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Benjamin P. Shieh, Ph.D. - Publications

Affiliations: 
2002 Stanford University, Palo Alto, CA 
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3 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2002 Shieh BP, Deal MD, Saraswat KC, Choudhury R, Park CW, Sukharev V, Loh W, Wright P. Electromigration reliability of low capacitance air-gap interconnect structures Proceedings of the Ieee 2002 International Interconnect Technology Conference, Iitc 2002. 203-205. DOI: 10.1109/IITC.2002.1014934  0.396
2001 Sukharev V, Shieh BP, Choudhury R, Park C, Saraswat KC. Reliability studies on multilevel interconnection with intermetal dielectric air gaps Microelectronics Reliability. 41: 1631-1635. DOI: 10.1016/S0026-2714(01)00153-6  0.397
1997 Bassman LC, Vinci RP, Shieh BP, Kim DK, McVittie JP, Saraswat KC, Deal MD. Simulation of the effect of dielectric air gaps on interconnect reliability Materials Research Society Symposium - Proceedings. 473: 323-328.  0.596
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