| Year |
Citation |
Score |
| 2019 |
Abere MJ, Yalisove SM, Torralva B. Alignment of morphology during high spatial frequency periodic structure formation in GaAs Journal of Applied Physics. 126: 143102. DOI: 10.1063/1.5114930 |
0.332 |
|
| 2019 |
Ahn M, Sarracino A, Ansari A, Torralva B, Yalisove S, Phillips J. Surface morphology and straight crack generation of ultrafast laser irradiated β-Ga2O3 Journal of Applied Physics. 125: 223104. DOI: 10.1063/1.5091700 |
0.486 |
|
| 2018 |
Rittman DR, Tracy CL, Chen C, Solomon JM, Asta M, Mao WL, Yalisove SM, Ewing RC. Phase transformation pathways of ultrafast-laser-irradiated
Ln2O3(Ln=Er–Lu) Physical Review B. 97. DOI: 10.1103/Physrevb.97.024104 |
0.391 |
|
| 2018 |
Ahn M, Cahyadi R, Wendorf J, Bowen W, Torralva B, Yalisove S, Phillips J. Low damage electrical modification of 4H-SiC via ultrafast laser irradiation Journal of Applied Physics. 123: 145106. DOI: 10.1063/1.5020445 |
0.352 |
|
| 2018 |
Cahyadi RS, Torralva B, Yalisove SM. High spatial frequency periodic structures formation on silicon using near UV femtosecond laser irradiation Applied Physics Letters. 112: 32105. DOI: 10.1063/1.5009776 |
0.35 |
|
| 2016 |
Abere MJ, Torralva B, Yalisove SM. Periodic surface structure bifurcation induced by ultrafast laser generated point defect diffusion in GaAs Applied Physics Letters. 108: 153110. DOI: 10.1063/1.4946861 |
0.313 |
|
| 2015 |
Schrider KJ, Torralva B, Yalisove SM. The dynamics of femtosecond pulsed laser removal of 20 nm Ni films from an interface Applied Physics Letters. 107: 124101. DOI: 10.1063/1.4930939 |
0.349 |
|
| 2015 |
Rittman DR, Tracy CL, Cusick AB, Abere MJ, Torralva B, Ewing RC, Yalisove SM. Ultrafast laser and swift heavy ion irradiation: Response of Gd<inf>2</inf>O<inf>3</inf> and ZrO<inf>2</inf> to intense electronic excitation Applied Physics Letters. 106. DOI: 10.1063/1.4919720 |
0.311 |
|
| 2014 |
Abere MJ, Chen C, Rittman DR, Kang M, Goldman RS, Phillips JD, Torralva B, Yalisove SM. Nanodot formation induced by femtosecond laser irradiation Applied Physics Letters. 105. DOI: 10.1063/1.4899066 |
0.358 |
|
| 2014 |
Murphy RD, Torralva B, Adams DP, Yalisove SM. Polarization dependent formation of femtosecond laser-induced periodic surface structures near stepped features Applied Physics Letters. 104. DOI: 10.1063/1.4882998 |
0.355 |
|
| 2013 |
Murphy RD, Torralva B, Adams DP, Yalisove SM. Pump-probe imaging of laser-induced periodic surface structures after ultrafast irradiation of Si Applied Physics Letters. 103. DOI: 10.1063/1.4823588 |
0.383 |
|
| 2013 |
Murphy RD, Abere MJ, Schrider KJ, Torralva B, Yalisove SM. Nanoparticle size and morphology control using ultrafast laser induced forward transfer of Ni thin films Applied Physics Letters. 103. DOI: 10.1063/1.4819437 |
0.342 |
|
| 2013 |
Murphy RD, Torralva B, Adams DP, Yalisove SM. Laser-induced periodic surface structure formation resulting from single-pulse ultrafast irradiation of Au microstructures on a Si substrate Applied Physics Letters. 102. DOI: 10.1063/1.4807830 |
