Maiz J, Spolenak R, Patel JR. Crystal plasticity in Cu damascene interconnect lines undergoing electromigration as revealed by synchrotron x-ray microdiffraction Applied Physics Letters. 88. DOI: 10.1063/1.2210451  1
2006 Hussen GNA, Shirakawa H, Nix WD, Clemens BM. Single layer mesoporous silica thin films as templates for metallic nanoscale arrays Journal of Applied Physics. 100. DOI: 10.1063/1.2189927  1
2006 Feng G, Nix WD, Yoon Y, Lee CJ. A study of the mechanical properties of nanowires using nanoindentation Journal of Applied Physics. 99. DOI: 10.1063/1.2189020  1
2006 Greer JR, Budiman A, Nix WD. Size effect in plasticity of gold at the sub-micron scale Microscopy and Microanalysis. 12: 940-941. DOI: 10.1017/S1431927606069583  1
2006 Huang Y, Zhang F, Hwang KC, Nix WD, Pharr GM, Feng G. A model of size effects in nano-indentation Journal of the Mechanics and Physics of Solids. 54: 1668-1686. DOI: 10.1016/j.jmps.2006.02.002  1
2006 Wang J, Lian J, Greer JR, Nix WD, Kim KS. Size effect in contact compression of nano- and microscale pyramid structures Acta Materialia. 54: 3973-3982. DOI: 10.1016/j.actamat.2006.04.030  1
2006 Han SM, Saha R, Nix WD. Determining hardness of thin films in elastically mismatched film-on-substrate systems using nanoindentation Acta Materialia. 54: 1571-1581. DOI: 10.1016/j.actamat.2005.11.026  1
2006 Lilleodden ET, Nix WD. Microstructural length-scale effects in the nanoindentation behavior of thin gold films Acta Materialia. 54: 1583-1593. DOI: 10.1016/j.actamat.2005.11.025  1
2006 Choi DH, Nix WD. Anelastic behavior of copper thin films on silicon substrates: Damping associated with dislocations Acta Materialia. 54: 679-687. DOI: 10.1016/j.actamat.2005.10.003  1
2006 Budiman AS, Tamura N, Valek BC, Gadre K, Maiz J, Spolenak R, Patel JR, Nix WD. Electromigration-induced plastic deformation in Cu damascene interconnect lines as revealed by synchrotron X-ray microdiffraction Materials Research Society Symposium Proceedings. 914: 295-304.  1
2005 Marshall AF, Aubertine DB, Nix WD, McIntyre PC. Misfit dislocation dissociation and Lomer formation in low mismatch SiGe/Si heterostructures Journal of Materials Research. 20: 447-455. DOI: 10.1557/JMR.2005.0065  1
2005 Liang Y, Nix WD, Griffin PB, Plummer JD. Critical thickness enhancement of epitaxial SiGe films grown on small structures Journal of Applied Physics. 97. DOI: 10.1063/1.1854204  1
2005 Han CS, Gao H, Huang Y, Nix WD. Mechanism-based strain gradient crystal plasticity - II. Analysis Journal of the Mechanics and Physics of Solids. 53: 1204-1222. DOI: 10.1016/j.jmps.2005.01.004  1
2005 Han CS, Gao H, Huang Y, Nix WD. Mechanism-based strain gradient crystal plasticity - I. Theory Journal of the Mechanics and Physics of Solids. 53: 1188-1203. DOI: 10.1016/j.jmps.2004.08.008  1
2005 Florando JN, Nix WD. A microbeam bending method for studying stress-strain relations for metal thin films on silicon substrates Journal of the Mechanics and Physics of Solids. 53: 619-638. DOI: 10.1016/j.jmps.2004.08.007  1
2005 Han SM, Shah R, Banerjee R, Viswanathan GB, Clemens BM, Nix WD. Combinatorial studies of mechanical properties of Ti-Al thin films using nanoindentation Acta Materialia. 53: 2059-2067. DOI: 10.1016/j.actamat.2005.01.017  1
2005 Greer JR, Oliver WC, Nix WD. Size dependence of mechanical properties of gold at the micron scale in the absence of strain gradients Acta Materialia. 53: 1821-1830. DOI: 10.1016/j.actamat.2004.12.031  1
2005 Lee A, Litteken CS, Dauskardt RH, Nix WD. Comparison of the telephone cord delamination method for measuring interfacial adhesion with the four-point bending method Acta Materialia. 53: 609-616. DOI: 10.1016/j.actamat.2004.10.014  1
