Chungho Lee, Ph.D.
Affiliations: | 2004 | Cornell University, Ithaca, NY, United States |
Area:
Electronics and Electrical EngineeringGoogle:
"Chungho Lee"Parents
Sign in to add mentorEdwin C. Kan | grad student | 2004 | Cornell | |
(Charge storage in nanocrystals.) |
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Publications
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Sartor BE, Zhang T, Muzzillo CP, et al. (2024) Hierarchical Transparent Back Contacts for Bifacial CdTe PV. Acs Energy Letters. 9: 1617-1623 |
Ganguly U, Lee C, Hou TH, et al. (2007) Enhanced electrostatics for low-voltage operations in nanocrystal based nanotube/nanowire memories Ieee Transactions On Nanotechnology. 6: 22-28 |
Hou TH, Lee C, Narayanan V, et al. (2006) Design optimization of metal nanocrystal memory - Part II: Gate-stack engineering Ieee Transactions On Electron Devices. 53: 3103-3108 |
Hou TH, Lee C, Narayanan V, et al. (2006) Design optimization of metal nanocrystal memory - Part I: Nanocrystal array engineering Ieee Transactions On Electron Devices. 53: 3095-3102 |
Ganguly U, Narayanan V, Lee C, et al. (2006) Three-dimensional analytical modeling of nanocrystal memory electrostatics Journal of Applied Physics. 99 |
Kim J, Ni W, Lee C, et al. (2006) Magnetic property characterization of magnetite (Fe 3 O 4) nanorod cores for integrated solenoid rf inductors Journal of Applied Physics. 99 |
Ganguly U, Lee C, Kan EC. (2005) Experimental observation of non-volatile charge injection and molecular redox in fullerenes C 60 and C 70 in an EEPROM-type device Materials Research Society Symposium Proceedings. 830: 355-361 |
Lee C, Ganguly U, Kan EC. (2005) Characterization of number fluctuations in gate-last metal nanocrystal nonvolatile memory array beyond 90nm CMOS technology Materials Research Society Symposium Proceedings. 830: 223-228 |
Lee C, Hou T, Kan EC-. (2005) Nonvolatile memory with a metal nanocrystal/nitride heterogeneous floating-gate Ieee Transactions On Electron Devices. 52: 2697-2702 |
Kim M, Shen NY-, Lee C, et al. (2005) Fast and sensitive electret polymer characterization by extended floating gate MOSFET Ieee Transactions On Dielectrics and Electrical Insulation. 12: 1082-1087 |