0.467 |
|
| 2013 |
Murphy RD, Torralva B, Yalisove SM. The role of an interface on Ni film removal and surface roughness after irradiation by femtosecond laser pulses Applied Physics Letters. 102. DOI: 10.1063/1.4804371 |
0.531 |
|
| 2012 |
Murphy RD, Abere MJ, Zhang H, Sun H, Torralva B, Mansfield JF, Kotov NA, Yalisove SM. Ultrafast laser orthogonal alignment and patterning of carbon nanotube-polymer composite films Applied Physics Letters. 101. DOI: 10.1063/1.4766926 |
0.412 |
|
| 2011 |
Abere MJ, Murphy RD, Jackson B, Mourou G, Menu M, Mansfield J, Yalisove SM. Ultrafast laser cleaning of daguerreotypes Materials Research Society Symposium Proceedings. 1319: 299-303. DOI: 10.1557/Opl.2011.734 |
0.44 |
|
| 2011 |
Murphy RD, Abere MJ, Zhang H, Sun H, Torralva B, Mansfield JF, Kotov N, Yalisove SM. Ultrafast laser alignment and processing of carbon nanotube films Materials Research Society Symposium Proceedings. 1308: 7-12. DOI: 10.1557/Opl.2011.259 |
0.436 |
|
| 2011 |
Abere M, Murphy R, Jackson B, Mourou G, Menu M, Mansfield J, Torralva B, Yalisove S. Cleaning Daguerreotypes with a Femtosecond Laser Microscopy and Microanalysis. 17: 1812-1813. DOI: 10.1017/S1431927611009937 |
0.47 |
|
| 2011 |
Murphy R, Abere M, Torralva B, Yalisove S. Ultrafast Laser Formation of Nanoparticles Using Interfaces Microscopy and Microanalysis. 17: 1742-1743. DOI: 10.1017/S1431927611009585 |
0.376 |
|
| 2010 |
McDonald JP, Thouless MD, Yalisove SM. Mechanics analysis of femtosecond laser-induced blisters produced in thermally grown oxide on Si(100) Journal of Materials Research. 25: 1087-1095. DOI: 10.1557/Jmr.2010.0146 |
0.677 |
|
| 2009 |
Whitacre JF, Murphy RD, Marrie A, Yalisove SM. Enhanced catalyst utilization in PEM fuel cells via ultrafast laser modification of the polymer exchange membrane surface Electrochemistry Communications. 11: 655-659. DOI: 10.1016/J.Elecom.2009.01.005 |
0.585 |
|
| 2008 |
Herbstman JF, Hunt AJ, Yalisove SM. Novel morphologies and non-linear scaling of laser damage in glass by tightly-focused femtosecond pulses. Applied Physics Letters. 93: 11112. PMID 19177176 DOI: 10.1063/1.2952832 |
0.442 |
|
| 2008 |
Herbstman JF, Yalisove SM, Hunt AJ. Ejection of glass rings during tightly focused femtosecond laser damage at a glass surface Proceedings of Spie - the International Society For Optical Engineering. 7132: 713208. DOI: 10.1117/12.804154 |
0.302 |
|
| 2008 |
Picard YN, McDonald JP, Friedmann TA, Yalisove SM, Adams DP. Nanosecond laser induced ignition thresholds and reaction velocities of energetic bimetallic nanolaminates Applied Physics Letters. 93. DOI: 10.1063/1.2981570 |
0.644 |
|
| 2008 |
McDonald JP, Ma S, Pollock TM, Yalisove SM, Nees JA. Femtosecond pulsed laser ablation dynamics and ablation morphology of nickel based superalloy CMSX-4 Journal of Applied Physics. 103: 093111. DOI: 10.1063/1.2917418 |
0.658 |
|
| 2008 |