2005 Greer JR, Nix WD. Size dependence of mechanical properties of gold at the sub-micron scale Applied Physics a: Materials Science and Processing. 80: 1625-1629. DOI: 10.1007/s00339-005-3204-6  1
2005 Greer JR, Oliver WC, Nix WD. Size dependence of mechanical properties of gold at the micron scale 11th International Conference On Fracture 2005, Icf11. 8: 6143-6148.  1
2005 Morusupalli RR, Nix WD, Patel JR, Budiman AS. Comparison of line stress predictions with measured electromigration failure times Materials Research Society Symposium Proceedings. 863: 253-258.  1
2004 Uchic MD, Dimiduk DM, Florando JN, Nix WD. Sample dimensions influence strength and crystal plasticity. Science (New York, N.Y.). 305: 986-9. PMID 15310897 DOI: 10.1126/science.1098993  1
2004 Qu S, Huang Y, Nix WD, Jiang H, Zhang F, Hwang KC. Indenter tip radius effect on the Nix-Gao relation in micro- and nanoindentation hardness experiments Journal of Materials Research. 19: 3423-3434. DOI: 10.1557/JMR.2004.0441  1
2004 Gilman JJ, Uchic MD, Dimiduk DM, Florando JN, Nix WD. Oxide surface films on metal crystals [4] (multiple letters) Science. 306: 1134-1135. DOI: 10.1126/science.306.5699.1134  1
2004 Lee H, Nix WD, Wong SS. Studies of the driving force for room-temperature microstructure evolution in electroplated copper films Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 22: 2369-2374. DOI: 10.1116/1.1788680  1
2004 Choi DH, Kim H, Nix WD. Anelasticity and damping of thin aluminum films on silicon substrates Journal of Microelectromechanical Systems. 13: 230-237. DOI: 10.1109/JMEMS.2004.825290  1
2004 O'Hayre R, Feng G, Nix WD, Prinz FB. Quantitative Impedance measurement using atomic force microscopy Journal of Applied Physics. 96: 3540-3549. DOI: 10.1063/1.1778217  1
2004 Feng G, Nix WD. Indentation size effect in MgO Scripta Materialia. 51: 599-603. DOI: 10.1016/j.scriptamat.2004.05.034  1
2004 Ramaswamy V, Nix WD, Clemens BM. Coherency and surface stress effects in metal multilayers Scripta Materialia. 50: 711-715. DOI: 10.1016/j.scriptamat.2003.11.037  1
2004 Conner RD, Li Y, Nix WD, Johnson WL. Shear band spacing under bending of Zr-based metallic glass plates Acta Materialia. 52: 2429-2434. DOI: 10.1016/j.actamat.2004.01.034  1
2004 Lee A, Clemens BM, Nix WD. Stress induced delamination methods for the study of adhesion of Pt thin films to Si Acta Materialia. 52: 2081-2093. DOI: 10.1016/j.actamat.2004.01.003  1
2004 Budiman AS, Tamura N, Valek BC, Gadre K, Maiz J, Spolenak R, Caldwell WA, Nix WD, Patell JR. Unexpected mode of plastic deformation in Cu damascene lines undergoing electromigration Materials Research Society Symposium Proceedings. 812: 345-350.  1
2003 Alex Greaney P, Chrzan DC, Clemens BM, Nix WD. Self-assembled nanostructures through wavelength-controlled spinodal decomposition Applied Physics Letters. 83: 1364-1366. DOI: 10.1063/1.1602581  1
2003 Valek BC, Tamura N, Spolenak R, Caldwell WA, MacDowell AA, Celestre RS, Padmore HA, Bravman JC, Batterman BW, Nix WD, Patel JR. Early stage of plastic deformation in thin films undergoing electromigration Journal of Applied Physics. 94: 3757-3761. DOI: 10.1063/1.1600843  1
2003 Conner RD, Johnson WL, Paton NE, Nix WD. Shear bands and cracking of metallic glass plates in bending Journal of Applied Physics. 94: 904-911. DOI: 10.1063/1.1582555  1
2003 Wright WJ, Hufnagel TC, Nix WD. Free volume coalescence and void formation in shear bands in metallic glass Journal of Applied Physics. 93: 1432-1437. DOI: 10.1063/1.1531212  1
