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Gheorghe Stan, Ph.D.

Affiliations: 
2005 Colorado State University, Fort Collins, CO 
Area:
Condensed Matter Physics
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"Gheorghe Stan"
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Stuart B. Field grad student 2005 Colorado State
 (Magnetic flux dynamics in superconducting films studied by scanning Hall probe microscopy.)

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Publications

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Stan G, Ciobanu CV, King SW. (2022) Resolving the Subsurface Structure and Elastic Modulus of Layered Films via Contact Resonance Atomic Force Microscopy. Acs Applied Materials & Interfaces
Stan G, Mays E, Yoo HJ, et al. (2022) The effect of edge compliance on the contact between a spherical indenter and a high-aspect-ratio rectangular fin. Experimental Mechanics. 58
Stan G. (2020) High-speed digitization of the amplitude and frequency in open-loop sideband frequency-modulation Kelvin probe force microscopy. Nanotechnology
Stan G, Ciobanu CV, Likith SRJ, et al. (2020) Doping of MoTe2 via surface charge-transfer in air. Acs Applied Materials & Interfaces
Stan G. (2019) The effect of edge compliance on the adhesive contact between a spherical indenter and a quarter-space. International Journal of Solids and Structures. 158
Stan G, Mays E, Yoo HJ, et al. (2019) Correction to: The Effect of Edge Compliance on the Contact between a Spherical Indenter and a High-Aspect-Ratio Rectangular Fin Experimental Mechanics. 1-11
Stan G, Gates RS, Hu Q, et al. (2017) Relationships between chemical structure, mechanical properties and materials processing in nanopatterned organosilicate fins. Beilstein Journal of Nanotechnology. 8: 863-871
Stan G, Mays E, Yoo HJ, et al. (2016) Nanoscale tomographic reconstruction of the subsurface mechanical properties of low-k high-aspect ratio patterns. Nanotechnology. 27: 485706
Stan G, Adams GG. (2016) Adhesive contact between a rigid spherical indenter and an elastic multi-layer coated substrate. International Journal of Solids and Structures. 87: 1-10
Friedman LH, Vaudin MD, Stranick SJ, et al. (2016) Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented Si. Ultramicroscopy. 163: 75-86
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