| Year |
Citation |
Score |
| 2020 |
Park S, Siahrostami S, Park J, Mostaghimi AHB, Kim TR, Vallez L, Gill TM, Park W, Goodson KE, Sinclair R, Zheng X. Effect of Adventitious Carbon on Pit Formation of Monolayer MoS. Advanced Materials (Deerfield Beach, Fla.). e2003020. PMID 32743836 DOI: 10.1002/Adma.202003020 |
0.308 |
|
| 2018 |
Sinclair R, Liu Y, Lee S, Koh AL. Contributions to High Resolution and In Situ Electron Microscopy. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 24: 10-11. PMID 30498393 DOI: 10.1017/S1431927618000545 |
0.305 |
|
| 2018 |
Kim TR, Phatak C, Petford-Long AK, Liu Y, Taylor C, Zhang B, Myers S, Greene A, Seki T, Alex M, Bertero GA, Sinclair R. Correlative Magnetic Imaging of Heat-Assisted Magnetic Recording Media in Cross Section Using Lorentz TEM and MFM Ieee Transactions On Magnetics. 54: 1-5. DOI: 10.1109/Tmag.2017.2753170 |
0.359 |
|
| 2018 |
MacIsaac C, Schneider JR, Closser RG, Hellstern TR, Bergsman DS, Park J, Liu Y, Sinclair R, Bent SF. Atomic and Molecular Layer Deposition of Hybrid Mo-Thiolate Thin Films with Enhanced Catalytic Activity Advanced Functional Materials. 28: 1800852. DOI: 10.1002/Adfm.201800852 |
0.316 |
|
| 2017 |
Ağaoğulları D, Madsen SJ, Ögüt B, Koh AL, Sinclair R. Synthesis and Characterization of Graphite-Encapsulated Iron Nanoparticles from Ball Milling-Assisted Low-Pressure Chemical Vapor Deposition. Carbon. 124: 170-179. PMID 29434378 DOI: 10.1016/J.Carbon.2017.08.043 |
0.335 |
|
| 2017 |
King LA, Hellstern TR, Park J, Sinclair R, Jaramillo TF. Highly Stable Molybdenum Disulfide Protected Silicon Photocathodes for Photoelectrochemical Water Splitting. Acs Applied Materials & Interfaces. PMID 29035498 DOI: 10.1021/Acsami.7B10749 |
0.307 |
|
| 2017 |
Madsen SJ, Esfandyarpour M, Brongersma ML, Sinclair R. Observing Plasmon Damping Due to Adhesion Layers in Gold Nanostructures Using Electron Energy Loss Spectroscopy. Acs Photonics. 4: 268-274. PMID 28944259 DOI: 10.1021/Acsphotonics.6B00525 |
0.312 |
|
| 2017 |
Sinclair R, Lee SC, Shi Y, Chueh WC. Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy. Ultramicroscopy. PMID 28341554 DOI: 10.1016/J.Ultramic.2017.03.015 |
0.374 |
|
| 2017 |
Narayan TC, Hayee F, Baldi A, Leen Koh A, Sinclair R, Dionne JA. Direct visualization of hydrogen absorption dynamics in individual palladium nanoparticles. Nature Communications. 8: 14020. PMID 28091597 DOI: 10.1038/Ncomms14020 |
0.302 |
|
| 2017 |
Lee M, Choi E, Ma J, Sinclair R, Cruz CD, Zhou H. Magnetic and electric properties of triangular lattice antiferromagnets Ba3ATa2O9 (A= Ni and Co) Materials Research Bulletin. 88: 308-314. DOI: 10.1016/J.Materresbull.2016.12.039 |
0.307 |
|
| 2016 |
Shi Y, Lee SC, Monti M, Wang C, Feng ZA, Nix WD, Toney MF, Sinclair R, Chueh WC. Growth of Highly Strained CeO2 Ultrathin Films. Acs Nano. 10: 9938-9947. PMID 27934073 DOI: 10.1021/Acsnano.6B04081 |
0.367 |
|
| 2016 |
Zhang J, Norris KJ, Gibson G, Zhao D, Samuels K, Zhang MM, Yang JJ, Park J, Sinclair R, Jeon Y, Li Z, Williams RS. Thermally induced crystallization in NbO2 thin films. Scientific Reports. 6: 34294. PMID 27682633 DOI: 10.1038/Srep34294 |
0.363 |
|
| 2016 |
Lee M, Choi ES, Ma J, Sinclair R, Dela Cruz CR, Zhou HD. Magnetism and multiferroicity of an isosceles triangular lattice antiferromagnet Sr3NiNb2O9. Journal of Physics. Condensed Matter : An Institute of Physics Journal. 28: 476004. PMID 27661860 DOI: 10.1088/0953-8984/28/47/476004 |
0.301 |
|
| 2016 |
Narayan TC, Baldi A, Koh AL, Sinclair R, Dionne JA. Reconstructing solute-induced phase transformations within individual nanocrystals. Nature Materials. PMID 27088234 DOI: 10.1038/Nmat4620 |
0.303 |
|
| 2016 |
Koh AL, Wang S, Ataca C, Grossman JC, Sinclair R, Warner JH. Torsional Deformations in Subnanometer MoS Interconnecting Wires. Nano Letters. PMID 26785319 DOI: 10.1021/Acs.Nanolett.5B04507 |
0.315 |
|
| 2015 |
Zhang M, Large N, Koh AL, Cao Y, Manjavacas A, Sinclair R, Nordlander P, Wang SX. High-Density 2D Homo- and Hetero- Plasmonic Dimers with Universal Sub-10-nm Gaps. Acs Nano. PMID 26202803 DOI: 10.1021/Acsnano.5B03090 |
0.311 |
|
| 2015 |
Sinclair R, Ma J, Cao HB, Hong T, Matsuda M, Dun ZL, Zhou HD. Evolution of the magnetic and structural properties of Fe1-xCox V2 O4 Physical Review B - Condensed Matter and Materials Physics. 92. DOI: 10.1103/Physrevb.92.134410 |
0.306 |
|
| 2015 |
Jo PS, Duong DT, Park J, Sinclair R, Salleo A. Control of rubrene polymorphs via polymer binders: Applications in organic field-effect transistors Chemistry of Materials. 27: 3979-3987. DOI: 10.1021/Acs.Chemmater.5B00884 |
0.325 |
|
| 2015 |
Roy Kim T, Hellwig O, Sinclair R. Lorentz Transmission Electron Microscopy for Imaging Magnetic Fields from a Perpendicular Ferromagnetic Stripe Domain Thin Film Microscopy and Microanalysis. 21: 1947-1948. DOI: 10.1017/S143192761501051X |
0.382 |
|
| 2015 |
Ogiit B, Machala ML, Leen Koh A, Sinclair R, Chueh WC. Preliminary Investigations of Chemical & Morphological Inhomogeneities in Laft6 Sro.4CoO3-δ Single-Crystalline Perovskite Thin Films by ACTEM and STEM-EELS Microscopy and Microanalysis. 21: 1055-1056. DOI: 10.1017/S1431927615006078 |
0.323 |
|
| 2014 |
Sinclair R, Kempen PJ, Chin R, Koh AL. The Stanford Nanocharacterization Laboratory (SNL) and Recent Applications of an Aberration-Corrected Environmental Transmission Electron Microscope. Advanced Engineering Materials. 16: 476-481. PMID 25364299 DOI: 10.1002/Adem.201400015 |
0.328 |
|
| 2014 |
Rong Y, Fan Y, Leen Koh A, Robertson AW, He K, Wang S, Tan H, Sinclair R, Warner JH. Controlling sulphur precursor addition for large single crystal domains of WS2. Nanoscale. 6: 12096-103. PMID 25195869 DOI: 10.1039/C4Nr04091K |
0.303 |
|
| 2014 |
Kim TR, Koh AL, Sinclair R. Imaging perpendicular magnetic domains in plan-view using lorentz transmission electron microscopy Microscopy and Microanalysis. 20: 286-287. DOI: 10.1017/S1431927614003158 |
0.385 |
|
| 2014 |
Lee K, Kim J, Mok IS, Na H, Ko DH, Sohn H, Lee S, Sinclair R. RESET-first unipolar resistance switching behavior in annealed Nb 2O5 films Thin Solid Films. 558: 423-429. DOI: 10.1016/J.Tsf.2014.03.003 |
0.341 |
|
| 2013 |
An J, Park JS, Koh AL, Lee HB, Jung HJ, Schoonman J, Sinclair R, Gür TM, Prinz FB. Atomic scale verification of oxide-ion vacancy distribution near a single grain boundary in YSZ. Scientific Reports. 3: 2680. PMID 24042150 DOI: 10.1038/Srep02680 |
0.363 |
|
| 2013 |