Picard YN, Yalisove SM. Femtosecond laser heat affected zones profiled in Co∕Si multilayer thin films Applied Physics Letters. 92: 14102. DOI: 10.1063/1.2832640 |
0.736 |
|
| 2008 |
Das DK, McDonald JP, Levi CG, Yalisove SM, Pollock TM. Detection of a marker layer in a 7YSZ thermal barrier coating by femtosecond laser-induced breakdown spectroscopy Surface and Coatings Technology. 202: 3940-3946. DOI: 10.1016/J.Surfcoat.2008.02.003 |
0.656 |
|
| 2008 |
McDonald JP, Das DK, Nees JA, Pollock TM, Yalisove SM. Approaching non-destructive surface chemical analysis of CMSX-4 superalloy with double-pulsed laser induced breakdown spectroscopy Spectrochimica Acta Part B: Atomic Spectroscopy. 63: 561-565. DOI: 10.1016/J.Sab.2008.02.004 |
0.686 |
|
| 2008 |
Das D, McDonald J, Yalisove S, Pollock T. Depth-profiling study of a thermal barrier coated superalloy using femtosecond laser-induced breakdown spectroscopy Spectrochimica Acta Part B: Atomic Spectroscopy. 63: 27-36. DOI: 10.1016/J.Sab.2007.10.048 |
0.599 |
|
| 2008 |
Das DK, McDonald JP, Yalisove SM, Pollock TM. Femtosecond pulsed laser damage characteristics of 7% Y2O3-ZrO2 thermal barrier coating Applied Physics A. 91: 421-428. DOI: 10.1007/S00339-008-4417-2 |
0.655 |
|
| 2007 |
McDonald JP, Nees JA, Yalisove SM. Pump-probe imaging of femtosecond pulsed laser ablation of silicon with thermally grown oxide films Journal of Applied Physics. 102: 63109. DOI: 10.1063/1.2778740 |
0.696 |
|
| 2007 |
McDonald JP, Hendricks JL, Mistry VR, Martin DC, Yalisove SM. Femtosecond pulsed laser patterning of poly(3,4-ethylene dioxythiophene)-poly(styrenesulfonate) thin films on gold/palladium substrates Journal of Applied Physics. 102. DOI: 10.1063/1.2752137 |
0.716 |
|
| 2007 |
Ma S, McDonald JP, Tryon B, Yalisove SM, Pollock TM. Femtosecond Laser Ablation Regimes in a Single-Crystal Superalloy Metallurgical and Materials Transactions a-Physical Metallurgy and Materials Science. 38: 2349-2357. DOI: 10.1007/S11661-007-9260-0 |
0.695 |
|
| 2006 |
McDonald JP, Ma S, Nees JA, Pollock TM, Yalisove SM. Dynamics of Ultrafast Laser Induced Damage in Single Crystal Ni-based Superalloy During Machining Mrs Proceedings. 980. DOI: 10.1557/PROC-980-0980-II05-31 |
0.366 |
|
| 2006 |
McDonald JP, Mistry VR, Nees JA, Yalisove SM. Time Resolved Dynamics of Femtosecond Laser Ablation of Si (100) with Thin Thermal Oxide Layers (20 - 1200 nm) Mrs Proceedings. 929. DOI: 10.1557/Proc-0929-Ii02-02 |
0.698 |
|
| 2006 |
Tull BR, Carey JE, Mazur E, McDonald JP, Yalisove SM. Silicon Surface Morphologies after Femtosecond Laser Irradiation Mrs Bulletin. 31: 626-633. DOI: 10.1557/Mrs2006.160 |
0.692 |
|
| 2006 |
Zhao ZB, Yalisove SM, Bilello JC. Stress anisotropy and stress gradient in magnetron sputtered films with different deposition geometries Journal of Vacuum Science and Technology. 24: 195-201. DOI: 10.1116/1.2150230 |
0.381 |
|
| 2006 |
McDonald JP, Mistry VR, Ray KE, Yalisove SM. Femtosecond pulsed laser direct write production of nano- and microfluidic channels Applied Physics Letters. 88: 183113. DOI: 10.1063/1.2201620 |
