Mark C. Strus - Publications
Affiliations: | 2009-2011 | Materials Reliability Division | National Institute of Standards and Technology, Gaithersburg, MD, United States |
Year | Citation | Score | |||
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2011 | Strus MC, Chiaramonti AN, Kim YL, Jung YJ, Keller RR. Accelerated reliability testing of highly aligned single-walled carbon nanotube networks subjected to DC electrical stressing. Nanotechnology. 22: 265713. PMID 21586818 DOI: 10.1088/0957-4484/22/26/265713 | 0.337 | |||
2011 | Strus MC, Cano CI, Byron Pipes R, Nguyen CV, Raman A. Corrigendum to "Interfacial energy between carbon nanotubes and polymers measured from nanoscale peel tests in the atomic force microscope" [Compos Sci Technol 69 (10) (2009) 1580-1586] Composites Science and Technology. 71: 1180. DOI: 10.1016/J.Compscitech.2010.12.002 | 0.324 | |||
2009 | Strus MC, Lahiji RR, Ares P, López V, Raman A, Reifenberger R. Strain energy and lateral friction force distributions of carbon nanotubes manipulated into shapes by atomic force microscopy. Nanotechnology. 20: 385709. PMID 19713587 DOI: 10.1088/0957-4484/20/38/385709 | 0.459 | |||
2009 | Strus MC, Raman A. Identification of multiple oscillation states of carbon nanotube tipped cantilevers interacting with surfaces in dynamic atomic force microscopy Physical Review B. 80. DOI: 10.1103/Physrevb.80.224105 | 0.396 | |||
2009 | Strus MC, Cano CI, Byron Pipes R, Nguyen CV, Raman A. Interfacial energy between carbon nanotubes and polymers measured from nanoscale peel tests in the atomic force microscope Composites Science and Technology. 69: 1580-1586. DOI: 10.1016/J.Compscitech.2009.02.026 | 0.457 | |||
2005 | Strus MC, Raman A, Han CS, Nguyen CV. Imaging artefacts in atomic force microscopy with carbon nanotube tips Nanotechnology. 16: 2482-2492. DOI: 10.1088/0957-4484/16/11/003 | 0.478 | |||
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