Sinclair R, Li H, Madsen S, Dai H. HREM analysis of graphite-encapsulated metallic nanoparticles for possible medical applications. Ultramicroscopy. 134: 167-74. PMID 23809196 DOI: 10.1016/J.Ultramic.2013.05.006 |
0.351 |
|
| 2013 |
Sinclair R. In situ high-resolution transmission electron microscopy of material reactions Mrs Bulletin. 38: 1065-1071. DOI: 10.1557/Mrs.2013.285 |
0.305 |
|
| 2013 |
Wongpiya R, Ouyang J, Roy Kim T, Deal M, Sinclair R, Nishi Y, Clemens B. Amorphous thin film TaWSiC as a diffusion barrier for copper interconnects Applied Physics Letters. 103. DOI: 10.1063/1.4813396 |
0.322 |
|
| 2013 |
Bakke JR, Hägglund C, Jung HJ, Sinclair R, Bent SF. Atomic layer deposition of CdO and CdxZn1-xO films Materials Chemistry and Physics. 140: 465-471. DOI: 10.1016/J.Matchemphys.2013.03.038 |
0.382 |
|
| 2013 |
Usui T, Donnelly CA, Logar M, Sinclair R, Schoonman J, Prinz FB. Approaching the limits of dielectric breakdown for SiO2 films deposited by plasma-enhanced atomic layer deposition Acta Materialia. 61: 7660-7670. DOI: 10.1016/J.Actamat.2013.09.003 |
0.35 |
|
| 2012 |
Hossein-Babaei F, Koh AL, Srinivasan K, Bertero GA, Sinclair R. Aberration-corrected transmission electron microscopy of the intergranular phase in magnetic recording media. Nano Letters. 12: 2595-8. PMID 22519694 DOI: 10.1021/Nl301274X |
0.432 |
|
| 2012 |
Langston MC, Dasgupta NP, Jung HJ, Logar M, Huang Y, Sinclair R, Prinz FB. In situ cycle-by-cycle flash annealing of atomic layer deposited materials Journal of Physical Chemistry C. 116: 24177-24183. DOI: 10.1021/Jp308895E |
0.343 |
|
| 2012 |
Lee W, Jung HJ, Lee MH, Kim YB, Park JS, Sinclair R, Prinz FB. Oxygen surface exchange at grain boundaries of oxide ion conductors Advanced Functional Materials. 22: 965-971. DOI: 10.1002/Adfm.201101996 |
0.38 |
|
| 2011 |
Hossein-Babaei F, Sinclair R, Sinclair RA, Srinivasan K, Bertero GA. Scanning transmission electron microscopy analysis of grain structure in perpendicular magnetic recording media. Nano Letters. 11: 3751-4. PMID 21806054 DOI: 10.1021/Nl201784Z |
0.309 |
|
| 2011 |
Lee J, Li Z, Reifenberg JP, Lee S, Sinclair R, Asheghi M, Goodson KE. Thermal conductivity anisotropy and grain structure in Ge 2Sb2Te5 films Journal of Applied Physics. 109. DOI: 10.1063/1.3573505 |
0.388 |
|
| 2011 |
Bakke JR, Tanskanen JT, Jung HJ, Sinclair R, Bent SF. Atomic layer deposition of CdxZn1-xS films Journal of Materials Chemistry. 21: 743-751. DOI: 10.1039/C0Jm02786C |
0.369 |
|
| 2011 |
Kim YB, Gür TM, Jung HJ, Kang S, Sinclair R, Prinz FB. Effect of crystallinity on proton conductivity in yttrium-doped barium zirconate thin films Solid State Ionics. 198: 39-46. DOI: 10.1016/J.Ssi.2011.07.004 |
0.38 |
|
| 2010 |
Lee W, Dasgupta NP, Jung HJ, Lee JR, Sinclair R, Prinz FB. Scanning tunneling spectroscopy of lead sulfide quantum wells fabricated by atomic layer deposition. Nanotechnology. 21: 485402. PMID 21063050 DOI: 10.1088/0957-4484/21/48/485402 |
0.32 |
|
| 2010 |
Bakke JR, Jung HJ, Tanskanen JT, Sinclair R, Bent SF. Atomic layer deposition of CdS films Chemistry of Materials. 22: 4669-4678. DOI: 10.1021/Cm100874F |
0.364 |
|
| 2010 |
Hossein-Babaei F, Sinclair R. Nanostructural Correlation between Layers in a Magnetic Recording Medium Microscopy and Microanalysis. 16: 1522-1523. DOI: 10.1017/S1431927610062124 |
0.312 |
|
| 2010 |
Bakke JR, King JS, Jung HJ, Sinclair R, Bent SF. Atomic layer deposition of ZnS via in situ production of H2S Thin Solid Films. 518: 5400-5408. DOI: 10.1016/J.Tsf.2010.03.074 |
0.355 |
|
| 2009 |
Wilson RJ, Hu W, Fu CW, Koh AL, Gaster RS, Earhart CM, Fu A, Heilshorn SC, Sinclair R, Wang SX. Formation and properties of magnetic chains for 100 nm nanoparticles used in separations of molecules and cells. Journal of Magnetism and Magnetic Materials. 321: 1452-1458. PMID 20161001 DOI: 10.1016/J.Jmmm.2009.02.066 |
0.303 |
|
| 2009 |
Hu W, Wilson RJ, Earhart CM, Koh AL, Sinclair R, Wang SX. Synthetic antiferromagnetic nanoparticles with tunable susceptibilities. Journal of Applied Physics. 105: 7B508. PMID 19529797 DOI: 10.1063/1.3072028 |
0.304 |
|
| 2008 |
Koh AL, Shachaf CM, Elchuri S, Nolan GP, Sinclair R. Electron microscopy localization and characterization of functionalized composite organic-inorganic SERS nanoparticles on leukemia cells. Ultramicroscopy. 109: 111-21. PMID 18995965 DOI: 10.1016/J.Ultramic.2008.09.004 |
0.307 |
|
| 2008 |
Koh AL, Hu W, Wilson RJ, Wang SX, Sinclair R. TEM analyses of synthetic anti-ferromagnetic (SAF) nanoparticles fabricated using different release layers. Ultramicroscopy. 108: 1490-4. PMID 18672328 DOI: 10.1016/J.Ultramic.2008.03.012 |
0.316 |
|
| 2008 |
Koh A, Hu W, Wilson R, Wang S, Sinclair R. Preparation, structural and magnetic characterization of synthetic anti-ferromagnetic (SAF) nanoparticles Philosophical Magazine. 88: 4225-4241. DOI: 10.1080/14786430802585133 |
0.352 |
|
| 2008 |
Hu W, Wilson RJ, Koh A, Fu A, Faranesh AZ, Earhart CM, Osterfeld SJ, Han SJ, Xu L, Guccione S, Sinclair R, Wang SX. High-moment antiferromagnetic nanoparticles with tunable magnetic properties Advanced Materials. 20: 1479-1483. DOI: 10.1002/Adma.200703077 |
0.31 |
|
| 2007 |
Risner JD, Nolan TP, Bentley J, Girt E, Harkness SD, Sinclair R. Analytical TEM examinations of CoPt-TiO2 perpendicular magnetic recording media. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 13: 70-9. PMID 17367546 DOI: 10.1017/S1431927607070213 |
0.803 |
|
| 2007 |
Nolan TP, Risner JD, Harkness IV SD, Girt E, Wu SZ, Ju G, Sinclair R. Microstructure and exchange coupling of segregated oxide perpendicular recording media Ieee Transactions On Magnetics. 43: 639-644. DOI: 10.1109/Tmag.2006.888208 |
0.803 |
|
| 2007 |
Bentley J, Risner J, Sinclair R. Composition Mapping of Co-Pt-Ti-O Perpendicular Magnetic Recording Media by Simultaneous EDS and EELS Spectrum Imaging Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607078385 |
0.812 |
|
| 2007 |
Park JS, Sinclair R, Rowcliffe D, Stern M, Davidson H. Orientation relationship in diamond and silicon carbide composites Diamond and Related Materials. 16: 562-565. DOI: 10.1016/J.Diamond.2006.11.050 |
0.342 |
|
| 2006 |
Risner JD, Sinclair R, Bentley J. Observation of the effect of grain orientation on chromium segregation in longitudinal magnetic media Journal of Applied Physics. 99. DOI: 10.1063/1.2169873 |
0.802 |
|
| 2006 |
Sinclair R, Risner J, Kwon U. Information Storage Technology: The Role of the TEM Microscopy and Microanalysis. 12: 76-77. DOI: 10.1017/S1431927606068358 |
