Year |
Citation |
Score |
2020 |
Salmani-Rezaie S, Ahadi K, Strickland WM, Stemmer S. Order-Disorder Ferroelectric Transition of Strained SrTiO_{3}. Physical Review Letters. 125: 087601. PMID 32909797 DOI: 10.1103/Physrevlett.125.087601 |
0.376 |
|
2020 |
Salmani-Rezaie S, Ahadi K, Stemmer S. Polar Nanodomains in a Ferroelectric Superconductor. Nano Letters. PMID 32786945 DOI: 10.1021/Acs.Nanolett.0C02285 |
0.355 |
|
2020 |
Cheng B, Kanda N, Ikeda TN, Matsuda T, Xia P, Schumann T, Stemmer S, Itatani J, Armitage NP, Matsunaga R. Efficient Terahertz Harmonic Generation with Coherent Acceleration of Electrons in the Dirac Semimetal Cd_{3}As_{2}. Physical Review Letters. 124: 117402. PMID 32242712 DOI: 10.1103/Physrevlett.124.117402 |
0.393 |
|
2020 |
Wu W, Combs NG, Mates TE, Stemmer S. Carbon impurity concentrations in BaSnO3 films grown by molecular beam epitaxy using a tin oxide source Journal of Vacuum Science & Technology A. 38: 043405. DOI: 10.1116/6.0000122 |
0.361 |
|
2020 |
Cheng J, Yang H, Wang C, Combs N, Freeze C, Shoron O, Wu W, Kalarickal NK, Chandrasekar H, Stemmer S, Rajan S, Lu W. Nanoscale etching of perovskite oxides for field effect transistor applications Journal of Vacuum Science & Technology B. 38: 12201. DOI: 10.1116/1.5122667 |
0.313 |
|
2020 |
Cheng J, Wang C, Freeze C, Shoron O, Combs N, Yang H, Kalarickal NK, Xia Z, Stemmer S, Rajan S, Lu W. High-Current Perovskite Oxide BaTiO 3 /BaSnO 3 Heterostructure Field Effect Transistors Ieee Electron Device Letters. 41: 621-624. DOI: 10.1109/Led.2020.2976456 |
0.351 |
|
2020 |
Kealhofer DA, Galletti L, Schumann T, Suslov A, Stemmer S. Topological Insulator State and Collapse of the Quantum Hall Effect in a Three-Dimensional Dirac Semimetal Heterojunction Physical Review X. 10: 11050. DOI: 10.1103/Physrevx.10.011050 |
0.326 |
|
2020 |
Porter Z, Need RF, Ahadi K, Zhao Y, Xu Z, Kirby BJ, Lynn JW, Stemmer S, Wilson SD. Correlating magnetic structure and magnetotransport in semimetal thin films of Eu 1 − x Sm x TiO 3 Physical Review Materials. 4: 54411. DOI: 10.1103/Physrevmaterials.4.054411 |
0.381 |
|
2020 |
Schumann T, Galletti L, Jeong H, Ahadi K, Strickland WM, Salmani-Rezaie S, Stemmer S. Possible signatures of mixed-parity superconductivity in doped polar SrTiO3 films Physical Review B. 101: 100503. DOI: 10.1103/Physrevb.101.100503 |
0.348 |
|
2020 |
Goyal M, Salmani-Rezaie S, Pardue TN, Guo B, Kealhofer DA, Stemmer S. Carrier mobilities of (001) cadmium arsenide films Apl Materials. 8: 51106. DOI: 10.1063/5.0002771 |
0.459 |
|
2020 |
Pardue T, Goyal M, Kim H, Stemmer S. Relating Crystal Symmetry to Topological Phases: Convergent Beam Electron Diffraction Studies of the Dirac Semimetal Cd3As2 Microscopy and Microanalysis. 1-4. DOI: 10.1017/S1431927620023600 |
0.302 |
|
2020 |
Chorsi HT, Yue S, Iyer PP, Goyal M, Schumann T, Stemmer S, Liao B, Schuller JA. Widely Tunable Optical and Thermal Properties of Dirac Semimetal Cd3As2 Advanced Optical Materials. 8: 1901192. DOI: 10.1002/Adom.201901192 |
0.33 |
|
2019 |
Mori R, Marshall PB, Ahadi K, Denlinger JD, Stemmer S, Lanzara A. Controlling a Van Hove singularity and Fermi surface topology at a complex oxide heterostructure interface. Nature Communications. 10: 5534. PMID 31797932 DOI: 10.1038/S41467-019-13046-Z |
0.403 |
|
2019 |
Ahadi K, Galletti L, Li Y, Salmani-Rezaie S, Wu W, Stemmer S. Enhancing superconductivity in SrTiO films with strain. Science Advances. 5: eaaw0120. PMID 31032417 DOI: 10.1126/Sciadv.Aaw0120 |
0.416 |
|
2019 |
Xia Z, Wang C, Kalarickal NK, Stemmer S, Rajan S. Design of Transistors Using High-Permittivity Materials Ieee Transactions On Electron Devices. 66: 896-900. DOI: 10.1109/Ted.2018.2888834 |
0.302 |
|
2019 |
Yue S, Chorsi HT, Goyal M, Schumann T, Yang R, Xu T, Deng B, Stemmer S, Schuller JA, Liao B. Soft phonons and ultralow lattice thermal conductivity in the Dirac semimetal Cd3As2 Arxiv: Materials Science. 1. DOI: 10.1103/Physrevresearch.1.033101 |
0.342 |
|
2019 |
Salmani-Rezaie S, Kim H, Ahadi K, Stemmer S. Lattice relaxations around individual dopant atoms in SrTiO3 Physical Review Materials. 3: 114404. DOI: 10.1103/Physrevmaterials.3.114404 |
0.397 |
|
2019 |
Russell R, Ratcliff N, Ahadi K, Dong L, Stemmer S, Harter JW. Ferroelectric enhancement of superconductivity in compressively strained
SrTiO3
films Physical Review Materials. 3. DOI: 10.1103/Physrevmaterials.3.091401 |
0.401 |
|
2019 |
Kim H, Goyal M, Salmani-Rezaie S, Schumann T, Pardue TN, Zuo JM, Stemmer S. Point group symmetry of cadmium arsenide thin films determined by convergent beam electron diffraction Physical Review Materials. 3: 84202. DOI: 10.1103/Physrevmaterials.3.084202 |
0.339 |
|
2019 |
Goyal M, Kim H, Schumann T, Galletti L, Burkov AA, Stemmer S. Surface states of strained thin films of the Dirac semimetal Cd3As2 Physical Review Materials. 3: 64204. DOI: 10.1103/Physrevmaterials.3.064204 |
0.318 |
|
2019 |
Ahadi K, Lu X, Salmani-Rezaie S, Marshall PB, Rondinelli JM, Stemmer S. Anisotropic magnetoresistance in the itinerant antiferromagnetic
EuTiO3 Physical Review B. 99. DOI: 10.1103/Physrevb.99.041106 |
0.31 |
|
2019 |
Shoron OF, Schumann T, Goyal M, Kealhofer DA, Stemmer S. Field-effect transistors with the three-dimensional Dirac semimetal cadmium arsenide Applied Physics Letters. 115: 62101. DOI: 10.1063/1.5103268 |
0.325 |
|
2019 |
Chandrasekar H, Cheng J, Wang T, Xia Z, Combs NG, Freeze CR, Marshall PB, McGlone J, Arehart A, Ringel S, Janotti A, Stemmer S, Lu W, Rajan S. Velocity saturation in La-doped BaSnO3 thin films Applied Physics Letters. 115: 92102. DOI: 10.1063/1.5097791 |
0.408 |
|
2018 |
Stemmer S, Allen SJ. Non-Fermi liquids in oxide heterostructures. Reports On Progress in Physics. Physical Society (Great Britain). PMID 29651990 DOI: 10.1088/1361-6633/Aabdfa |
0.378 |
|
2018 |
Schumann T, Galletti L, Kealhofer DA, Kim H, Goyal M, Stemmer S. Observation of the Quantum Hall Effect in Confined Films of the Three-Dimensional Dirac Semimetal Cd_{3}As_{2}. Physical Review Letters. 120: 016801. PMID 29350963 DOI: 10.1103/Physrevlett.120.016801 |
0.376 |
|
2018 |
Need RF, Marshall PB, Weschke E, Grutter AJ, Gilbert DA, Arenholz E, Shafer P, Stemmer S, Wilson SD. Resolving interfacial charge transfer in titanate superlattices using resonant x-ray reflectometry Physical Review Materials. 2. DOI: 10.1103/Physrevmaterials.2.093801 |
0.391 |
|
2018 |
Marshall PB, Ahadi K, Kim H, Stemmer S. Electron nematic fluid in a strained Sr3Ru2O7 film Physical Review B. 97: 155160. DOI: 10.1103/Physrevb.97.155160 |
0.385 |
|
2018 |
Galletti L, Schumann T, Shoron OF, Goyal M, Kealhofer DA, Kim H, Stemmer S. Two-dimensional Dirac fermions in thin films of Cd3As2 Physical Review B. 97: 115132. DOI: 10.1103/Physrevb.97.115132 |
0.313 |
|
2018 |
Ahadi K, Gui Z, Porter Z, Lynn JW, Xu ZN, Wilson SD, Janotti A, Stemmer S. Carrier density control of magnetism and Berry phases in doped EuTiO3 Apl Materials. 6: 56105. DOI: 10.1063/1.5025317 |
0.358 |
|
2018 |
Ahadi K, Kim H, Stemmer S. Spontaneous Hall effects in the electron system at the SmTiO3/EuTiO3 interface Apl Materials. 6: 56102. DOI: 10.1063/1.5025169 |
0.361 |
|
2018 |
Goyal M, Galletti L, Salmani-Rezaie S, Schumann T, Kealhofer DA, Stemmer S. Thickness dependence of the quantum Hall effect in films of the three-dimensional Dirac semimetal Cd3As2 Apl Materials. 6: 26105. DOI: 10.1063/1.5016866 |
0.415 |
|
2018 |
Need RF, Isaac BJ, Kirby BJ, Borchers JA, Stemmer S, Wilson SD. Octahedral tilt independent magnetism in confined GdTiO3 films Applied Physics Letters. 112: 132407. DOI: 10.1063/1.5016174 |
0.395 |
|
2017 |
Kim H, Marshall PB, Ahadi K, Mates TE, Mikheev E, Stemmer S. Response of the Lattice across the Filling-Controlled Mott Metal-Insulator Transition of a Rare Earth Titanate. Physical Review Letters. 119: 186803. PMID 29219551 DOI: 10.1103/Physrevlett.119.186803 |
0.36 |
|
2017 |
Marshall PB, Kim H, Stemmer S. Disorder versus two transport lifetimes in a strongly correlated electron liquid. Scientific Reports. 7: 10312. PMID 28871210 DOI: 10.1038/S41598-017-10841-W |
0.336 |
|
2017 |
Ahadi K, Stemmer S. Novel Metal-Insulator Transition at the SmTiO_{3}/SrTiO_{3} Interface. Physical Review Letters. 118: 236803. PMID 28644662 DOI: 10.1103/Physrevlett.118.236803 |
0.373 |
|
2017 |
Hardy WJ, Isaac B, Marshall P, Mikheev E, Zhou P, Stemmer S, Natelson D. Potential Fluctuations at Low Temperatures in Mesoscopic-Scale SmTiO3/SrTiO3/SmTiO3 Quantum Well Structures. Acs Nano. PMID 28350436 DOI: 10.1021/Acsnano.6B08427 |
0.386 |
|
2017 |
Schumann T, Goyal M, Kealhofer DA, Stemmer S. Negative magnetoresistance due to conductivity fluctuations in films of the topological semimetal C d 3 A s 2 Physical Review B. 95: 241113. DOI: 10.1103/Physrevb.95.241113 |