2003 Phillips MA, Clemens BM, Nix WD. Microstructure and nanoindentation hardness of Al/Al3Sc multilayers Acta Materialia. 51: 3171-3184. DOI: 10.1016/S1359-6454(03)00128-9  1
2003 Phillips MA, Clemens BM, Nix WD. A model for dislocation behavior during deformation of Al/Al3Sc (fcc/L12) metallic multilayers Acta Materialia. 51: 3157-3170. DOI: 10.1016/S1359-6454(03)00127-7  1
2003 Sabiryanov RF, Cho K, Larsson MI, Nix WD, Clemens BM. Growth and properties of small Co islands on a strained Pt surface Journal of Magnetism and Magnetic Materials. 258: 365-368. DOI: 10.1016/S0304-8853(02)01091-0  1
2003 Lilleodden ET, Zimmerman JA, Foiles SM, Nix WD. Atomistic simulations of elastic deformation and dislocation nucleation during nanoindentation Journal of the Mechanics and Physics of Solids. 51: 901-920. DOI: 10.1016/S0022-5096(02)00119-9  1
2003 Wright WJ, Dauskardt RH, Nix WD. The prospects for mechanical ratcheting of bulk metallic glasses Materials Research Society Symposium - Proceedings. 806: 319-324.  1
2003 Uchic MD, Dimiduk DM, Florando JN, Nix WD. Exploring specimen size effects in plastic deformation of Ni 3(Al, Ta) Materials Research Society Symposium - Proceedings. 753: 27-32.  1
2003 Phillips MA, Clemens BM, Nix WD. Mechanical properties of Al/Al3Sc metallic multilayers - Deformation mechanisms at the nanoscale Materials Science Forum. 426: 3373-3378.  1
2003 Sabiryanov RF, Larsson MI, Cho KJ, Nix WD, Clemens BM. Surface diffusion and growth of patterned nanostructures on strained surfaces Physical Review B - Condensed Matter and Materials Physics. 67: 1254121-1254128.  1
2002 Gill SPA, Gao H, Ramaswamy V, Nix WD. Confined capillary stresses during the initial growth of thin films on amorphous substrates Journal of Applied Mechanics, Transactions Asme. 69: 425-432. DOI: 10.1115/1.1469001  1
2002 Huber N, Nix WD, Gao H. Identification of elastic-plastic material parameters from pyramidal indentation of thin films Proceedings of the Royal Society a: Mathematical, Physical and Engineering Sciences. 458: 1593-1620. DOI: 10.1098/rspa.2001.0927  1
2002 Saha R, Nix WD. Effects of the substrate on the determination of thin film mechanical properties by nanoindentation Acta Materialia. 50: 23-38. DOI: 10.1016/S1359-6454(01)00328-7  1
2002 Nix WD. Conference report Intermetallics. 10: 1037-1038. DOI: 10.1016/S0966-9795(02)00149-8  1
2002 Phillips MA, Clemens BM, Nix WD. High strength nanoscale Al/Al3Sc multilayers formed by interface reaction Materials Research Society Symposium - Proceedings. 727: 65-70.  1
2002 Huang R, Suo Z, Prevost JH, Nix WD. Inhomogeneous deformation in metallic glasses Journal of the Mechanics and Physics of Solids. 50: 1011-1027.  1
2001 Kim DK, Nix WD, Vinci RP, Deal MD, Plummer JD. Study of the effect of grain boundary migration on hillock formation in Al thin films Journal of Applied Physics. 90: 781-788. DOI: 10.1063/1.1381045  1
2001 Qiu X, Huang Y, Nix WD, Hwang KC, Gao H. Effect of intrinsic lattice resistance in strain gradient plasticity Acta Materialia. 49: 3949-3958. DOI: 10.1016/S1359-6454(01)00299-3  1
2001 Huang Y, Aziz MJ, Hutchinson JW, Evans AG, Saha R, Nix WD. Comparison of mechanical properties of Ni3Al thin films in disordered FCC and ordered L12 phases Acta Materialia. 49: 2853-2861. DOI: 10.1016/S1359-6454(01)00094-5  1
2001 Göken M, Kempf M, Nix WD. Hardness and modulus of the lamellar microstructure in PST-TiAl studied by nanoindentations and AFM Acta Materialia. 49: 903-911. DOI: 10.1016/S1359-6454(00)00375-X  1
2001 Uchic MD, Nix WD. Sigmoidal creep of Ni3(Al, Ta) Intermetallics. 9: 1053-1061. DOI: 10.1016/S0966-9795(01)00108-X  1
