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Candi S. Cook, Ph.D. - Publications

Affiliations: 
2006 Arizona State University, Tempe, AZ, United States 
Area:
Materials Science Engineering, Condensed Matter Physics
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11 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2006 D'Costa VR, Cook CS, Birdwell AG, Littler CL, Canonico M, Zollner S, Kouvetakis J, Menéndez J. Optical critical points of thin-film Ge1-y Sny alloys: A comparative Ge1-y Sny Ge1-x six study Physical Review B - Condensed Matter and Materials Physics. 73. DOI: 10.1103/Physrevb.73.125207  0.571
2006 Chizmeshya AVG, Ritter C, Tolle J, Cook C, Menéndez J, Kouvetakis J. Fundamental Studies of P(GeH3)3, As(GeH 3)3, and Sb(GeH3)3: Practical n-Dopants for New Group IV Semiconductors Chemistry of Materials. 18: 6266-6277. DOI: 10.1021/Cm061696J  0.598
2006 D'Costa VR, Cook CS, Menéndez J, Tolle J, Kouvetakis J, Zollner S. Transferability of optical bowing parameters between binary and ternary group-IV alloys Solid State Communications. 138: 309-313. DOI: 10.1016/J.Ssc.2006.02.023  0.584
2005 Cook CS, D'Costa V, Kouvetakis J, Zollner S, Menéndez J. Compositional dependence of critical point transitions in Ge 1-xSn x alloys Aip Conference Proceedings. 772: 65-66. DOI: 10.1063/1.1993997  0.573
2005 Roucka R, Tolle J, Cook C, Chizmeshya AVG, Kouvetakis J, D'Costa V, Menendez J, Chen ZD, Zollner S. Versatile buffer layer architectures based on Ge 1- x Sn x alloys Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1922078  0.604
2004 Aella P, Cook C, Tolle J, Zollner S, Chizmeshya AVG, Kouvetakis J. Optical and structural properties of Si xSn yGe 1-x-y alloys Applied Physics Letters. 84: 888-890. DOI: 10.1063/1.1645324  0.647
2004 Cook CS, Zollner S, Bauer MR, Aella P, Kouvetakis J, Menendez J. Optical constants and interband transitions of Ge1-xSn x alloys (x<0.2) grown on Si by UHV-CVD Thin Solid Films. 455: 217-221. DOI: 10.1016/J.Tsf.2003.11.277  0.645
2004 Zollner S, Liu R, Volinsky AA, White T, Nguyen BY, Cook CS. Gate oxide metrology and silicon piezooptics Thin Solid Films. 455: 261-265. DOI: 10.1016/J.Tsf.2003.11.276  0.31
2004 Cook CS, Daly T, Liu R, Canonico M, Xie Q, Gregory RB, Zollner S. Spectroscopic ellipsometry for in-line monitoring of silicon nitrides Thin Solid Films. 455: 794-797. DOI: 10.1016/J.Tsf.2003.11.265  0.353
2003 Xie Q, Liu R, Wang X, Canonico M, Duda E, Lu S, Cook C, Volinsky AA, Zollner S, Thomas SG, White T, Barr A, Sadaka M, Nguyen B. Characterization Techniques for Evaluating Strained Si CMOS Materials Characterization and Metrology For Ulsi Technology. 683: 223-227. DOI: 10.1063/1.1622475  0.412
2003 Bauer MR, Cook CS, Aella P, Tolle J, Kouvetakis J, Crozier PA, Chizmeshya AVG, Smith DJ, Zollner S. SnGe superstructure materials for Si-based infrared optoelectronics Applied Physics Letters. 83: 3489-3491. DOI: 10.1063/1.1622435  0.636
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