0.436 |
|
2017 |
Meyers CJG, Freeze CR, Stemmer S, York RA. Effect of BST film thickness on the performance of tunable interdigital capacitors grown by MBE Applied Physics Letters. 111: 262903. DOI: 10.1063/1.5004566 |
0.395 |
|
2017 |
Marshall PB, Kim H, Ahadi K, Stemmer S. Growth of strontium ruthenate films by hybrid molecular beam epitaxy Apl Materials. 5: 96101. DOI: 10.1063/1.4998772 |
0.465 |
|
2017 |
Ahadi K, Galletti L, Stemmer S. Evidence of a topological Hall effect in Eu1−xSmxTiO3 Applied Physics Letters. 111: 172403. DOI: 10.1063/1.4997498 |
0.406 |
|
2017 |
Shoron OF, Raghavan S, Freeze CR, Stemmer S. BaTiO3/SrTiO3 heterostructures for ferroelectric field effect transistors Applied Physics Letters. 110: 232902. DOI: 10.1063/1.4985014 |
0.419 |
|
2017 |
Ahadi K, Shoron OF, Marshall PB, Mikheev E, Stemmer S. Electric field effect near the metal-insulator transition of a two-dimensional electron system in SrTiO3 Applied Physics Letters. 110: 62104. DOI: 10.1063/1.4975806 |
0.381 |
|
2017 |
Kim H, Raghavan S, Shoron O, Stemmer S. Probing Disorder in MBE-grown Oxide Films Using Quantitative STEM Microscopy and Microanalysis. 23: 1578-1579. DOI: 10.1017/S1431927617008558 |
0.349 |
|
2016 |
Marshall PB, Mikheev E, Raghavan S, Stemmer S. Pseudogaps and Emergence of Coherence in Two-Dimensional Electron Liquids in SrTiO_{3}. Physical Review Letters. 117: 046402. PMID 27494486 DOI: 10.1103/Physrevlett.117.046402 |
0.321 |
|
2016 |
Raghavan S, Zhang JY, Shoron OF, Stemmer S. Probing the Metal-Insulator Transition in BaTiO_{3} by Electrostatic Doping. Physical Review Letters. 117: 037602. PMID 27472141 DOI: 10.1103/Physrevlett.117.037602 |
0.394 |
|
2016 |
Need RF, Isaac BJ, Kirby BJ, Borchers JA, Stemmer S, Wilson SD. Interface-Driven Ferromagnetism within the Quantum Wells of a Rare Earth Titanate Superlattice. Physical Review Letters. 117: 037205. PMID 27472135 DOI: 10.1103/Physrevlett.117.037205 |
0.332 |
|
2016 |
Zhang JY, Kim H, Mikheev E, Hauser AJ, Stemmer S. Key role of lattice symmetry in the metal-insulator transition of NdNiO3 films. Scientific Reports. 6: 23652. PMID 27033955 DOI: 10.1038/Srep23652 |
0.414 |
|
2016 |
Mikheev E, Raghavan S, Zhang JY, Marshall PB, Kajdos AP, Balents L, Stemmer S. Carrier density independent scattering rate in SrTiO3-based electron liquids. Scientific Reports. 6: 20865. PMID 26861764 DOI: 10.1038/Srep20865 |
0.306 |
|
2016 |
Bjaalie L, Azcatl A, McDonnell S, Freeze CR, Stemmer S, Wallace RM, Walle CGVd. Band alignments between SmTiO3, GdTiO3, and SrTiO3 Journal of Vacuum Science and Technology. 34: 61102. DOI: 10.1116/1.4963833 |
0.329 |
|
2016 |
Schumann T, Raghavan S, Ahadi K, Kim H, Stemmer S. Structure and optical band gaps of (Ba,Sr)SnO3 films grown by molecular beam epitaxy Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 34. DOI: 10.1116/1.4959004 |
0.414 |
|
2016 |
Kim H, Zhang JY, Raghavan S, Stemmer S. Direct Observation of Sr Vacancies in SrTiO 3 by Quantitative Scanning Transmission Electron Microscopy Physical Review X. 6: 41063. DOI: 10.1103/Physrevx.6.041063 |
0.356 |
|
2016 |
Nemšák S, Conti G, Gray AX, Palsson GK, Conlon C, Eiteneer D, Keqi A, Rattanachata A, Saw AY, Bostwick A, Moreschini L, Rotenberg E, Strocov VN, Kobayashi M, Schmitt T, ... ... Stemmer S, et al. Energetic, spatial, and momentum character of the electronic structure at a buried interface: The two-dimensional electron gas between two metal oxides Physical Review B - Condensed Matter and Materials Physics. 93. DOI: 10.1103/Physrevb.93.245103 |
0.788 |
|
2016 |
Schumann T, Goyal M, Kim H, Stemmer S. Molecular beam epitaxy of Cd3As2 on a III-V substrate Apl Materials. 4: 126110. DOI: 10.1063/1.4972999 |
0.429 |
|
2016 |
Freeze CR, Stemmer S. Role of film stoichiometry and interface quality in the performance of (Ba,Sr)TiO3 tunable capacitors with high figures of merit Applied Physics Letters. 109: 192904. DOI: 10.1063/1.4967374 |
0.41 |
|
2016 |
Meyers CJG, Freeze CR, Stemmer S, York RA. (Ba,Sr)TiO3 tunable capacitors with RF commutation quality factors exceeding 6000 Applied Physics Letters. 109. DOI: 10.1063/1.4961626 |
0.339 |
|
2016 |
James Allen S, Raghavan S, Schumann T, Law KM, Stemmer S. Conduction band edge effective mass of La-doped BaSnO3 Applied Physics Letters. 108. DOI: 10.1063/1.4954671 |
0.374 |
|
2016 |
Verma A, Nomoto K, Hwang WS, Raghavan S, Stemmer S, Jena D. Large electron concentration modulation using capacitance enhancement in SrTiO3/SmTiO3 Fin-field effect transistors Applied Physics Letters. 108. DOI: 10.1063/1.4948770 |
0.44 |
|
2016 |
Raghavan S, Schumann T, Kim H, Zhang JY, Cain TA, Stemmer S. High-mobility BaSnO3 grown by oxide molecular beam epitaxy Apl Materials. 4. DOI: 10.1063/1.4939657 |
0.455 |
|
2016 |
Eiteneer D, Pálsson GK, Nemšák S, Gray AX, Kaiser AM, Son J, LeBeau J, Conti G, Greer AA, Keqi A, Rattanachata A, Saw AY, Bostwick A, Rotenberg E, Gullikson EM, ... ... Stemmer S, et al. Depth-Resolved Composition and Electronic Structure of Buried Layers and Interfaces in a LaNiO3/SrTiO3 Superlattice from Soft- and Hard- X-ray Standing-Wave Angle-Resolved Photoemission Journal of Electron Spectroscopy and Related Phenomena. 211: 70-81. DOI: 10.1016/J.Elspec.2016.04.008 |
0.707 |
|
2015 |
Mikheev E, Hauser AJ, Himmetoglu B, Moreno NE, Janotti A, Van de Walle CG, Stemmer S. Tuning bad metal and non-Fermi liquid behavior in a Mott material: Rare-earth nickelate thin films. Science Advances. 1: e1500797. PMID 26601140 DOI: 10.1126/Sciadv.1500797 |
0.331 |
|
2015 |
Lee D, Lu H, Gu Y, Choi SY, Li SD, Ryu S, Paudel TR, Song K, Mikheev E, Lee S, Stemmer S, Tenne DA, Oh SH, Tsymbal EY, Wu X, et al. Emergence of room-temperature ferroelectricity at reduced dimensions. Science (New York, N.Y.). 349: 1314-1317. PMID 26383947 DOI: 10.1126/Science.Aaa6442 |
0.368 |
|
2015 |
Zhang JY, Hwang J, Isaac BJ, Stemmer S. Variable-angle high-angle annular dark-field imaging: application to three-dimensional dopant atom profiling. Scientific Reports. 5: 12419. PMID 26206489 DOI: 10.1038/Srep12419 |
0.333 |
|
2015 |
Mikheev E, Hwang J, Kajdos AP, Hauser AJ, Stemmer S. Tailoring resistive switching in Pt/SrTiO3 junctions by stoichiometry control. Scientific Reports. 5: 11079. PMID 26056783 DOI: 10.1038/Srep11079 |
0.304 |
|
2015 |
Son J, Chobpattana V, McSkimming BM, Stemmer S. In-situ nitrogen plasma passivation of Al2O3/GaN interface states Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 33. DOI: 10.1116/1.4905846 |
0.566 |
|
2015 |
Mikheev E, Freeze CR, Isaac BJ, Cain TA, Stemmer S. Separation of transport lifetimes in SrTi O3 -based two-dimensional electron liquids Physical Review B - Condensed Matter and Materials Physics. 91. DOI: 10.1103/Physrevb.91.165125 |
0.312 |
|
2015 |
Nemšák S, Conti G, Palsson GK, Conlon C, Cho S, Rault JE, Avila J, Asensio MC, Jackson CA, Moetakef P, Janotti A, Bjaalie L, Himmetoglu B, Van De Walle CG, Balents L, ... ... Stemmer S, et al. Observation by resonant angle-resolved photoemission of a critical thickness for 2-dimensional electron gas formation in SrTiO3 embedded in GdTiO3 Applied Physics Letters. 107. DOI: 10.1063/1.4936936 |
0.775 |
|
2015 |
Verma A, Raghavan S, Stemmer S, Jena D. Ferroelectric transition in compressively strained SrTiO3 thin films Applied Physics Letters. 107. DOI: 10.1063/1.4935592 |
0.416 |
|
2015 |
Mikheev E, Raghavan S, Stemmer S. Dielectric response of metal/SrTiO3/two-dimensional electron liquid heterostructures Applied Physics Letters. 107. DOI: 10.1063/1.4928751 |
0.396 |
|
2015 |
Bjaalie L, Ouellette DG, Moetakef P, Cain TA, Janotti A, Himmetoglu B, Allen SJ, Stemmer S, Van De Walle CG. Small hole polarons in rare-earth titanates Applied Physics Letters. 106. DOI: 10.1063/1.4922316 |
0.704 |
|
2015 |
Raghavan S, Zhang JY, Stemmer S. Two-dimensional electron liquid at the (111) SmTiO3/SrTiO3 interface Applied Physics Letters. 106. DOI: 10.1063/1.4916963 |
0.421 |
|
2015 |
Bubel S, Hauser AJ, Glaudell AM, Mates TE, Stemmer S, Chabinyc ML. The electrochemical impact on electrostatic modulation of the metal-insulator transition in nickelates Applied Physics Letters. 106. DOI: 10.1063/1.4915269 |
0.362 |
|
2015 |
Hauser AJ, Mikheev E, Moreno NE, Hwang J, Zhang JY, Stemmer S. Correlation between stoichiometry, strain, and metal-insulator transitions of NdNiO3 films Applied Physics Letters. 106. DOI: 10.1063/1.4914002 |
0.386 |
|
2015 |
Mikheev E, Himmetoglu B, Kajdos AP, Moetakef P, Cain TA, Van De Walle CG, Stemmer S. Limitations to the room temperature mobility of two- and three-dimensional electron liquids in SrTiO3 Applied Physics Letters. 106. DOI: 10.1063/1.4907888 |
0.721 |
|
2015 |
