Year |
Citation |
Score |
2015 |
Han E, Younkin TR, Chandhok M, Myers AM, Tronic TA, Gstrein F, Elineni KK, Gaikwad A, Nyhus PA, Setu PK, Wallace CH. Material readiness for generation 2 directed self-assembly (DSA) < 24nm pitch Proceedings of Spie - the International Society For Optical Engineering. 9425. DOI: 10.1117/12.2086094 |
0.43 |
|
2015 |
Choi JW, Kim M, Safron NS, Han E, Arnold MS, Gopalan P. A facile route for fabricating graphene nanoribbon array transistors using graphoepitaxy of a symmetric block copolymer Proceedings of Spie - the International Society For Optical Engineering. 9428. DOI: 10.1117/12.2085836 |
0.597 |
|
2013 |
Sweat DP, Kim M, Yu X, Schmitt SK, Han E, Choi JW, Gopalan P. A dual functional layer for block copolymer self-assembly and the growth of nanopatterned polymer brushes. Langmuir : the Acs Journal of Surfaces and Colloids. 29: 12858-65. PMID 24053350 DOI: 10.1021/La403474K |
0.77 |
|
2013 |
Kim M, Han E, Sweat DP, Gopalan P. Interplay of surface chemical composition and film thickness on graphoepitaxial assembly of asymmetric block copolymers Soft Matter. 9: 6135-6141. DOI: 10.1039/C3Sm50307K |
0.757 |
|
2013 |
Widin JM, Kim M, Schmitt AK, Han E, Gopalan P, Mahanthappa MK. Bulk and thin film morphological behavior of broad dispersity poly(styrene-b-methyl methacrylate) diblock copolymers Macromolecules. 46: 4472-4480. DOI: 10.1021/Ma4004538 |
0.669 |
|
2013 |
Liu CC, Ramírez-Hernández A, Han E, Craig GSW, Tada Y, Yoshida H, Kang H, Ji S, Gopalan P, De Pablo JJ, Nealey PF. Chemical patterns for directed self-assembly of lamellae-forming block copolymers with density multiplication of features Macromolecules. 46: 1415-1424. DOI: 10.1021/Ma302464N |
0.664 |
|
2012 |
Kim M, Safron NS, Han E, Arnold MS, Gopalan P. Electronic transport and Raman scattering in size-controlled nanoperforated graphene. Acs Nano. 6: 9846-54. PMID 23113838 DOI: 10.1021/Nn3033985 |
0.572 |
|
2012 |
Han E, Kim M, Gopalan P. Chemical patterns from surface grafted resists for directed assembly of block copolymers. Acs Nano. 6: 1823-9. PMID 22243029 DOI: 10.1021/Nn204995Z |
0.668 |
|
2012 |
Kang H, Craig GSW, Han E, Gopalan P, Nealey PF. Degree of perfection and pattern uniformity in the directed assembly of cylinder-forming block copolymer on chemically patterned surfaces Macromolecules. 45: 159-164. DOI: 10.1021/Ma202249N |
0.667 |
|
2011 |
Liu CC, Han E, Onses MS, Thode CJ, Ji S, Gopalan P, Nealey PF. Fabrication of lithographically defined chemically patterned polymer brushes and mats Macromolecules. 44: 1876-1885. DOI: 10.1021/Ma102856T |
0.631 |
|
2010 |
Han E, Leolukman M, Kim M, Gopalan P. Resist free patterning of nonpreferential buffer layers for block copolymer lithography. Acs Nano. 4: 6527-34. PMID 20958012 DOI: 10.1021/Nn101616D |
0.761 |
|
2010 |
Han E, Kang H, Liu CC, Nealey PF, Gopalan P. Graphoepitaxial assembly of symmetric block copolymers on weakly preferential substrates. Advanced Materials (Deerfield Beach, Fla.). 22: 4325-9. PMID 20806266 DOI: 10.1002/Adma.201001669 |
0.65 |
|
2010 |
Kim M, Safron NS, Han E, Arnold MS, Gopalan P. Fabrication and characterization of large-area, semiconducting nanoperforated graphene materials. Nano Letters. 10: 1125-31. PMID 20192229 DOI: 10.1021/Nl9032318 |
0.552 |
|
2010 |
Han E, Gopalan P. Cross-linked random copolymer mats as ultrathin nonpreferential layers for block copolymer self-assembly. Langmuir : the Acs Journal of Surfaces and Colloids. 26: 1311-5. PMID 19791776 DOI: 10.1021/La902483M |
0.592 |
|
2010 |
Liu CC, Nealey PF, Raub AK, Hakeem PJ, Brueck SRJ, Han E, Gopalan P. Integration of block copolymer directed assembly with 193 immersion lithography Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 28: C6B30-C6B34. DOI: 10.1116/1.3501348 |
0.631 |
|
2009 |
Hirai T, Leolukman M, Liu CC, Han E, Kim YJ, Ishida Y, Hayakawa T, Kakimoto MA, Nealey PF, Gopalan P. One-Step Direct-Patterning Template Utilizing Self-Assembly of POSS-Containing Block Copolymers. Advanced Materials (Deerfield Beach, Fla.). 21: 4334-8. PMID 26042939 DOI: 10.1002/Adma.200900518 |
0.761 |
|
2009 |
Han E, Stuen KO, Leolukman M, Liu CC, Nealey PF, Gopalan P. Perpendicular orientation of domains in cylinder-forming block copolymer thick films by controlled interfacial interactions Macromolecules. 42: 4896-4901. DOI: 10.1021/Ma9002903 |
0.766 |
|
2008 |
Han E, Stuen KO, La YH, Nealey PF, Gopalan P. Effect of composition of substrate-modifying random copolymers on the orientation of symmetric and asymmetric diblock copolymer domains Macromolecules. 41: 9090-9097. DOI: 10.1021/Ma8018393 |
0.69 |
|
2007 |
Stuen KO, In I, Han E, Streifer JA, Hamers RJ, Nealey PF, Gopalan P. Imaging layers for the directed assembly of block copolymer films: Dependence of the physical and chemical properties of patterned polymer brushes on brush molecular weight Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 25: 1958-1962. DOI: 10.1116/1.2799970 |
0.657 |
|
2007 |
Han E, In I, Park SM, La YH, Wang Y, Nealey PF, Gopalan P. Photopatternable imaging layers for controlling block copolymer microdomain orientation Advanced Materials. 19: 4448-4452. DOI: 10.1002/adma.200602708 |
0.511 |
|
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