0.741 |
|
| 2006 |
Park JS, Sinclair R, Rowcliffe D, Stern M, Davidson H. FIB and TEM studies of interface structure in diamond–SiC composites Journal of Materials Science. 41: 4611-4616. DOI: 10.1007/S10853-006-0249-7 |
0.347 |
|
| 2005 |
Sinclair R, Min KH, Kwon U. Application of In Situ HREM to Study Crystallization in Materials Materials Science Forum. 494: 7-12. DOI: 10.4028/Www.Scientific.Net/Msf.494.7 |
0.354 |
|
| 2005 |
Min K-, Sinclair R, Park I-, Kim S-, Chung U-. Crystallization behaviour of ALD-Ta2O5 thin films: the application of in-situ TEM Philosophical Magazine. 85: 2049-2063. DOI: 10.1080/14786430500036546 |
0.374 |
|
| 2005 |
Kwon U, Sinclair R. HRTEM and Nano-probe EDS Studies on the Microstructure of CoCrPtO Perpendicular Recording Media with Ru/Ru-oxide Interlayers Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605509450 |
0.752 |
|
| 2005 |
Risner JD, Nolan TP, Bentley J, Wu SZ, IV SDH, Sinclair R. High-Resolution Analytical TEM and Energy-Filtered Imaging of CoPt-Oxide Perpendicular Magnetic Recording Media Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605502186 |
0.812 |
|
| 2004 |
Cho M, Chang HS, Cho YJ, Moon DW, Min K, Sinclair R, Kang SK, Ko D, Lee JH, Gu JH, Lee NI. Change in the chemical state and thermal stability of HfO2 by the incorporation of Al2O3 Applied Physics Letters. 84: 571-573. DOI: 10.1063/1.1633976 |
0.356 |
|
| 2004 |
Risner JD, Sinclair R, Bentley J. High-resolution and analytical TEM of Cr grain boundary segregation in co-alloy hard disk longitudinal magnetic recording media Microscopy and Microanalysis. 10: 14-15. DOI: 10.1017/S143192760488187X |
0.799 |
|
| 2004 |
Cho M, Chang H, Cho Y, Moon D, Min K, Sinclair R, Kang S, Ko D, Lee J, Gu J, Lee N. Investigation of the chemical state of ultrathin Hf–Al–O films during high temperature annealing Surface Science. 554: L75-L80. DOI: 10.1016/J.Susc.2004.01.058 |
0.353 |
|
| 2004 |
Wittig JE, Sinclair R. Carbide Evolution in Temper Embrittled NiCrMoV Bainitic Steel Steel Research International. 75: 47-54. DOI: 10.1002/Srin.200405926 |
0.618 |
|
| 2003 |
Cho M, Moon DW, Min KH, Sinclair R, Park SA, Kim YK, Jeong K, Kang SK, Ko D. Thermal stability of epitaxial Pt films on Y2O3 in a metal-oxide–Si structure Applied Physics Letters. 83: 4758-4760. DOI: 10.1063/1.1632541 |
0.374 |
|
| 2003 |
Risner J, Kwon U, Sinclair R. Nanoscale Investigation of Composition and Grain Boundary Effects in Magnetic Hard Disk Media Microscopy and Microanalysis. 9: 512-513. DOI: 10.1017/S1431927603442566 |
0.78 |
|
| 2003 |
Risner J, Kwon U, Park DW, Sinclair R. Transmission electron microscopy analysis of computer hard disc, magnetic thin films Materials Chemistry and Physics. 81: 241-243. DOI: 10.1016/S0254-0584(02)00559-X |
0.798 |
|
| 2002 |
Sinclair R, Itoh T, Chin R. In situ TEM studies of metal-carbon reactions. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 8: 288-304. PMID 12533226 DOI: 10.1017/S1431927602020226 |
0.321 |
|
| 2002 |
Sinclair R, Kwon U, Risner JD. TEM Microstructure Studies of Thin Film Magnetic Recording Media Microscopy and Microanalysis. 8: 368-369. DOI: 10.1017/S1431927602100602 |
0.782 |
|
| 2001 |
Wittig JE, Al-Sharab JF, Bentley J, Evans ND, Nolan TP, Sinclair R. Quantitative EFTEM of Cr Grain Boundary Segregation in Cocrta Microscopy and Microanalysis. 7: 298-299. DOI: 10.1017/S1431927600027562 |
0.618 |
|
| 2000 |
Ma K, Sinclair R, Bertero G, Cao W. Grain Size Relationships between the Magnetic Layer and the Underlayers in CoCrPtTa Recording Media Mrs Proceedings. 614. DOI: 10.1557/Proc-614-F3.4.1 |
0.387 |
|
| 2000 |
Park D, Sinclair R, Lal BB, Malhotra SS, Russak MA. Grain size analysis of longitudinal thin film media Journal of Applied Physics. 87: 5687-5689. DOI: 10.1063/1.372490 |
0.675 |
|
| 1999 |
Sinclair R, Park D, Habermeier C, Ma K. Microstructural Characterization of Longitudinal Magnetic Recording Media Mrs Proceedings. 589. DOI: 10.1557/Proc-589-3 |
0.674 |
|
| 1999 |
Mancoff FB, Bobo JF, Richter OE, Bessho K, Johnson PR, Sinclair R, Nix WD, White RL, Clemens BM. Growth and Characterization of Epitaxial NiMnSb/PtMnSb C1b Heusler alloy superlattices Journal of Materials Research. 14: 1560-1569. DOI: 10.1557/Jmr.1999.0209 |
0.381 |
|
| 1999 |
Lee H, Sinclair R, Li P, Roberts B. A study of the failure mechanism of a titanium nitride diffusion barrier Journal of Applied Physics. 86: 3096-3103. DOI: 10.1063/1.371173 |
0.309 |
|
| 1999 |
Ramı́rez AG, Sinclair R. Wear-induced modifications of amorphous carbon in the presence of magnetic media Journal of Applied Physics. 85: 5597-5599. DOI: 10.1063/1.369811 |
0.403 |
|
| 1999 |
Ramírez AG, Itoh T, Sinclair R. Crystallization of amorphous carbon thin films in the presence of magnetic media Journal of Applied Physics. 85: 1508-1513. DOI: 10.1063/1.369334 |
0.398 |
|
| 1999 |
Kwon K, Lee H, Sinclair R. Solid-state amorphization at tetragonal-Ta/Cu interfaces Applied Physics Letters. 75: 935-937. DOI: 10.1063/1.124559 |
0.621 |
|
| 1999 |
Kwon K, Lee H, Sinclair R. Thermal Stability of The Copper/Tantalum Interfaces In Advanced Microelectronic Metallization Microscopy and Microanalysis. 5: 176-177. DOI: 10.1017/S1431927600014203 |
0.593 |
|
| 1999 |
Sinclair R, Tang K. Magnetic Imaging Of Recording Media Microscopy and Microanalysis. 5: 28-29. DOI: 10.1017/S1431927600013465 |
0.309 |
|
| 1999 |
Lee HJ, Kwon KW, Ryu C, Sinclair R. Thermal stability of a Cu/Ta multilayer: An intriguing interfacial reaction Acta Materialia. 47: 3965-3975. DOI: 10.1016/S1359-6454(99)00257-8 |
0.632 |
|
| 1998 |
Wittig J, Nolan T, Sinclair R, Bentley J. Chromium Distribution in CoCrTa/Cr Longitudinal Recording Media Mrs Proceedings. 517. DOI: 10.1557/Proc-517-211 |
0.632 |
|
| 1998 |
Gao C, Wu S, Chen J, Malmhall R, Habermeier C, Sinclair R, Laidler H, O'Grady K. Effects of ultra-high vacuum on crystallographic, recording and magnetic properties of thin film media Ieee Transactions On Magnetics. 34: 1576-1578. DOI: 10.1109/20.706620 |
0.369 |
|
| 1998 |
Wittig J, Nolan T, Ross C, Schabes M, Tang K, Sinclair R, Bentley J. Chromium segregation in CoCrTa/Cr and CoCrPt/Cr thin films for longitudinal recording media Ieee Transactions On Magnetics. 34: 1564-1566. DOI: 10.1109/20.706616 |
0.63 |
|
| 1998 |
Lee H, Sinclair R, Lee M, Lee H. Interfacial reaction in the poly-Si/Ta2O5/TiN capacitor system Journal of Applied Physics. 83: 139-144. DOI: 10.1063/1.366732 |