Allen SJ, Hauser AJ, Mikheev E, Zhang JY, Moreno NE, Son J, Ouellette DG, Kally J, Kozhanov A, Balents L, Stemmer S. Gaps and pseudogaps in perovskite rare earth nickelates Apl Materials. 3. DOI: 10.1063/1.4907771 |
0.556 |
|
2014 |
Jackson CA, Zhang JY, Freeze CR, Stemmer S. Quantum critical behaviour in confined SrTiO3 quantum wells embedded in antiferromagnetic SmTiO3. Nature Communications. 5: 4258. PMID 25005611 DOI: 10.1038/Ncomms5258 |
0.556 |
|
2014 |
Elias DC, Sivananthan A, Zhang C, Keller S, Chiang HW, Law JJM, Thibeault BJ, Mitchell WJ, Lee S, Carter AD, Huang CY, Chobpattana V, Stemmer S, Denbaars SP, Coldren LA, et al. Formation of InGaAs fins by atomic layer epitaxy on InP sidewalls Japanese Journal of Applied Physics. 53. DOI: 10.7567/Jjap.53.065503 |
0.338 |
|
2014 |
Stemmer S, James Allen S. Two-dimensional electron gases at complex oxide interfaces Annual Review of Materials Research. 44: 151-171. DOI: 10.1146/Annurev-Matsci-070813-113552 |
0.378 |
|
2014 |
Verma A, Kajdos AP, Cain TA, Stemmer S, Jena D. Intrinsic mobility limiting mechanisms in lanthanum-doped strontium titanate Physical Review Letters. 112. DOI: 10.1103/Physrevlett.112.216601 |
0.342 |
|
2014 |
Hardy WJ, Ji H, Mikheev E, Stemmer S, Natelson D. Nanostructure investigations of nonlinear differential conductance in NdNiO3 thin films Physical Review B - Condensed Matter and Materials Physics. 90. DOI: 10.1103/Physrevb.90.205117 |
0.361 |
|
2014 |
Zhang JY, Jackson CA, Chen R, Raghavan S, Moetakef P, Balents L, Stemmer S. Correlation between metal-insulator transitions and structural distortions in high-electron-density SrTiO 3 quantum wells Physical Review B - Condensed Matter and Materials Physics. 89. DOI: 10.1103/Physrevb.89.075140 |
0.775 |
|
2014 |
Kajdos AP, Stemmer S. Surface reconstructions in molecular beam epitaxy of SrTiO3 Applied Physics Letters. 105. DOI: 10.1063/1.4901726 |
0.414 |
|
2014 |
Chobpattana V, Mikheev E, Zhang JY, Mates TE, Stemmer S. Extremely scaled high- k /In0.53Ga0.47As gate stacks with low leakage and low interface trap densities Journal of Applied Physics. 116. DOI: 10.1063/1.4896494 |
0.39 |
|
2014 |
Verma A, Raghavan S, Stemmer S, Jena D. Au-gated SrTiO3field-effect transistors with large electron concentration and current modulation Applied Physics Letters. 105. DOI: 10.1063/1.4896275 |
0.43 |
|
2014 |
Thompson J, Hwang J, Nichols J, Connell JG, Stemmer S, Seo SSA. Alleviating polarity-conflict at the heterointerfaces of KTaO3/GdScO3polar complex-oxides Applied Physics Letters. 105. DOI: 10.1063/1.4895392 |
0.323 |
|
2014 |
Chobpattana V, Mates TE, Zhang JY, Stemmer S. Scaled ZrO2 dielectrics for In0.53Ga0.47As gate stacks with low interface trap densities Applied Physics Letters. 104. DOI: 10.1063/1.4875977 |
0.381 |
|
2014 |
Boucherit M, Shoron O, Jackson CA, Cain TA, Buffon MLC, Polchinski C, Stemmer S, Rajan S. Modulation of over 1014 cm−2 electrons in SrTiO3/GdTiO3 heterostructures Applied Physics Letters. 104: 182904. DOI: 10.1063/1.4875796 |
0.601 |
|
2014 |
Hwang J, Zhang JY, D'Alfonso AJ, Allen LJ, Stemmer S. Three-dimensional observation of dopant atoms in quantitative scanning transmission electron microscopy Microscopy and Microanalysis. 20: 52-53. DOI: 10.1017/S1431927614001986 |
0.332 |
|
2013 |
Hwang J, Zhang JY, D'Alfonso AJ, Allen LJ, Stemmer S. Three-dimensional imaging of individual dopant atoms in SrTiO3. Physical Review Letters. 111: 266101. PMID 24483805 DOI: 10.1103/Physrevlett.111.266101 |
0.304 |
|
2013 |
Ouellette DG, Moetakef P, Cain TA, Zhang JY, Stemmer S, Emin D, Allen SJ. High-density two-dimensional small polaron gas in a delta-doped Mott insulator. Scientific Reports. 3: 3284. PMID 24257578 DOI: 10.1038/Srep03284 |
0.748 |
|
2013 |
Zhang JY, Hwang J, Raghavan S, Stemmer S. Symmetry lowering in extreme-electron-density perovskite quantum wells. Physical Review Letters. 110: 256401. PMID 23829748 DOI: 10.1103/Physrevlett.110.256401 |
0.39 |
|
2013 |
Stemmer S, Moetakef P, Cain T, Jackson C, Ouellette D, Williams JR, Goldhaber-Gordon D, Balents L, Allen SJ. Properties of high-density, two-dimensional electron gases at Mott/band insulator interfaces Proceedings of Spie - the International Society For Optical Engineering. 8626. DOI: 10.1117/12.2009086 |
0.791 |
|
2013 |
Moetakef P, Zhang JY, Raghavan S, Kajdos AP, Stemmer S. Growth window and effect of substrate symmetry in hybrid molecular beam epitaxy of a Mott insulating rare earth titanate Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 31. DOI: 10.1116/1.4804180 |
0.745 |
|
2013 |
Jackson CA, Stemmer S. Interface-induced magnetism in perovskite quantum wells Physical Review B - Condensed Matter and Materials Physics. 88. DOI: 10.1103/Physrevb.88.180403 |
0.578 |
|
2013 |
Zhang JY, Jackson CA, Raghavan S, Hwang J, Stemmer S. Magnetism and local structure in low-dimensional Mott insulating GdTiO 3 Physical Review B - Condensed Matter and Materials Physics. 88. DOI: 10.1103/Physrevb.88.121104 |
0.623 |
|
2013 |
Allen SJ, Jalan B, Lee S, Ouellette DG, Khalsa G, Jaroszynski J, Stemmer S, Macdonald AH. Conduction-band edge and Shubnikov-de Haas effect in low-electron-density SrTiO3 Physical Review B - Condensed Matter and Materials Physics. 88. DOI: 10.1103/Physrevb.88.045114 |
0.672 |
|
2013 |
Hwang J, Son J, Zhang JY, Janotti A, Van de Walle CG, Stemmer S. Structural origins of the properties of rare earth nickelate superlattices Physical Review B. 87. DOI: 10.1103/Physrevb.87.060101 |
0.644 |
|
2013 |
Raghavan S, James Allen S, Stemmer S. Subband structure of two-dimensional electron gases in SrTiO3 Applied Physics Letters. 103. DOI: 10.1063/1.4831976 |
0.41 |
|
2013 |
Hauser AJ, Mikheev E, Moreno NE, Cain TA, Hwang J, Zhang JY, Stemmer S. Temperature-dependence of the Hall coefficient of NdNiO3 thin films Applied Physics Letters. 103: 182105. DOI: 10.1063/1.4828557 |
0.36 |
|
2013 |
Chobpattana V, Mates TE, Mitchell WJ, Zhang JY, Stemmer S. Influence of plasma-based in-situ surface cleaning procedures on HfO 2/In0.53Ga0.47As gate stack properties Journal of Applied Physics. 114. DOI: 10.1063/1.4825259 |
0.347 |
|
2013 |
Kajdos AP, Ouellette DG, Cain TA, Stemmer S. Two-dimensional electron gas in a modulation-doped SrTiO3/Sr(Ti, Zr)O3 heterostructure Applied Physics Letters. 103. DOI: 10.1063/1.4819203 |
0.417 |
|
2013 |
Boucherit M, Shoron OF, Cain TA, Jackson CA, Stemmer S, Rajan S. Extreme charge density SrTiO3/GdTiO3 heterostructure field effect transistors Applied Physics Letters. 102. DOI: 10.1063/1.4811273 |
0.584 |
|
2013 |
Cain TA, Kajdos AP, Stemmer S. La-doped SrTiO3 films with large cryogenic thermoelectric power factors Applied Physics Letters. 102. DOI: 10.1063/1.4804182 |
0.392 |
|
2013 |
Conti G, Kaiser AM, Gray AX, Nemšák S, Pálsson GK, Son J, Moetakef P, Janotti A, Bjaalie L, Conlon CS, Eiteneer D, Greer AA, Keqi A, Rattanachata A, Saw AY, ... ... Stemmer S, et al. Band offsets in complex-oxide thin films and heterostructures of SrTiO 3/LaNiO3 and SrTiO3/GdTiO3 by soft and hard X-ray photoelectron spectroscopy Journal of Applied Physics. 113. DOI: 10.1063/1.4795612 |
0.777 |
|
2013 |
Chobpattana V, Son J, Law JJM, Engel-Herbert R, Huang C, Stemmer S. Nitrogen-passivated dielectric/InGaAs interfaces with sub-nm equivalent oxide thickness and low interface trap densities Applied Physics Letters. 102: 22907. DOI: 10.1063/1.4776656 |
0.597 |
|
2013 |
Hwang J, Zhang J, Son J, Mikheev E, Hauser A, Stemmer S. Quantification of Epitaxial Strain and Crystal Structure in Nanoscale Oxide Films Using Position Averaged Convergent Beam Electron Diffraction Microscopy and Microanalysis. 19: 686-687. DOI: 10.1017/S1431927613005424 |
0.398 |
|
2012 |
Moetakef P, Williams JR, Ouellette DG, Kajdos AP, Goldhaber-Gordon D, Allen SJ, Stemmer S. Erratum: Carrier-Controlled Ferromagnetism in SrTiO 3 [Phys. Rev. X 2, 021014 (2012)] Physical Review X. 2: 39901. DOI: 10.1103/Physrevx.2.039901 |
0.683 |
|
2012 |
Moetakef P, Williams JR, Ouellette DG, Kajdos AP, Goldhaber-Gordon D, Allen SJ, Stemmer S. Carrier-controlled ferromagnetism in SrTiO3 Physical Review X. 2. DOI: 10.1103/Physrevx.2.021014 |
0.766 |
|
2012 |
Moetakef P, Jackson CA, Hwang J, Balents L, Allen SJ, Stemmer S. Toward an artificial Mott insulator: Correlations in confined high-density electron liquids in SrTiO 3 Physical Review B - Condensed Matter and Materials Physics. 86. DOI: 10.1103/Physrevb.86.201102 |
0.772 |
|
2012 |
LeBeau JM, Findlay SD, Allen LJ, Stemmer S. Quantitative STEM: Experimental methods and applications Journal of Physics: Conference Series. 371. DOI: 10.1088/1742-6596/371/1/012053 |
0.507 |
|
2012 |
