Year |
Citation |
Score |
2021 |
Triet Ho LT, Mukherjee A, Vasileska D, Akis J, Stavro J, Zhao W, Goldan AH. Modeling Dark Current Conduction Mechanisms and Mitigation Techniques in Vertically Stacked Amorphous Selenium-Based Photodetectors. Acs Applied Electronic Materials. 3: 3538-3546. PMID 35600494 DOI: 10.1021/acsaelm.1c00444 |
0.324 |
|
2020 |
Yang C, Fu H, Kumar VN, Fu K, Liu H, Huang X, Yang T, Chen H, Zhou J, Deng X, Montes J, Ponce FA, Vasileska D, Zhao Y. GaN Vertical-Channel Junction Field-Effect Transistors With Regrown p-GaN by MOCVD Ieee Transactions On Electron Devices. 67: 3972-3977. DOI: 10.1109/Ted.2020.3010183 |
0.347 |
|
2020 |
Cheng C, Vasileska D. Static and Transient Simulation of 4H-SiC VDMOS Using Full-Band Monte Carlo Simulation That Includes Real-Space Treatment of the Coulomb Interactions Ieee Transactions On Electron Devices. 67: 3705-3710. DOI: 10.1109/Ted.2020.3007368 |
0.452 |
|
2020 |
Muralidharan P, Leilaeioun MA, Weigand W, Holman ZC, Goodnick SM, Vasileska D. Understanding Transport in Hole Contacts of Silicon Heterojunction Solar Cells by Simulating TLM Structures Ieee Journal of Photovoltaics. 10: 363-371. DOI: 10.1109/Jphotov.2019.2957655 |
0.352 |
|
2020 |
Cheng C, Vasileska D. Electron transport analysis of 4H-SiC with full-band Monte Carlo simulation including real-space Coulomb interactions Journal of Applied Physics. 127: 155702. DOI: 10.1063/1.5144214 |
0.461 |
|
2020 |
Rossetto ACJ, Camargo VVA, Both TH, Vasileska D, Wirth GI. Statistical analysis of the impact of charge traps in p-type MOSFETs via particle-based Monte Carlo device simulations Journal of Computational Electronics. 19: 648-657. DOI: 10.1007/S10825-020-01478-6 |
0.431 |
|
2020 |
Camargo VVA, Rossetto ACJ, Vasileska D, Wirth GI. 3-D Monte Carlo device simulator for variability modeling of p-MOSFETs Journal of Computational Electronics. 19: 668-676. DOI: 10.1007/S10825-020-01461-1 |
0.468 |
|
2019 |
Mohamed M, Raleva K, Ravaioli U, Vasileska D, Aksamija Z. Phonon Dissipation in Nanostructured Semiconductor Devices: Dispersing Heat Is Critical for Continued Integrated Circuit Progress Ieee Nanotechnology Magazine. 13: 6-17. DOI: 10.1109/Mnano.2019.2916114 |
0.625 |
|
2019 |
Shaik AR, Brinkman D, Sankin I, Ringhofer C, Krasikov D, Kang H, Benes B, Vasileska D. PVRD-FASP: A Unified Solver for Modeling Carrier and Defect Transport in Photovoltaic Devices Ieee Journal of Photovoltaics. 9: 1602-1613. DOI: 10.1109/Jphotov.2019.2937238 |
0.331 |
|
2019 |
Kumar VN, Vasileska D. Phonon-limited mobility modeling of gallium nitride nanowires Journal of Applied Physics. 125: 114301. DOI: 10.1063/1.5072759 |
0.389 |
|
2019 |
Muralidharan P, Goodnick SM, Vasileska D. Kinetic Monte Carlo simulation of transport in amorphous silicon passivation layers in silicon heterojunction solar cells Journal of Computational Electronics. 18: 1152-1161. DOI: 10.1007/S10825-019-01379-3 |
0.58 |
|
2018 |
Mukherjee A, Vasileska D, Goldan AH. Hole transport in selenium semiconductors using density functional theory and bulk Monte Carlo Journal of Applied Physics. 124: 235102. DOI: 10.1063/1.5055373 |
0.393 |
|
2017 |
Daugherty R, Vasileska D. Multi-Scale Modeling of Self Heating Effects on Power Consumption in Silicon CMOS Devices Additional Conferences (Device Packaging, Hitec, Hiten, and Cicmt). 2017: 1-22. DOI: 10.4071/2017DPC-TP3_Presentation4 |
0.418 |
|
2017 |
Muralidharan P, Goodnick SM, Vasileska D. Multiscale modeling of transport in silicon heterojunction solar cells Additional Conferences (Device Packaging, Hitec, Hiten, and Cicmt). 2017: 1-15. DOI: 10.4071/2017DPC-THA3_Presentation1 |
0.338 |
|
2017 |
Kannan G, Vasileska D. The impact of surface-roughness scattering on the low-field electron mobility in nano-scale Si MOSFETs Journal of Applied Physics. 122: 114303. DOI: 10.1063/1.5003253 |
0.406 |
|
2016 |
Vasileska D. Modeling self-heating in nanoscale devices Ieee-Nano 2015 - 15th International Conference On Nanotechnology. 200-203. DOI: 10.1109/NANO.2015.7388957 |
0.367 |
|
2016 |
Qazi SS, Shaik AR, Daugherty RL, Laturia A, Vasileska D, Guo X, Bury E, Kaczer B, Raleva K. Multi-scale modeling of self-heating effects in silicon nanoscale devices Ieee-Nano 2015 - 15th International Conference On Nanotechnology. 1461-1464. DOI: 10.1109/NANO.2015.7388916 |
0.366 |
|
2016 |
Vasileska D, Raleva K. Special issue: electrothermal and thermoelectric modeling of nanoscale devices Journal of Computational Electronics. 15: 1-2. DOI: 10.1007/S10825-016-0796-3 |
0.402 |
|
2015 |
Muralidharan P, Vasileska D, Goodnick SM. A Kinetic Monte Carlo Approach to Study Transport in Amorphous Silicon Additional Conferences (Device Packaging, Hitec, Hiten, and Cicmt). 2015: 000743-000758. DOI: 10.4071/2015DPC-tp33 |
0.311 |
|
2015 |
Fang Y, Vasileska D, Honsberg C, Goodnick SM. High temperature InGaN solar cell modeling 2015 Ieee 42nd Photovoltaic Specialist Conference, Pvsc 2015. DOI: 10.1109/PVSC.2015.7356348 |
0.495 |
|
2015 |
