Brian L. Wehrenberg, Ph.D. - Publications
Affiliations: | 2005 | University of Chicago, Chicago, IL |
Area:
Quantum Confined Semiconductors, Plasmonic Metal NanoparticlesYear | Citation | Score | |||
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2006 | Yu D, Wehrenberg BL, Jha P, Ma J, Guyot-Sionnest P. Electronic transport of n-type CdSe quantum dot films: Effect of film treatment Journal of Applied Physics. 99. DOI: 10.1063/1.2192288 | 0.569 | |||
2006 | Yu D, Wehrenberg BL, Yang I, Kang W, Guyot-Sionnest P. Magnetoresistance of n-type quantum dot solids Applied Physics Letters. 88. DOI: 10.1063/1.2174089 | 0.705 | |||
2005 | Wehrenberg BL, Yu D, Ma J, Guyot-Sionnest P. Conduction in charged PbSe nanocrystal films. The Journal of Physical Chemistry. B. 109: 20192-9. PMID 16853610 DOI: 10.1021/Jp053621T | 0.693 | |||
2005 | Guyot-Sionnest P, Wehrenberg B, Yu D. Intraband relaxation in CdSe nanocrystals and the strong influence of the surface ligands. The Journal of Chemical Physics. 123: 074709. PMID 16229612 DOI: 10.1063/1.2004818 | 0.628 | |||
2004 | Yu D, Wang C, Wehrenberg BL, Guyot-Sionnest P. Variable range hopping conduction in semiconductor nanocrystal solids. Physical Review Letters. 92: 216802. PMID 15245304 DOI: 10.1103/Physrevlett.92.216802 | 0.666 | |||
2004 | Wang C, Wehrenberg BL, Woo CY, Guyot-Sionnest P. Light emission and amplification in charged CdSe quantum dots Journal of Physical Chemistry B. 108: 9027-9031. DOI: 10.1021/Jp0489830 | 0.686 | |||
2003 | Wehrenberg BL, Guyot-Sionnest P. Electron and hole injection in PbSe quantum dot films. Journal of the American Chemical Society. 125: 7806-7. PMID 12822991 DOI: 10.1021/Ja035369D | 0.648 | |||
2002 | Wehrenberg BL, Wang C, Guyot-Sionnest P. Interband and intraband optical studies of PbSe colloidal quantum dots Journal of Physical Chemistry B. 106: 10634-10640. DOI: 10.1021/Jp021187E | 0.587 | |||
2002 | Matranga C, Wehrenberg BL, Guyot-Sionnest P. Vibrational relaxation of cyanide on copper surfaces: Can metal d-bands influence vibrational energy transfer? Journal of Physical Chemistry B. 106: 8172-8175. DOI: 10.1021/Jp020618Q | 0.623 | |||
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