Mikheev E, Kajdos AP, Hauser AJ, Stemmer S. Electric field-tunable BaxSr1-xTiO3 films with high figures of merit grown by molecular beam epitaxy Applied Physics Letters. 101. DOI: 10.1063/1.4773034 |
0.43 |
|
2012 |
Moetakef P, Ouellette DG, Williams JR, James Allen S, Balents L, Goldhaber-Gordon D, Stemmer S. Quantum oscillations from a two-dimensional electron gas at a Mott/band insulator interface Applied Physics Letters. 101. DOI: 10.1063/1.4758989 |
0.731 |
|
2012 |
Cain TA, Moetakef P, Jackson CA, Stemmer S. Modulation doping to control the high-density electron gas at a polar/non-polar oxide interface Applied Physics Letters. 101. DOI: 10.1063/1.4752439 |
0.785 |
|
2012 |
Son J, Chobpattana V, McSkimming BM, Stemmer S. Fixed charge in high-k/GaN metal-oxide-semiconductor capacitor structures Applied Physics Letters. 101. DOI: 10.1063/1.4751466 |
0.595 |
|
2012 |
Kaiser AM, Gray AX, Conti G, Jalan B, Kajdos AP, Gloskovskii A, Ueda S, Yamashita Y, Kobayashi K, Drube W, Stemmer S, Fadley CS. Electronic structure of delta-doped La:SrTiO 3 layers by hard x-ray photoelectron spectroscopy Applied Physics Letters. 100. DOI: 10.1063/1.4731642 |
0.667 |
|
2012 |
Janotti A, Jalan B, Stemmer S, Van De Walle CG. Effects of doping on the lattice parameter of SrTiO 3 Applied Physics Letters. 100. DOI: 10.1063/1.4730998 |
0.658 |
|
2012 |
Jackson CA, Moetakef P, James Allen S, Stemmer S. Capacitance-voltage analysis of high-carrier-density SrTiO 3/GdTiO 3 heterostructures Applied Physics Letters. 100. DOI: 10.1063/1.4726263 |
0.786 |
|
2012 |
Stemmer S, Chobpattana V, Rajan S. Frequency dispersion in III-V metal-oxide-semiconductor capacitors Applied Physics Letters. 100. DOI: 10.1063/1.4724330 |
0.338 |
|
2012 |
Hwang J, Zhang JY, Son J, Stemmer S. Nanoscale quantification of octahedral tilts in perovskite films Applied Physics Letters. 100. DOI: 10.1063/1.4714734 |
0.638 |
|
2012 |
Cain TA, Lee S, Moetakef P, Balents L, Stemmer S, James Allen S. Seebeck coefficient of a quantum confined, high-electron-density electron gas in SrTiO 3 Applied Physics Letters. 100. DOI: 10.1063/1.4704363 |
0.751 |
|
2012 |
Hwang J, Zhang J, Son J, Stemmer S. Quantifying Octahedral Rotations in Ultrathin LaNiO3 Films Using Position Averaged Convergent Beam Electron Diffraction Microscopy and Microanalysis. 18: 1844-1845. DOI: 10.1017/S1431927612011075 |
0.387 |
|
2012 |
Moetakef P, Ouellette DG, Zhang JY, Cain TA, Allen SJ, Stemmer S. Growth and properties of GdTiO 3 films prepared by hybrid molecular beam epitaxy Journal of Crystal Growth. 355: 166-170. DOI: 10.1016/J.Jcrysgro.2012.06.052 |
0.759 |
|
2012 |
Julian N, Mages P, Zhang C, Zhang J, Kraemer S, Stemmer S, Denbaars S, Coldren L, Petroff P, Bowers J. Coalescence of InP epitaxial lateral overgrowth by MOVPE with V/III ratio variation Journal of Electronic Materials. 41: 845-852. DOI: 10.1007/S11664-012-2020-Y |
0.314 |
|
2011 |
Forbes BD, D'Alfonso AJ, Findlay SD, Van Dyck D, Lebeau JM, Stemmer S, Allen LJ. Thermal diffuse scattering in transmission electron microscopy. Ultramicroscopy. 111: 1670-80. PMID 22088442 DOI: 10.1016/J.Ultramic.2011.09.017 |
0.548 |
|
2011 |
Kaiser AM, Gray AX, Conti G, Son J, Greer A, Perona A, Rattanachata A, Saw AY, Bostwick A, Yang S, Yang SH, Gullikson EM, Kortright JB, Stemmer S, Fadley CS. Suppression of near-Fermi level electronic states at the interface in a LaNiO3/SrTiO3 superlattice. Physical Review Letters. 107: 116402. PMID 22026689 DOI: 10.1103/Physrevlett.107.116402 |
0.619 |
|
2011 |
Long RD, Shin B, Monaghan S, Cherkaoui K, Cagnon J, Stemmer S, McIntyre PC, Hurley PK. Charged defect quantification in PtAl2O3In 0.53Ga0.47AsInP MOS capacitors Journal of the Electrochemical Society. 158: G103-G107. DOI: 10.1149/1.3545799 |
0.363 |
|
2011 |
Burek GJ, Hwang Y, Carter AD, Chobpattana V, Law JJM, Mitchell WJ, Thibeault B, Stemmer S, Rodwell MJW. Influence of gate metallization processes on the electrical characteristics of high-k/In 0.53Ga0.47 As interfaces Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 29. DOI: 10.1116/1.3610989 |
0.645 |
|
2011 |
Burke PG, Lu H, Rudawski NG, Stemmer S, Gossard AC, Bahk JH, Bowers JE. Electrical properties of Er-doped In0.53Ga0.47As Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 29. DOI: 10.1116/1.3559480 |
0.383 |
|
2011 |
LeBeau JM, Findlay SD, D'Alfonso AJ, Allen LJ, Stemmer S. Counting atoms with quantitative scanning transmission electron microscopy Acta Crystallographica Section A. 67: 105-105. DOI: 10.1107/S010876731109742X |
0.571 |
|
2011 |
Allen LJ, D'Alfonso AJ, Forbes BD, Lugg NR, Martin AV, Findlay SD, LeBeau JM, Stemmer S. Modelling thermal scattering and solving structures using Z-contrast imaging Acta Crystallographica Section A. 67: 155-156. DOI: 10.1107/S0108767311096176 |
0.515 |
|
2011 |
Gray AX, Janotti A, Son J, Lebeau JM, Ueda S, Yamashita Y, Kobayashi K, Kaiser AM, Sutarto R, Wadati H, Sawatzky GA, Van De Walle CG, Stemmer S, Fadley CS. Insulating state of ultrathin epitaxial LaNiO3 thin films detected by hard x-ray photoemission Physical Review B - Condensed Matter and Materials Physics. 84. DOI: 10.1103/Physrevb.84.075104 |
0.713 |
|
2011 |
Moetakef P, Cain TA, Ouellette DG, Zhang JY, Klenov DO, Janotti A, Van De Walle CG, Rajan S, Allen SJ, Stemmer S. Electrostatic carrier doping of GdTiO 3/SrTiO 3 interfaces Applied Physics Letters. 99. DOI: 10.1063/1.3669402 |
0.76 |
|
2011 |
Keeble DJ, Jalan B, Ravelli L, Egger W, Kanda G, Stemmer S. Suppression of vacancy defects in epitaxial La-doped SrTiO 3 films Applied Physics Letters. 99. DOI: 10.1063/1.3664398 |
0.664 |
|
2011 |
Son J, Jalan B, Kajdos AP, Balents L, James Allen S, Stemmer S. Probing the metal-insulator transition of NdNiO3 by electrostatic doping Applied Physics Letters. 99. DOI: 10.1063/1.3659310 |
0.742 |
|
2011 |
Son J, Rajan S, Stemmer S, James Allen S. A heterojunction modulation-doped Mott transistor Journal of Applied Physics. 110. DOI: 10.1063/1.3651612 |
0.582 |
|
2011 |
Saddik GN, Son J, Stemmer S, York RA. Improvement of barium strontium titanate solidly mounted resonator quality factor by reduction in electrode surface roughness Journal of Applied Physics. 109. DOI: 10.1063/1.3581204 |
0.519 |
|
2011 |
Oh DW, Ravichandran J, Liang CW, Siemons W, Jalan B, Brooks CM, Huijben M, Schlom DG, Stemmer S, Martin LW, Majumdar A, Ramesh R, Cahill DG. Thermal conductivity as a metric for the crystalline quality of SrTiO 3 epitaxial layers Applied Physics Letters. 98. DOI: 10.1063/1.3579993 |
0.655 |
|
2011 |
Hwang Y, Chobpattana V, Zhang JY, Lebeau JM, Engel-Herbert R, Stemmer S. Al-doped HfO2/In0.53Ga0.47 As metal-oxide-semiconductor capacitors Applied Physics Letters. 98. DOI: 10.1063/1.3575569 |
0.738 |
|
2011 |
Jalan B, Allen SJ, Beltz GE, Moetakef P, Stemmer S. Enhancing the electron mobility of SrTiO3 with strain Applied Physics Letters. 98. DOI: 10.1063/1.3571447 |
0.803 |
|
2011 |
Moetakef P, Zhang JY, Kozhanov A, Jalan B, Seshadri R, Allen SJ, Stemmer S. Transport in ferromagnetic GdTiO3 / SrTiO3 heterostructures Applied Physics Letters. 98. DOI: 10.1063/1.3568894 |
0.808 |
|
2011 |
Hwang Y, Engel-Herbert R, Stemmer S. Influence of trimethylaluminum on the growth and properties of HfO 2 / In0.53 Ga0.47 As interfaces Applied Physics Letters. 98. DOI: 10.1063/1.3553275 |
0.621 |
|
2011 |
Lebeau JM, D'Alfonso AJ, Wright NJ, Allen LJ, Stemmer S. Determining ferroelectric polarity at the nanoscale Applied Physics Letters. 98. DOI: 10.1063/1.3549300 |
0.6 |
|
2011 |
LeBeau JM, Findlay SD, Allen LJ, Stemmer S. Erratum: Standardless atom counting in scanning transmission electron microscopy (Nano Letters (2010) 10 (4405) Nano Letters. 11. DOI: 10.1021/Nl1042215 |
0.573 |
|
2011 |
LeBeau J, D'Alfonso A, Allen L, Stemmer S. Determination of Thin-Film Ferroelectric Polarity at the Nanoscale Microscopy and Microanalysis. 17: 1366-1367. DOI: 10.1017/S1431927611007707 |
0.587 |
|
2011 |
Zhang J, LeBeau J, D'Alfonso A, Allen L, Stemmer S. Exploring the Strain Sensitivity of Image Contrast in Quantitative STEM of SrTiO3 Microscopy and Microanalysis. 17: 1310-1311. DOI: 10.1017/S1431927611007422 |
0.516 |
|
2010 |
LeBeau JM, Findlay SD, Allen LJ, Stemmer S. Standardless atom counting in scanning transmission electron microscopy. Nano Letters. 10: 4405-8. PMID 20945926 DOI: 10.1021/Nl102025S |
0.588 |
|
2010 |
Son J, Moetakef P, Jalan B, Bierwagen O, Wright NJ, Engel-Herbert R, Stemmer S. Epitaxial SrTiO3 films with electron mobilities exceeding 30,000 cm2 V(-1) s(-1). Nature Materials. 9: 482-4. PMID 20364139 DOI: 10.1038/Nmat2750 |
0.833 |
|
2010 |
Lebeau JM, Findlay SD, Allen LJ, Stemmer S. Position averaged convergent beam electron diffraction: theory and applications. Ultramicroscopy. 110: 118-25. PMID 19939565 DOI: 10.1016/J.Ultramic.2009.10.001 |