0.353 |
|
| 1997 |
Chang JJK, Chen Q, Chen G, Sinclair R. Nanoroughness effect on Cr growth mechanism Journal of Applied Physics. 81: 3943-3945. DOI: 10.1063/1.365079 |
0.302 |
|
| 1997 |
Kwon K, Ryu C, Sinclair R, Wong SS. Evidence of heteroepitaxial growth of copper on beta-tantalum Applied Physics Letters. 71: 3069-3071. DOI: 10.1063/1.119439 |
0.649 |
|
| 1997 |
Sinclair R, Tang K, McKinlay SE. Micromagnetic and Microstructure-Property Relationships in Magnetic Recording Media Microscopy and Microanalysis. 3: 513-514. DOI: 10.1017/S1431927600009454 |
0.35 |
|
| 1997 |
Ramirez AG, Sinclair R. Wear effects on microstructural features of amorphous-carbon thin films Surface & Coatings Technology. 549-554. DOI: 10.1016/S0257-8972(97)00464-7 |
0.379 |
|
| 1996 |
Margulies DT, Parker FT, Spada FE, Goldman RS, Li J, Sinclair R, Berkowitz AE. Anomalous moment and anisotropy behavior in Fe3O4 films. Physical Review. B, Condensed Matter. 53: 9175-9187. PMID 9982420 DOI: 10.1103/Physrevb.53.9175 |
0.306 |
|
| 1996 |
Lee H, Sinclair R, Li P, Roberts B. The Failure Mechanism of MOCVD TiN Diffusion Barrier at high Temperature Mrs Proceedings. 428. DOI: 10.1557/Proc-428-279 |
0.344 |
|
| 1996 |
Tanaka H, Hirashita N, Sinclair R. In Situ Observation of the C49-to-C54 Phase Transformation in $\bf TiSi_{2}$ Thin Films by Transmission Electron Microscopy Japanese Journal of Applied Physics. 35: L479-L481. DOI: 10.1143/Jjap.35.L479 |
0.318 |
|
| 1996 |
Chang JJK, Peng Q, Chen Q, Lin Z, Yen E, Chen G, Bertram HN, Sinclair R. Evolution of bicrystal media development Ieee Transactions On Magnetics. 33: 885-890. DOI: 10.1109/20.560126 |
0.366 |
|
| 1996 |
Chang JJK, Peng Q, Bertram HN, Sinclair R. Measurements of crystalline anisotropy on longitudinal media Ieee Transactions On Magnetics. 32: 4902-4904. DOI: 10.1109/20.539282 |
0.336 |
|
| 1996 |
Chen Q, Chang J, Chen G, Sinclair R. Thin film media with and without bicrystal cluster structure on glass ceramic substrates Ieee Transactions On Magnetics. 32: 3599-3601. DOI: 10.1109/20.538702 |
0.327 |
|
| 1996 |
McKinlay S, Fussing N, Sinclair R. Microstructure/magnetic property relationships in CoCrPt magnetic thin films Ieee Transactions On Magnetics. 32: 3587-3589. DOI: 10.1109/20.538698 |
0.442 |
|
| 1996 |
Clark TE, Visokay MR, Zhu N, Sinclair R. Growth of α' nitrogen martensite and feni films using (001)silicon substrates Ieee Transactions On Magnetics. 32: 3503-3505. DOI: 10.1109/20.538671 |
0.324 |
|
| 1996 |
Bailey WE, Zhu N, Sinclair R, Wang SX. Structural comparisons of ion beam and dc magnetron sputtered spin valves by high-resolution transmission electron microscopy Journal of Applied Physics. 79: 6393. DOI: 10.1063/1.362009 |
0.345 |
|
| 1996 |
Li J, Rosenbluem SS, Hayashi H, Sinclair R. Magnetic and structural characteristics of sputtered barium ferrite thin films Journal of Magnetism and Magnetic Materials. 155: 157-160. DOI: 10.1016/0304-8853(95)00683-4 |
0.348 |
|
| 1996 |
Li J, Sinclair R, Rosenblum SS, Hayashi H. As-deposited crystalline barium ferrite thin film media for longitudinal recording Journal of Magnetism and Magnetic Materials. 153: 246-254. DOI: 10.1016/0304-8853(95)00538-2 |
0.359 |
|
| 1996 |
Ishikawa A, Sinclair R. Effects of Pt addition on the magnetic and crystallographic properties of CoCrPt thin-film media Journal of Magnetism and Magnetic Materials. 152: 265-273. DOI: 10.1016/0304-8853(95)00472-6 |
0.358 |
|
| 1995 |
VISOKAY M, LAIRSON B, CLEMENS B, SINCLAIR R. FORMATION OF EPITAXIAL (001) ORDERED FePd FILMS FROM MULTILAYER PRECURSORS Journal of the Magnetics Society of Japan. 19: S1_399-403. DOI: 10.3379/Jmsjmag.19.S1_399 |
0.361 |
|
| 1995 |
OZKAN M, SUZUKI T, MILLER D, KELLOCK A, CHANG C, SINCLAIR R. MICROSTRUCTURAL, MAGNETIC AND MAGNETO-OPTICAL PROPERTIES OF (100) AND (111) ORIENTED THICK “FCC” COBALT SINGLE CRYSTAL Journal of the Magnetics Society of Japan. 19: S1_267-270. DOI: 10.3379/Jmsjmag.19.S1_267 |
0.366 |
|
| 1995 |
BERTERO G, SINCLAIR R. (Pt/Co/Pt)/X MULTILAYER FILMS FOR MAGNETO-OPTIC MEDIA Journal of the Magnetics Society of Japan. 19: S1_201-204. DOI: 10.3379/Jmsjmag.19.S1_201 |
0.304 |
|
| 1995 |
Lee H, Sinclair R, Roberts B, Jackson R. Study of Diffusion Barrier Performance in MOCVD TiN by Transmission Electron Microscopy Mrs Proceedings. 391. DOI: 10.1557/Proc-391-205 |
0.362 |
|
| 1995 |
Visokay M, Sinclair R. Growth and Characterization of Fept Compound thin Films Mrs Proceedings. 384. DOI: 10.1557/Proc-384-91 |
0.377 |
|
| 1995 |
Tang K, Visokay M, Sinclair R, Ross C, Ranjan R, Yamashita T. Observation of Micromagnetic Structure in Computer Hard Disks by Lorentz Transmission Electron Microscopy Mrs Proceedings. 384. DOI: 10.1557/Proc-384-21 |
0.369 |
|
| 1995 |
Itoh T, Sinclair R. In Situ Tem Study of Reactions in Iron/amorphous Carbon Layered Thin Films Mrs Proceedings. 382. DOI: 10.1557/Proc-382-45 |
0.377 |
|
| 1995 |
Zh N, Sinclair R. Tem Study of Crystallization of a-SiC in Contact With Silver Mrs Proceedings. 382. DOI: 10.1557/Proc-382-39 |
0.337 |
|
| 1995 |
Li J, Sinclair R, Rosenblum SS, Hayashi H. Reaction-mediated texturing of barium ferrite magnetic thin films on ZnO underlayer Journal of Materials Research. 10: 2343-2349. DOI: 10.1557/Jmr.1995.2343 |
0.39 |
|
| 1995 |
Konno TJ, Sinclair R. Metal-mediated crystallization of amorphous germanium in germanium-silver layered systems Philosophical Magazine B. 71: 179-199. DOI: 10.1080/01418639508240305 |
0.337 |
|
| 1995 |
Konno TJ, Sinclair R. Metal-mediated crystallization of amorphous silicon in silicon-silver layered systems Philosophical Magazine B. 71: 163-178. DOI: 10.1080/01418639508240304 |
0.312 |
|
| 1995 |
Tanaka H, Konno TJ, Sinclair R, Hirashita N. Interfacial reactions in the Zr–Si system studied byinsitutransmission electron microscopy Journal of Applied Physics. 78: 4982-4987. DOI: 10.1063/1.359789 |
0.354 |
|
| 1995 |
Bertero GA, Sinclair R, Park C, Shen ZX. Interface structure and perpendicular magnetic anisotropy in Pt/Co multilayers Journal of Applied Physics. 77: 3953-3959. DOI: 10.1063/1.358577 |
0.39 |
|
| 1995 |
Visokay MR, Sinclair R. Direct formation of ordered CoPt and FePt compound thin films by sputtering Applied Physics Letters. 66: 1692-1694. DOI: 10.1063/1.113895 |
0.348 |
|
| 1995 |
Konno T, Sinclair R. Crystallization of amorphous carbon in carbon—cobalt layered thin films Acta Metallurgica Et Materialia. 43: 471-484. DOI: 10.1016/0956-7151(94)00289-T |