0.671 |
|
| 2006 |
McDonald JP, Mistry VR, Ray KE, Yalisove SM, Nees JA, Moody NR. Femtosecond-laser-induced delamination and blister formation in thermal oxide films on silicon (100) Applied Physics Letters. 88: 153121. DOI: 10.1063/1.2193777 |
0.716 |
|
| 2006 |
Picard YN, Adams DP, Palmer JA, Yalisove SM. Pulsed laser ignition of reactive multilayer films Applied Physics Letters. 88. DOI: 10.1063/1.2191952 |
0.691 |
|
| 2006 |
Picard Y, Yalisove S. Temperature Profiling Femtosecond Laser Induced Modifications Through Transmission Electron Micrscopy Microscopy and Microanalysis. 12: 636-637. DOI: 10.1017/S1431927606065627 |
0.627 |
|
| 2006 |
Feng Q, Picard Y, McDonald J, Van Rompay P, Yalisove S, Pollock T. Femtosecond laser machining of single-crystal superalloys through thermal barrier coatings Materials Science and Engineering: A. 430: 203-207. DOI: 10.1016/J.Msea.2006.05.104 |
0.759 |
|
| 2006 |
Liu Hh, Mourou G, McDonald JP, Picard YN, Yalisove SM, Juhasz T. SEM and SPM studies of single-shot damage on silicon Optics Infobase Conference Papers. |
0.657 |
|
| 2005 |
McDonald JP, Mistry VR, Ray KE, Yalisove SM. O12.6 Fracture and Deformation of Thermal Oxide Films on Si (100) Using a Femtosecond Pulsed Laser Mrs Proceedings. 875. DOI: 10.1557/PROC-875-O12.6 |
0.446 |
|
| 2005 |
McDonald JP, Mistry VR, Ray KE, Yalisove SM. Nanofluidic capillaries produced via femtosecond laser induced delamination of thin thermal oxide films from Si(100) substrates Mrs Proceedings. 901. DOI: 10.1557/Proc-0901-Ra16-36-Rb16-36 |
0.713 |
|
| 2005 |
Picard YN, Yalisove SM. Nano-Thermometry: Transmission Electron Microscopy of Femtosecond Laser Irradiated Co/Si Multilayer Thin Foils Mrs Proceedings. 899: 141-145. DOI: 10.1557/Proc-0899-N07-30 |
0.674 |
|
| 2005 |
McDonald JP, McClelland AA, Picard YN, Yalisove SM. Role of a native oxide on femtosecond laser interaction with silicon (100) near the damage threshold Applied Physics Letters. 86: 264103. DOI: 10.1063/1.1946916 |
0.758 |
|
| 2005 |
Zhao ZB, Rek ZU, Yalisove SM, Bilello JC. Evolution of in-plane texture in reactively sputtered CrN films Journal of Applied Physics. 97: 23525. DOI: 10.1063/1.1823022 |
0.422 |
|
| 2005 |
Zhao ZB, Rek ZU, Yalisove SM, Bilello JC. Nanostructured chromium nitride films with a valley of residual stress Thin Solid Films. 472: 96-104. DOI: 10.1016/J.Tsf.2004.06.116 |
0.414 |
|
| 2005 |
Feng Q, Picard Y, Liu H, Yalisove S, Mourou G, Pollock T. Femtosecond laser micromachining of a single-crystal superalloy Scripta Materialia. 53: 511-516. DOI: 10.1016/J.Scriptamat.2005.05.006 |
0.685 |
|
| 2004 |
Feng Q, Picard YN, Liu H, Yalisove SM, Mourou G, Pollock TM. Femtosecond Laser Micromachining Of Single-Crystal Superalloys Superalloys. 687-696. DOI: 10.7449/2004/Superalloys_2004_687_696 |
0.701 |
|
| 2004 |
Picard YN, Adams DP, Yalisove SM. Femtosecond laser interactions with Co/Al multilayer films Mrs Proceedings. 850: 115-121. DOI: 10.1557/Proc-850-Mm1.9 |