0.595 |
|
2010 |
Saddik GN, Son J, Stemmer S, York RA. Towards a high quality factor dc electric field switchable barium strontium titanate solidly mounted resonator Materials Research Society Symposium Proceedings. 1199: 27-31. DOI: 10.1557/Proc-1199-F06-16 |
0.541 |
|
2010 |
Jalan B, Stemmer S, MacK S, Allen SJ. Two-dimensional electron gas in δ -doped SrTiO3 Physical Review B - Condensed Matter and Materials Physics. 82. DOI: 10.1103/Physrevb.82.081103 |
0.656 |
|
2010 |
Engel-Herbert R, Hwang Y, Stemmer S. Comparison of methods to quantify interface trap densities at dielectric/III-V semiconductor interfaces Journal of Applied Physics. 108. DOI: 10.1063/1.3520431 |
0.626 |
|
2010 |
Son J, Lebeau JM, Allen SJ, Stemmer S. Conductivity enhancement of ultrathin LaNiO3 films in superlattices Applied Physics Letters. 97. DOI: 10.1063/1.3511738 |
0.709 |
|
2010 |
Engel-Herbert R, Hwang Y, Stemmer S. Quantification of trap densities at dielectric/III-V semiconductor interfaces Applied Physics Letters. 97. DOI: 10.1063/1.3479047 |
0.623 |
|
2010 |
Jalan B, Stemmer S. Large Seebeck coefficients and thermoelectric power factor of La-doped SrTiO3 thin films Applied Physics Letters. 97. DOI: 10.1063/1.3471398 |
0.66 |
|
2010 |
Hwang Y, Engel-Herbert R, Rudawski NG, Stemmer S. Effect of postdeposition anneals on the Fermi level response of HfO 2/In0.53Ga0.47 As gate stacks Journal of Applied Physics. 108. DOI: 10.1063/1.3465524 |
0.635 |
|
2010 |
Booth JC, Orloff ND, Cagnon J, Lu J, Stemmer S. Temperature-dependent dielectric relaxation in bismuth zinc niobate thin films Applied Physics Letters. 97. DOI: 10.1063/1.3455897 |
0.378 |
|
2010 |
Hwang Y, Engel-Herbert R, Rudawski NG, Stemmer S. Analysis of trap state densities at HfO2/In0.53 Ga0.47 As interfaces Applied Physics Letters. 96. DOI: 10.1063/1.3360221 |
0.624 |
|
2010 |
Son J, Moetakef P, Lebeau JM, Ouellette D, Balents L, Allen SJ, Stemmer S. Low-dimensional Mott material: Transport in ultrathin epitaxial LaNiO 3 films Applied Physics Letters. 96. DOI: 10.1063/1.3309713 |
0.807 |
|
2010 |
Stemmer S, LeBeau J, Findlay S, D'Alfonso A, Allen L. Towards Quantitative Analysis of STEM Image Contrast of Interfaces and Surfaces Microscopy and Microanalysis. 16: 1472-1473. DOI: 10.1017/S1431927610061684 |
0.534 |
|
2010 |
Buehl TE, Lebeau JM, Stemmer S, Scarpulla MA, Palmstrøm CJ, Gossard AC. Growth of embedded ErAs nanorods on (4 1 1)A and (4 1 1)B GaAs by molecular beam epitaxy Journal of Crystal Growth. 312: 2089-2092. DOI: 10.1016/J.Jcrysgro.2010.04.031 |
0.579 |
|
2009 |
Bougeard D, Sircar N, Ahlers S, Lang V, Abstreiter G, Trampert A, Lebeau JM, Stemmer S, Saxey DW, Cerezo A. Ge(1-x) Mn(x) clusters: central structural and magnetic building blocks of nanoscale wire-like self-assembly in a magnetic semiconductor. Nano Letters. 9: 3743-8. PMID 19751066 DOI: 10.1021/Nl901928F |
0.537 |
|
2009 |
Engel-Herbert R, Hwang Y, LeBeau JM, Zheng Y, Stemmer S. Chemical beam deposition of high-k gate dielectrics on III-V semiconductors: TiO2 on In0.53Ga0.47As Materials Research Society Symposium Proceedings. 1155: 111-117. DOI: 10.1557/Proc-1155-C13-02 |
0.739 |
|
2009 |
Shin B, Cagnon J, Long RD, Hurley PK, Stemmer S, McIntyre PC. Unpinned Interface between Al2O3 Gate Dielectric Layer Grown by Atomic Layer Deposition and Chemically Treated n-In 0.53Ga0.47As (001) Electrochemical and Solid-State Letters. 12: G40-G43. DOI: 10.1149/1.3139603 |
0.383 |
|
2009 |
Jalan B, Cagnon J, Mates TE, Stemmer S. Analysis of carbon in SrTiO3 grown by hybrid molecular beam epitaxy Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 27: 1365-1368. DOI: 10.1116/1.3253355 |
0.667 |
|
2009 |
Jalan B, Engel-Herbert R, Wright NJ, Stemmer S. Growth of high-quality SrTiO3 films using a hybrid molecular beam epitaxy approach Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 27: 461-464. DOI: 10.1116/1.3106610 |
0.694 |
|
2009 |
Jalan B, Engel-Herbert R, Cagnon J, Stemmer S. Growth modes in metal-organic molecular beam epitaxy of TiO2 on r -plane sapphire Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 27: 230-233. DOI: 10.1116/1.3065713 |
0.678 |
|
2009 |
Lebeau JM, D'Alfonso AJ, Findlay SD, Stemmer S, Allen LJ. Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images Physical Review B - Condensed Matter and Materials Physics. 80. DOI: 10.1103/Physrevb.80.174106 |
0.58 |
|
2009 |
Son J, Stemmer S. Resistive switching and resonant tunneling in epitaxial perovskite tunnel barriers Physical Review B - Condensed Matter and Materials Physics. 80. DOI: 10.1103/Physrevb.80.035105 |
0.579 |
|
2009 |
Lebeau JM, Findlay SD, Wang X, Jacobson AJ, Allen LJ, Stemmer S. High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment Physical Review B - Condensed Matter and Materials Physics. 79. DOI: 10.1103/Physrevb.79.214110 |
0.577 |
|
2009 |
Kim EJ, Chagarov E, Cagnon J, Yuan Y, Kummel AC, Asbeck PM, Stemmer S, Saraswat KC, McIntyre PC. Atomically abrupt and unpinned Al2O3/In 0.53Ga0.47 As interfaces: Experiment and simulation Journal of Applied Physics. 106. DOI: 10.1063/1.3266006 |
0.429 |
|
2009 |
Lebeau JM, Engel-Herbert R, Jalan B, Cagnon J, Moetakef P, Stemmer S, Stephenson GB. Stoichiometry optimization of homoepitaxial oxide thin films using x-ray diffraction Applied Physics Letters. 95. DOI: 10.1063/1.3243696 |
0.815 |
|
2009 |
Son J, Cagnon J, Stemmer S. Strain relaxation in epitaxial Pt films on (001) SrTiO3 Journal of Applied Physics. 106. DOI: 10.1063/1.3207795 |
0.607 |
|
2009 |
Engel-Herbert R, Hwang Y, Cagnon J, Stemmer S. Metal-oxide-semiconductor capacitors with ZrO2 dielectrics grown on In0.53 Ga0.47 As by chemical beam deposition Applied Physics Letters. 95. DOI: 10.1063/1.3204465 |
0.647 |
|
2009 |
Jalan B, Moetakef P, Stemmer S. Molecular beam epitaxy of SrTiO3 with a growth window Applied Physics Letters. 95. DOI: 10.1063/1.3184767 |
0.796 |
|
2009 |
Hwang Y, Wistey MA, Cagnon J, Engel-Herbert R, Stemmer S. Metal-oxide-semiconductor capacitors with erbium oxide dielectrics on In0.53 Ga0.47 As channels Applied Physics Letters. 94. DOI: 10.1063/1.3106618 |
0.6 |
|
2009 |
Son J, Cagnon J, Stemmer S. Electrical properties of epitaxial SrTiO3 tunnel barriers on (001) Pt/ SrTiO3 substrates Applied Physics Letters. 94. DOI: 10.1063/1.3081110 |
0.622 |
|
2009 |
LeBeau JM, Findlay SD, Allen LJ, Stemmer S. Position averaged convergent beam electron diffraction Microscopy and Microanalysis. 15: 494-495. DOI: 10.1017/S1431927609096743 |
0.561 |
|
2009 |
Lebeau JM, Findlay SD, Wang X, Jacobson AJ, Allen LJ, Stemmer S. Quantitative HAADF Imaging of Crystals Containing Heavy Elements: A Comparison with Theory Microscopy and Microanalysis. 15: 466-467. DOI: 10.1017/S143192760909521X |
0.504 |
|
2009 |
Engel-Herbert R, Jalan B, Cagnon J, Stemmer S. Microstructure of epitaxial rutile TiO2 films grown by molecular beam epitaxy on r-plane Al2O3 Journal of Crystal Growth. 312: 149-153. DOI: 10.1016/J.Jcrysgro.2009.10.005 |
0.685 |
|
2009 |
Choi D, Harris JS, Kim E, McIntyre PC, Cagnon J, Stemmer S. High-quality III–V semiconductor MBE growth on Ge/Si virtual substrates for metal-oxide-semiconductor device fabrication Journal of Crystal Growth. 311: 1962-1971. DOI: 10.1016/J.Jcrysgro.2008.09.138 |
0.431 |
|
2009 |
Stemmer S, LeBeau JM, Cagnon J, Hwang Y, Engel-Herbert R. Applications of advanced transmission electron microscopy techniques in gate stack scaling Digest of Technical Papers - Symposium On Vlsi Technology. 198-199. |
0.581 |
|
2008 |
Lebeau JM, Stemmer S. Experimental quantification of annular dark-field images in scanning transmission electron microscopy. Ultramicroscopy. 108: 1653-8. PMID 18707809 DOI: 10.1016/J.Ultramic.2008.07.001 |
0.562 |
|
2008 |
LeBeau JM, Findlay SD, Allen LJ, Stemmer S. Quantitative atomic resolution scanning transmission electron microscopy. Physical Review Letters. 100: 206101. PMID 18518557 DOI: 10.1103/Physrevlett.100.206101 |
0.558 |
|
2008 |
Findlay SD, Klenov DO, Stemmer S, Allen LJ. Atomic number contrast in high angle annular dark field imaging of crystals Materials Science and Technology. 24: 660-666. DOI: 10.1179/174328408X257315 |
0.343 |
|
2008 |
Stemmer S, Agustin MP, Klenov DO. Scanning transmission electron microscopy studies of interface stability and point defects in gate stacks with high-k dielectrics Ecs Transactions. 16: 177-183. DOI: 10.1149/1.2981600 |
0.809 |
|
2008 |
Delabie A, Brunco DP, Conard T, Favia P, Bender H, Franquet A, Sioncke S, Vandervorst W, Van Elshocht S, Heyns M, Meuris M, Kim E, McIntyre PC, Saraswat KC, Lebeau JM, ... ... Stemmer S, et al. Atomic layer deposition of hafnium oxide on ge and gaas substrates: Precursors and surface preparation Journal of the Electrochemical Society. 155. DOI: 10.1149/1.2979144 |
