Liang T. Pang, Ph.D.
Affiliations: | 2008 | University of California, Berkeley, Berkeley, CA, United States |
Area:
Integrated Circuits (INC); Communications & Networking (COMNET); Design, Modeling and Analysis (DMA); Computer Architecture & Engineering (ARC)Google:
"Liang Pang"Parents
Sign in to add mentor| Borivoje Nikolic | grad student | 2008 | UC Berkeley | |
| (Measurement and analysis of variability in CMOS circuits.) | ||||
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Publications
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| Nikolić B, Park JH, Kwak J, et al. (2011) Technology variability from a design perspective Ieee Transactions On Circuits and Systems I: Regular Papers. 58: 1996-2009 |
| Tsai J, Toh SO, Guo Z, et al. (2010) SRAM stability characterization using tunable ring oscillators in 45nm CMOS Digest of Technical Papers - Ieee International Solid-State Circuits Conference. 53: 354-355 |
| Guo Z, Carlson A, Pang LT, et al. (2009) Large-scale SRAM variability characterization in 45 nm CMOS Ieee Journal of Solid-State Circuits. 44: 3174-3192 |
| Pang LT, Qian K, Spanos CJ, et al. (2009) Measurement and analysis of variability in 45 nm strained-Si CMOS technology Ieee Journal of Solid-State Circuits. 44: 2233-2243 |
| Pang LT, Nikolić B. (2009) Measurements and analysis of process variability in 90 nm CMOS Ieee Journal of Solid-State Circuits. 44: 1655-1663 |
| Park JH, Pang LT, Duong K, et al. (2009) Fixed- and variable-length ring oscillators for variability characterization in 45nm CMOS Proceedings of the Custom Integrated Circuits Conference. 519-522 |
| Wang LTN, Poppe WJ, Pang LT, et al. (2008) Hypersensitive parameter-identifying ring oscillators for lithography process monitoring Proceedings of Spie - the International Society For Optical Engineering. 6925 |
| Guo Z, Carlson A, Pang LT, et al. (2008) Large-scale read/write margin measurement in 45nm CMOS SRAM arrays Ieee Symposium On Vlsi Circuits, Digest of Technical Papers. 42-43 |
| Pang LT, Nikolić B. (2008) Measurement and analysis of variability in 45nm strained-Si CMOS technology Proceedings of the Custom Integrated Circuits Conference. 129-132 |
| Nikolić B, Pang LT. (2007) Measurements and analysis of process variability in 90nm CMOS Icsict-2006: 2006 8th International Conference On Solid-State and Integrated Circuit Technology, Proceedings. 505-508 |