Maros A, Gangam S, Fang Y, Smith J, Vasileska D, Goodnick S, Bertoni MI, Honsberg CB. High temperature characterization of GaAs single junction solar cells 2015 Ieee 42nd Photovoltaic Specialist Conference, Pvsc 2015. DOI: 10.1109/PVSC.2015.7356338 |
0.492 |
|
2015 |
Muralidharan P, Vasileska D, Goodnick SM, Bowden S. A Kinetic Monte Carlo approach to study transport in amorphous silicon/crystalline silicon HIT cells 2015 Ieee 42nd Photovoltaic Specialist Conference, Pvsc 2015. DOI: 10.1109/PVSC.2015.7356048 |
0.497 |
|
2015 |
Brinkman D, Guo D, Akis R, Ringhofer C, Sankin I, Fang T, Vasileska D. Self-consistent simulation of CdTe solar cells with active defects Journal of Applied Physics. 118. DOI: 10.1063/1.4927155 |
0.395 |
|
2015 |
Muralidharan P, Vasileska D, Goodnick SM, Bowden S. A kinetic Monte Carlo study of defect assisted transport in silicon heterojunction solar cells Physica Status Solidi (C) Current Topics in Solid State Physics. 12: 1198-1200. DOI: 10.1002/Pssc.201510071 |
0.59 |
|
2014 |
Muralidharan P, Ghosh K, Vasileska D, Goodnick SM. Hot hole transport in a-Si/c-Si heterojunction solar cells 2014 Ieee 40th Photovoltaic Specialist Conference, Pvsc 2014. 2519-2523. DOI: 10.1109/PVSC.2014.6925443 |
0.531 |
|
2014 |
Both TH, Wirth GI, Vasileska D. 1/f noise simulation in MOSFETs under cyclo-stationary conditions using SPICE simulator Journal of Computational Electronics. DOI: 10.1007/S10825-014-0655-Z |
0.312 |
|
2014 |
Qazi S, Raleva K, Vasileska D. Electrical and thermal transport in alternative device technologies International Conference and Exhibition On Device Packaging 2014. 382-385. |
0.373 |
|
2013 |
Nedjalkov M, Selberherr S, Ferry DK, Vasileska D, Dollfus P, Querlioz D, Dimov I, Schwaha P. Physical scales in the Wigner-Boltzmann equation. Annals of Physics. 328: 220-237. PMID 23504194 DOI: 10.1016/J.Aop.2012.10.001 |
0.308 |
|
2013 |
Vasileska D, Klimeck G, Magana A, Goodnick S. Tool-Based Curricula and Visual Learning Electronics. 17: 95-104. DOI: 10.7251/Els1317095V |
0.505 |
|
2013 |
Vasileska D. Modeling thermal effects in nano-devices Microelectronic Engineering. 109: 163-167. DOI: 10.1109/Ted.2008.921263 |
0.458 |
|
2013 |
Muralidharan P, Vasileska D, Goodnick SM. Advanced tunneling models for solar cell applications Conference Record of the Ieee Photovoltaic Specialists Conference. 2113-2117. DOI: 10.1109/PVSC.2013.6744891 |
0.537 |
|
2013 |
Vasileska D. (Invited) Modeling reliability in GaN HEMTs Ieee International Integrated Reliability Workshop Final Report. 32-37. DOI: 10.1109/IIRW.2013.6804150 |
0.357 |
|
2013 |
Nedjalkov M, Schwaha P, Selberherr S, Sellier JM, Vasileska D. Wigner quasi-particle attributes—An asymptotic perspective Applied Physics Letters. 102: 163113. DOI: 10.1063/1.4802931 |
0.352 |
|
2013 |
Padmanabhan B, Vasileska D, Goodnick SM. Current degradation due to electromechanical coupling in GaN HEMT's Microelectronics Journal. 44: 592-597. DOI: 10.1016/J.Mejo.2013.03.009 |
0.719 |
|
2013 |
Raleva K, Vasileska D. The importance of thermal conductivity modeling for simulations of self-heating effects in FD SOI devices Journal of Computational Electronics. 12: 601-610. DOI: 10.1007/S10825-013-0520-5 |
0.428 |
|
2013 |
Padmanabhan B, Vasileska D, Goodnick SM. Reliability concerns due to self-heating effects in GaN HEMTs Journal of Integrated Circuits and Systems. 8: 78-82. |
0.687 |
|
2012 |
Vasileska D, Hossain A, Goodnick SM. The interplay of self-heating effects and static RTF in nanowire transistors 2012 Ieee Silicon Nanoelectronics Workshop, Snw 2012. DOI: 10.1109/SNW.2012.6243294 |
0.6 |
|
2012 |
Padmanabhan B, Vasileska D, Goodnick SM. GaN HEMTs reliability the role of shielding Proceedings of the Ieee Conference On Nanotechnology. DOI: 10.1109/NANO.2012.6322177 |
0.729 |
|
2012 |
Raleva K, Vasileska D, Goodnick SM. Self-heating and current degradation in 25 nm FD SOI devices with (100) and (110) crystallographic orientation 2012 15th International Workshop On Computational Electronics, Iwce 2012. DOI: 10.1109/IWCE.2012.6242855 |
0.592 |
|
2012 |
Padmanabhan B, Vasileska D, Goodnick SM. Reliability of GaN HEMTs: Current degradation in GaN/AlGaN/AlN/GaN HEMT 2012 15th International Workshop On Computational Electronics, Iwce 2012. DOI: 10.1109/IWCE.2012.6242851 |
0.699 |
|
2012 |
Wirth G, Vasileska D, Ashraf N, Brusamarello L, Della Giustina R, Srinivasan P. Compact modeling and simulation of Random Telegraph Noise under non-stationary conditions in the presence of random dopants Microelectronics Reliability. 52: 2955-2961. DOI: 10.1016/J.Microrel.2012.07.011 |
0.817 |
|
2012 |
Vasileska D, Raleva K, Hossain A, Goodnick SM. Current progress in modeling self-heating effects in FD SOI devices and nanowire transistors Journal of Computational Electronics. 11: 238-248. DOI: 10.1007/S10825-012-0404-0 |
0.706 |
|
2012 |
Padmanabhan B, Vasileska D, Goodnick SM. Is self-heating responsible for the current collapse in GaN HEMTs? Journal of Computational Electronics. 11: 129-136. DOI: 10.1007/S10825-012-0385-Z |
0.731 |
|
2012 |
Raleva K, Vasileska D, Hossain A, Yoo SK, Goodnick SM. Study of self-heating effects in SOI and conventional MOSFETs with electro-thermal particle-based device simulator Journal of Computational Electronics. 11: 106-117. DOI: 10.1007/S10825-012-0384-0 |