0.32 |
|
| 1995 |
Nakayama T, Yamamoto K, Satoh H, Konno TJ, Clemens BM, Sinclair R. Structure and corrosion properties of Al/Si and Fe/Zr multilayers Materials Science and Engineering: A. 198: 19-24. DOI: 10.1016/0921-5093(95)80054-X |
0.307 |
|
| 1995 |
Snoeck E, Sinclair R, Parker MA, Hylton TL, Coffey KR, Howard JK, Lessmann A, Bienenstock AI. Microstructural evolution of NiFe/Ag multilayers studied by X-ray diffraction and in situ high-resolution TEM Journal of Magnetism and Magnetic Materials. 151: 24-32. DOI: 10.1016/0304-8853(95)00409-2 |
0.347 |
|
| 1994 |
Sinclair R. Studies of Material Reactions by In Situ High-Resolution Electron Microscopy Mrs Bulletin. 19: 26-31. DOI: 10.1557/S088376940003671X |
0.318 |
|
| 1994 |
Li J, Sinclair R, Rosenblum SS, Hayashi H. Interface Reaction Enhanced Epitaxial Growth of Barium Ferrite Magnetic Thin Films Mrs Proceedings. 357. DOI: 10.1557/Proc-357-165 |
0.399 |
|
| 1994 |
Itoh T, Sinclair R. Nickel Mediated Transformation of Amorphous Carbon to Graphite Mrs Proceedings. 349. DOI: 10.1557/Proc-349-31 |
0.339 |
|
| 1994 |
Visokay MR, Kuwabara M, Saffari H, Hayashi H, Sinclair R, Onishi Y. Effect of Interlayers Upon Texture and Magnetic Properties in Co Alloy Multilayer Films for Longitudinal Magnetic Recording Mrs Proceedings. 343. DOI: 10.1557/Proc-343-381 |
0.425 |
|
| 1994 |
Bertero GA, Sinclair R. On the Perpendicular Magnetic Anisotropy of Pt/Co Multilayers: Structure-Property Relationships Mrs Proceedings. 343. DOI: 10.1557/Proc-343-369 |
0.44 |
|
| 1994 |
Lairson BM, Visokay MR, Sinclair R, Brennan SM, Clemens BM, Perez J, Baldwin C. Atomically Layered Structures for Perpendicular Magnetic Information Storage Mrs Proceedings. 343. DOI: 10.1557/Proc-343-359 |
0.382 |
|
| 1994 |
Ishikawa A, Shiroishi Y, Sinclair R. Effects of Substrate Temperature on Magnetic and Crystallographic Properties of Co-Cr-Pt/Cr Films Deposited by Laser Ablation Mrs Proceedings. 343. DOI: 10.1557/Proc-343-345 |
0.383 |
|
| 1994 |
Nolan TP, Sinclair R, Ranjan R, Yamashita T, Tarnopolsky G, Bennett W. Correlation of Structure and Properties in Thin-Film Magnetic Media Mrs Proceedings. 343. DOI: 10.1557/Proc-343-297 |
0.39 |
|
| 1994 |
Li J, Sinclair R, Rosenblum SS, Hayashi H. Characterization of Sputtered Barium Ferrite Thin Films on Silicon Nitride Coated Carbon Substrates Mrs Proceedings. 341. DOI: 10.1557/Proc-341-59 |
0.416 |
|
| 1994 |
Itoh T, Konno TJ, Sinclair R, Raaijmakers IJ, Roberts BE. Transmission Electron Microscopy of Mocvd Titanium Nitride Films Mrs Proceedings. 337. DOI: 10.1557/Proc-337-735 |
0.391 |
|
| 1994 |
Li J, Sinclair R, Rosenblum SS, Hayashi H. Temperature and orientation effects on the magnetic properties of doped barium ferrite thin films Ieee Transactions On Magnetics. 30: 4050-4052. DOI: 10.1109/20.333986 |
0.363 |
|
| 1994 |
Rosenblum SS, Hayashi H, Li J, Sinclair R. Longitudinal recording performance of sputtered barium ferrite media on a carbon rigid disk substrate Ieee Transactions On Magnetics. 30: 4047-4049. DOI: 10.1109/20.333985 |
0.35 |
|
| 1994 |
Ranjan R, Bennett WR, Tarnopolsky GJ, Yamashita T, Nolan T, Sinclair R. Noise properties and microstructure of oriented CoCrTa/Cr media Journal of Applied Physics. 75: 6144-6146. DOI: 10.1063/1.355436 |
0.316 |
|
| 1994 |
Bertero GA, Sinclair R. (Pt/Co/Pt)/X multilayer films with high Kerr rotations and large perpendicular magnetic anisotropies Applied Physics Letters. 64: 3337-3339. DOI: 10.1063/1.111271 |
0.316 |
|
| 1994 |
Konno T, Sinclair R. Crystallization of co-sputtered amorphous cobalt-carbon alloys Acta Metallurgica Et Materialia. 42: 1231-1247. DOI: 10.1016/0956-7151(94)90140-6 |
0.312 |
|
| 1994 |
Konno TJ, Sinclair R. Metal-contact-induced crystallization of semiconductors Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing. 426-432. DOI: 10.1016/0921-5093(94)90240-2 |
0.363 |
|
| 1994 |
Konno TJ, Sinclair R. Crystallization of co-sputtered amorphous cobaltcarbon alloys: morphology and kinetics of spherulitic growth Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing. 297-302. DOI: 10.1016/0921-5093(94)90214-3 |
0.337 |
|
| 1994 |
Bertero G, Sinclair R. Structure-property correlations in Pt/Co multilayers for magneto-optic recording Journal of Magnetism and Magnetic Materials. 134: 173-184. DOI: 10.1016/0304-8853(94)90089-2 |
0.416 |
|
| 1994 |
Sinclair R, Konno T. In situ HREM: application to metal-mediated crystallization Ultramicroscopy. 56: 225-232. DOI: 10.1016/0304-3991(94)90162-7 |
0.323 |
|
| 1994 |
Ko DH, Sinclair R. In-situ dynamic high-resolution transmission electron microscopy: application to Pt/GaAs interfacial reactions Ultramicroscopy. 54: 166-178. DOI: 10.1016/0304-3991(94)90115-5 |
0.343 |
|
| 1993 |
Lairson BM, Visokay MR, Sinclair R, Clemens BM. PRODUCTION OF C-AXIS ORIENTED PTFE THIN FILMS WITH PERPENDICULAR MAGNETIC ANISOTROPY Journal of the Magnetics Society of Japan. 17: S1_40-43. DOI: 10.3379/Jmsjmag.17.S1_40 |
0.347 |
|
| 1993 |
Visokay M, Lairson B, Clemens B, Sinclair R. TRANSMISSION ELECTRON MICROSCOPY OF EPITAXIAL FE/PT MULTILAYERS Journal of the Magnetics Society of Japan. 17: S1_113-116. DOI: 10.3379/Jmsjmag.17.S1_113 |
0.336 |
|
| 1993 |
Ogawa S, Fair JA, Kouzaki T, Sinclair R, Jones EC, Cheung NW, Fraser DB. Direct Solid State Phase Transformation from Co to Epitaxial CoSi2 in Co / Thin Ti / (100) Si Structure and its Application for Shallow Junction Formation Mrs Proceedings. 320. DOI: 10.1557/Proc-320-355 |
0.345 |
|
| 1993 |
Bertero G, White R, Sinclair R. Magnetic Properties and Crystallography of Selected Co/Pt Multilayers with Rare-Earth Additions Mrs Proceedings. 313. DOI: 10.1557/Proc-313-817 |
0.425 |
|
| 1993 |
Lairson BM, Visokay MR, Sinclair R, Clemens BM. Magnetic and Magneto-Optic Properties of PtFe (001) and PtCo (001) Thin Films Mrs Proceedings. 313. DOI: 10.1557/Proc-313-805 |
0.38 |
|
| 1993 |
Konno TJ, Nakayama T, Clemens BM, Sinclair R. Structure and Magnetic Properties of FE/ZR Multilayer Films Mrs Proceedings. 313. DOI: 10.1557/Proc-313-731 |
0.402 |
|
| 1993 |
Sinclair R, Nolan T, Bertero G, Visokay M. Application of High-Resolution Electron Microscopy to the Study of Magnetic Thin Films and Multilayers Mrs Proceedings. 313. DOI: 10.1557/Proc-313-705 |
0.446 |
|
| 1993 |
Konno TJ, Sinclair R. Crystallization of Amorphous Germanium in a Silver Germanium Layered System Mrs Proceedings. 311. DOI: 10.1557/Proc-311-99 |
