Year |
Citation |
Score |
2007 |
Zangenberg N, Beaton DA, Tiedje T, Tixier S, Adamcyk M, Kumaran R, MacKenzie JA, Nodwell E, Young EC, Sproule GI. Molecular beam epitaxy growth of the dilute nitride GaAs1−xNx with a helical resonator plasma source Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 25: 850-856. DOI: 10.1116/1.2748800 |
0.501 |
|
2007 |
Karaiskaj D, Mascarenhas A, Klem JF, Volz K, Stolz W, Adamcyk M, Tiedje T. Excitons bound to nitrogen pairs in GaAs as seen by photoluminescence of high spectral and spatial resolution Physical Review B. 76. DOI: 10.1103/Physrevb.76.125209 |
0.501 |
|
2005 |
Seong M, Francoeur S, Yoon S, Mascarenhas A, Tixier S, Adamcyk M, Tiedje T. Bi-induced vibrational modes in GaAsBi Superlattices and Microstructures. 37: 394-400. DOI: 10.1016/J.Spmi.2005.02.004 |
0.44 |
|
2004 |
Nodwell E, Adamcyk M, Ballestad A, Tiedje T, Tixier S, Webster SE, Young EC, Moewes A, Kurmaev EZ, van Buuren T. Tight-binding model for the x-ray absorption and emission spectra of diluteGaNxAs1−xat the nitrogenKedge Physical Review B. 69. DOI: 10.1103/Physrevb.69.155210 |
0.512 |
|
2004 |
Ballestad A, Tiedje T, Schmid J, Ruck B, Adamcyk M. Predicting GaAs surface shapes during MBE regrowth on patterned substrates Journal of Crystal Growth. 271: 13-21. DOI: 10.1016/J.Jcrysgro.2004.07.047 |
0.674 |
|
2003 |
Francoeur S, Seong M, Mascarenhas A, Tixier S, Adamcyk M, Tiedje T. Band gap of GaAs1−xBix, 0Applied Physics Letters. 82: 3874-3876. DOI: 10.1063/1.1581983 |
0.496 |
|
2003 |
Tixier S, Adamcyk M, Tiedje T, Francoeur S, Mascarenhas A, Wei P, Schiettekatte F. Molecular beam epitaxy growth of GaAs1−xBix Applied Physics Letters. 82: 2245-2247. DOI: 10.1063/1.1565499 |
0.598 |
|
2003 |
Tixier S, Adamcyk M, Young E, Schmid J, Tiedje T. Surfactant enhanced growth of GaNAs and InGaNAs using bismuth Journal of Crystal Growth. 251: 449-454. DOI: 10.1016/S0022-0248(02)02217-0 |
0.69 |
|
2002 |
Adamcyk M, Ballestad A, Schmid JH, Tiedje T, Tixier S, Young EC, Fink V, Kavanagh KL, Koveshnikov A. Surfactant enhanced growth of GaNAs and InGaNAs using a Bi flux Mbe 2002 - 2002 12th International Conference On Molecular Beam Epitaxy. 275-276. DOI: 10.1109/MBE.2002.1037866 |
0.517 |
|
2002 |
Schmid JH, Ballestad A, Ruck BJ, Adamcyk M, Tiedje T. Kinetic roughening of GaAs(001) during thermalCl2etching Physical Review B. 65. DOI: 10.1103/Physrevb.65.155315 |
0.659 |
|
2002 |
Adamcyk M, Schmid JH, Tiedje T, Koveshnikov A, Chahboun A, Fink V, Kavanagh KL. Comparison of strain relaxation in InGaAsN and InGaAs thin films Applied Physics Letters. 80: 4357-4359. DOI: 10.1063/1.1485124 |
0.66 |
|
2001 |
Ballestad A, Ruck BJ, Adamcyk M, Pinnington T, Tiedje T. Evidence from the surface morphology for nonlinear growth of epitaxial GaAs films. Physical Review Letters. 86: 2377-80. PMID 11289933 DOI: 10.1103/Physrevlett.86.2377 |
0.589 |
|
2001 |
Adamcyk M, Tixier S, Ruck BJ, Schmid JH, Tiedje T, Fink V, Jeffries M, Karaiskaj D, Kavanagh KL, Thewalt M. Faceting transition in epitaxial growth of dilute GaNAs films on GaAs Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 19: 1417-1421. DOI: 10.1116/1.1386379 |
0.621 |
|
2000 |
Adamcyk M, Ballestad A, Pinnington T, Tiedje T, Davies M, Feng Y. Smoothing of textured GaAs surfaces during molecular beam epitaxy growth Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 18: 1488. DOI: 10.1116/1.591410 |
0.599 |
|
2000 |
Sfigakis F, Paddon P, Pacradouni V, Adamcyk M, Nicoll C, Cowan A, Tiedje T, Young J. Near-infrared refractive index of thick, laterally oxidized AlGaAs cladding layers Journal of Lightwave Technology. 18: 199-202. DOI: 10.1109/50.822793 |
0.465 |
|
2000 |
Adamcyk M, Pinnington T, Ballestad A, Tiedje T. Effect of the starting surface on the morphology of MBE-grown GaAs Materials Science and Engineering: B. 75: 153-156. DOI: 10.1016/S0921-5107(00)00352-4 |
0.61 |
|
1999 |
ADAMCYK M, EISEBITT S, KARL A, NICOLL C, PINNINGTON T, SCHERER R, TIEDJE T, EBERHARDT W. SURFACE ROUGHNESS AND RESONANT SCATTERING EFFECTS IN SOFT X-RAY SPECKLE FROM RANDOM SEMICONDUCTOR INTERFACES Surface Review and Letters. 6: 1121-1128. DOI: 10.1142/S0218625X99001244 |
0.57 |
|
1999 |
Adamcyk M, Nicoll C, Pinnington T, Tiedje T, Eisebitt S, Karl A, Scherer R, Eberhardt W. Coherent soft x-ray scattering from InP islands on a semiconductor substrate Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 17: 1728. DOI: 10.1116/1.590816 |
0.561 |
|
1998 |
Elsebitt S, Karl A, Scherer R, Eberhardt W, Adamcyk M, Tiedje T, Pistonesi C. Speckle with soft X-rays: A demonstration Synchrotron Radiation News. 11: 15-19. DOI: 10.1080/08940889808260953 |
0.485 |
|
1998 |
Adamcyk M, Beaudoin M, Kelson I, Levy Y, Tiedje T. Diffusion studies of Ra and Pb in GaAs by the alpha-particle energy loss method Journal of Applied Physics. 84: 6003-6006. DOI: 10.1063/1.368877 |
0.488 |
|
1998 |
Beaudoin M, Adamcyk M, Gelbart Z, Giesen U, Kelson I, Levy Y, MacKenzie JA, Tiedje T. Film thickness and composition monitoring during growth by molecular beam epitaxy using alpha particle energy loss Applied Physics Letters. 72: 3288-3290. DOI: 10.1063/1.121626 |
0.553 |
|
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