2001 Uchic MD, Chrzan DC, Nix WD. Primary creep of Ni3(Al, Ta) in the anomalous flow regime Intermetallics. 9: 963-969. DOI: 10.1016/S0966-9795(01)00097-8  1
2001 Göken M, Sakidja R, Nix WD, Perepezko JH. Microstructural mechanical properties and yield point effects in Mo alloys Materials Science and Engineering A. 319: 902-908. DOI: 10.1016/S0921-5093(01)01086-3  1
2001 Saha R, Nix WD. Solt films on hard substrates - Nanoindentation of tungsten films on sapphire substrates Materials Science and Engineering A. 319: 898-901. DOI: 10.1016/S0921-5093(01)01076-0  1
2001 Wright WJ, Schwarz RB, Nix WD. Localized heating during serrated plastic flow in bulk metallic glasses Materials Science and Engineering A. 319: 229-232. DOI: 10.1016/S0921-5093(01)01066-8  1
2001 Ramaswamy V, Phillips MA, Nix WD, Clemens BM. Observation of the strengthening of Pt layers in Ni/Pt and Pd/Pt multilayers by in-situ substrate curvature measurement Materials Science and Engineering A. 319: 887-892. DOI: 10.1016/S0921-5093(01)01006-1  1
2001 Saha R, Xue Z, Huang Y, Nix WD. Indentation of a soft metal film on a hard substrate: Strain gradient hardening effects Journal of the Mechanics and Physics of Solids. 49: 1997-2014. DOI: 10.1016/S0022-5096(01)00035-7  1
2001 Lilleodden ET, Zimmerman JA, Foiles SM, Nix WD. An experimental and computational study of the elastic-plastic transition in thin films Materials Research Society Symposium - Proceedings. 673: P1.3.1-P1.3.6.  1
2001 Florando JN, Nix WD. Study of the yielding and strain hardening behavior of a copper thin film on a silicon substrate using microbeam bending Materials Research Society Symposium - Proceedings. 673: P1.9.1-P1.9.6.  1
2001 Wright WJ, Saha R, Nix WD. Deformation mechanisms of the Zr40Ti14Ni10Cu12Be24 bulk metallic glass Materials Transactions. 42: 642-649.  1
2000 Holloway BC, Kraft O, Shuh DK, Nix WD, Kelly M, Pianetta P, Hagström S. Role of delocalized nitrogen in determining the local atomic arrangement and mechanical properties of amorphous carbon nitride thin films Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 18: 2964-2971. DOI: 10.1116/1.1308592  1
2000 Brennan S, Munkholm A, Leung OS, Nix WD. X-ray measurements of the depth dependence of stress in gold films Physica B: Condensed Matter. 283: 125-129. DOI: 10.1016/S0921-4526(99)01904-3  1
2000 Kim DK, Heiland B, Nix WD, Arzt E, Deal MD, Plummer JD. Microstructure of thermal hillocks on blanket Al thin films Thin Solid Films. 371: 278-282. DOI: 10.1016/S0040-6090(00)00971-8  1
2000 Schulze M, Nix WD. Finite element analysis of the wedge delamination test International Journal of Solids and Structures. 37: 1045-1063. DOI: 10.1016/S0020-7683(98)00285-6  1
2000 Kim DK, Nix WD, Arzt E, Deal MD, Plummer JD. Diffusional hillock formation in Al thin films controlled by creep Materials Research Society Symposium - Proceedings. 594: 129-134.  1
2000 Leung OS, Nix WD. Wafer curvature studies of strengthening mechanisms in thin films on substrates Materials Research Society Symposium - Proceedings. 594: 51-56.  1
2000 Xue Z, Huang Y, Gao H, Nix WD. The strain gradient effects in micro-indentation hardness experiments Materials Research Society Symposium - Proceedings. 578: 53-58.  1
2000 Stach EA, Dahmen U, Nix WD. Real time observations of dislocation-mediated plasticity in the epitaxial Al (011)/Si (100) thin film system Materials Research Society Symposium - Proceedings. 619: 27-34.  1
2000 Phillips MA, Ramaswamy V, Clemens BM, Nix WD. A model for calculating substrate curvature during coalescence of PT islands on an amorphous substrate Materials Research Society Symposium - Proceedings. 578: 39-44.  1