0.709 |
|
2012 |
Ashraf N, Joshi S, Vasileska D. Impact of channel length and gate width of a n-MOSFET device on the threshold voltage and its fluctuations in presence of random channel dopants and random interface trap: A 3D ensemble Monte Carlo study Technical Proceedings of the 2012 Nsti Nanotechnology Conference and Expo, Nsti-Nanotech 2012. 455-458. |
0.371 |
|
2012 |
Gada ML, Vasileska D, Raleva K, Goodnick SM. Electron drift velocity calculations in bulk silicon using an analytical model for acoustic and optical phonon dispersions Technical Proceedings of the 2012 Nsti Nanotechnology Conference and Expo, Nsti-Nanotech 2012. 712-715. |
0.513 |
|
2011 |
Ashraf N, Vasileska D. Static analysis of random telegraph noise in a 45-nm channel length conventional mosfet device: Threshold voltage and ON-current fluctuations Ieee Transactions On Nanotechnology. 10: 1394-1400. DOI: 10.1109/Tnano.2011.2148726 |
0.806 |
|
2011 |
Lim SH, Allen CR, Ding D, Liu X, Furdyna JK, Vasileska D, Zhang YH. Cascade tunnel diode incorporating InAs/GaSb broken gap interface for multi-junction solar cells Conference Record of the Ieee Photovoltaic Specialists Conference. 000252-000255. DOI: 10.1109/PVSC.2011.6185893 |
0.327 |
|
2011 |
Hossain A, Vasileska D, Goodnick SM. Self-heating and short-range Coulomb interactions due to traps in a 10 nm channel length nanowire transistor Proceedings of the Ieee Conference On Nanotechnology. 1110-1113. DOI: 10.1109/NANO.2011.6144513 |
0.508 |
|
2011 |
Ashraf N, Vasileska D, Wirth G, Purushothaman S. Comparative analysis of mobility and dopant number fluctuations based models for the threshold voltage fluctuations estimation in 45 nm channel length MOSFET devices in the presence of random traps and random dopants Proceedings of the Ieee Conference On Nanotechnology. 492-495. DOI: 10.1109/NANO.2011.6144308 |
0.38 |
|
2011 |
Ashraf N, Vasileska D, Wirth G, Srinivasan P. Accurate model for the threshold voltage fluctuation estimation in 45-nm channel length MOSFET devices in the presence of random traps and random dopants Ieee Electron Device Letters. 32: 1044-1046. DOI: 10.1109/Led.2011.2158287 |
0.814 |
|
2011 |
Padmanabhan B, Vasileska D, Goodnick SM. Modeling reliability of GaN/AlGaN/AlN/GaN HEMT 2011 International Semiconductor Device Research Symposium, Isdrs 2011. DOI: 10.1109/ISDRS.2011.6135165 |
0.677 |
|
2011 |
Raleva K, Vasileska D, Goodnick SM. Self-heating effects in high performance devices Communications in Computer and Information Science. 83: 114-122. DOI: 10.1007/978-3-642-19325-5_12 |
0.563 |
|
2011 |
Vasileska D, Hossain A, Raleva K, Goodnick SM. Is self-heating important in nanowire FETs? Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). 6046: 118-124. DOI: 10.1007/978-3-642-18466-6_13 |
0.301 |
|
2011 |
Raleva K, Vasileska D, Goodnick SM. Modeling thermal effects in fully-depleted SOI devices with arbitrary crystallographic orientation Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). 6046: 103-109. DOI: 10.1007/978-3-642-18466-6_11 |
0.587 |
|
2011 |
Ashraf N, Vasileska D. Comparative analysis of threshold voltage variations in presence of random channel dopants and a single random interface trap for 45 nm n-MOSFET as predicted by ensemble Monte Carlo simulation and existing analytical model expressions Technical Proceedings of the 2011 Nsti Nanotechnology Conference and Expo, Nsti-Nanotech 2011. 2: 145-148. |
0.319 |
|
2011 |
Padmanabhan B, Vasileska D, Goodnick SM. Electromechanical coupling in AlGaN/AlN/GaN HEMT's Technical Proceedings of the 2011 Nsti Nanotechnology Conference and Expo, Nsti-Nanotech 2011. 2: 679-681. |
0.668 |
|
2010 |
Vasileska D, Raleva K, Goodnick SM. Electrothermal studies of FD SOI devices that utilize a new theoretical model for the temperature and thickness dependence of the thermal conductivity Ieee Transactions On Electron Devices. 57: 726-728. DOI: 10.1109/Ted.2009.2039526 |
0.637 |
|
2010 |
Ashok A, Vasileska D, Hartin OL, Goodnick SM. Electrothermal monte carlo simulation of GaN HEMTs including electronelectron interactions Ieee Transactions On Electron Devices. 57: 562-570. DOI: 10.1109/Ted.2009.2038585 |
0.527 |
|
2010 |
Hossain A, Vasileska D, Goodnick SM, Raleva K. Modeling self-heating effects in 10nm channel length nanowire transistors 2010 Silicon Nanoelectronics Workshop, Snw 2010. DOI: 10.1109/SNW.2010.5562566 |
0.573 |
|
2010 |
Vasileska D. Self-heating in SOI nano devices 2010 Ieee Nanotechnology Materials and Devices Conference, Nmdc2010. 389-394. DOI: 10.1109/NMDC.2010.5649608 |
0.377 |
|
2010 |
Ashraf N, Vasileska D. 3D ensemble Monte Carlo device simulations of random trap induced degradation in drain current and in threshold voltage in the presence of random dopant distributions for 45 nm gate length MOSFETs 2010 14th International Workshop On Computational Electronics, Iwce 2010. 231-234. DOI: 10.1109/IWCE.2010.5677974 |
0.322 |
|
2010 |