0.331 |
|
| 1993 |
Lairson BM, Visokay MR, Brennan SB, Sinclair R, Clemens BM. Structural Properties of Anisotropic PtCo(001) and PtFe(001) Thin Films on MgO(001) Mrs Proceedings. 311. DOI: 10.1557/Proc-311-9 |
0.362 |
|
| 1993 |
Hufnagel T, Bertero G, Sinclair R, Clemens B. Evolution of Gd Thin Film Structure Due to Amorphization by Co Deposition Mrs Proceedings. 311. DOI: 10.1557/Proc-311-73 |
0.385 |
|
| 1993 |
Visokay M, Lairson B, Clemens B, Sinclair R. Transmission Electron Microscopy Study of CoPt(001) and FePt(001) Films Formed from Epitaxial Co/Pt and Fe/Pt Multilayers Mrs Proceedings. 311. DOI: 10.1557/Proc-311-15 |
0.371 |
|
| 1993 |
Bertero G, Hufnagel T, Clemens B, Sinclair R. TEM analysis of Co–Gd and Co–Gd multilayer structures Journal of Materials Research. 8: 771-774. DOI: 10.1557/Jmr.1993.0771 |
0.367 |
|
| 1993 |
Nolan T, Sinclair R, Ranjan R, Yamashita T. Transmission electron microscopic analysis of microstructural features in magnetic recording media Ieee Transactions On Magnetics. 29: 292-299. DOI: 10.1109/20.195585 |
0.445 |
|
| 1993 |
Lairson BM, Visokay MR, Marinero EE, Sinclair R, Clemens BM. Epitaxial tetragonal PtCo (001) thin films with perpendicular magnetic anisotropy Journal of Applied Physics. 74: 1922-1928. DOI: 10.1063/1.354775 |
0.374 |
|
| 1993 |
Nolan TP, Sinclair R, Ranjan R, Yamashita T. Crystallographic orientation of textured CoCrTa/Cr sputtered thin film media for longitudinal recording Journal of Applied Physics. 73: 5117-5124. DOI: 10.1063/1.353785 |
0.443 |
|
| 1993 |
Nolan TP, Sinclair R, Ranjan R, Yamashita T. Effect of microstructural features on media noise in longitudinal recording media Journal of Applied Physics. 73: 5566-5568. DOI: 10.1063/1.353652 |
0.414 |
|
| 1993 |
Lairson BM, Visokay MR, Sinclair R, Clemens BM. Epitaxial PtFe(001) thin films on MgO(001) with perpendicular magnetic anisotropy Applied Physics Letters. 62: 639-641. DOI: 10.1063/1.108880 |
0.382 |
|
| 1993 |
Lairson B, Visokay M, Sinclair R, Clemens B. Epitaxial PtFe and PtCo(001) thin films with perpendicular magnetic anisotropy Journal of Magnetism and Magnetic Materials. 126: 577-579. DOI: 10.1016/0304-8853(93)90691-T |
0.374 |
|
| 1993 |
Bertero G, Sinclair R, White R. Influence of interfacial doping with rare earth elements on the magnetic properties of selected Co/Pt multilayers Journal of Magnetism and Magnetic Materials. 126: 275-278. DOI: 10.1016/0304-8853(93)90600-7 |
0.331 |
|
| 1993 |
Visokay M, Lairson B, Clemens B, Sinclair R. Microstructural analysis of magnetic Fe/Pt multilayer thin films by transmission electron microscopy Journal of Magnetism and Magnetic Materials. 126: 136-140. DOI: 10.1016/0304-8853(93)90564-I |
0.374 |
|
| 1993 |
Yamamoto K, Nakayama T, Satoh H, Konno T, Sinclair R. Annealing effect on structure of Fe/Zr multilayers Journal of Magnetism and Magnetic Materials. 126: 128-130. DOI: 10.1016/0304-8853(93)90562-G |
0.3 |
|
| 1993 |
Sinclair R, Konno T. Annealing of metal-metalloid multilayers studied by in situ electron microscopy Journal of Magnetism and Magnetic Materials. 126: 108-112. DOI: 10.1016/0304-8853(93)90557-I |
0.318 |
|
| 1993 |
Nakayama T, Satoh H, Konno T, Clemens B, Stevenson D, Sinclair R, Hagstrom S. Structure and corrosion properties of Fe/Zr multilayers Journal of Magnetism and Magnetic Materials. 126: 105-107. DOI: 10.1016/0304-8853(93)90556-H |
0.334 |
|
| 1993 |
Sinclair R, Morgiel J, Kirtikar A, Wu I, Chiang A. Direct observation of crystallization in silicon by in situ high-resolution electron microscopy Ultramicroscopy. 51: 41-45. DOI: 10.1016/0304-3991(93)90134-J |
0.34 |
|
| 1993 |
Konno TJ, Sinclair R. Crystallization and decomposition of co-sputtered amorphous silicon-aluminum thin films Materials Chemistry and Physics. 35: 99-113. DOI: 10.1016/0254-0584(93)90183-M |
0.347 |
|
| 1992 |
Kirtikar A, Sinclair R. Reactions at the Titanium-Silicon Interface Studied Using Hot-Stage Tem Mrs Proceedings. 260. DOI: 10.1557/Proc-260-227 |
0.335 |
|
| 1992 |
Niwa M, Matsumoto M, Iwasaki H, Onada M, Sinclair R. SiO2 / Si Interfaces Studied by Scanning Tunneling Microscopy and High Resolution Transmission Electron Microscopy Journal of the Electrochemical Society. 139: 901-906. DOI: 10.1149/1.2069322 |
0.345 |
|
| 1992 |
Konno TJ, Sinclair R. Crystallization of silicon in aluminium/amorphous-silicon multilayers Philosophical Magazine B. 66: 749-765. DOI: 10.1080/13642819208220126 |
0.335 |
|
| 1992 |
Ko DH, Sinclair R. Amorphous phase formation and initial interfacial reactions in the platinum/GaAs system Journal of Applied Physics. 72: 2036-2042. DOI: 10.1063/1.352347 |
0.352 |
|
| 1992 |
Nolan TP, Sinclair R, Beyers R. Modeling of agglomeration in polycrystalline thin films: Application to TiSi2on a silicon substrate Journal of Applied Physics. 71: 720-724. DOI: 10.1063/1.351333 |
0.384 |
|
| 1992 |
Moine P, Delage J, Pelton A, Sinclair R. Structural determination of amorphous NiTi thin films using electron diffraction analysis Acta Metallurgica Et Materialia. 40: 1855-1863. DOI: 10.1016/0956-7151(92)90172-B |
0.354 |
|
| 1992 |
Nolan T, Sinclair R, Ranjan R, Yamashita T. Microstructure and crystallography of textured CoCrTa/Cr recording media Ultramicroscopy. 47: 437-446. DOI: 10.1016/0304-3991(92)90175-J |
0.411 |
|
| 1991 |
Konno TJ, Sinclair R. Crystallization of Amorphous Silicon-Aluminum thin Films: IN-SITU Observation and Thermal Analysis. Mrs Proceedings. 237. DOI: 10.1557/Proc-237-609 |
0.358 |
|
| 1991 |
Konno TJ, Sinclair R. Crystallization of Amorphous Si In Al/Si Multilayers Mrs Proceedings. 230. DOI: 10.1557/Proc-230-189 |
0.303 |
|
| 1991 |
Ogawa S, Kouzaki T, Yoshida T, Sinclair R. Interface microstructure of titanium thin‐film/silicon single‐crystal substrate correlated with electrical barrier heights Journal of Applied Physics. 70: 827-832. DOI: 10.1063/1.349641 |
0.358 |
|
| 1991 |
Ko DH, Sinclair R. Amorphous phase formation in an as-deposited platinum-GaAs interface Applied Physics Letters. 58: 1851-1853. DOI: 10.1063/1.105077 |
0.332 |
|
| 1991 |
Holloway K, Moine P, Delage J, Sinclair R. Structure of an amorphous TiSi alloy formed by thermal reaction Journal of Non-Crystalline Solids. 134: 133-140. DOI: 10.1016/0022-3093(91)90021-W |
0.354 |
|
| 1991 |
Schwartzman AF, Sinclair R. Metastable and equilibrium defect structure of II–VI/GaAs interfaces Journal of Electronic Materials. 20: 805-814. DOI: 10.1007/Bf02665968 |