2000 Phillips MA, Ramaswamy V, Clemens BM, Nix WD. Stress and microstructure evolution during initial growth of Pt on amorphous substrates Journal of Materials Research. 15: 2540-2546.  1
2000 Kim DK, Nix WD, Deal MD, Plummer JD. Creep-controlled diffusional hillock formation in blanket aluminum thin films as a mechanism of stress relaxation Journal of Materials Research. 15: 1709-1718.  1
2000 Leung OS, Munkholm A, Brennan S, Nix WD. A search for strain gradients in gold thin films on substrates using x-ray diffraction Journal of Applied Physics. 88: 1389-1396.  1
2000 Huang Y, Xue Z, Gao H, Nix WD, Xia ZC. A study of microindentation hardness tests by mechanism-based strain gradient plasticity Journal of Materials Research. 15: 1786-1796.  1
2000 Berding MA, Nix WD, Rhiger DR, Sen S, Sher A. Critical thickness in the HgCdTe/CdZnTe system Journal of Electronic Materials. 29: 676-679.  1
2000 Clemens BM, Nix WD, Ramaswamy V. Surface-energy-driven intermixing and its effect on the measurement of interface stress Journal of Applied Physics. 87: 2816-2820.  1
2000 Huggins RA, Nix WD. Decrepitation model for capacity loss during cycling of alloys in rechargeable electrochemical systems Ionics. 6: 57-63.  1
2000 Huang Y, Gao H, Nix WD, Hutchinson JW. Mechanism-based strain gradient plasticity - II. Analysis Journal of the Mechanics and Physics of Solids. 48: 99-128.  1
1999 Gao H, Huang Y, Nix WD. Modeling plasticity at the micrometer scale Die Naturwissenschaften. 86: 507-15. PMID 10551944 DOI: 10.1007/s001140050665  1
1999 Gao H, Nix WD. Surface roughening of heteroepitaxial thin films Annual Review of Materials Science. 29: 173-209. DOI: 10.1146/annurev.matsci.29.1.173  1
1999 Gao H, Zhang L, Nix WD, Thompson CV, Arzt E. Crack-like grain-boundary diffusion wedges in thin metal films Acta Materialia. 47: 2865-2878. DOI: 10.1016/S1359-6454(99)00178-0  1
1999 Gao H, Huang Y, Nix WD, Hutchinson JW. Mechanism-based strain gradient plasticity - I. Theory Journal of the Mechanics and Physics of Solids. 47: 1239-1263. DOI: 10.1016/S0022-5096(98)00103-3  1
1999 Goods SH, Neuschwanger CL, Whinnery LL, Nix WD. Mechanical properties of a particle-strengthened polyurethane foam Journal of Applied Polymer Science. 74: 2724-2736.  1
1999 Hung CY, Marshall AF, Kim DK, Nix WD, Harris JS, Kiehl RA. Strain directed assembly of nanoparticle arrays within a semiconductor Journal of Nanoparticle Research. 1: 329-347.  1
1999 Chrzan DC, Uchic MD, Nix WD. Size scaling in the self-immortalization of superdislocations in the L12 compounds displaying the yield strength anomaly Materials Research Society Symposium - Proceedings. 552: KK10.5.1-KK10.5.4.  1
1999 Florando J, Fujimoto H, Ma Q, Kraft O, Schwaiger R, Nix WD. Measurement of thin film mechanical properties by microbeam bending Materials Research Society Symposium - Proceedings. 563: 231-236.  1
1999 Chrzan DC, Uchic MD, Nix WD. Self-immobilization of superdislocations in L12 alloys: A simple statistical analysis Philosophical Magazine a: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 79: 2397-2412.  1
1999 Gleixner RJ, Nix WD. A physically based model of electromigration and stress-induced void formation in microelectronic interconnects Journal of Applied Physics. 86: 1932-1944.  1
1999 Nix WD, Clemens BM. Crystallite coalescence: A mechanism for intrinsic tensile stresses in thin films Journal of Materials Research. 14: 3467-3473.  1
1999 Ozkan CS, Nix WD, Gao H. Stress-driven surface evolution in heteroepitaxial thin films: Anisotropy of the two-dimensional roughening mode Journal of Materials Research. 14: 3247-3256.  1