Vasileska D, Raleva K, Goodnick SM, Aksamija Z, Knezevic I. Thermal modeling of nanodevices 2010 14th International Workshop On Computational Electronics, Iwce 2010. 355-358. DOI: 10.1109/IWCE.2010.5677916 |
0.718 |
|
2010 |
Vasileska D. Computational electronics and 21st century education Aip Conference Proceedings. 1239: 3-11. DOI: 10.1063/1.3459784 |
0.313 |
|
2010 |
Atanassov E, Gurov T, Karaivanova A, Nedjalkov M, Vasileska D, Raleva K. Electron–phonon interaction in nanowires: A Monte Carlo study of the effect of the field Mathematics and Computers in Simulation. 81: 515-521. DOI: 10.1016/J.Matcom.2009.09.006 |
0.41 |
|
2010 |
Camargo VVA, Ashraf N, Brusamarello L, Vasileska D, Wirth G. Impact of RDF and RTS on the performance of SRAM cells Journal of Computational Electronics. 9: 122-127. DOI: 10.1007/S10825-010-0340-9 |
0.792 |
|
2010 |
Vasileska D, Hossain A, Raleva K, Goodnick SM. The role of the source and drain contacts on self-heating effect in nanowire transistors Ecs Transactions. 31: 83-90. DOI: 10.1007/S10825-010-0334-7 |
0.724 |
|
2010 |
Vasileska D, Ashok A, Hartin O, Goodnick SM. Thermal modeling of GaN HEMTs Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). 5910: 451-458. DOI: 10.1007/978-3-642-12535-5_53 |
0.357 |
|
2010 |
Raleva K, Vasileska D, Goodnick SM. The role of the boundary conditions on the current degradation in FD-SOI devices Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). 5910: 427-434. DOI: 10.1007/978-3-642-12535-5_50 |
0.59 |
|
2010 |
Hossain A, Raleva K, Vasileska D, Goodnick SM. Self-heating effects in nanowire transistors Nanotechnology 2010: Electronics, Devices, Fabrication, Mems, Fluidics and Computational - Technical Proceedings of the 2010 Nsti Nanotechnology Conference and Expo, Nsti-Nanotech 2010. 2: 45-48. |
0.537 |
|
2010 |
Vasileska D, Klimeck G, Magana A, Goodnick S. Tool-based curricula and visual learning 9th European Conference On Elearning 2010, Ecel 2010. 643-656. |
0.457 |
|
2009 |
Knezevic I, Ramayya EB, Vasileska D, Goodnick SM. Diffusive transport in quasi-2D and quasi-1D electron systems Journal of Computational and Theoretical Nanoscience. 6: 1725-1753. DOI: 10.1166/Jctn.2009.1240 |
0.704 |
|
2009 |
Vasileska D, Raleva K, Goodnick SM. Thermal effects in fully-depleted SOI devices Ecs Transactions. 23: 337-344. DOI: 10.1149/13183737 |
0.594 |
|
2009 |
Padmanabhan B, Vasileska D, Goodnick SM. Current degradation in GaN HEMTs: Is self-heating responsible? Ecs Transactions. 49: 103-109. DOI: 10.1149/04901.0103ecst |
0.695 |
|
2009 |
Vasileska D, Raleva K, Goodnick SM. Self-heating effects in nanoscale FD SOI devices: The role of the substrate, boundary conditions at various interfaces, and the dielectric material type for the BOX Ieee Transactions On Electron Devices. 56: 3064-3071. DOI: 10.1109/Ted.2009.2032615 |
0.611 |
|
2009 |
Ashok A, Vasileska D, Goodnick SM, Hartin OL. Importance of the gate-dependent polarization charge on the operation of GaN HEMTs Ieee Transactions On Electron Devices. 56: 998-1006. DOI: 10.1109/Ted.2009.2015822 |
0.59 |
|
2009 |
Vasileska D, Raleva K, Goodnick SM. Electro-thermal modeling of nano-scale devices 15th International Workshop On Thermal Investigations of Ics and Systems, Therminic 2009. 195-196. DOI: 10.1109/MIEL.2010.5490455 |
0.569 |
|
2009 |
Vasileska D, Goodnick SM, Raleva K. Self-consistent simulation of heating effects in nanoscale devices Proceedings - 2009 13th International Workshop On Computational Electronics, Iwce 2009. DOI: 10.1109/IWCE.2009.5091146 |
0.58 |
|
2009 |
Ashok A, Vasileska D, Goodnick SM, Hartin O. Bias induced strain effects, short-range electron - Electron interactions and quantum effects in AlGaN/GaN HEMTs Proceedings - 2009 13th International Workshop On Computational Electronics, Iwce 2009. DOI: 10.1109/IWCE.2009.5091087 |
0.54 |
|
2009 |
Padmanabhan B, Ashok A, Vasileska D, Goodnick SM. Modeling GaN HEMTs using thermal particle-based device simulator 2009 International Semiconductor Device Research Symposium, Isdrs '09. DOI: 10.1109/ISDRS.2009.5378113 |
0.692 |
|
2009 |
Vasileska D, Goodnick SM, Raleva K. Modeling self-heating effects in nanoscale SOI devices Journal of Physics: Conference Series. 193. DOI: 10.1088/1742-6596/193/1/012036 |
0.614 |
|
2009 |
Ashok A, Vasileska D, Goodnick SM, Hartin O. Importance of the gate-dependent polarization charge and the electron-electron interactions on the operation of GaN HEMTs Aip Conference Proceedings. 1199: 97-98. DOI: 10.1063/1.3295571 |
0.532 |
|
2009 |
Padmanabhan B, Ashok A, Vasileska D, Zhang YH. Drift diffusion modeling of solar cells Aip Conference Proceedings. 1199: 501-502. DOI: 10.1063/1.3295527 |
0.575 |
|
2009 |
Vasileska D, Raleva K, Goodnick SM. First self-consistent thermal device simulator Aip Conference Proceedings. 1199: 495-496. DOI: 10.1063/1.3295523 |
0.584 |
|
2009 |
Vasileska D, Raleva K, Goodnick SM. Inclusion of phonon dispersion and its influence on electrical characteristic degradation due to heating effects in nanoscale FD-SOI devices Aip Conference Proceedings. 1199: 493-494. DOI: 10.1063/1.3295522 |
0.534 |
|
2009 |