0.356 |
|
| 1990 |
Clemens BM, Sinclair R. Metastable Phase Formation in Thin Films and Multilayers Mrs Bulletin. 15: 19-28. DOI: 10.1557/S0883769400060425 |
0.405 |
|
| 1990 |
Nolan T, Beyers R, Sinclair R. Evidence for a Grain Boundary Grooving Model of Agglomeration in Polycrystalline Tisi2 Thin Films Mrs Proceedings. 202. DOI: 10.1557/Proc-202-95 |
0.397 |
|
| 1990 |
Kirtikar AS, Morgiel J, Sinclair R, Wu I, Chiang A. An in Situ Hrem Study of Crystal Nucleation in Amorphous Silicon thin Films Mrs Proceedings. 202. DOI: 10.1557/Proc-202-627 |
0.362 |
|
| 1990 |
Holloway K, Moine P, Delage J, Bormann R, Capuano L, Sinclair R. Structure and Thermodynamics of Amorphous Ti-Si Produced by Solid-State Interdiffusion Mrs Proceedings. 187. DOI: 10.1557/Proc-187-71 |
0.341 |
|
| 1990 |
Bhansali A, Raaijmakers I, Sinclair R, Morgan A, Burrow B, Arst M. A Phase Diagram Approach for Predicting Reactions in Al/TiW(-Nitride) Thin-Film Systems Mrs Proceedings. 187. DOI: 10.1557/Proc-187-15 |
0.314 |
|
| 1990 |
Morgiel J, Wu I, Chiang A, Sinclair R. In Situ Hrem Observations of Crystallization in LPCVD Amorphous Silicon Mrs Proceedings. 182. DOI: 10.1557/Proc-182-191 |
0.338 |
|
| 1990 |
Ko D, Sinclair R. Thermodynamic Stability of Ptal Thin Films on GaAs Mrs Proceedings. 181. DOI: 10.1557/Proc-181-333 |
0.361 |
|
| 1990 |
Ogawa S, Kouzaki T, Yoshida T, Sinclair R. Structure of the Ti-Single Crystal Si Interface Mrs Proceedings. 181. DOI: 10.1557/Proc-181-139 |
0.366 |
|
| 1990 |
Niwa M, Onoda M, Matsumoto M, Iwasaki H, Sinclair R. SiO2/Si Interfaces Studied by STM and HRTEM (II) Japanese Journal of Applied Physics. 29: 2665-2670. DOI: 10.1143/Jjap.29.2665 |
0.311 |
|
| 1990 |
Moberly W, Proft J, Duerig T, Sinclair R. Deformation, twinning and thermo-mechanical strengthening of Ti50Ni47Fe3 Acta Metallurgica Et Materialia. 38: 2601-2612. DOI: 10.1016/0956-7151(90)90272-I |
0.332 |
|
| 1990 |
Bhansali AS, Ko DH, Sinclair R. Phase reactions at semiconductor metallization interfaces Journal of Electronic Materials. 19: 1171-1175. DOI: 10.1007/Bf02673329 |
0.314 |
|
| 1989 |
Bhansali A, Sinclair R. Quaternary Phase Equilibria in the Ti-Si-N-O System: Stability of Metallization Layers and Prediction of Thin Film Reactions Mrs Proceedings. 148. DOI: 10.1557/Proc-148-71 |
0.31 |
|
| 1989 |
Kim K, Sinclair R. In-Situannealing Transmission Electron Microscopy(Tem) Study of the Ti/GaAs Interfacial Reactions Mrs Proceedings. 148. DOI: 10.1557/Proc-148-21 |
0.571 |
|
| 1989 |
Sinclair R, Kim KB, Shippou O, Iwasaki H. A High Resolution Electron Microscopy Study of the Fine Structure in a Trench Capacitor Journal of the Electrochemical Society. 136: 511-518. DOI: 10.1149/1.2096672 |
0.311 |
|
| 1989 |
Holloway K, Sinclair R, Nathan M. Amorphous silicide formation by thermal reaction: A comparison of several metal–silicon systems Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 7: 1479-1483. DOI: 10.1116/1.576081 |
0.388 |
|
| 1989 |
Holloway K, Do KB, Sinclair R. Interfacial reactions on annealing molybdenum‐silicon multilayers Journal of Applied Physics. 65: 474-480. DOI: 10.1063/1.343425 |
0.368 |
|
| 1989 |
Ogawa S, Okuda S, Yoshida T, Kouzaki T, Tsukamoto K, Sinclair R. Structure and electrical properties of interfaces between silicon films andn+silicon crystals Journal of Applied Physics. 65: 668-671. DOI: 10.1063/1.343101 |
0.336 |
|
| 1988 |
Kim KB, Kniffin M, Sinclair R, Helms CR. Interfacial reactions in the Ti/GaAs system Journal of Vacuum Science and Technology. 6: 1473-1477. DOI: 10.1116/1.575728 |
0.357 |
|
| 1988 |
Sinclair R, Yamashita T, Parker MA, Kim KB, Holloway K, Schwartzman AF. The development ofin situhigh-resolution electron microscopy Acta Crystallographica Section a Foundations of Crystallography. 44: 965-975. DOI: 10.1107/S0108767388007445 |
0.331 |
|
| 1988 |
Abelson JR, Kim KB, Mercer DE, Helms CR, Sinclair R, Sigmon TW. Disordered intermixing at the platinum:silicon interface demonstrated by high‐resolution cross‐sectional transmission electron microscopy, Auger electron spectroscopy, and MeV ion channeling Journal of Applied Physics. 63: 689-692. DOI: 10.1063/1.340058 |
0.359 |
|
| 1988 |
Holloway K, Sinclair R. High-resolution and in situ tem studies of annealing of Ti-Si multilayers Journal of the Less Common Metals. 140: 139-148. DOI: 10.1016/0022-5088(88)90376-1 |
0.389 |
|
| 1988 |
Moine P, Pelton A, Sinclair R. Structural determination of small amorphous volumes by electron diffraction Journal of Non-Crystalline Solids. 101: 213-222. DOI: 10.1016/0022-3093(88)90156-1 |
0.364 |
|
| 1987 |
Sinclair R, Carim AH, Morgiel J, Bravman JC. Microstructures of Polysilicon Mrs Proceedings. 106. DOI: 10.1557/Proc-106-27 |
0.412 |
|
| 1987 |
Holloway K, Do KB, Sinclair R. In-Situ and High-Resolution Tem Observation of Interfacial Reactions in Metal-Silicon Multilayers Mrs Proceedings. 103. DOI: 10.1557/Proc-103-167 |
0.35 |
|
| 1987 |
Carim AH, Sinclair R. The Evolution of Si / SiO2 Interface Roughness Journal of the Electrochemical Society. 134: 741-746. DOI: 10.1149/1.2100544 |
0.321 |
|
| 1987 |
Carim AH, Dovek MM, Quate CF, Sinclair R, Vorst C. High-resolution electron microscopy and scanning tunneling microscopy of native oxides on silicon Science. 237: 630-633. DOI: 10.1126/Science.237.4815.630 |
0.339 |
|
| 1987 |
Holloway K, Sinclair R. Amorphous Ti‐Si alloy formed by interdiffusion of amorphous Si and crystalline Ti multilayers Journal of Applied Physics. 61: 1359-1364. DOI: 10.1063/1.338114 |
0.367 |
|
| 1987 |
Sinclair R, Parker MA, Kim KB. In situ high-resolution electron microscopy reactions in semiconductors Ultramicroscopy. 23: 383-395. DOI: 10.1016/0304-3991(87)90249-X |
0.335 |
|
| 1986 |
Parker MA, Sinclair R. In Stlo High Resolution Electron Microscopy for Interface Studies Mrs Proceedings. 82. DOI: 10.1557/Proc-82-379 |
0.343 |
|
| 1986 |
Holloway K, Sinclair R. Interfacial Reactions in Titanium - Silicon Multilayers Mrs Proceedings. 77. DOI: 10.1557/Proc-77-357 |
0.359 |
|
| 1986 |
Sinclair R, Parker MA. High-resolution transmission electron microscopy of silicon re-growth at controlled elevated temperatures Nature. 322: 531-533. DOI: 10.1038/322531A0 |
0.337 |
|
| 1985 |
Parker MA, Sigmon TW, Sinclair R. In-Situ High Resolution Transmission Electron Microscopy of Dynamic Events During the Amorphous to Crystalline Phase Transformation in Silicon Mrs Proceedings. 62. DOI: 10.1557/Proc-62-311 |