0.726 |
|
| 2004 |
Zhao ZB, Rek ZU, Yalisove SM, Bilello JC. In situ x-ray diffraction observation of multiple texture turnovers in sputtered Cr films Journal of Vacuum Science and Technology. 22: 2365-2372. DOI: 10.1116/1.1804984 |
0.411 |
|
| 2004 |
Burnett DJ, Gabelnick AM, Marsh AL, Lewis HD, Yalisove SM, Fischer DA, Gland JL. Defect enhanced carbon monoxide oxidation at elevated oxygen pressures on a Pt/Al 2O 3 thin film Journal of Physical Chemistry B. 108: 5314-5323. DOI: 10.1021/Jp036012Z |
0.328 |
|
| 2004 |
Zhao ZB, Rek ZU, Yalisove SM, Bilello JC. Phase formation and structure of magnetron sputtered chromium nitride films: in-situ and ex-situ studies Surface & Coatings Technology. 185: 329-339. DOI: 10.1016/J.Surfcoat.2003.12.026 |
0.402 |
|
| 2004 |
Shyam A, Picard YN, Jones JW, Allison JE, Yalisove SM. Small fatigue crack propagation from micronotches in the cast aluminum alloy W319 Scripta Materialia. 50: 1109-1114. DOI: 10.1016/J.Scriptamat.2004.01.031 |
0.584 |
|
| 2003 |
Picard YN, Liu HH, Speys SJ, McDonald JP, Adams DP, Weihs TP, Yalisove SM. Cutting Reactive Foils Without Igniting Them (A Femtosecond Laser Machining Approach) Mrs Proceedings. 800: 387-392. DOI: 10.1557/Proc-800-Aa9.8 |
0.742 |
|
| 2003 |
Picard YN, Liu HH, Speys SJ, McDonald JP, Adams DP, Weihs TP, Yalisove SM. Cutting reactive foils without igniting them (a femtosecond laser machining approach) Materials Research Society Symposium - Proceedings. 800: 387-392. |
0.674 |
|
| 2002 |
Picard YN, Adams DP, Spahn OB, Yalisove SM, Dagel DJ, Sobczak J. Low Stress, High Reflectivity Thin Films for MEMS Mirrors Mrs Proceedings. 729. DOI: 10.1557/Proc-729-U3.11 |
0.619 |
|
| 2002 |
Whitacre JF, Yalisove SM, Bilello JC. Erratum: “Real-time/in situ diffraction study of phase and microstructural evolution in sputtered β-Ta/Ta2O5 films” [J. Vac. Sci. Technol. A 19, 2910 (2001)] Journal of Vacuum Science and Technology. 20: 1505-1505. DOI: 10.1116/1.1477419 |
0.562 |
|
| 2002 |
Zhao ZB, Yalisove SM, Rek ZU, Bilello JC. Evolution of anisotropic microstructure and residual stress in sputtered Cr films Journal of Applied Physics. 92: 7183-7192. DOI: 10.1063/1.1521791 |
0.412 |
|
| 2002 |
Zhao ZB, Hershberger J, Yalisove SM, Bilello JC. Determination of residual stress in thin films: A comparative study of X-ray topography versus laser curvature method Thin Solid Films. 415: 21-31. DOI: 10.1016/S0040-6090(02)00489-3 |
0.435 |
|
| 2001 |
Agarwal AB, Rainey BA, Yalisove SM, Bilello JC. Nanoindentation and Microstructural Evolution Studies of DC Magnetron Sputtered Chromium Nitride Thin Films Mrs Proceedings. 672. DOI: 10.1557/Proc-671-O5.8 |
0.371 |
|
| 2001 |
Whitacre JF, Yalisove SM, Bilello JC. Real-time/in situ diffraction study of phase and microstructural evolution in sputtered β-Ta/Ta2O5 films Journal of Vacuum Science and Technology. 19: 2910-2919. DOI: 10.1116/1.1414119 |
0.639 |
|
| 2000 |