Ng G, Vasileska D, Schroder DK. Calculation of the electron Hall mobility and Hall scattering factor in 6H-SiC Journal of Applied Physics. 106. DOI: 10.1063/1.3212532 |
0.345 |
|
2009 |
Ashraf N, Vasileska D. 1/f Noise: Threshold voltage and ON-current fluctuations in 45 nm device technology due to charged random traps Journal of Computational Electronics. 8: 128-134. DOI: 10.1007/S10825-010-0330-Y |
0.814 |
|
2009 |
Ahmed S, Ringhofer C, Vasileska D. An effective potential approach to modeling 25 nm MOSFET devices Journal of Computational Electronics. 8: 197-200. DOI: 10.1007/S10825-010-0326-7 |
0.466 |
|
2009 |
Vasileska D, Raleva K, Goodnick SM. Electro-thermal modeling of nano-scale devices 15th International Workshop On Thermal Investigations of Ics and Systems, Therminic 2009. 195-196. |
0.333 |
|
2008 |
Vasileska D, Khan HR, Ahmed SS. Modeling Coulomb effects in nanoscale devices Journal of Computational and Theoretical Nanoscience. 5: 1793-1827. DOI: 10.1166/Jctn.2008.901 |
0.468 |
|
2008 |
Vasileska D, Mamaluy D, Khan HR, Raleva K, Goodnick SM. Semiconductor Device Modeling Journal of Computational and Theoretical Nanoscience. 5: 999-1030. DOI: 10.1166/Jctn.2008.2538 |
0.599 |
|
2008 |
Khan HR, Mamaluy D, Vasileska D. Simulation of the impact of process variation on the optimized 10-nm FinFET Ieee Transactions On Electron Devices. 55: 2134-2141. DOI: 10.1109/Ted.2008.925937 |
0.468 |
|
2008 |
Raleva K, Vasileska D, Goodnick SM, Nedjalkov M. Modeling thermal effects in nanodevices Ieee Transactions On Electron Devices. 55: 1306-1316. DOI: 10.1109/TED.2008.921263 |
0.609 |
|
2008 |
Khan HR, Mamaluy D, Vasileska D. Approaching optimal characteristics of 10-nm high-performance devices: A quantum transport simulation study of Si FinFET Ieee Transactions On Electron Devices. 55: 743-753. DOI: 10.1109/Ted.2007.915387 |
0.501 |
|
2008 |
Goodnick SM, Vasileska D, Raleva K. Is dual gate device structure better from thermal perspective? International Conference On Simulation of Semiconductor Processes and Devices, Sispad. 125-128. DOI: 10.1109/SISPAD.2008.4648253 |
0.586 |
|
2008 |
Goodnick SM, Raleva K, Vasileska D. Heating effects in dual-gate devices 2008 8th Ieee Conference On Nanotechnology, Ieee-Nano. 10-13. DOI: 10.1109/NANO.2008.12 |
0.572 |
|
2008 |
Ramayya EB, Vasileska D, Goodnick SM, Knezevic I. Thermoelectric properties of silicon nanowires 2008 8th Ieee Conference On Nanotechnology, Ieee-Nano. 339-342. DOI: 10.1109/NANO.2008.106 |
0.556 |
|
2008 |
Raleva K, Vasileska D, Goodnick SM. Is SOD technology the solution to heating problems in SOI devices? Ieee Electron Device Letters. 29: 621-624. DOI: 10.1109/Led.2008.920756 |
0.621 |
|
2008 |
Ramayya EB, Vasileska D, Goodnick SM, Knezevic I. Electron transport in silicon nanowires: The role of acoustic phonon confinement and surface roughness scattering Journal of Applied Physics. 104. DOI: 10.1063/1.2977758 |
0.693 |
|
2008 |
Vasileska D, Raleva K, Goodnick SM. Modeling heating effects in nanoscale devices: The present and the future Journal of Computational Electronics. 7: 66-93. DOI: 10.1007/S10825-008-0254-Y |
0.622 |
|
2008 |
Khan H, Mamaluy D, Vasileska D. Fully 3D self-consistent quantum transport simulation of Double-gate and Tri-gate 10 nm FinFETs Journal of Computational Electronics. 7: 346-349. DOI: 10.1007/S10825-008-0224-4 |
0.513 |
|
2008 |
Nedjalkov M, Vasileska D. Semi-discrete 2D Wigner-particle approach Journal of Computational Electronics. 7: 222-225. DOI: 10.1007/S10825-008-0197-3 |
0.358 |
|
2008 |
Ramayya EB, Vasileska D, Goodnick SM, Knezevic I. Cross-sectional dependence of electron mobility and lattice thermal conductivity in silicon nanowires Journal of Computational Electronics. 7: 319-323. DOI: 10.1007/s10825-008-0195-5 |
0.656 |
|
2008 |
Khan H, Mamaluy D, Vasileska D. Can silicon FinFETs satisfy ITRS projections for high performance 10 nm devices? Journal of Computational Electronics. 7: 284-287. DOI: 10.1007/S10825-008-0194-6 |
0.487 |
|
2008 |
Raleva K, Vasileska D, Goodnick SM, Dzekov T. Modeling thermal effects in nano-devices Journal of Computational Electronics. 7: 226-230. DOI: 10.1007/s10825-008-0189-3 |
0.585 |
|
2008 |
Nedjalkov M, Kosina H, Vasileska D. Wigner ensemble Monte Carlo: Challenges of 2D nano-device simulation Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). 4818: 139-147. DOI: 10.1007/978-3-540-78827-0_14 |
0.335 |
|
2008 |
Goodnick SM, Raleva K, Vasileska D. Self-consistent thermal electron-phonon simulator for SOI devices Technical Proceedings of the 2008 Nsti Nanotechnology Conference and Trade Show, Nsti-Nanotech, Nanotechnology 2008. 3: 537-540. |
0.609 |
|
2007 |
Nedjalkov M, Vasileska D, Dimov I, Arsov G. Mixed initial-boundary value problem in particle modeling of microelectronic devices Monte Carlo Methods and Applications. 13. DOI: 10.1515/Mcma.2007.017 |
0.352 |
|
2007 |
Khan H, Mamaluy D, Vasileska D. Assessment of the CBR quantum transport simulator on experimentally fabricated nano-FinFET Ecs Transactions. 6: 197-203. DOI: 10.1149/1.2728861 |
0.368 |
|
2007 |
