Year |
Citation |
Score |
2021 |
Hatui N, Krishna A, Pasayat SS, Keller S, Mishra UK. Metal Organic Vapor Phase Epitaxy of Thick N-Polar InGaN Films Electronics. 10: 1182. DOI: 10.3390/ELECTRONICS10101182 |
0.339 |
|
2020 |
Romanczyk B, Li W, Guidry M, Hatui N, Krishna A, Wurm C, Keller S, Mishra UK. N-polar GaN-on-Sapphire Deep Recess HEMTs with High W-Band Power Density Ieee Electron Device Letters. 1-1. DOI: 10.1109/Led.2020.3022401 |
0.314 |
|
2020 |
Liu W, Sayed I, Romanczyk B, Hatui N, Guidry M, Mitchell WJ, Keller S, Mishra UK. Ru/N-polar GaN Schottky diode with less than 2 μA/cm2 reverse current Ieee Electron Device Letters. 1-1. DOI: 10.1109/Led.2020.3014524 |
0.308 |
|
2020 |
Shrestha P, Guidry M, Romanczyk B, Hatui N, Wurm C, Krishna A, Pasayat SS, Karnaty RR, Keller S, Buckwalter JF, Mishra UK. High Linearity and High Gain Performance of N-Polar GaN MIS-HEMT at 30 GHz Ieee Electron Device Letters. 41: 681-684. DOI: 10.1109/Led.2020.2980841 |
0.3 |
|
2020 |
Romanczyk B, Mishra UK, Zheng X, Guidry M, Li H, Hatui N, Wurm C, Krishna A, Ahmadi E, Keller S. W-Band Power Performance of SiN-Passivated N-Polar GaN Deep Recess HEMTs Ieee Electron Device Letters. 41: 349-352. DOI: 10.1109/Led.2020.2967034 |
0.351 |
|
2020 |
Raj A, Krishna A, Hatui N, Gupta C, Jang R, Keller S, Mishra UK. Demonstration of a GaN/AlGaN Superlattice-Based p-Channel FinFET With High ON-Current Ieee Electron Device Letters. 41: 220-223. DOI: 10.1109/Led.2019.2963428 |
0.317 |
|
2020 |
Hatui N, Krishna A, Li H, Gupta C, Romanczyk B, Acker-James D, Ahmadi E, Keller S, Mishra UK. Ultra-high silicon doped N-polar GaN contact layers grown by metal-organic chemical vapor deposition Semiconductor Science and Technology. 35: 95002. DOI: 10.1088/1361-6641/Ab9727 |
0.467 |
|
2020 |
Pasayat SS, Hatui N, Li W, Gupta C, Nakamura S, Denbaars SP, Keller S, Mishra UK. Method of growing elastically relaxed crack-free AlGaN on GaN as substrates for ultra-wide bandgap devices using porous GaN Applied Physics Letters. 117: 62102. DOI: 10.1063/5.0017948 |
0.413 |
|
2020 |
Krishna A, Raj A, Hatui N, Sayed I, Keller S, Mishra UK. Proposed existence of acceptor-like traps at positive polarization interfaces in p-type III-nitride semiconductors Applied Physics Letters. 117: 42104. DOI: 10.1063/5.0015290 |
0.375 |
|
2020 |
Wurm C, Ahmadi E, Wu F, Hatui N, Keller S, Speck J, Mishra U. Growth of high-quality N-polar GaN on bulk GaN by plasma-assisted molecular beam epitaxy Solid State Communications. 305: 113763. DOI: 10.1016/J.Ssc.2019.113763 |
0.465 |
|
2019 |
Krishna A, Raj A, Hatui N, Keller S, Mishra UK. Investigation of nitrogen polar p-type doped GaN/AlxGa(1-x)N superlattices for applications in wide-bandgap p-type field effect transistors Applied Physics Letters. 115: 172105. DOI: 10.1063/1.5124326 |
0.404 |
|
2017 |
Lund C, Hestroffer K, Hatui N, Nakamura S, DenBaars SP, Mishra UK, Keller S. Digital growth of thick N-polar InGaN films on relaxed InGaN pseudosubstrates Applied Physics Express. 10: 111001. DOI: 10.7567/Apex.10.111001 |
0.349 |
|
2017 |
Gupta C, Chan SH, Agarwal A, Hatui N, Keller S, Mishra UK. First Demonstration of AlSiO as Gate Dielectric in GaN FETs; Applied to a High Performance OG-FET Ieee Electron Device Letters. 38: 1575-1578. DOI: 10.1109/Led.2017.2756926 |
0.377 |
|
2016 |
Maliakkal CB, Hatui N, Bapat RD, Chalke BA, Rahman AA, Bhattacharya A. The Mechanism of Ni-Assisted GaN Nanowire Growth. Nano Letters. 16: 7632-7638. PMID 27960500 DOI: 10.1021/Acs.Nanolett.6B03604 |
0.773 |
|
2016 |
