Ralf K Heilmann

Affiliations: 
Massachusetts Institute of Technology, Cambridge, MA, United States 
Area:
X-ray optics
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"Ralf Heilmann"
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Publications

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Wisniewski HJ, Heilmann RK, Schattenburg ML, et al. (2023) Axial shift mapping: a self-referencing test for measuring the axial figure of near-cylindrical surfaces. Applied Optics. 62: 9307-9316
Chalifoux BD, Heilmann RK, Marshall HL, et al. (2020) Optical design of diffraction-limited x-ray telescopes. Applied Optics. 59: 4901-4914
Chalifoux BD, Yao Y, Woller KB, et al. (2019) Compensating film stress in thin silicon substrates using ion implantation. Optics Express. 27: 11182-11195
Heilmann RK, Kolodziejczak J, Bruccoleri AR, et al. (2019) Demonstration of resolving power λ/Δλ > 10,000 for a space-based x-ray transmission grating spectrometer. Applied Optics. 58: 1223-1238
Yao Y, Chalifoux BD, Heilmann RK, et al. (2019) Thermal oxide patterning method for compensating coating stress in silicon substrates. Optics Express. 27: 1010-1024
Yao Y, Chalifoux BD, Heilmann RK, et al. (2019) Progress of coating stress compensation of silicon mirrors for Lynx x-ray telescope mission concept using thermal oxide patterning method Journal of Astronomical Telescopes, Instruments, and Systems. 5: 1
Chalifoux BD, Yao Y, Heilmann RK, et al. (2019) Simulations of film stress effects on mirror segments for the Lynx X-ray Observatory concept Journal of Astronomical Telescopes, Instruments, and Systems. 5: 1
Günther HM, Heilmann RK. (2019) Lynx soft x-ray critical-angle transmission grating spectrometer Journal of Astronomical Telescopes, Instruments, and Systems. 5: 1
Song J, Heilmann RK, Bruccoleri AR, et al. (2019) Characterizing profile tilt of nanoscale deep-etched gratings via x-ray diffraction Journal of Vacuum Science & Technology B. 37: 062917
Chalifoux BD, Heilmann RK, Schattenburg ML. (2018) Correcting flat mirrors with surface stress: analytical stress fields. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 35: 1705-1716
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