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Liang T. Pang, Ph.D. - Publications

Affiliations: 
2008 University of California, Berkeley, Berkeley, CA, United States 
Area:
Integrated Circuits (INC); Communications & Networking (COMNET); Design, Modeling and Analysis (DMA); Computer Architecture & Engineering (ARC)
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11 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2011 Nikolić B, Park JH, Kwak J, Giraud B, Guo Z, Pang LT, Toh SO, Jevtić R, Qian K, Spanos C. Technology variability from a design perspective Ieee Transactions On Circuits and Systems I: Regular Papers. 58: 1996-2009. DOI: 10.1109/Tcsi.2011.2165389  0.557
2010 Tsai J, Toh SO, Guo Z, Pang LT, Liu TJK, Nikolic B. SRAM stability characterization using tunable ring oscillators in 45nm CMOS Digest of Technical Papers - Ieee International Solid-State Circuits Conference. 53: 354-355. DOI: 10.1109/ISSCC.2010.5433820  0.583
2009 Guo Z, Carlson A, Pang LT, Duong KT, Liu TJK, Nikolić B. Large-scale SRAM variability characterization in 45 nm CMOS Ieee Journal of Solid-State Circuits. 44: 3174-3192. DOI: 10.1109/Jssc.2009.2032698  0.609
2009 Pang LT, Qian K, Spanos CJ, Nikolic B. Measurement and analysis of variability in 45 nm strained-Si CMOS technology Ieee Journal of Solid-State Circuits. 44: 2233-2243. DOI: 10.1109/Jssc.2009.2022217  0.635
2009 Pang LT, Nikolić B. Measurements and analysis of process variability in 90 nm CMOS Ieee Journal of Solid-State Circuits. 44: 1655-1663. DOI: 10.1109/Jssc.2009.2015789  0.681
2009 Park JH, Pang LT, Duong K, Nikolić B. Fixed- and variable-length ring oscillators for variability characterization in 45nm CMOS Proceedings of the Custom Integrated Circuits Conference. 519-522. DOI: 10.1109/CICC.2009.5280798  0.501
2008 Wang LTN, Poppe WJ, Pang LT, Neureuther AR, Alon E, Nikolic B. Hypersensitive parameter-identifying ring oscillators for lithography process monitoring Proceedings of Spie - the International Society For Optical Engineering. 6925. DOI: 10.1117/12.773184  0.62
2008 Guo Z, Carlson A, Pang LT, Duong K, Liu TJK, Nikolic B. Large-scale read/write margin measurement in 45nm CMOS SRAM arrays Ieee Symposium On Vlsi Circuits, Digest of Technical Papers. 42-43. DOI: 10.1109/VLSIC.2008.4585944  0.573
2008 Pang LT, Nikolić B. Measurement and analysis of variability in 45nm strained-Si CMOS technology Proceedings of the Custom Integrated Circuits Conference. 129-132. DOI: 10.1109/CICC.2008.4672038  0.424
2007 Nikolić B, Pang LT. Measurements and analysis of process variability in 90nm CMOS Icsict-2006: 2006 8th International Conference On Solid-State and Integrated Circuit Technology, Proceedings. 505-508. DOI: 10.1109/ICSICT.2006.306337  0.496
2006 Pang LT, Nikolic B. Impact of layout on 90nm CMOS process parameter fluctuations Ieee Symposium On Vlsi Circuits, Digest of Technical Papers. 69-70.  0.423
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