Candi S. Cook, Ph.D.
Affiliations: | 2006 | Arizona State University, Tempe, AZ, United States |
Area:
Materials Science Engineering, Condensed Matter PhysicsGoogle:
"Candi Cook"Mean distance: (not calculated yet)
Parents
Sign in to add mentorJohn Kouvetakis | grad student | 2006 | Arizona State | |
(Growth and optical properties of novel doped and undoped group IV materials based on silicon, germanium, and tin.) |
BETA: Related publications
See more...
Publications
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
D'Costa VR, Cook CS, Birdwell AG, et al. (2006) Optical critical points of thin-film Ge1-y Sny alloys: A comparative Ge1-y Sny Ge1-x six study Physical Review B - Condensed Matter and Materials Physics. 73 |
Chizmeshya AVG, Ritter C, Tolle J, et al. (2006) Fundamental Studies of P(GeH3)3, As(GeH 3)3, and Sb(GeH3)3: Practical n-Dopants for New Group IV Semiconductors Chemistry of Materials. 18: 6266-6277 |
D'Costa VR, Cook CS, Menéndez J, et al. (2006) Transferability of optical bowing parameters between binary and ternary group-IV alloys Solid State Communications. 138: 309-313 |
Cook CS, D'Costa V, Kouvetakis J, et al. (2005) Compositional dependence of critical point transitions in Ge 1-xSn x alloys Aip Conference Proceedings. 772: 65-66 |
Roucka R, Tolle J, Cook C, et al. (2005) Versatile buffer layer architectures based on Ge 1- x Sn x alloys Applied Physics Letters. 86: 1-3 |
Aella P, Cook C, Tolle J, et al. (2004) Optical and structural properties of Si xSn yGe 1-x-y alloys Applied Physics Letters. 84: 888-890 |
Cook CS, Zollner S, Bauer MR, et al. (2004) Optical constants and interband transitions of Ge1-xSn x alloys (x<0.2) grown on Si by UHV-CVD Thin Solid Films. 455: 217-221 |
Zollner S, Liu R, Volinsky AA, et al. (2004) Gate oxide metrology and silicon piezooptics Thin Solid Films. 455: 261-265 |
Cook CS, Daly T, Liu R, et al. (2004) Spectroscopic ellipsometry for in-line monitoring of silicon nitrides Thin Solid Films. 455: 794-797 |
Xie Q, Liu R, Wang X, et al. (2003) Characterization Techniques for Evaluating Strained Si CMOS Materials Characterization and Metrology For Ulsi Technology. 683: 223-227 |