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Sean M. Polvino, Ph.D. - Publications

Affiliations: 
2011 Materials Science and Engineering Columbia University, New York, NY 
Area:
Materials Science Engineering
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9 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2015 Hruszkewycz SO, Holt MV, Allain M, Chamard V, Polvino SM, Murray CE, Fuoss PH. Efficient modeling of Bragg coherent x-ray nanobeam diffraction. Optics Letters. 40: 3241-4. PMID 26176439 DOI: 10.1364/Ol.40.003241  0.317
2013 Murray CE, Polvino SM, Noyan IC, Cai Z, Maser J, Holt M. Probing strain at the nanoscale with X-ray diffraction in microelectronic materials induced by stressor elements Thin Solid Films. 530: 85-90. DOI: 10.1016/J.Tsf.2012.05.043  0.728
2011 Murray CE, Ying A, Polvino SM, Noyan IC, Holt M, Maser J. Nanoscale silicon-on-insulator deformation induced by stressed liner structures Journal of Applied Physics. 109. DOI: 10.1063/1.3579421  0.736
2010 Murray CE, Ying AJ, Polvino SM, Noyan IC, Cai Z. Nanoscale strain characterization in microelectronic materials using X-ray diffraction Powder Diffraction. 25: 108-113. DOI: 10.1154/1.3394205  0.715
2009 Murray CE, Ren Z, Ying A, Polvino SM, Noyan IC, Cai Z. Strain measured in a silicon-on-insulator, complementary metal-oxide-semiconductor device channel induced by embedded silicon-carbon source/drain regions Applied Physics Letters. 94. DOI: 10.1063/1.3079656  0.667
2008 Murray CE, Polvino SM, Noyan IC, Lai B, Cai Z. Real-space strain mapping of SOI features using microbeam X-ray diffraction Powder Diffraction. 23: 106-108. DOI: 10.1154/1.2912329  0.717
2008 Murray CE, Saenger KL, Kalenci O, Polvino SM, Noyan IC, Lai B, Cai Z. Submicron mapping of silicon-on-insulator strain distributions induced by stressed liner structures Journal of Applied Physics. 104. DOI: 10.1063/1.2952044  0.588
2008 Polvino SM, Murray CE, Kalenci O, Noyan IC, Lai B, Cai Z. Synchrotron microbeam x-ray radiation damage in semiconductor layers Applied Physics Letters. 92. DOI: 10.1063/1.2942380  0.545
2007 Murray CE, Sankarapandian M, Polvino SM, Noyan IC, Lai B, Cai Z. Submicron mapping of strained silicon-on-insulator features induced by shallow-trench-isolation structures Applied Physics Letters. 90. DOI: 10.1063/1.2732180  0.707
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