Robert Hull
Affiliations: | Bell Laboratories, Murray Hill, NJ, United States | ||
| 2008 | University of Virginia, Charlottesville, VA | ||
| 2008- | Materials Engineering | Rensselaer Polytechnic Institute, Troy, NY, United States |
Area:
Materials Science Engineering, NanotechnologyWebsite:
https://mse.rpi.edu/people/faculty/robert-hull#:~:text=He%20received%20his%20PhD%20in%20Materials%20Science%20from%20Oxford%20University%20in%201983Google:
"Robert Hull"Bio:
https://faculty.rpi.edu/robert-hull
https://books.google.com/books?id=DzyWQ_UtIWsC
DOI: 10.1111/j.1365-2818.1983.tb04218.x
Parents
Sign in to add mentor| Colin J. Humphreys | grad student | 1983 | Oxford | |
| (High resolution electron microscopy of sodium beta-alumina) | ||||
Children
Sign in to add trainee| Eric A. Stach | grad student | 1998 | UVA |
| Ganapathi P. Balasubramanian | grad student | 2014 | RPI |
| Hamed Parvaneh | grad student | 2014 | RPI |
BETA: Related publications
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Publications
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| Eswara S, Yedra L, Pshenova A, et al. (2018) In Situ Correlative Microscopy Combining Transmission Electron Microscopy and Secondary Ion Mass Spectrometry Microscopy and Microanalysis. 24: 380-381 |
| Zhang Q, Bruck AM, Bock DC, et al. (2017) Visualization of structural evolution and phase distribution of a lithium vanadium oxide (Li1.1V3O8) electrode via an operando and in situ energy dispersive X-ray diffraction technique. Physical Chemistry Chemical Physics : Pccp |
| Zhang Q, Brady AB, Pelliccione CJ, et al. (2017) Investigation of Structural Evolution of Li1.1V3O8 by In Situ X-ray Diffraction and Density Functional Theory Calculations Chemistry of Materials. 29: 2364-2373 |
| Hull R, Paraveneh H, Wu X. (2016) New Methods for Measuring Chemistry and Temperature Using Scanning Ion and Electron Beams Microscopy and Microanalysis. 22: 610-611 |
| Hull R, Parvaneh H, Andersen D, et al. (2015) Materials genomics of thin film strain relaxation by misfit dislocations Journal of Applied Physics. 118 |
| Parvaneh H, Hull R. (2014) Ion-induced auger electron spectroscopy as a potential route to chemical focused-ion beam tomography Microscopy and Microanalysis. 20: 310-311 |
| Parvaneh H, Hull R. (2014) Examination of ion-induced Auger electron spectra of Ti, Cr and Co in a mass-selecting Focused Ion Beam with a gold-silicon liquid metal source Vacuum. 110: 69-73 |
| Balasubramanian P, Floro JA, Gray JL, et al. (2014) Nano-scale chemistry of self-assembled nanostructures in epitaxial SiGe growth Journal of Crystal Growth. 400: 15-20 |
| Chee SW, Kammler M, Balasubramanian P, et al. (2013) Microstructural changes in silicon induced by patterning with focused ion beams of Ga, Si and Au. Ultramicroscopy. 127: 126-31 |
| Gray JL, Nichols PL, Hull R, et al. (2013) One-dimensional lateral growth of epitaxial islands on focused ion beam patterned substrates Journal of Applied Physics. 113 |