Maliakkal CB, Rahman AA, Hatui N, Chalke BA, Bapat RD, Bhattacharya A. Comparison of GaN nanowires grown on c-, r- and m-plane sapphire substrates Journal of Crystal Growth. 439: 47-53. DOI: 10.1016/J.Jcrysgro.2015.12.044 |
0.783 |
|
2016 |
Hatui N, Rahman AA, Maliakkal CB, Bhattacharya A. Direct MOVPE growth of semipolar (11 2¯ 2) AlxGa1-xN across the alloy composition range Journal of Crystal Growth. 437: 1-5. DOI: 10.1016/J.Jcrysgro.2015.12.009 |
0.795 |
|
2015 |
Maliakkal CB, Mathew JP, Hatui N, Rahman AA, Deshmukh MM, Bhattacharya A. Fabrication and characterization of GaN nanowire doubly clamped resonators Journal of Applied Physics. 118. DOI: 10.1063/1.4930088 |
0.746 |
|
2015 |
Hatui N, Frentrup M, Rahman AA, Kadir A, Subramanian S, Kneissl M, Bhattacharya A. MOVPE growth of semipolar (112¯2) Al1-xInxN across the alloy composition range (0 ≤ x ≤ 0.55) Journal of Crystal Growth. 411: 106-109. DOI: 10.1016/J.Jcrysgro.2014.11.016 |
0.786 |
|
2013 |
Frentrup M, Hatui N, Wernicke T, Stellmach J, Bhattacharya A, Kneissl M. Determination of lattice parameters, strain state and composition in semipolar III-nitrides using high resolution X-ray diffraction Journal of Applied Physics. 114. DOI: 10.1063/1.4834521 |
0.658 |
|
2013 |
Gupta P, Rahman AA, Hatui N, Parmar JB, Chalke BA, Bapat RD, Purandare SC, Deshmukh MM, Bhattacharya A. Free-standing semipolar III-nitride quantum well structures grown on chemical vapor deposited graphene layers Applied Physics Letters. 103. DOI: 10.1063/1.4827539 |
0.767 |
|
2013 |
Arora A, Hatui N, Bhattacharya A, Ghosh S. Large exciton g-factors in anisotropically strained A-plane GaN film measured using magneto-optical Kerr effect spectroscopy Applied Physics Letters. 103. DOI: 10.1063/1.4817399 |
0.596 |
|
2013 |
Gupta P, Rahman AA, Hatui N, Gokhale MR, Deshmukh MM, Bhattacharya A. MOVPE growth of semipolar III-nitride semiconductors on CVD graphene Journal of Crystal Growth. 372: 105-108. DOI: 10.1016/J.Jcrysgro.2013.03.020 |
0.783 |
|
2012 |
Gupta P, Rahman AA, Hatui N, Gokhale MR, Deshmukh MM, Bhattacharya A. Optoelectronic devices based on III-N quantum wells grown on CVD graphene Photonics. 1-2. DOI: 10.1364/Photonics.2012.W3A.4 |
0.733 |
|
2011 |
Laskar MR, Ganguli T, Rahman AA, Arora A, Hatui N, Gokhale MR, Ghosh S, Bhattacharya A. Anisotropic structural and optical properties of a -plane (11 2- 0) AlInN nearly-lattice-matched to GaN Applied Physics Letters. 98. DOI: 10.1063/1.3583457 |
0.795 |
|
2011 |
Laskar MR, Ganguli T, Rahman AA, Mukherjee A, Hatui N, Gokhale MR, Bhattacharya A. Distorted wurtzite unit cells: Determination of lattice parameters of nonpolar a-plane AlGaN and estimation of solid phase Al content Journal of Applied Physics. 109. DOI: 10.1063/1.3525602 |
0.776 |
|
2011 |
Laskar MR, Ganguli T, Hatui N, Rahman AA, Gokhale MR, Bhattacharya A. High-resolution X-ray diffraction investigations of the microstructure of MOVPE grown a-plane AlGaN epilayers Journal of Crystal Growth. 315: 208-210. DOI: 10.1016/J.Jcrysgro.2010.09.003 |
0.778 |
|
2011 |
Laskar MR, Ganguli T, Kadir A, Hatui N, Rahman AA, Shah AP, Gokhale MR, Bhattacharya A. Influence of buffer layers on the microstructure of MOVPE grown a-plane InN Journal of Crystal Growth. 315: 233-237. DOI: 10.1016/J.Jcrysgro.2010.08.019 |
0.763 |
|
2010 |
Laskar MR, Kadir A, Rahman AA, Shah AP, Hatui N, Gokhale MR, Bhattacharya A. Optimizationof a-plane (11̄2 0) InN grown via MOVPE on a-plane GaN buffer layers on r-plane (1̄1 02) sapphire Journal of Crystal Growth. 312: 2033-2037. DOI: 10.1016/J.Jcrysgro.2010.03.042 |
0.772 |
|
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