John J. Garramone

Affiliations: 
2011 Nanoscale Science and Engineering-Nanoscale Science State University of New York, Albany, Albany, NY, United States 
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"John Garramone"
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SNBCP

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Vincent P. LaBella grad student 2011 SUNY Albany
 (Role of interface band structure on hot electron transport.)
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Karmel HJ, Garramone JJ, Emery JD, et al. (2014) Self-assembled organic monolayers on epitaxial graphene with enhanced structural and thermal stability. Chemical Communications (Cambridge, England). 50: 8852-5
Sitnitsky I, Garramone JJ, Abel J, et al. (2012) Schottky barrier and attenuation length for hot hole injection in nonepitaxial Au on p-type GaAs Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 30
Abel J, Matsubayashi A, Garramone JJ, et al. (2012) Temperature dependent spin precession measurements in trilayer graphene utilizing co/graphene contacts Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 30: 03D115
Garramone JJ, Abel JR, Barraza-Lopez S, et al. (2012) Signatures of the semiconductor crystallographic orientation on the charge transport across non-epitaxial diodes Applied Physics Letters. 100
Garramone JJ, Abel JR, Sitnitsky IL, et al. (2010) Hot-electron transport studies of the Ag/Si(001) interface using ballistic electron emission microscopy Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 28: 643-646
Abel J, Garramone JJ, Sitnitsky IL, et al. (2010) Studies of Al2 O3 barriers for use in tunnel junctions for nonlocal spin detection experiments Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 28: 702-705
Garramone JJ, Abel JR, Sitnitsky IL, et al. (2010) Erratum: “Measurement of the hot electron attenuation length of copper” [Appl. Phys. Lett. 96, 062105 (2010)] Applied Physics Letters. 96: 269901
Garramone JJ, Abel JR, Sitnitsky IL, et al. (2010) Measurement of the hot electron attenuation length of copper Applied Physics Letters. 96
Garramone JJ, Abel JR, Sitnitsky IL, et al. (2009) Hot electron transport studies of the Cu/Si(001) interface using ballistic electron emission microscopy Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 27: 2044-2047
Stollenwerk AJ, Spadafora EJ, Garramone JJ, et al. (2008) Effect of interface band structure on hot-electron attenuation lengths in Au thin films Physical Review B - Condensed Matter and Materials Physics. 77
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