Ramayya EB, Vasileska D, Goodnick SM, Knezevic I. Electronic and thermal properties of silicon nanowires Ecs Transactions. 6: 159-164. DOI: 10.1149/1.2728855 |
0.665 |
|
2007 |
Khan H, Mamaluy D, Vasileska D. Influence of interface roughness on quantum transport in nanoscale FinFET Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 25: 1437-1440. DOI: 10.1116/1.2748414 |
0.485 |
|
2007 |
Ramayya EB, Vasileska D, Goodnick SM, Knezevic I. Electron mobility in silicon nanowires Ieee Transactions On Nanotechnology. 6: 113-117. DOI: 10.1109/Tnano.2006.888521 |
0.63 |
|
2007 |
Khan HR, Mamaluy D, Vasileska D. Quantum transport simulation of experimentally fabricated nano-FinFET Ieee Transactions On Electron Devices. 54: 784-796. DOI: 10.1109/Ted.2007.892353 |
0.509 |
|
2007 |
Khan HR, Mamaluy D, Vasileska D. Modeling FinFETs using non-equilibrium green's function formalism: Influence of interface-roughness on device characteristics 2007 7th Ieee International Conference On Nanotechnology - Ieee-Nano 2007, Proceedings. 695-699. DOI: 10.1109/NANO.2007.4601284 |
0.394 |
|
2007 |
Ashok A, Vasileska D, Hartin O, Goodnick SM. Monte Carlo simulation of GaN n+nn+ diode including intercarrier interactions 2007 7th Ieee International Conference On Nanotechnology - Ieee-Nano 2007, Proceedings. 338-341. DOI: 10.1109/NANO.2007.4601203 |
0.551 |
|
2007 |
Raleva K, Vasileska D, Goodnick SM. The role of the temperature boundary conditions on the gate electrode on the heat distribution in 25 nm FD-SOI MOSFETs with SiO2 and gate-stack (high-k dielectric) as the gate oxide 2007 International Semiconductor Device Research Symposium, Isdrs. DOI: 10.1109/ISDRS.2007.4422323 |
0.48 |
|
2007 |
Yu S, Wang J, Ding D, Johnson S, Vasileska D, Zhang Y. Impact of electronic density of states on electroluminescence refrigeration Solid-State Electronics. 51: 1387-1390. DOI: 10.1016/J.Sse.2007.06.015 |
0.377 |
|
2007 |
Nedjalkov M, Vasileska D, Atanassov E, Palankovski V. Ultrafast Wigner transport in quantum wires Journal of Computational Electronics. 6: 235-238. DOI: 10.1007/S10825-006-0101-Y |
0.399 |
|
2007 |
Khan H, Mamaluy D, Vasileska D. Self-consistent treatment of quantum transport in 10 nm FinFET using Contact Block Reduction (CBR) method Journal of Computational Electronics. 6: 77-80. DOI: 10.1007/S10825-006-0074-X |
0.494 |
|
2007 |
Heitzinger C, Ringhofer C, Ahmed S, Vasileska D. 3D Monte-Carlo device simulations using an effective quantum potential including electron-electron interactions Journal of Computational Electronics. 6: 15-18. DOI: 10.1007/S10825-006-0058-X |
0.46 |
|
2007 |
Khan H, Mamaluy D, Vasileska D. Quantum transport simulation of Si FinFET: Approaching optimal characteristics for 10 nm high performance devices 2007 Nsti Nanotechnology Conference and Trade Show - Nsti Nanotech 2007, Technical Proceedings. 1: 181-184. |
0.411 |
|
2007 |
Vasileska D, Krishnan S, Fischetti M. Examining performance enhancement of p-channel strained-SiGe MOSFET devices Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). 4310: 189-196. |
0.328 |
|
2006 |
Vasileska D, Goodnick SM. Computational electronics Synthesis Lectures On Computational Electromagnetics. 6: 1-216. DOI: 10.2200/S00026ED1V01Y200605CEM006 |
0.544 |
|
2006 |
Vasileska D, Krishnan S, Fischetti MV. Modeling of SiGe devices using a self-consistent full-band device simulator which properly takes into account quantum-mechanical size quantization and mobility enhancement Ecs Transactions. 3: 55-66. DOI: 10.1149/1.2355794 |
0.399 |
|
2006 |
Krishnan S, Fischetti M, Vasileska D. Self-consistent full band two-dimensional Monte Carlo two-dimensional Poisson device solver for modeling SiGe p-channel devices Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 24: 1997-2003. DOI: 10.1116/1.2216718 |
0.63 |
|
2006 |
Nedjalkov M, Vasileska D, Ferry DK, Jacoboni C, Ringhofer C, Dimov I, Palankovski V. Wigner transport models of the electron-phonon kinetics in quantum wires Physical Review B - Condensed Matter and Materials Physics. 74. DOI: 10.1103/Physrevb.74.035311 |
0.545 |
|
2006 |
Khan H, Mamaluy D, Vasileska D. Ballistic quantum-mechanical simulation of 10nm FinFET using CBR method Journal of Physics: Conference Series. 38: 196-199. DOI: 10.1088/1742-6596/38/1/047 |
0.368 |
|
2006 |
Ramayya E, Vasileska D, Goodnick SM, Knezevic I. Electron transport in Si nanowires Journal of Physics: Conference Series. 38: 126-129. DOI: 10.1088/1742-6596/38/1/031 |
0.67 |
|
2006 |
Krishnan S, Vasileska D, Fischetti MV. Modeling p-channel SiGe MOSFETs by taking into account the band-structure and the size quantization effects self-consistently Journal of Computational Electronics. 5: 435-438. DOI: 10.1007/S10825-006-0046-1 |
0.58 |
|
2006 |
Khan HR, Mamaluy D, Vasileska D. Self-consistent quantum mechanical treatment of the ballistic transport in 10 nm FinFET devices using CBR method 2006 Nsti Nanotechnology Conference and Trade Show - Nsti Nanotech 2006 Technical Proceedings. 1: 54-57. |
0.402 |
|
2006 |
Tank K, Vasileska D, Thornton TJ. Study of RF characteristic features of optimized SOI - MESFETs 2006 Nsti Nanotechnology Conference and Trade Show - Nsti Nanotech 2006 Technical Proceedings. 1: 669-672. |