1999 Tsui TY, Vlassak J, Nix WD. Indentation plastic displacement field: Part I. The case of soft films on hard substrates Journal of Materials Research. 14: 2196-2203.  1
1999 Tsui TY, Vlassak J, Nix WD. Indentation plastic displacement field: Part II. The case of hard films on soft substrates Journal of Materials Research. 14: 2204-2209.  1
1999 Holloway BC, Kraft O, Shuh DK, Kelly MA, Nix WD, Pianetta P, Hagström S. Interpretation of X-ray photoelectron spectra of elastic amorphous carbon nitride thin films Applied Physics Letters. 74: 3290-3292.  1
1999 Mancoff FB, Bobo JF, Richter OE, Bessho K, Johnson PR, Sinclair R, Nix WD, White RL, Clemens BM. Growth and characterization of epitaxial NiMnSb/PtMnSb C1b Heusler alloy superlattices Journal of Materials Research. 14: 1560-1569.  1
1999 Gao H, Ozkan CS, Nix WD, Zimmerman JA, Freund LB. Atomistic models of dislocation formation at crystal surface ledges in Si1-xGex/Si(100) heteroepitaxial thin films Philosophical Magazine a: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 79: 349-370.  1
1998 Gleixner RJ, Nix WD. Effect of "bamboo" grain boundaries on the maximum electromigration-induced stress in microelectronic interconnect lines Journal of Applied Physics. 83: 3595-3599.  1
1998 Kraft O, Nix WD. Thermomechanical behavior of continuous and patterned Al thin films Materials Research Society Symposium - Proceedings. 516: 201-212.  1
1998 Kraft O, Schwaiger R, Nix WD. Measurement of mechanical properties in small dimensions by microbeam deflection Materials Research Society Symposium - Proceedings. 518: 39-44.  1
1998 Wolfer WO, Bartelt MC, Dike JJ, Hoyt JJ, Gleixner RJ, Nix WD. Modeling of failure time distributions for interconnects due to stress voiding and electromigration Materials Research Society Symposium - Proceedings. 516: 147-158.  1
1998 Nix WD. Yielding and strain hardening of thin metal films on substrates Scripta Materialia. 39: 545-554.  1
1998 McElhaney KW, Vlassak JJ, Nix WD. Determination of indenter tip geometry and indentation contact area for depth-sensing indentation experiments Journal of Materials Research. 13: 1300-1306.  1
1998 Kraft O, Nix WD. Measurement of the lattice thermal expansion coefficients of thin metal films on substrates Journal of Applied Physics. 83: 3035-3038.  1
1998 Nix WD, Gao H. Indentation size effects in crystalline materials: A law for strain gradient plasticity Journal of the Mechanics and Physics of Solids. 46: 411-425.  1
1998 Cornella G, Lee S, Kraft O, Nix WD, Bravman JC. Determination of temperature dependent unstressed lattice spacings in crystalline thin films on substrates Materials Research Society Symposium - Proceedings. 505: 527-532.  1
1998 Vlassak JJ, Tsui TY, Nix WD. New technique for visualizing the displacement field of indentations: The case of a soft film on a hard substrate Materials Research Society Symposium - Proceedings. 505: 71-76.  1
1998 Kitabjian PH, Nix WD. Atomic size effects in Ni-Al based solid solutions Acta Materialia. 46: 701-710.  1
1997 Nix WD, Gao H. Plastic deformation in small volumes - The separate effects of fine structures and strain gradients American Society of Mechanical Engineers, Applied Mechanics Division, Amd. 224: 27-29.  1
1997 Kitabjian PH, Garg A, Noebe RD, Nix WD. High-temperature creep behavior of single crystals of the solid-solution alloy NiAl-2.5Ti Proceedings of the International Conference On Creep and Fracture of Engineering Materials and Structures. 667-676.  1
