Chakravarthy Gopalan, Ph.D. - Publications

Affiliations: 
2005 Arizona State University, Tempe, AZ, United States 
Area:
Electronics and Electrical Engineering

9 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2014 Gonzalez-Velo Y, Barnaby HJ, Kozicki MN, Gopalan C, Holbert K. Total ionizing dose retention capability of conductive bridging random access memory Ieee Electron Device Letters. 35: 205-207. DOI: 10.1109/Led.2013.2295801  0.51
2011 Gopalan C, Ma Y, Gallo T, Wang J, Runnion E, Saenz J, Koushan F, Blanchard P, Hollmer S. Demonstration of Conductive Bridging Random Access Memory (CBRAM) in logic CMOS process Solid-State Electronics. 58: 54-61. DOI: 10.1016/J.Sse.2010.11.024  0.37
2007 Gopalan C, Kozicki MN, Bhagat S, Puthen Thermadam SC, Alford TL, Mitkova M. Structure of copper-doped tungsten oxide films for solid-state memory Journal of Non-Crystalline Solids. 353: 1844-1848. DOI: 10.1016/J.Jnoncrysol.2007.02.054  0.527
2006 Kozicki MN, Gopalan C, Balakrishnan M, Mitkova M. A low-power nonvolatile switching element based on copper-tungsten oxide solid electrolyte Ieee Transactions On Nanotechnology. 5: 535-544. DOI: 10.1109/Tnano.2006.880407  0.512
2005 Gilbert NE, Gopalan C, Kozicki MN. A macro model of programmable metallization cell devices Solid-State Electronics. 49: 1813-1819. DOI: 10.1016/J.Sse.2005.10.019  0.503
2003 Chakraborty PS, McCartney MR, Li J, Gopalan C, Gilbert M, Goodnick SM, Thornton TJ, Kozicki MN. Electron holographic characterization of ultra-shallow junctions in Si for nanoscale MOSFETs Ieee Transactions On Nanotechnology. 2: 102-109. DOI: 10.1109/Tnano.2003.812586  0.534
2003 Gopalan C, Chakraborty PS, Yang J, Kim T, Wu Z, McCartney MR, Goodnick SM, Kozicki MN, Thornton TJ. Shallow source/drain extensions for deep submicron MOSFETs using spin-on-dopants Ieee Transactions On Electron Devices. 50: 1277-1283. DOI: 10.1109/Ted.2003.813467  0.522
2003 Chakraborty PS, McCartney MR, Li J, Gopalan C, Singisetti U, Goodnick SM, Thornton TJ, Kozicki MN. Electron holographic characterization of nanoscale charge distributions for ultra shallow PN junctions in Si Physica E: Low-Dimensional Systems and Nanostructures. 19: 167-172. DOI: 10.1016/S1386-9477(03)00302-3  0.535
2003 Kozicki MN, Mitkova M, Park M, Balakrishnan M, Gopalan C. Information storage using nanoscale electrodeposition of metal in solid electrolytes Superlattices and Microstructures. 34: 459-465. DOI: 10.1016/J.Spmi.2004.03.042  0.535
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