0.352 |
|
2006 |
Ramayya EB, Knezevic I, Vasileska D, Goodnick SM. Electronic properties of silicon nanowires: Confined phonons and surface roughness 2006 6th Ieee Conference On Nanotechnology, Ieee-Nano 2006. 1: 20-22. |
0.592 |
|
2005 |
Vasileska D, Khan HR, Ahmed SS, Ringhofer C, Heitzinger C. Quantum and coulomb effects in nanodevices International Journal of Nanoscience. 4: 305-361. DOI: 10.1142/S0219581X05003164 |
0.481 |
|
2005 |
Khan T, Vasileska D, Thornton TJ. Effect of interface roughness on silicon-on-insulator-metal-semiconductor field-effect transistor mobility and the device low-power high-frequency operation Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 23: 1782-1784. DOI: 10.1116/1.1949220 |
0.491 |
|
2005 |
Ahmed SS, Ringhofer C, Vasileska D. Parameter-free effective potential method for use in particle-based device simulations Ieee Transactions On Nanotechnology. 4: 465-471. DOI: 10.1109/Tnano.2005.851239 |
0.469 |
|
2005 |
Khan T, Vasileska D, Thornton TJ. Subthreshold electron mobility in SOI MOSFETs and MESFETs Ieee Transactions On Electron Devices. 52: 1622-1626. DOI: 10.1109/Ted.2005.850617 |
0.484 |
|
2005 |
Vasileska D, Ahmed SS. Narrow-width SOI devices: The role of quantum-mechanical size quantization effect and unintentional doping the device operation Ieee Transactions On Electron Devices. 52: 227-236. DOI: 10.1109/Ted.2004.842715 |
0.487 |
|
2005 |
Krishnan S, Vasileska D, Fischetti MV. Simulation of hole transport in p-channel Si MOSFETs Device Research Conference - Conference Digest, Drc. 2005: 91-92. DOI: 10.1109/DRC.2005.1553070 |
0.32 |
|
2005 |
Mamaluy D, Vasileska D, Sabathil M, Zibold T, Vogl P. Contact block reduction method for ballistic transport and carrier densities of open nanostructures Physical Review B. 71. DOI: 10.1103/Physrevb.71.245321 |
0.431 |
|
2005 |
Ashok A, Akis R, Vasileska D, Ferry DK. Spin polarization in GaAs/Al0.24Ga0.76As heterostructures Molecular Simulation. 31: 797-800. DOI: 10.1080/08927020500283800 |
0.502 |
|
2005 |
Krishnan S, Vasileska D, Fischetti MV. Hole transport in p-channel Si MOSFETs Microelectronics Journal. 36: 323-326. DOI: 10.1016/J.Mejo.2005.02.111 |
0.597 |
|
2005 |
Ashok A, Akis R, Vasileska D, Ferry DK. Spontaneous spin polarization in GaAs/AlGaAs split-gate heterostructures Microelectronics Journal. 36: 460-462. DOI: 10.1016/J.Mejo.2005.02.089 |
0.51 |
|
2005 |
Ahmed SS, Vasileska D, Heitzinger C, Ringhofer C. Quantum potential approach to modeling nanoscale MOSFETs Journal of Computational Electronics. 4: 57-61. DOI: 10.1007/s10825-005-7107-8 |
0.307 |
|
2005 |
Krishnan S, Vasileska D, Fischetti MV. Band-structure and quantum effects on hole transport in p-MOSFETs Journal of Computational Electronics. 4: 27-30. DOI: 10.1007/S10825-005-7101-1 |
0.597 |
|
2005 |
Ahmed SS, Ringhofer C, Vasileska D. Efficacy of the thermalized effective potential approach for modeling nano-devices International Conference On Simulation of Semiconductor Processes and Devices, Sispad. 2005: 251-254. |
0.371 |
|
2005 |
Khan T, Vasileska D, Thornton TJ. Study of cutoff frequency calculation in the subthreshold regime of operation of the SOI - MESFETs 2005 Nsti Nanotechnology Conference and Trade Show - Nsti Nanotech 2005 Technical Proceedings. 150-152. |
0.348 |
|
2005 |
Khan H, Ahmed SS, Vasileska D. Examination of the effects of unintentional doping on the operation of FinFETs with monte carlo simulation integrated with Fast Multipole Method (FMM) 2005 Nsti Nanotechnology Conference and Trade Show - Nsti Nanotech 2005 Technical Proceedings. 41-44. |
0.382 |
|
2004 |
Vasileska D, Ahmed SS. Monte Carlo simulation of narrow-width SOI devices: Incorporation of the short range Coulomb interaction Monte Carlo Methods and Applications. 10: 629-640. DOI: 10.1515/Mcma.2004.10.3-4.629 |
0.501 |
|
2004 |
Khan T, Vasileska D, Thornton TJ. Treatment of interface roughness in SOI-MESFETs Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 22: 2110-2112. DOI: 10.1116/1.1768194 |
0.47 |
|
2004 |
Goodnick SM, Saraniti M, Vasileska D, Aboud S. Particle-based methods in computational electronics Ieee Potentials. 23: 12-16. DOI: 10.1109/Mp.2004.1301239 |
0.427 |
|
2004 |
Ahmed SS, Vasileska D. Modeling of narrow-width SOI devices: The impact of quantum mechanical size quantization effects and unintentional doping on device operation Device Research Conference - Conference Digest, Drc. 117-118. DOI: 10.1109/DRC.2004.1367811 |
0.416 |
|
2004 |
Khan T, Vasileska D, Thornton TJ. Study of subthreshold electron mobility behavior in SOI - MESFETs Device Research Conference - Conference Digest, Drc. 61-62. DOI: 10.1109/DRC.2004.1367783 |
0.378 |
|
2004 |
Ahmed SS, Vasileska D. Modelling of narrow-width SOI devices Semiconductor Science and Technology. 19. DOI: 10.1088/0268-1242/19/4/046 |
0.501 |
|
2004 |
Mamaluy D, Mannargudi A, Vasileska D, Sabathil M, Vogl P. Contact block reduction method and its application to a 10 nm MOSFET device Semiconductor Science and Technology. 19: S118-S121. DOI: 10.1088/0268-1242/19/4/042 |
