Griff L. Bilbro
Affiliations: | Electrical Engineering | North Carolina State University, Raleigh, NC |
Area:
Electronics and Electrical EngineeringGoogle:
"Griff Bilbro"Children
Sign in to add traineeEric A. Rying | grad student | 2001 | NCSU |
Puxuan Dong | grad student | 2006 | NCSU |
Weiwei Kuang | grad student | 2008 | NCSU |
Yueying Liu | grad student | 2009 | NCSU |
Danqiong Hou | grad student | 2012 | NCSU |
Ryan D. Schimizzi | grad student | 2012 | NCSU |
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Publications
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Bilbro GL, Trew RJ. (2015) A Five-Parameter Model of the AlGaN/GaN HFET Ieee Transactions On Electron Devices |
Goswami A, Trew RJ, Bilbro GL. (2014) Modeling of the gate leakage current in AlGaN/GaN HFETs Ieee Transactions On Electron Devices. 61: 1014-1021 |
Goswami A, Trew RJ, Bilbro GL. (2014) Physics of gate leakage current in N-polar InAlN/GaN heterojunction field effect transistors Journal of Applied Physics. 116 |
Hou D, Bilbro GL, Trew RJ. (2013) A compact physical AlGaN/GaN HFET model Ieee Transactions On Electron Devices. 60: 639-645 |
Goswami A, Trew RJ, Bilbro GL. (2013) Physics based modeling of gate leakage current due to traps in AlGaN/GaN HFETs Solid-State Electronics. 80: 23-27 |
Hou D, Bilbro GL, Trew RJ. (2012) Analytic model for conduction current in AlGaN/GaN HFETs/HEMTs Active and Passive Electronic Components. 2012 |
Schimizzi RD, Trew RJ, Bilbro GL. (2012) A simplified physical model of RF channel breakdown in AlGaN/GaN HFETs Ieee Transactions On Electron Devices. 59: 2973-2978 |
Bhatia A, Snyder WE, Bilbro G. (2010) Stacked integral image Proceedings - Ieee International Conference On Robotics and Automation. 1530-1535 |
Bhatia A, Bilbro GL, Snyder WE. (2010) Pattern recognition by cluster accumulation Ieee Intelligent Vehicles Symposium, Proceedings. 799-804 |
Schimizzi RD, Trew RJ, Bilbro GL. (2010) Space-charge-limited current transport in nitride HFETs Physica Status Solidi (C) Current Topics in Solid State Physics. 7: 2426-2428 |