0.614 |
|
2008 |
Boesch DS, Son J, LeBeau JM, Cagnon J, Stemmer S. Thickness dependence of the dielectric properties of epitaxial SrTiO 3 films on (001)Pt/SrTiO3 Applied Physics Express. 1: 0916021-0916023. DOI: 10.1143/Apex.1.091602 |
0.731 |
|
2008 |
Son J, Cagnon J, Boesch DS, Stemmer S. Epitaxial SrTiO3 tunnel barriers on Pt/MgO substrates Applied Physics Express. 1: 06160310616033. DOI: 10.1143/Apex.1.061603 |
0.607 |
|
2008 |
Son J, Stemmer S. Thermal leakage characteristics of PtSrTi O3 Pt structures Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 26: 555-557. DOI: 10.1116/1.2907782 |
0.642 |
|
2008 |
Son J, Cagnon J, Finstrom NH, Boesch DS, Lu JW, Stemmer S. Relationship between defects and the dielectric and transport properties of SrTiO3 thin films Ieee International Symposium On Applications of Ferroelectrics. 1. DOI: 10.1109/ISAF.2008.4693915 |
0.31 |
|
2008 |
Stemmer S, LeBeau JM, Findlay SD, Allen LJ. Image contrast in atomic resolution high-angle annular dark-field images Acta Crystallographica Section A. 64: 65-65. DOI: 10.1107/S0108767308097924 |
0.53 |
|
2008 |
LeBeau JM, Hu QO, Palmstrøm CJ, Stemmer S. Atomic structure of postgrowth annealed epitaxial Fe/(001)GaAs interfaces Applied Physics Letters. 93. DOI: 10.1063/1.2990622 |
0.618 |
|
2008 |
Jalan B, Engel-Herbert R, Mates TE, Stemmer S. Effects of hydrogen anneals on oxygen deficient SrTiO3-x single crystals Applied Physics Letters. 93. DOI: 10.1063/1.2969037 |
0.632 |
|
2008 |
LeBeau JM, Jur JS, Lichtenwalner DJ, Craft HS, Maria JP, Kingon AI, Klenov DO, Cagnon J, Stemmer S. High temperature stability of Hf-based gate dielectric stacks with rare-earth oxide layers for threshold voltage control Applied Physics Letters. 92. DOI: 10.1063/1.2901036 |
0.614 |
|
2008 |
LeBeau JM, Jur JS, Lichtenwalner DJ, Kingon AI, Klenov DO, Stemmer S. Thermal stability of Hf-based gate dielectric stacks with rare-earth oxide capping layers Microscopy and Microanalysis. 14: 418-419. DOI: 10.1017/S1431927608084109 |
0.564 |
|
2008 |
LeBeau JM, Findlay SD, Allen LJ, Stemmer S. Quantitative HAADF-STEM and EELS Microscopy and Microanalysis. 14: 1352-1353. DOI: 10.1017/S1431927608082263 |
0.509 |
|
2008 |
Allen LJ, D'Alfonso AJ, Bosman M, Findlay SD, Oxley MP, Keast VJ, LeBeau JM, Stemmer S. Simulation of atomic resolution images in STEM Microscopy and Microanalysis. 14: 922-923. DOI: 10.1017/S1431927608082019 |
0.521 |
|
2008 |
Choi D, Ge Y, Harris JS, Cagnon J, Stemmer S. Low surface roughness and threading dislocation density Ge growth on Si (0 0 1) Journal of Crystal Growth. 310: 4273-4279. DOI: 10.1016/J.Jcrysgro.2008.07.029 |
0.389 |
|
2007 |
Klenov DO, Findlay SD, Allen LJ, Stemmer S. Influence of orientation on the contrast of high-angle annular dark-field images of silicon Physical Review B - Condensed Matter and Materials Physics. 76. DOI: 10.1103/Physrevb.76.014111 |
0.326 |
|
2007 |
Cagnon J, Boesch DS, Finstrom NH, Nergiz SZ, Keane SP, Stemmer S. Microstructure and dielectric properties of pyrochlore Bi2 Ti2 O7 thin films Journal of Applied Physics. 102. DOI: 10.1063/1.2769777 |
0.398 |
|
2007 |
Klenov DO, Zide JMO, Lebeau JM, Gossard AC, Stemmer S. Ordering of ErAs nanoparticles embedded in epitaxial InGaAs layers Applied Physics Letters. 90. DOI: 10.1063/1.2715174 |
0.557 |
|
2007 |
Finstrom NH, Cagnon J, Stemmer S. Properties of dielectric dead layers for SrTi O3 thin films on Pt electrodes Journal of Applied Physics. 101. DOI: 10.1063/1.2433745 |
0.435 |
|
2007 |
Klenov D, LeBeau J, Zide J, Gossard A, Stemmer S. Combination of TEM and STEM to Investigate the Self-Assembly of Epitaxial Nanocomposites Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607077252 |
0.512 |
|
2007 |
Voyles P, Yang J, Zuo J, Stemmer S. The Electron Microscopy Database: A Resource for Teaching and Learning Quantitative Methods in Electron Microscopy and Spectroscopy Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607074156 |
0.308 |
|
2006 |
Klenov DO, Stemmer S. Contributions to the contrast in experimental high-angle annular dark-field images. Ultramicroscopy. 106: 889-901. PMID 16713091 DOI: 10.1016/J.Ultramic.2006.03.007 |
0.346 |
|
2006 |
Klenov DO, Stemmer S. Limitations in through-focus depth sectioning in non-aberration corrected high-angle annular dark-field imaging Japanese Journal of Applied Physics, Part 2: Letters. 45. DOI: 10.1143/Jjap.45.L602 |
0.302 |
|
2006 |
Dora Y, Han S, Klenov D, Hansen PJ, No KS, Mishra UK, Stemmer S, Speck JS. ZrO 2 gate dielectrics produced by ultraviolet ozone oxidation for GaN and AlGaN/GaN transistors Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 24: 575-581. DOI: 10.1116/1.2167991 |
0.458 |
|
2006 |
Park J, Lu JW, Boesch DS, Stemmer S, York RA. Distributed phase shifter with pyrochlore bismuth zinc niobate thin films Ieee Microwave and Wireless Components Letters. 16: 264-266. DOI: 10.1109/Lmwc.2006.873528 |
0.361 |
|
2006 |
Pervez NK, Park J, Lu J, Stemmer S, York RA. Geometrical scaling effects in high permittivity capacitors Integrated Ferroelectrics. 80: 437-442. DOI: 10.1080/10584580600663235 |
0.305 |
|
2006 |
Pervez NK, Park J, Lu J, Stemmer S, York RA. High frequency loss modeling using dielectric relaxation Integrated Ferroelectrics. 77: 87-92. DOI: 10.1080/10584580500414184 |
0.367 |
|
2006 |
Park J, Lu J, Stemmer S, York RA. BZN thin film capacitors for microwave low loss tunable applications Integrated Ferroelectrics. 77: 21-26. DOI: 10.1080/10584580500413665 |
0.359 |
|
2006 |
Finstrom NH, Gannon JA, Pervez NK, York RA, Stemmer S. Dielectric losses of SrTiO 3 thin film capacitors with Pt bottom electrodes at frequencies up to 1 GHz Applied Physics Letters. 89. DOI: 10.1063/1.2405381 |
0.347 |
|
2006 |
Klenov DO, Mates TE, Stemmer S. Detection and mobility of hafnium in SiO 2 Applied Physics Letters. 89. DOI: 10.1063/1.2240743 |
0.395 |
|
2006 |
Agustin MP, Alshareef H, Quevedo-Lopez MA, Stemmer S. Influence of AIN layers on the interface stability of HfO 2 gate dielectric stacks Applied Physics Letters. 89. DOI: 10.1063/1.2236264 |
0.797 |
|
2006 |
Edge LF, Schlom DG, Rivillon S, Chabal YJ, Agustin MP, Stemmer S, Lee T, Kim MJ, Craft HS, Maria JP, Hawley ME, Holländer B, Schubert J, Eisenbeiser K. Thermal stability of amorphous LaScO 3 films on silicon Applied Physics Letters. 89. DOI: 10.1063/1.2222302 |
0.818 |
|
2006 |
Agustin MP, Bersuker G, Foran B, Boatner LA, Stemmer S. Scanning transmission electron microscopy investigations of interfacial layers in HfO 2 gate stacks Journal of Applied Physics. 100. DOI: 10.1063/1.2214187 |
0.818 |
|
2006 |
Schmidt S, Klenov DO, Keane SP, Lu J, Mates TE, Stemmer S. Atomic structure of (111) SrTiO 3/Pt interfaces Applied Physics Letters. 88. DOI: 10.1063/1.2191410 |
0.388 |
|
2006 |
Lu J, Schmidt S, Boesch DS, Pervez N, York RA, Stemmer S. Low-loss tunable capacitors fabricated directly on gold bottom electrodes Applied Physics Letters. 88. DOI: 10.1063/1.2186077 |
0.336 |
|
2006 |
Keane SP, Schmidt S, Lu J, Romanov AE, Stemmer S. Phase transitions in textured SrTiO 3 thin films on epitaxial Pt electrodes Journal of Applied Physics. 99. DOI: 10.1063/1.2171786 |
0.403 |
|
2006 |
Klenov DO, Stemmer S. Thickness effects in high-angle annular dark-field imaging of interfaces Microscopy and Microanalysis. 12: 1360-1361. DOI: 10.1017/S143192760606288X |
0.315 |
|
2006 |
McCarthy I, Agustin MP, Shamuilia S, Stemmer S, Afanas'ev VV, Campbell SA. Strontium hafnate films deposited by physical vapor deposition Thin Solid Films. 515: 2527-2530. DOI: 10.1016/J.Tsf.2006.07.030 |
0.821 |
|
2006 |
Edge LF, Schlom DG, Stemmer S, Lucovsky G, Luning J. Detection of nanocrystallinity by X-ray absorption spectroscopy in thin film transition metal/rare-earth atom, elemental and complex oxides Radiation Physics and Chemistry. 75: 1608-1612. DOI: 10.1016/J.Radphyschem.2006.05.005 |
0.305 |
|
2005 |
Schmidt S, Ok YW, Klenov DO, Lu J, Keane SP, Stemmer S. Microstructure of epitaxial SrTiO3/Pt/Ti/sapphire heterostructures Journal of Materials Research. 20: 2261-2265. DOI: 10.1557/Jmr.2005.0282 |
0.425 |
|
2005 |
Klenov DO, Schlom DG, Li H, Stemmer S. The interface between single crystalline (001) LaAlO3 and (001) silicon Japanese Journal of Applied Physics, Part 2: Letters. 44. DOI: 10.1143/Jjap.44.L617 |
0.409 |
|
2005 |
Schmidt S, Lu J, Keane SP, Bregante LD, Klenov DO, Stemmer S. Microstructure and dielectric properties of textured SrTiO 3 thin films Journal of the American Ceramic Society. 88: 789-801. DOI: 10.1111/J.1551-2916.2005.00195.X |
0.432 |
|
2005 |
Agustin MP, Fonseca LRC, Hooker JC, Stemmer S. Scanning transmission electron microscopy of gate stacks with HfO 2 dielectrics and TiN electrodes Applied Physics Letters. 87: 1-3. DOI: 10.1063/1.2053362 |