1997 Gleixner RJ, Kaneko H, Matsuo M, Toyoda H, Nix WD. Examination of mass transport paths in conventional and highly textured Al-Cu interconnect lines Materials Research Society Symposium - Proceedings. 472: 319-324.  1
1997 Uchic MD, Nix WD. Transient creep of Ni3(Al, Ta single crystals at room temperature Proceedings of the International Conference On Creep and Fracture of Engineering Materials and Structures. 269-278.  1
1997 Cornella G, Lee SH, Nix WD, Bravman JC. An analysis technique for extraction of thin film stresses from x-ray data Applied Physics Letters. 71: 2949-2951.  1
1997 Nix WD. Elastic and plastic properties of thin films on substrates: Nanoindentation techniques Materials Science and Engineering A. 234: 37-44.  1
1997 Gleixner RJ, Clemens BM, Nix WD. Void nucleation in passivated interconnect lines: Effects of site geometries, interfaces, and interface flaws Journal of Materials Research. 12: 2081-2089.  1
1997 Clemens BM, Nix WD, Gleixner RJ. Void nucleation on a contaminated patch Journal of Materials Research. 12: 2038-2042.  1
1997 Vlassak JJ, Drory MD, Nix WD. A simple technique for measuring the adhesion of brittle films to ductile substrates with application to diamond-coated titanium Journal of Materials Research. 12: 1900-1910.  1
1997 Ozkan CS, Nix WD, Gao H. Strain relaxation and defect formation in heteroepitaxial Si1-xGex films via surface roughening induced by controlled annealing experiments Applied Physics Letters. 70: 2247-2249.  1
1997 Chidsey CED, Luo H, Limburg WH, Nix WD, Hohlfelder RJ. The bulge-blister test as a probe of adhesion at the polymer/solid interface American Chemical Society, Polymer Preprints, Division of Polymer Chemistry. 38: 947-948.  1
1997 Kitabjian PH, Garg A, Noebe R, Nix WD. Solid-solution alloying effects of Ti on the high-temperature deformation behavior of NiAl single crystals Materials Research Society Symposium - Proceedings. 460: 479-486.  1
1997 Uchic MD, Nix WD. Primary creep of Ni3(Al, Ta) single crystals at room temperature Materials Research Society Symposium - Proceedings. 460: 437-442.  1
1996 Forbes KR, Glatzel U, Darolia R, Nix WD. High- temperature deformation properties of nial single crystals Metallurgical and Materials Transactions A. 27: 1229-1240. DOI: 10.1007/BF02649860  1
1996 Gleixner RJ, Nix WD. Analysis of void nucleation in passivated interconnect lines due to vacancy condensation and interface contamination Materials Research Society Symposium - Proceedings. 428: 475-480.  1
1996 Hohlfelder RJ, Luo H, Vlassak JJ, Chidsey CED, Nix WD. Measuring interfacial fracture toughness with the blister test Materials Research Society Symposium - Proceedings. 436.  1
1996 Öveçoglu ML, Suryanarayana C, Nix WD. Identification of precipitate phases in a mechanically alloyed rapidly solidified Al-Fe-Ce alloy Metallurgical and Materials Transactions a: Physical Metallurgy and Materials Science. 27: 1033-1041.  1
1995 Daniels BJ, Nix WD, Clemens BM. Effect of coherency stresses on the hardness of epitaxial Fe(001)/Pt(001) multilayers Applied Physics Letters. 66: 2969. DOI: 10.1063/1.114246  1
1995 Ueda T, Simenson GF, Nix WD, Clemens BM. In-situ observation of stress in Cu/Pd multilayers Materials Research Society Symposium - Proceedings. 382: 279-284.  1
1995 Daniels BJ, Nix WD, Clemens BM. Enhanced hardness and stress-driven delamination in Fe/Pt multilayers Materials Research Society Symposium - Proceedings. 382: 315-320.  1
1995 Sizemore J, Hohlfelder RJ, Vlassak JJ, Nix WD. Measuring the adhesion of diamond thin films to substrates using the blister test Materials Research Society Symposium - Proceedings. 383: 197-207.  1
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