Daniels M, Maciejewski J, Zabinski J, Rek Z, Yalisove S, Bilello J. An Investigation of Sputtered Al-Cu-Fe-Cr Quasicrystalline Films Via Synchrotron Diffraction Mrs Proceedings. 643. DOI: 10.1557/Proc-643-K8.4 |
0.375 |
|
| 2000 |
Whitacre JF, Yalisove SM, Bilello JC. In-Plane Texturing in Sputtered Films Textures and Microstructures. 34: 91-103. DOI: 10.1155/TSM.34.91 |
0.618 |
|
| 2000 |
Kendig LP, Rek ZU, Yalisove SM, Bilello JC. The role of impurities and microstructure on residual stress in nanoscale Mo films Surface & Coatings Technology. 132: 124-129. DOI: 10.1016/S0257-8972(00)00908-7 |
0.426 |
|
| 1999 |
Cammarata RC, Bilello JC, Greer AL, Sieradzki K, Yalisove SM. Stresses in multilayered thin films Mrs Bulletin. 24: 34-38. DOI: 10.1557/S0883769400051526 |
0.368 |
|
| 1999 |
Whitacre JF, Yalisove SM, Bilello JC. Deposition Kinetics and Microstructural Evolution in Sputtered TA Films: a Real-Time/In-Situ Study Mrs Proceedings. 562: 141. DOI: 10.1557/Proc-562-141 |
0.633 |
|
| 1998 |
Whitacre JF, Rek ZU, Yalisove SM, Bilello JC. Probing stress state and phase content in ultra-thin Ta films Mrs Proceedings. 524: 115-119. DOI: 10.1557/Proc-524-115 |
0.619 |
|
| 1998 |
Hershberger J, Rek ZU, Kustas F, Yalisove SM, Bilello JC. Degree of crystallinity and strain in B{sub 4}C and SiC thin films as a function of processing conditions Mrs Proceedings. 524. DOI: 10.1557/Proc-524-109 |
0.369 |
|
| 1998 |
Whitacre JF, Rek ZU, Bilello JC, Yalisove SM. Surface Roughness And In-Plane Texturing In Sputtered Thin Films Journal of Applied Physics. 84: 1346-1353. DOI: 10.1063/1.368204 |
0.65 |
|
| 1998 |
Malhotra AK, Whitacre JF, Zhao ZB, Hershberger J, Yalisove SM, Bilello JC. An in situ/ex situ X-ray analysis system for thin sputtered films Surface & Coatings Technology. 110: 105-110. DOI: 10.1016/S0257-8972(98)00678-1 |
0.619 |
|
| 1997 |
Hershberger J, Kustas F, Rek ZU, Yalisove SM, Bilello JC. Structure determination of B{sub 4}C and SiC thin films via synchrotron high-resolution diffraction Mrs Proceedings. 505: 635. DOI: 10.1557/Proc-505-635 |
0.375 |
|
| 1997 |
Zhao ZB, Hershberger J, Yalisove SM, Bilello JC. On The Measurement Of Residual Stress In Thin Films Mrs Proceedings. 505. DOI: 10.1557/Proc-505-519 |
0.341 |
|
| 1997 |
Malhotra SG, Rek ZU, Yalisove SM, Bilello JC. Strain gradients and normal stresses in textured Mo thin films Journal of Vacuum Science and Technology. 15: 345-352. DOI: 10.1116/1.580490 |
0.376 |
|
| 1997 |
Karpenko OP, Bilello JC, Yalisove SM. Growth anisotropy and self-shadowing: A model for the development of in-plane texture during polycrystalline thin-film growth Journal of Applied Physics. 82: 1397-1403. DOI: 10.1063/1.365916 |
0.309 |
|
| 1997 |
Karpenko OP, Yalisove SM, Eaglesham DJ. Surface Roughening During Low Temperature Si(100) Epitaxy Journal of Applied Physics. 82: 1157-1165. DOI: 10.1063/1.365883 |
0.321 |
|
| 1997 |
Malhotra SG, Rek ZU, Yalisove SM, Bilello JC. Analysis of thin film stress measurement techniques Thin Solid Films. 301: 45-54. DOI: 10.1016/S0040-6090(96)09569-7 |