0.821 |
|
2005 |
Zide JM, Klenov DO, Stemmer S, Gossard AC, Zeng G, Bowers JE, Vashaee D, Shakouri A. Thermoelectric power factor in semiconductors with buried epitaxial semimetallic nanoparticles Applied Physics Letters. 87. DOI: 10.1063/1.2043241 |
0.321 |
|
2005 |
Li M, Zhang Z, Campbell SA, Gladfelter WL, Agustin MP, Klenov DO, Stemmer S. Electrical and material characterizations of high-permittivity Hf x Ti 1-x O 2 gate insulators Journal of Applied Physics. 98. DOI: 10.1063/1.2039268 |
0.826 |
|
2005 |
Lu J, Schmidt S, Ok YW, Keane SP, Stemmer S. Contributions to the dielectric losses of textured SrTi O 3 thin films with Pt electrodes Journal of Applied Physics. 98. DOI: 10.1063/1.2034649 |
0.396 |
|
2005 |
Lichtenwalner DJ, Jur JS, Kingon AI, Agustin MP, Yang Y, Stemmer S, Goncharova LV, Gustafsson T, Garfunkel E. Lanthanum silicate gate dielectric stacks with subnanometer equivalent oxide thickness utilizing an interfacial silica consumption reaction Journal of Applied Physics. 98. DOI: 10.1063/1.1988967 |
0.814 |
|
2005 |
Klenov DO, Zide JM, Zimmerman JD, Gossard AC, Stemmer S. Interface atomic structure of epitaxial ErAs layers on (001)In 0.53Ga 0.47As and GaAs Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1947910 |
0.388 |
|
2005 |
Klenov DO, Driscoll DC, Gossard AC, Stemmer S. Scanning transmission electron microscopy of ErAs nanoparticles embedded in epitaxial in 0.53Ga 0.47as layers Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1885172 |
0.356 |
|
2005 |
Park J, Lu J, Stemmer S, York RA. Microwave dielectric properties of tunable capacitors employing bismuth zinc niobate thin films Journal of Applied Physics. 97. DOI: 10.1063/1.1883306 |
0.344 |
|
2005 |
Klenov DO, Edge LF, Schlom DG, Stemmer S. Extended defects in epitaxial Sc2 O3 films grown on (111) Si Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1857068 |
0.431 |
|
2005 |
Tagantsev AK, Lu J, Stemmer S. Temperature dependence of the dielectric tunability of pyrochlore bismuth zinc niobate thin films Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1853533 |
0.371 |
|
2005 |
Biswas N, Gurganus J, Misra V, Yang Y, Stemmer S. Evaluation of nickel and molybdenum silicides for dual gate complementary metal-oxide semiconductor application Applied Physics Letters. 86. DOI: 10.1063/1.1849850 |
0.391 |
|
2005 |
Klenov DO, Lu J, Schmidt S, Stemmer S. Characterization of Bi1.5ZnNb1.5O7-x Pyrochlore Thin Films by High-angle Annular Dark-field Imaging in STEM Microscopy and Microanalysis. 11: 1732-1733. DOI: 10.1017/S1431927605506469 |
0.349 |
|
2005 |
Agustin MP, Fonseca LRC, Hooker JH, Stemmer S. HAADF Imaging and Low-Loss EELS Investigation of HfO2/TiN Interfaces in High-k Gate Stacks Microscopy and Microanalysis. 11: 1446-1447. DOI: 10.1017/S1431927605504458 |
0.783 |
|
2005 |
Foran B, Barnett J, Lysaght PS, Agustin MP, Stemmer S. Characterization of advanced gate stacks for Si CMOS by electron energy-loss spectroscopy in scanning transmission electron microscopy Journal of Electron Spectroscopy and Related Phenomena. 143: 149-158. DOI: 10.1016/J.Elspec.2004.03.013 |
0.826 |
|
2004 |
Diebold AC, Foran B, Kisielowski C, Muller DA, Pennycook SJ, Principe E, Stemmer S. Thin dielectric film thickness determination by advanced transmission electron microscopy. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 9: 493-508. PMID 14750984 DOI: 10.1017/S1431927603030629 |
0.41 |
|
2004 |
Pervez NK, Lu J, Stemmer S, York RA. AC Loss Modeling in Ba 0.5 Sr 0.5 TiO 3 Using Dielectric Relaxation Mrs Proceedings. 833. DOI: 10.1557/Proc-833-G1.10 |
0.319 |
|
2004 |
Klenov DO, Taylor TR, Stemmer S. SrTiO3 films on platinized (0001) Al2O3: Characterization of texture and nonstoichiometry accommodation Journal of Materials Research. 19: 1477-1486. DOI: 10.1557/Jmr.2004.0197 |
0.421 |
|
2004 |
Stemmer S. Thermodynamic considerations in the stability of binary oxides for alternative gate dielectrics in complementary metal-oxide-semiconductors Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 22: 791-800. DOI: 10.1116/1.1688357 |
0.333 |
|
2004 |
Kim H, McIntyre PC, Chui CO, Saraswat KC, Stemmer S. Engineering chemically abrupt high-k metal oxide/silicon interfaces using an oxygen-gettering metal overlayer Journal of Applied Physics. 96: 3467-3472. DOI: 10.1063/1.1776636 |
0.399 |
|
2004 |
Edge LF, Schlom DG, Brewer RT, Chabal YJ, Williams JR, Chambers SA, Hinkle C, Lucovsky G, Yang Y, Stemmer S, Copel M, Holländer B, Schubert J. Suppression of subcutaneous oxidation during the deposition of amorphous lanthanum aluminate on silicon Applied Physics Letters. 84: 4629-4631. DOI: 10.1063/1.1759065 |
0.464 |
|
2004 |
Yang Y, Zhu W, Ma TP, Stemmer S. High-temperature phase stability of hafnium aluminate films for alternative gate dielectrics Journal of Applied Physics. 95: 3772-3776. DOI: 10.1063/1.1652240 |
0.444 |
|
2004 |
Lu J, Klenov DO, Stemmer S. Influence of strain on the dielectric relaxation of pyrochlore bismuth zinc niobate thin films Applied Physics Letters. 84: 957-959. DOI: 10.1063/1.1646216 |
0.317 |
|
2004 |
Agustin MP, Foran B, Bersuker G, Barnett J, Stemmer S. Characterization of ultra-thin Hf-based alternative dielectric layers for Si CMOS by Z-contrast imaging and electron energy-loss spectroscopy in STEM Microscopy and Microanalysis. 10: 322-323. DOI: 10.1017/S1431927604886525 |
0.8 |
|
2004 |
Stemmer S, Agustin MP, Yang Y, Schmidt S, Foran B, Bersuker G, Schlom DG. Advanced characterization of novel gate stacks for Si CMOS by scanning transmission electron microscopy Microscopy and Microanalysis. 10: 290-291. DOI: 10.1017/S1431927604886343 |
0.796 |
|
2004 |
Ushakov SV, Navrotsky A, Yang Y, Stemmer S, Kukli K, Ritala M, Leskelä MA, Fejes P, Demkov A, Wang C, Nguyen B, Triyoso D, Tobin P. Crystallization in hafnia- and zirconia-based systems Physica Status Solidi (B). 241: 2268-2278. DOI: 10.1002/Pssb.200404935 |
0.34 |
|
2004 |
Chen Z, Misra V, Haggerty RP, Stemmer S. Stability of Ru- And Ta-based metal gate electrodes in contact with dielectrics for Si-CMOS Physica Status Solidi (B) Basic Research. 241: 2253-2267. DOI: 10.1002/Pssb.200404933 |
0.333 |
|
2003 |
Stemmer S, Chen ZQ, Zhu WJ, Ma TP. Electron energy-loss spectroscopy study of thin film hafnium aluminates for novel gate dielectrics. Journal of Microscopy. 210: 74-9. PMID 12694419 DOI: 10.1046/J.1365-2818.2003.01175.X |
0.487 |
|
2003 |
Klenov DO, Donner W, Chen L, Jacobson AJ, Stemmer S. Composition control of radio-frequency magnetron sputter-deposited La0.5Sr0.5CoO3−∂ thin films Journal of Materials Research. 18: 188-194. DOI: 10.1557/Jmr.2003.0026 |
0.412 |
|
2003 |
Ramanathan S, McIntyre PC, Luning J, Lysaght PS, Yang Y, Chen Z, Stemmer S. Phase Separation in Hafnium Silicates for Alternative Gate Dielectrics Journal of the Electrochemical Society. 150: F173. DOI: 10.1149/1.1604115 |
0.39 |
|
2003 |
Niu D, Ashcraft RW, Chen Z, Stemmer S, Parsons GN. Chemical, physical, and electrical characterizations of oxygen plasma assisted chemical vapor deposited yttrium oxide on silicon Journal of the Electrochemical Society. 150: F102-F109. DOI: 10.1149/1.1566415 |
0.442 |
|
2003 |
Stemmer S, Chen Z, Levi CG, Lysaght PS, Foran B, Gisby JA, Taylor JR. Application of Metastable Phase Diagrams to Silicate Thin Films for Alternative Gate Dielectrics Japanese Journal of Applied Physics. 42: 3593-3597. DOI: 10.1143/Jjap.42.3593 |
0.341 |
|
2003 |
Lu J, Chen Z, Taylor TR, Stemmer S. Composition control and dielectric properties of bismuth zinc niobate thin films synthesized by radio-frequency magnetron sputtering Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 21: 1745-1751. DOI: 10.1116/1.1603280 |
0.415 |
|
2003 |
Risbud AS, Spaldin NA, Chen ZQ, Stemmer S, Seshadri R. Magnetism in polycrystalline cobalt-substituted zinc oxide Physical Review B. 68. DOI: 10.1103/Physrevb.68.205202 |
0.318 |
|
2003 |
Stemmer S, Li Y, Foran B, Lysaght PS, Streiffer SK, Fuoss P, Seifert S. Grazing-incidence small angle x-ray scattering studies of phase separation in hafnium silicate films Applied Physics Letters. 83: 3141-3143. DOI: 10.1063/1.1617369 |
0.408 |
|
2003 |
Lu J, Stemmer S. Low-loss, tunable bismuth zinc niobate films deposited by rf magnetron sputtering Applied Physics Letters. 83: 2411-2413. DOI: 10.1063/1.1613036 |
0.398 |
|
2003 |
Klenov DO, Donner W, Foran B, Stemmer S. Impact of stress on oxygen vacancy ordering in epitaxial (La0.5Sr0.5)CoO3-∂ thin films Applied Physics Letters. 82: 3427-3429. DOI: 10.1063/1.1575503 |
0.361 |
|
2003 |
Lysaght P, Foran B, Stemmer S, Bersuker G, Bennett J, Tichy R, Larson L, Huff HR. Thermal response of MOCVD hafnium silicate Microelectronic Engineering. 69: 182-189. DOI: 10.1016/S0167-9317(03)00295-8 |
