Hans Hilgenkamp
Affiliations: | University of Twente, Enschede, Overijssel, Netherlands |
Website:
https://people.utwente.nl/j.w.m.hilgenkampGoogle:
"Hans Hilgenkamp"Mean distance: (not calculated yet)
Parents
Sign in to add mentorHorst Rogalla | grad student | 1995 | University of Twente (E-Tree) | |
(High-Tc dc SQUID Magnetometers) |
Children
Sign in to add traineeAriando Ariando | grad student | ||
Abhimanyu Singh Rana | grad student | 2015-2017 | University of Twente |
Nicola Poccia | post-doc | 2012-2016 | University of Twente |
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Publications
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Leermakers I, Rubi K, Yang M, et al. (2021) Quantum oscillations in an optically-illuminated two-dimensional electron system at the LaAlO/SrTiOinterface. Journal of Physics. Condensed Matter : An Institute of Physics Journal |
Rana A, Li C, Koster G, et al. (2020) Resistive switching studies in VO thin films. Scientific Reports. 10: 3293 |
Yin C, Smink AEM, Leermakers I, et al. (2020) Electron Trapping Mechanism in LaAlO_{3}/SrTiO_{3} Heterostructures. Physical Review Letters. 124: 017702 |
Hilgenkamp H, Smink AEM. (2020) Suppressing superconductivity by adding it. Nature Materials. 18: 913-914 |
Smink AEM, Birkhölzer YA, van Dam J, et al. (2020) Mapping unit-cell thickness variations in thin films by post-deposition reflection high-energy electron diffraction Physical Review Materials. 4 |
Chen B, Gauquelin N, Reith P, et al. (2020) Thermal-strain-engineered ferromagnetism of LaMnO3/SrTiO3 heterostructures grown on silicon Physical Review Materials. 4 |
Faley MI, Reith P, Satrya CD, et al. (2020) MoRe/YBCO Josephson junctions and π-loops Superconductor Science and Technology. 33: 044005 |
Uzun Y, Smink AEM, de Jong MP, et al. (2020) Acoustoelectric charge transport at the LaAlO3/SrTiO3 interface Applied Physics Letters. 116: 011601 |
Faley MI, Reith P, Stolyarov VS, et al. (2019) π-Loops With ds Josephson Junctions Ieee Transactions On Applied Superconductivity. 29: 1-5 |
Le PTP, Hofhuis K, Rana A, et al. (2019) Tailoring Vanadium Dioxide Film Orientation Using Nanosheets: a Combined Microscopy, Diffraction, Transport, and Soft X‐Ray in Transmission Study Advanced Functional Materials. 30: 1900028 |