0.378 |
|
| 1996 |
Parfitt LJ, Rek ZU, Yalisove SM, Bilello JC. Native Oxide and the Residual Stress of Thin Mo and Ta Films Mrs Proceedings. 441. DOI: 10.1557/Proc-441-385 |
0.43 |
|
| 1996 |
Whitacre JF, Bilello JC, Yalisove SM. The Role of Roughness in Texture Development Mrs Proceedings. 440: 241. DOI: 10.1557/Proc-440-241 |
0.549 |
|
| 1996 |
Parfitt LJ, Karpenko OP, Rek ZU, Yalisove SM, Bilello JC. Origins of Residual Stress in Mo and Ta Films: the Role of Impurities, Microstructural Evolution, and Phase Transformations Mrs Proceedings. 436: 505. DOI: 10.1557/Proc-436-505 |
0.341 |
|
| 1996 |
Karpenko OP, Yalisove SM. CoSi2 heteroepitaxy on patterned Si(100) substrates Journal of Applied Physics. 80: 6211-6218. DOI: 10.1063/1.363697 |
0.327 |
|
| 1996 |
Malhotra SG, Rek ZU, Yalisove SM, Bilello JC. Depth dependence of residual strains in polycrystalline Mo thin films using high‐resolution x‐ray diffraction Journal of Applied Physics. 79: 6872-6879. DOI: 10.1063/1.361509 |
0.391 |
|
| 1996 |
Hershberger J, Ying T, Kustas F, Fehrenbacher L, Yalisove SM, Bilello JC. Residual stress, atomic structure, and growth morphology in B4C/SiC multilayer coatings Surface and Coatings Technology. 86: 237-242. DOI: 10.1016/S0257-8972(96)03034-4 |
0.413 |
|
| 1996 |
Malhotra AK, Yalisove SM, Bilello JC. Growth and characterization of Ta/W multiscalar multilayer composite films Thin Solid Films. 286: 196-202. DOI: 10.1016/S0040-6090(95)08521-1 |
0.405 |
|
| 1995 |
Malhotra AK, Yalisove SM, Bilello JC. Origin of In-Plane Texturing in Sputtered Mo Films Mrs Proceedings. 403. DOI: 10.1557/Proc-403-33 |
0.42 |
|
| 1995 |
Malhotra SG, Rek ZU, Yalisove SM, Bilello JC. Depth dependence of residual strains in textured Mo thin films using high-resolution x-ray diffraction Mrs Proceedings. 403: 127-132. DOI: 10.1557/Proc-403-127 |
0.346 |
|
| 1995 |
Olk CH, Yalisove SM, Heremans JP, Doll GL. Negative magnetoresistance as a result of hopping conduction in polycrystalline thin films of β-FeSi2 Physical Review B. 52: 4643-4646. DOI: 10.1103/Physrevb.52.4643 |
0.366 |
|
| 1995 |
Vill MA, Rek ZU, Yalisove SM, Bilello JC. Growth Textures Of Thick Sputtered Films And Multilayers Assessed Via Synchrotron Transmission Laue Journal of Applied Physics. 78: 3812-3819. DOI: 10.1063/1.360746 |
0.357 |
|
| 1995 |
Adams DP, Parfitt LJ, Bilello JC, Yalisove SM, Rek ZU. Microstructure and residual stress of very thin Mo films Thin Solid Films. 266: 52-57. DOI: 10.1016/0040-6090(95)00603-6 |
0.421 |
|
| 1994 |
Malhotra SG, Rek ZU, Parfitt LJ, Yalisove SM, Bilello JC. Principal Residual Strains as A function of Depth for Sputter Deposited Mo Thin Films Mrs Proceedings. 356. DOI: 10.1557/Proc-356-603 |
0.364 |
|
| 1994 |
Olk CH, Karpenko OP, Yalisove SM, Doll GL, Mansfield JF. Growth of epitaxial β-FeSi 2 thin films by pulsed laser deposition on silicon (111) Journal of Materials Research. 9: 2733-2736. DOI: 10.1557/Jmr.1994.2733 |
0.519 |
|
| 1994 |