0.446 |
|
2002 |
Stemmer S. Atomic scale structure-property relationships of defects and interfaces in novel oxide thin films Proceedings of Spie - the International Society For Optical Engineering. 4811: 244-251. DOI: 10.1117/12.455838 |
0.316 |
|
2002 |
Stemmer S, Chen Z, Keding R, Maria J, Wicaksana D, Kingon AI. Erratum: “Stability of ZrO2 layers on Si (001) during high-temperature anneals under reduced oxygen partial pressures” [J. Appl. Phys. 92, 82 (2002)] Journal of Applied Physics. 92: 6942-6942. DOI: 10.1063/1.1519098 |
0.336 |
|
2002 |
Stemmer S, Klenov DO, Chen Z, Niu D, Ashcraft RW, Parsons GN. Reactions of Y2O3 films with (001) Si substrates and with polycrystalline Si capping layers Applied Physics Letters. 81: 712-714. DOI: 10.1063/1.1496500 |
0.433 |
|
2002 |
Niu D, Ashcraft RW, Chen Z, Stemmer S, Parsons GN. Electron energy-loss spectroscopy analysis of interface structure of yttrium oxide gate dielectrics on silicon Applied Physics Letters. 81: 676-678. DOI: 10.1063/1.1496138 |
0.461 |
|
2002 |
Stemmer S, Chen Z, Keding R, Maria JP, Wicaksana D, Kingon AI. Stability of ZrO 2 layers on Si (001) during high-temperature anneals under reduced oxygen partial pressures Journal of Applied Physics. 92: 82-86. DOI: 10.1063/1.1481970 |
0.411 |
|
2002 |
Stemmer S, Klenov D, Chen Z, Maria JP, Kingon AI, Niu D, Parsons GN. Electron energy-loss spectroscopy of alternative gate dielectric stacks Microscopy and Microanalysis. 8: 66-67. DOI: 10.1017/S1431927602101826 |
0.344 |
|
2001 |
Klie RF, Ito Y, Stemmer S, Browning ND. Observation of oxygen vacancy ordering and segregation in Perovskite oxides Ultramicroscopy. 86: 289-302. PMID 11281149 DOI: 10.1016/S0304-3991(00)00120-0 |
0.334 |
|
2001 |
Baumann PK, Streiffer SK, Bai GR, Ghosh K, Auciello O, Thompson C, Stemmer S, Rao RA, Eom C, Xu F, Trolier-mckinstry S, Kim D, Maria J, Kingon AI. Epitaxial Pb(Mg1/3Nb2/3)O3-PbTiO3 thin films grown by MOCVD Integrated Ferroelectrics. 35: 151-158. DOI: 10.1080/10584580108016896 |
0.396 |
|
2001 |
Stemmer S, Höche T, Keding R, Rüssel C, Schneider R, Browning ND, Streiffer SK, Kleebe H-. Oxidation states of titanium in bulk barium titanates and in (100) fiber-textured (BaxSr1−x)Ti1+yO3+z thin films Applied Physics Letters. 79: 3149-3151. DOI: 10.1063/1.1418036 |
0.416 |
|
2001 |
Stemmer S, Jacobson AJ, Chen X, Ignatiev A. Oxygen vacancy ordering in epitaxial La0.5Sr0.5CoO3 - ∂ thin films on (001) LaAlO3 Journal of Applied Physics. 90: 3319-3324. DOI: 10.1063/1.1401793 |
0.425 |
|
2001 |
Stemmer S, Maria JP, Kingon AI. Structure and stability of La2O3/SiO2 layers on Si(001) Applied Physics Letters. 79: 102-104. DOI: 10.1063/1.1383268 |
0.396 |
|
2000 |
Stemmer S, Bai GR, Browning ND, Streiffer SK. Microstructure of epitaxial Pb(Mg1/3Nb2/3)O3–PbTiO3 thin films grown by metalorganic chemical vapor deposition Journal of Applied Physics. 87: 3526-3531. DOI: 10.1063/1.372376 |
0.408 |
|
2000 |
Bai GR, Streiffer SK, Baumann PK, Auciello O, Ghosh K, Stemmer S, Munkholm A, Thompson C, Rao RA, Eom CB. Epitaxial Pb(Mg1/3Nb2/3)O3 thin films synthesized by metal-organic chemical vapor deposition Applied Physics Letters. 76: 3106-3108. DOI: 10.1063/1.126538 |
0.411 |
|
2000 |
Stemmer S, Streiffer SK, Browning ND, Basceri C, Kingon AI. Grain Boundaries in Barium Strontium Titanate Thin Films: Structure, Chemistry and Influence on Electronic Properties Interface Science. 8: 209-221. DOI: 10.1023/A:1008794520909 |
0.401 |
|
2000 |
Stemmer S, Sane A, Browning ND, Mazanec TJ. Characterization of oxygen-deficient SrCoO3-δ by electron energy-loss spectroscopy and Z-contrast imaging Solid State Ionics. 130: 71-80. DOI: 10.1016/S0167-2738(99)00309-4 |
0.345 |
|
2000 |
Stemmer S, Bai GR, Browning ND, Streiffer SK. Microstructure of epitaxial Pb(Mg1/3Nb2/3)O3-PbTiO3 thin films grown by metalorganic chemical vapor deposition Journal of Applied Physics. 87: 3526-3531. |
0.305 |
|
1999 |
Baumann PK, Bai GR, Streiffer SK, Auciello O, Ghosh K, Stemmer S, Munkholm A, Thompson C, Kim D-, Maria J-, Kingon AI. Ferroelectric and Piezoelectric Properties of MOCVD Pb(Mg 1/3 Nb 2/3 )O 3 -PbTiO 3 Epitaxial Thin Films Mrs Proceedings. 596. DOI: 10.1557/Proc-596-517 |
0.398 |
|
1999 |
Browning ND, Kingon AI, Stemmer S, Streiffer SK. Microstructure and nonstoichiometry of barium strontium titanate thin films for dram applications. Mrs Proceedings. 574. DOI: 10.1557/Proc-574-119 |
0.404 |
|
1999 |
Stemmer S, Streiffer SK, Browning ND, Kingon AI. Accommodation Of Nonstoichiometry In (100) Fiber-Textured (Baxsr1-X)Ti1+Yo3+Z Thin Films Grown By Chemical Vapor Deposition Applied Physics Letters. 74: 2432-2434. DOI: 10.1063/1.123871 |
0.391 |
|
1999 |
Zaborac JA, Buban JP, Moltaji HO, Stemmer S, Browning ND. Cation Coordination At Σ Grain Boundaries in TiO2 and SrTiO3, and its Effect on the Local Electronic Properties Microscopy and Microanalysis. 5: 792-793. DOI: 10.1017/S1431927600017281 |
0.306 |
|
1998 |
James EM, Browning ND, Nicholls AW, Kawasaki M, Xin Y, Stemmer S. Demonstration of atomic resolution Z-contrast imaging by a JEOL JEM-2010F scanning transmission electron microscope Journal of Electron Microscopy. 47: 561-574. DOI: 10.1093/Oxfordjournals.Jmicro.A023629 |
0.309 |
|
1998 |
James EM, Browning ND, Nicholls AW, Kawasaki M, Stemmer S, Xin Y, Duscher G. Compositional Imaging At The Sub- 2 Å Level Using A 200 Kv Schottky Field Emission Transmission Electron Microscope Microscopy and Microanalysis. 4: 138-139. DOI: 10.1017/S143192760002081X |
0.311 |
|
1998 |
Stemmer S, Roebben G, Van Der Biest O. Evolution of grain boundary films in liquid phase intered silicon nitride during high-temperature testing Acta Materialia. 46: 5599-5606. DOI: 10.1016/S1359-6454(98)00183-9 |
0.424 |
|
1998 |
Roebben G, Donzel L, Stemmer S, Steen M, Schaller R, Biest OVd. Viscous Energy Dissipation At High Temperatures In Silicon Nitride Acta Materialia. 46: 4711-4723. DOI: 10.1016/S1359-6454(98)00131-1 |
0.358 |
|
1998 |
Stemmer S, Vleugels J, Van Der Biest O. Grain boundary segregation in high-purity, yttria-stabilized tetragonal zirconia polycrystals (Y-TZP) Journal of the European Ceramic Society. 18: 1565-1570. DOI: 10.1016/S0955-2219(98)00078-8 |
0.322 |
|
1997 |
Stemmer S, Duscher G, Scheu C, Heuer AH, Rühle M. The reaction between a TiNi shape memory thin film and silicon Journal of Materials Research. 12: 1734-1740. DOI: 10.1557/Jmr.1997.0239 |
0.381 |
|
1996 |
Stemmer S, Pirouz P, Ikuhara Y, Davis RF. Film/Substrate Orientation Relationship in the AlN/6H-SiC Epitaxial System. Physical Review Letters. 77: 1797-1800. PMID 10063174 DOI: 10.1103/Physrevlett.77.1797 |
0.405 |
|
1996 |
Ernst F, Hofmann D, Nadarzinski K, Schmidt C, Stemmer S, Streiffer SK. Quantitative high-resolution electron microscopy of interfaces Materials Science Forum. 207: 23-34. DOI: 10.4028/Www.Scientific.Net/Msf.207-209.23 |
0.304 |
|
1996 |
Kahn H, Stemmer S, Mullen RL, Huff MA, Heuer AH. Polycrystalline silicon films for microelectromechanical devices Materials Research Society Symposium - Proceedings. 403: 321-326. DOI: 10.1557/Proc-403-321 |
0.389 |
|
1996 |
Chien FR, Ning XJ, Stemmer S, Pirouz P, Bremser MD, Davis RF. Growth defects in GaN films on 6H-SiC substrates Applied Physics Letters. 68: 2678-2680. DOI: 10.1063/1.116279 |
0.419 |
|
1995 |
Stemmer S, Streiffer SK, Hsu WY, Ernst F, Rai R, Rüle M. The influence of Pt and SrTiO3 interlayers on the microstructure of PbTiO3 thin films deposited by laser ablation on (001) MgO Journal of Materials Research. 10: 791-794. DOI: 10.1557/Jmr.1995.0791 |
0.407 |
|
1995 |
Stemmer S, Streiffer SK, Ernst F, Rüuhle M. Atomistic structure of 90° domain walls in ferroelectric PbTiO3 thin films Philosophical Magazine a: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 71: 713-724. DOI: 10.1080/01418619508244477 |
0.333 |
|
1995 |
Stemmer S, Streiffer SK, Ernst F, Rühle M, Hsu WY, Raj R. Domain configurations in ferroelectric PbTiO3 thin films: The influence of substrate and film thickness Solid State Ionics. 75: 43-48. DOI: 10.1016/0167-2738(94)00151-H |
0.428 |
|
1995 |
Stemmer S, Streiffer SK, Ernst F, Rühle M. Dislocations in PbTiO3 thin films Physica Status Solidi (a). 147: 135-154. DOI: 10.1002/Pssa.2211470115 |
0.421 |
|
1995 |
Stemmer S, Streiffer SK, Ernst F, Ruehle M. Dislocations in PbTiO3 thin films Physica Status Solidi (a) Applied Research. 147: 135-154. |
0.313 |
|
1994 |
Bruley J, Stemmer S, Ernst F, Rühle M, Hsu WY, Raj R. Nanostructure and chemistry of a (100)MgO/(100)GaAs interface Applied Physics Letters. 65: 564-566. DOI: 10.1063/1.112296 |
0.458 |
|
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