☰

Xiaoliang Bai, Ph.D. - Publications

Affiliations: 
2003 University of California, San Diego, La Jolla, CA 
Area:
Electronics and Electrical Engineering
Tree Info Similar researchers PubMed Report error

5 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2007 Zhao C, Bai X, Dey S. Evaluating Transient Error Effects in Digital Nanometer Circuits Ieee Transactions On Reliability. 56: 381-391. DOI: 10.1109/Tr.2007.903288  0.52
2005 Zhao C, Dey S, Bai X. Soft-spot analysis: targeting compound noise effects in nanometer circuits Ieee Design & Test of Computers. 22: 362-375. DOI: 10.1109/Mdt.2005.95  0.538
2004 Bai X, Dey S. High-level crosstalk defect Simulation methodology for system-on-chip interconnects Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 23: 1355-1361. DOI: 10.1109/Tcad.2004.833612  0.492
2004 Bai X, Chandra R, Dey S, Srinivas PV. Interconnect coupling-aware driver modeling in static noise analysis for nanometer circuits Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 23: 1256-1263. DOI: 10.1109/Tcad.2004.831568  0.526
2002 Chen L, Bai X, Dey S. Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores Journal of Electronic Testing. 18: 529-538. DOI: 10.1023/A:1016562011549  0.456
Show low-probability matches.