Karpenko OP, Olk CH, Yalisove SM, Mansfield JF, Doll GL. Structural investigation of Fe silicide films grown by pulsed laser deposition Journal of Applied Physics. 76: 2202-2207. DOI: 10.1063/1.357635 |
0.449 |
|
| 1994 |
Karpenko OP, Bilello JC, Yalisove SM. Combined transmission electron microscopy and x-ray study of the microstructure and texture in sputtered Mo films Journal of Applied Physics. 76: 4610-4617. DOI: 10.1063/1.357295 |
0.435 |
|
| 1994 |
Adams DP, Yalisove SM, Eaglesham DJ. Interfacial and surface energetics of CoSi2 Journal of Applied Physics. 76: 5190-5194. DOI: 10.1063/1.357237 |
0.317 |
|
| 1993 |
Karpenko OP, Olk CH, Doll GL, Mansfield JF, Yalisove SM. Structural analysis of pulsed laser deposited FeSi2 films Mrs Proceedings. 320. DOI: 10.1557/Proc-320-103 |
0.523 |
|
| 1993 |
Malhotra SG, Rek Z, Vill M, Karpenko OP, Yalisove SM, Bilello JC. Depth Profiling of Molybdenum Thin Films Using Grazing Incidence X-Ray Scattering Mrs Proceedings. 317. DOI: 10.1557/Proc-317-473 |
0.34 |
|
| 1993 |
Karpenko OP, Vill M, Malhotra SG, Bilello JC, Yalisove SM. Texture in sputtered Mo films Mrs Proceedings. 317: 467-472. DOI: 10.1557/Proc-317-467 |
0.385 |
|
| 1993 |
Vill M, Malhotra SG, Rek Z, Yalisove SM, Bilello JC. White-Beam Transmission Characterization of Texture in Mo Thin Films and Mo/W Multilayers Mrs Proceedings. 317: 413. DOI: 10.1557/Proc-317-413 |
0.37 |
|
| 1993 |
Eaglesham DJ, Unterwald FC, Luftman H, Adams DP, Yalisove SM. Effect of H on Si molecular‐beam epitaxy Journal of Applied Physics. 74: 6615-6618. DOI: 10.1063/1.355101 |
0.308 |
|
| 1993 |
Adams DP, Vill M, Tao J, Bilello JC, Yalisove SM. Controlling strength and toughness of multilayer films: A new multiscalar approach Journal of Applied Physics. 74: 1015-1021. DOI: 10.1063/1.354947 |
0.419 |
|
| 1993 |
Adams DP, Yalisove SM, Eaglesham DJ. Effect of hydrogen on surface roughening during Si homoepitaxial growth Applied Physics Letters. 63: 3571-3573. DOI: 10.1063/1.110100 |
0.352 |
|
| 1991 |
Tao J, Adams D, Yalisove SM, Bilello JC. The Origin of Anomalous Strain in Thin Sputtered Mo Films on Si(100) Mrs Proceedings. 239. DOI: 10.1557/Proc-239-57 |
0.359 |
|
| 1989 |
Tung RT, Batstone JL, Yalisove SM. Si/CoSi2/Si Structures: Pseudomorphism, Interface Structures, Epitaxial Orientations, and the Control of Pinholes Journal of the Electrochemical Society. 136: 815-819. DOI: 10.1149/1.2096749 |
0.309 |
|
| 1989 |
Tung RT, Schrey F, Yalisove SM. Homoepitaxial growth of CoSi2 and NiSi2 on (100) and (110) surfaces at room temperature Applied Physics Letters. 55: 2005-2007. DOI: 10.1063/1.102338 |
0.326 |
|
| 1989 |
Yalisove SM, Eaglesham DJ, Tung RT. Single-crystal growth of CoSi2 (110) on Si (110) Applied Physics Letters. 55: 2075-2077. DOI: 10.1063/1.102110 |
0.416 |
|
| 1988 |
Loretto D, Gibson JM, Yalisove SM. A Uhv Tem Study of the in Situ Growth of Ultra-Thin Films of CoSi2 ON Si (100). Mrs Proceedings. 138. DOI: 10.1557/Proc-138-403 |
0.377 |
|
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