Kundan Nepal, Ph.D.
Affiliations: | 2007 | Brown University, Providence, RI |
Area:
Computer Architecture, Low-Power Design, and Computer-Aided VLSI Design.Google:
"Kundan Nepal"Parents
Sign in to add mentor| Ruth Iris Bahar | grad student | 2007 | Brown | |
| (Designing reliable nanoscale circuits using principles of Markov random fields.) | ||||
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Publications
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| Hellkamp D, Nepal K. (2019) True Three-Valued Ternary Content Addressable Memory Cell Based On Ambipolar Carbon Nanotube Transistors Journal of Circuits, Systems, and Computers. 28: 1950085 |
| Sun Y, Zhang F, Jiang H, et al. (2019) Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack Journal of Electronic Testing. 35: 887-900 |
| Nepal K, Alhelaly S, Dworak J, et al. (2015) Repairing a 3-D die-stack using available programmable logic Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 34: 849-861 |
| Hellkamp D, Nepal K. (2015) Metallic tube-tolerant ternary dynamic content-addressable memory based on carbon nanotube transistors Micro & Nano Letters. 10: 209-212 |
| Dworak J, Nepal K, Alves N, et al. (2013) Using implications to choose tests through suspect fault identification Acm Transactions On Design Automation of Electronic Systems. 18: 14 |
| Nepal K, You K. (2012) Carbon nanotube field effect transistor-based content addressable memory architectures Micro & Nano Letters. 7: 20-23 |
| Dunbar C, Nepal K. (2011) Using platform FPGAs for fault emulation and test-set generation to detect stuck-at faults Journal of Computers. 6: 2335-2344 |
| You K, Nepal K. (2011) Design of a ternary static memory cell using carbon nanotube-based transistors Micro & Nano Letters. 6: 381-385 |
| Alves N, Buben A, Nepal K, et al. (2010) A cost effective approach for online error detection using invariant relationships Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 29: 788-801 |
| Nepal K, Bahar RI, Mundy J, et al. (2007) Designing nanoscale logic circuits based on Markov random fields Journal of Electronic Testing: Theory and Applications (Jetta). 23: 255-266 |