Prashant M. Chavarkar, Ph.D.

Affiliations: 
2000 University of California, Santa Barbara, Santa Barbara, CA, United States 
Area:
Electronics & Photonics
Google:
"Prashant Chavarkar"

Parents

Sign in to add mentor
Umesh Mishra grad student 2000 UC Santa Barbara
 (Lattice engineered substrates using lateral oxidation of aluminum arsenide.)
BETA: Related publications

Publications

You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Wu YF, Saxler A, Moore M, et al. (2004) 30-W/mm GaN HEMTs by Field Plate Optimization Ieee Electron Device Letters. 25: 117-119
Parikh P, Wu YF, Moore M, et al. (2004) GaN HEMTs: Material, device, circuit technology and applications Imfedk 2004 - International Meeting For Future of Electron Devices, Kansai. 41-42
Wu YF, Saxler A, Wisleder T, et al. (2004) Linearity performance of GaN HEMTs with field plates Device Research Conference - Conference Digest, Drc. 35-36
Wu YF, Moore M, Wisleder T, et al. (2004) High-gain microwave GaN HEMTs with source-terminated field-plates Technical Digest - International Electron Devices Meeting, Iedm. 1078-1079
Xing H, Chavarkar PM, Keller S, et al. (2003) Very high voltage operation (> 330 V) with high current gain of AlGaN/GaN HBTs Ieee Electron Device Letters. 24: 141-143
Parikh P, Wu YF, Chavarkar P, et al. (2003) AlGaN-GaN HEMTs: Material, device, circuit technology and applications Ieee International Symposium On Compound Semiconductors, Proceedings. 2003: 165-166
Wu YF, Moore M, Saxler A, et al. (2003) 3.5-Watt AlGaN/GaN HEMTs and Amplifiers at 35 GHz Technical Digest - International Electron Devices Meeting. 579-581
Buttari D, Chini A, Meneghesso G, et al. (2002) Systematic characterization of Cl2 reactive ion etching for gate recessing in AlGaN/GaN HEMTs Ieee Electron Device Letters. 23: 118-120
Chavarkar P, Mishra U. (2001) Field effect transistors: FETs and HEMTs Thin Films. 28: 71-145
Wu YF, Chavarkar PM, Moore M, et al. (2001) Bias-dependent performance of high-power AlGaN/GaN HEMTs Technical Digest - International Electron Devices Meeting. 378-380
See more...