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Ashish Goel, Ph.D. - Publications

Affiliations: 
2010 Electrical and Computer Engineering Purdue University, West Lafayette, IN, United States 
Area:
Electronics and Electrical Engineering, Nanotechnology, Computer Engineering
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12 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2019 Sarin SK, Choudhury A, Sharma MK, Maiwall R, Al Mahtab M, Rahman S, Saigal S, Saraf N, Soin AS, Devarbhavi H, Kim DJ, Dhiman RK, Duseja A, Taneja S, Eapen CE, ... Goel A, et al. Acute-on-chronic liver failure: consensus recommendations of the Asian Pacific association for the study of the liver (APASL): an update. Hepatology International. PMID 31172417 DOI: 10.1007/s12072-019-09946-3  0.318
2016 Dalela D, Gupta P, Dalela D, Bansal A, Govil T, Goel A, Sankhwar SN. Meatal Occlusive Disease in Adult Males: Are There Any Clinical Variations. Urologia Internationalis. PMID 27160440 DOI: 10.1159/000446221  0.364
2011 Kulkarni JP, Goel A, Ndai P, Roy K. A read-disturb-free, differential sensing 1R/1W Port, 8T bitcell array Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 19: 1727-1730. DOI: 10.1109/Tvlsi.2010.2055169  0.715
2011 Goel A, Gupta SK, Roy K. Asymmetric Drain Spacer Extension (ADSE) FinFETs for Low-Power and Robust SRAMs Ieee Transactions On Electron Devices. 58: 296-308. DOI: 10.1109/Ted.2010.2090421  0.684
2011 Goel A, Ghosh S, Meterelliyoz M, Parkhurst J, Roy K. Integrated design & test: Conquering the conflicting requirements of low-power, variation-tolerance and test cost Proceedings of the Asian Test Symposium. 486-491. DOI: 10.1109/ATS.2011.100  0.728
2010 Li J, Ndai P, Goel A, Salahuddin S, Roy K. Design paradigm for robust spin-torque transfer magnetic RAM (STT MRAM) from circuit/architecture perspective Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 18: 1710-1723. DOI: 10.1109/Tvlsi.2009.2027907  0.767
2010 Ndai P, Goel A, Roy K. A scalable circuit-architecture co-design to improve memory yield for high-performance processors Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 18: 1209-1219. DOI: 10.1109/Tvlsi.2009.2022628  0.772
2010 Meterelliyoz M, Goel A, Kulkarni JP, Roy K. Accurate characterization of random process variations using a robust low-voltage high-sensitivity sensor featuring replica-bias circuit Digest of Technical Papers - Ieee International Solid-State Circuits Conference. 53: 186-187. DOI: 10.1109/ISSCC.2010.5433991  0.735
2010 Moradi F, Augustine C, Goel A, Karakonstantis G, Cao TV, Wisland D, Mahmoodi H, Roy K. Data-dependant sense-amplifier flip-flop for low power applications Proceedings of the Custom Integrated Circuits Conference. DOI: 10.1109/CICC.2010.5617468  0.735
2009 Goel A, Ndai P, Kulkarni JP, Roy K. REad/access-preferred (REAP) SRAM - Architecture-aware bit cell design for improved yield and lower V MIN Proceedings of the Custom Integrated Circuits Conference. 503-506. DOI: 10.1109/CICC.2009.5280794  0.736
2009 Li J, Ndai P, Goel A, Liu H, Roy K. An alternate design paradigm for robust spin-torque transfer magnetic RAM (STT MRAM) from circuit/architecture perspective Proceedings of the Asia and South Pacific Design Automation Conference, Asp-Dac. 841-846. DOI: 10.1109/ASPDAC.2009.4796585  0.769
2007 Datta A, Goel A, Cakici RT, Mahmoodi H, Lekshmanan D, Roy K. Modeling and Circuit Synthesis for Independently Controlled Double Gate FinFET Devices Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 26: 1957-1966. DOI: 10.1109/Tcad.2007.896320  0.689
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