0.333 |
|
| 1985 |
Pelton R, Moine P, Noack MA, Sinclair R. Crystalline-to-Amorphous Transitions in Ti-Ni Alloys Mrs Proceedings. 62. DOI: 10.1557/Proc-62-291 |
0.354 |
|
| 1985 |
Beyers R, Sinclair R. The Phase Formation Sequence In Titanium-Silicon Thin Films Mrs Proceedings. 54. DOI: 10.1557/Proc-54-43 |
0.367 |
|
| 1985 |
Parker MA, Sinclair R, Sigmon TW. Lattice images of defect‐free silicon on sapphire prepared by ion implantation Applied Physics Letters. 47: 626-628. DOI: 10.1063/1.96094 |
0.325 |
|
| 1985 |
Beyers R, Sinclair R. Metastable phase formation in titanium‐silicon thin films Journal of Applied Physics. 57: 5240-5245. DOI: 10.1063/1.335263 |
0.398 |
|
| 1985 |
Moine P, Rivieri JP, Ruault MO, Chaumont J, Pelton A, Sinclair R. In situ TEM study of martensitic NiTi amorphization by Ni ion implantation Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms. 7: 20-25. DOI: 10.1016/0168-583X(85)90523-3 |
0.329 |
|
| 1985 |
Goo E, Duerig T, Melton K, Sinclair R. Mechanical twinning in Ti50Ni47Fe3 and Ti49Ni51 alloys Acta Metallurgica. 33: 1725-1733. DOI: 10.1016/0001-6160(85)90167-1 |
0.331 |
|
| 1984 |
Bravman JC, Patton GL, Sinclair R, Plummer JD. Morphological Studies of Polysilicon Emitter Contacts Mrs Proceedings. 37. DOI: 10.1557/Proc-37-461 |
0.342 |
|
| 1984 |
Bube RH, Fahrenbruch AL, Huber W, Lee CT, Sinclair R, Thorpe T, Anthony TC, Yamashita T, Fortmann C. Cadmium Telluride Films and Solar Cells Ieee Transactions On Electron Devices. 31: 528-538. DOI: 10.1109/T-Ed.1984.21564 |
0.34 |
|
| 1984 |
Moine P, Goo E, Sinclair R. Thin foil artifacts observed in electron diffraction on A Ti49·5Ni5-·5 alloy Scripta Metallurgica. 18: 1143-1147. DOI: 10.1016/0036-9748(84)90195-9 |
0.332 |
|
| 1984 |
Bravman JC, Sinclair R. The preparation of cross-section specimens for transmission electron microscopy Journal of Electron Microscopy Technique. 1: 53-61. DOI: 10.1002/Jemt.1060010106 |
0.367 |
|
| 1983 |
Beyers R, Sinclair R, Thomas ME. Tem Studies of Cosputtered Tisi 2 Films Containing Excess Silicon. Mrs Proceedings. 25. DOI: 10.1557/Proc-25-601 |
0.34 |
|
| 1983 |
Bravman J, Sinclair R. The Morphology of the Polysilicon - SiO2 Interface Mrs Proceedings. 25. DOI: 10.1557/Proc-25-311 |
0.314 |
|
| 1983 |
MOGHADAM FK, YAMASHITA T, SINCLAIR R, STEVENSON DA. Transmission Electron Microscopy of Annealed ZrO2+8 Mol% Sc2O3 Journal of the American Ceramic Society. 66: 213-216. DOI: 10.1111/J.1151-2916.1983.Tb10020.X |
0.347 |
|
| 1983 |
Bravman J, Sinclair R. Transmission electron microscopy studies of the polycrystalline silicon-SiO2 interface Thin Solid Films. 104: 153-161. DOI: 10.1016/0040-6090(83)90556-4 |
0.399 |
|
| 1983 |
Jayaram V, Sinclair R, Rowcliffe D. Intergranular cracking in WC-6% Co: An application of the von mises criterion Acta Metallurgica. 31: 373-378. DOI: 10.1016/0001-6160(83)90214-6 |
0.308 |
|
| 1982 |
Bravman JC, Sinclair R. Transmission Electron Microscopy Studies of the Polycrystalline Silicon–SiO2 Interface Mrs Proceedings. 18. DOI: 10.1557/Proc-18-153 |
0.408 |
|
| 1982 |
Beyers R, Sinclair R. The Effect of Oxygen in Cosputtered (Titanium + Silicon) Films Mrs Proceedings. 14. DOI: 10.1557/Proc-14-423 |
0.37 |
|
| 1982 |
Moine P, Goo E, Sinclair R. MARTENSITIC TRANSFORMATIONS IN A TiNi THIN FOIL Le Journal De Physique Colloques. 43: C4-243-C4-248. DOI: 10.1051/Jphyscol:1982432 |
0.33 |
|
| 1982 |
Sinclair R, Ponce FA, Yamashita T, Smith DJ, Camps RA, Freeman LA, Erasmus SJ, Nixon WC, Smith KCA, Catto CJD. Dynamic observation of defect annealing in CdTe at lattice resolution Nature. 298: 127-131. DOI: 10.1038/298127A0 |
0.318 |
|
| 1982 |
Thomas G, Mori H, Fujita H, Sinclair R. Electron irradiation induced crystalline amorphous transitions in NiTi alloys Scripta Metallurgica. 16: 589-592. DOI: 10.1016/0036-9748(82)90276-9 |
0.311 |
|
| 1981 |
Sinclair R. Recent Developments in Lattice Imaging of Materials Annual Review of Materials Science. 11: 427-439. DOI: 10.1146/Annurev.Ms.11.080181.002235 |
0.315 |
|
| 1981 |
Chen T, Yamashita T, Sinclair R. The effect of orientation, grain size and polymorphism on magnetic properties of sputtered Co-Re thin film media Ieee Transactions On Magnetics. 17: 3187-3189. DOI: 10.1109/Tmag.1981.1061483 |
0.387 |
|
| 1981 |
Ponce FA, Sinclair R, Bube RH. Native tellurium dioxide layer on cadmium telluride: A high‐resolution electron microscopy study Applied Physics Letters. 39: 951-953. DOI: 10.1063/1.92623 |
0.329 |
|
| 1981 |
Sinclair R, Michal GM, Yamashita T. Metallurgical applications of the 21/2D TEM technique Metallurgical and Materials Transactions A. 12: 1503-1512. DOI: 10.1007/Bf02643697 |
0.332 |
|
| 1980 |
Ponce FA, Yamashita T, Bube RH, Sinclair R. Imaging of Defects in Cadmium Telluride using High Resolution Transmission Electron Microscopy Mrs Proceedings. 2. DOI: 10.1557/Proc-2-503 |
0.307 |
|
| 1980 |
Michal GM, Sinclair R. A quantitative assessment of the capabilities of 2 1/2D microscopy for analysing crystalline solids Philosophical Magazine. 42: 691-704. DOI: 10.1080/01418618008239378 |
0.306 |
|
| 1980 |
Regolini JL, Johnson NM, Sinclair R, Sigmon TW, Gibbons JF. Physical Properties Of Ion-Implanted Sem-Annealed Silicon Laser and Electron Beam Processing of Materials. 297-302. DOI: 10.1016/B978-0-12-746850-1.50046-3 |
0.301 |
|
| 1978 |
Sinclair R, Mohamed HA. Lattice imaging study of a martensite-austenite interface Acta Metallurgica. 26: 623-628. DOI: 10.1016/0001-6160(78)90114-1 |
0.345 |
|
| 1978 |
Wu CK, Sinclair R, Thomas G. Lattice imaging and optical microanalysis of a Cu-Ni-Cr spinodal alloy Metallurgical Transactions A. 9: 381-387. DOI: 10.1007/Bf02646388 |
0.314 |
|
| 1978 |
Sinclair R, Thomas G. Determination of local composition by lattice imaging Metallurgical Transactions A. 9: 373-379. DOI: 10.1007/Bf02646387 |
0.317 |
|
| 1977 |
Sinclair R, Dutkiewicz J. Lattice imaging of the B19 ordering transformation and interfacial structures in Mg3Cd Acta Metallurgica. 25: 235-249. DOI: 10.1016/0001-6160(77)90142-0 |
0.315 |
|
| 1977 |
Thomas G, Sinclair R. Discussion of “an electron diffraction study of short-range order in quenched Ni4Mo alloy” Acta Metallurgica. 25: 231-234. DOI: 10.1016/0001-6160(77)90141-9 |
0.303 |
|
| 1976 |
Sinclair R, Gronsky R, Thomas G. Optical diffraction from lattice images of alloys Acta Metallurgica. 24: 789-796. DOI: 10.1016/0001-6160(76)90045-6 |
0.55 |
|
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