Year |
Citation |
Score |
2005 |
Brewer RT, Boyd DA, El-Naggar MY, Boland SW, Park YB, Haile SM, Goodwin DG, Atwater HA. Growth of biaxially textured Ba xPb 1-xTiO 3 ferroelectric thin films on amorphous Si 3N 4 Proceedings - Electrochemical Society. 167-180. DOI: 10.1063/1.1806994 |
0.72 |
|
2005 |
Wielunski LS, Chabal Y, Paunescu M, Ho MT, Brewer R, Reyes JE. Ion backscattering study of ultra-thin oxides: Al2O3 and AlHfOx films on Si Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 241: 377-381. DOI: 10.1016/J.Nimb.2005.07.045 |
0.369 |
|
2004 |
Edge LF, Schlom DG, Brewer RT, Chabal YJ, Williams JR, Chambers SA, Hinkle C, Lucovsky G, Yang Y, Stemmer S, Copel M, Holländer B, Schubert J. Suppression of subcutaneous oxidation during the deposition of amorphous lanthanum aluminate on silicon Applied Physics Letters. 84: 4629-4631. DOI: 10.1063/1.1759065 |
0.588 |
|
2003 |
Brewer RT, Atwater HA, Groves JR, Arendt PN. Reflection high-energy electron diffraction experimental analysis of polycrystalline MgO films with grain size and orientation distributions Journal of Applied Physics. 93: 205-210. DOI: 10.1063/1.1526156 |
0.743 |
|
2002 |
Hartman JW, Brewer RT, Atwater HA. Reflection high-energy electron diffraction analysis of polycrystalline films with grain size and orientation distributions Journal of Applied Physics. 92: 5133-5139. DOI: 10.1063/1.1510954 |
0.686 |
|
2002 |
Brewer RT, Atwater HA. Rapid biaxial texture development during nucleation of MgO thin films during ion beam-assisted deposition Applied Physics Letters. 80: 3388-3390. DOI: 10.1063/1.1476385 |
0.739 |
|
2001 |
Brewer RT, Arendt PN, Groves JR, Atwater HA. In situ biaxial texture analysis of MgO films during growth on amorphous substrates by ion beam-assisted deposition Proceedings of Spie - the International Society For Optical Engineering. 4468: 124-130. DOI: 10.1117/12.452547 |
0.737 |
|
2001 |
Brewer RT, Hartman JW, Groves JR, Arendt PN, Yashar PC, Atwater HA. Rheed in-plane rocking curve analysis of biaxially-textured polycrystalline MgO films on amorphous substrates grown by ion beam-assisted deposition Applied Surface Science. 175: 691-696. DOI: 10.1016/S0169-4332(01)00106-4 |
0.736 |
|
2000 |
Brewer RT, Hartman JW, Atwater HA. Quantitative RHEED analysis of biaxially-textured polycrystalline MgO films on amorphous substrates grown by ion beam-assisted deposition Materials Research Society Symposium - Proceedings. 585: 75-81. |
0.719 |
|
1999 |
Brewer RT, Hartman JW, Atwater HA. Quantitative Rheed Analysis of Biaxially-Textured Polycrystalline MgO Films on Amorphous Substrates Grown by Ion Beam-Assisted Deposition Mrs Proceedings. 585. DOI: 10.1557/Proc-585-75 |
0.757 |
|
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