Alain C. Diebold

Affiliations: 
Nanoscale Science and Engineering-Nanoscale Science State University of New York, Albany, Albany, NY, United States 
Area:
Nanoscience, General Physics, Materials Science Engineering
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"Alain Diebold"

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Ming Di grad student 2010 SUNY Albany
Vimal K. Kamineni grad student 2011 SUNY Albany
Lay W. Kong grad student 2011 SUNY Albany
Florence Nelson grad student 2012 SUNY Albany
Gangadhara R. Muthinti grad student 2013 SUNY Albany
Manasa Medikonda grad student 2014 SUNY Albany
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Publications

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O'Mullane S, Peterson B, Race J, et al. (2016) Enhancing one dimensional sensitivity with plasmonic coupling: erratum. Optics Express. 24: 3613-4
An YQ, Green AJ, Diebold AC. (2016) Tracking quintuple layer oxidation on cleaved B i2 S e3 by optical second-harmonic anisotropy Physical Review B - Condensed Matter and Materials Physics. 93
Sunkoju S, Schujman S, Dixit D, et al. (2016) Spectroscopic ellipsometry studies of 3-stage deposition of CuIn1 - XGaxSe2 on Mo-coated glass and stainless steel substrates Thin Solid Films. 606: 113-119
Dixit D, O'Mullane S, Sunkoju S, et al. (2015) Silicon fin line edge roughness determination and sensitivity analysis by Mueller matrix spectroscopic ellipsometry based scatterometry Proceedings of Spie - the International Society For Optical Engineering. 9424
Dixit D, Hosler ER, Preil M, et al. (2015) Optical CD metrology for directed self-assembly assisted contact hole shrink process Proceedings of Spie - the International Society For Optical Engineering. 9424
Dixit DJ, Kamineni V, Farrell R, et al. (2015) Metrology for block copolymer directed self-assembly structures using Mueller matrix-based scatterometry Journal of Micro/ Nanolithography, Mems, and Moems. 14
Narasimham AJ, Green A, Matyi RJ, et al. (2015) Pulsed-N2 assisted growth of 5-20 nm thick β-W films Aip Advances. 5
O'Mullane S, Peterson B, Race J, et al. (2014) Enhancing one dimensional sensitivity with plasmonic coupling. Optics Express. 22: 26246-53
Green AJ, Diebold AC. (2014) Thickness and rotational effects in simulated HRTEM images of graphene on hexagonal boron nitride. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20: 1753-63
Nelson FJ, Idrobo JC, Fite JD, et al. (2014) Electronic excitations in graphene in the 1-50 eV range: the π and π + σ peaks are not plasmons. Nano Letters. 14: 3827-31
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