0.467 |
|
2004 |
Mamaluy D, Mannargudi A, Vasileska D. Electron density calculation using the contact block reduction method Journal of Computational Electronics. 3: 45-50. DOI: 10.1023/B:Jcel.0000029455.15886.Cb |
0.424 |
|
2004 |
Ashok A, Akis R, Vasileska D, Ferry DK. Theoretical evidence of spontaneous spin polarization in GaAs/AlGaAs split-gate heterostructures 2004 10th International Workshop On Computational Electronics, Ieee Iwce-10 2004, Abstracts. 255-256. DOI: 10.1007/s10825-005-7122-9 |
0.454 |
|
2004 |
Zorman B, Krishnan S, Vasileska D, Xu J, Van Schilfgaarde M. A First Principles Alloy Scattering Approach for Monte Carlo Hole Mobility Calculations Journal of Computational Electronics. 3: 351-354. DOI: 10.1007/S10825-004-7075-4 |
0.566 |
|
2004 |
Khan HR, Vasileska D, Ahmed SS, Ringhofer C, Heitzinger C. Modeling of FinFET: 3D MC simulation using FMM and unintentional doping effects on device operation Journal of Computational Electronics. 3: 337-340. DOI: 10.1007/S10825-004-7072-7 |
0.469 |
|
2004 |
Vasileska D, Ahmed SS. How quantum effects and unintentional doping affect the threshold voltage of narrow-width SOI devices 2004 4th Ieee Conference On Nanotechnology. 340-342. |
0.42 |
|
2004 |
Ahmed SS, Ringhofer C, Vasileska D. Quantum potential approach to modeling nano-MOSFETs 2004 10th International Workshop On Computational Electronics, Ieee Iwce-10 2004, Abstracts. 213-214. |
0.301 |
|
2003 |
Ringhofer C, Gardner C, Vasileska D. Effective potentials and quantum fluid models: A thermodynamic approach International Journal of High Speed Electronics and Systems. 13: 771-801. DOI: 10.1142/S0129156403002022 |
0.403 |
|
2003 |
Prasad C, Ferry DK, Vasileska D, Wieder HH. Electron heating measurements in an In0.52Al 0.48As/in0.53Ga0.47As/In0.52Al 0.48As heterostructure system Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 21: 1936-1939. DOI: 10.1116/1.1588644 |
0.742 |
|
2003 |
Vasileska D, Prasad C, Wieder HH, Ferry DK. Green's function approach for transport calculation in a In 0.53Ga0.47As/In0.52Al0.48As modulation-doped heterostructure Physica Status Solidi (B) Basic Research. 239: 103-109. DOI: 10.1116/1.1588643 |
0.769 |
|
2003 |
Vasileska D, Prasad C, Wieder HH, Ferry DK. Green's function approach for transport calculation in a In0.53Ga0.47As/In0.52Al0.48As modulation-doped heterostructure Journal of Applied Physics. 93: 3359-3363. DOI: 10.1063/1.1555279 |
0.445 |
|
2003 |
Krishnan S, Vasileska D. Self-Consistent Subband Structure and Mobility of Two Dimensional Holes in Strained SiGe MOSFETs Journal of Computational Electronics. 2: 443-448. DOI: 10.1023/B:Jcel.0000011468.64475.94 |
0.58 |
|
2003 |
Ahmed SS, Vasileska D. Threshold voltage shifts in narrow-width SOI devices due to quantum mechanical size-quantization effects Physica E: Low-Dimensional Systems and Nanostructures. 19: 48-52. DOI: 10.1016/S1386-9477(03)00328-X |
0.486 |
|
2003 |
Prasad C, Ferry DK, Vasileska D, Wieder HH. Electron-phonon interaction studies in an In0.52Al 0.48As/In0.53Ga0.47As/In0.52Al 0.48As quantum well structure Physica E: Low-Dimensional Systems and Nanostructures. 19: 215-220. DOI: 10.1016/S1386-9477(03)00319-9 |
0.722 |
|
2003 |
Mannargudi A, Vasileska D. Quantum confinements in highly asymmetric sub-micrometer device structures Superlattices and Microstructures. 34: 347-354. DOI: 10.1016/J.Spmi.2004.03.024 |
0.503 |
|
2003 |
Tarik K, Vasileska D, Thornton TJ. Quantum mechanical tunneling phenomena in metal-semiconductor junctions Superlattices and Microstructures. 34: 335-339. DOI: 10.1016/J.Spmi.2004.03.022 |
0.469 |
|
2003 |
Ringhofer C, Ahmed SS, Vasileska D. Effective potential approach to modeling of 25 nm MOSFET devices Superlattices and Microstructures. 34: 311-317. DOI: 10.1016/J.Spmi.2004.03.021 |
0.474 |
|
2003 |
Mannargudi A, Vasileska D. Monte Carlo and energy balance simulations of deep sub-micrometer conventional and asymmetric MOSFET device structures 2003 Nanotechnology Conference and Trade Show - Nanotech 2003. 2: 1-4. |
0.372 |
|
2002 |
Knezevic I, Vasileska DZ, Ferry DK. Impact of strong quantum confinement on the performance of a highly asymmetric device structure: Monte Carlo particle-based simulation of a focused-ion-beam MOSFET Ieee Transactions On Electron Devices. 49: 1019-1026. DOI: 10.1109/Ted.2002.1003723 |
0.706 |
|
2002 |
Ahmed SS, Vasileska D. Narrow-width SOI devices the role of quantum mechanical space-quantization effects on device performance Proceedings of the Ieee Conference On Nanotechnology. 2002: 243-246. DOI: 10.1109/NANO.2002.1032238 |
0.401 |
|
2002 |
Formicone G, Saraniti M, Vasileska D, Ferry D. Study of a 50 nm nMOSFET by ensemble Monte Carlo simulation including a new approach to surface roughness and impurity scattering in the Si inversion layer Ieee Transactions On Electron Devices. 49: 125-132. DOI: 10.1109/16.974759 |
0.536 |
|
2002 |
Akis R, Vasileska D, Ferry DK. Adiabatic switching in coupled quantum dot systems facilitated by the coexistence of "molecular" and "atomic" states Applied Physics Letters. 80: 4440-4442. DOI: 10.1063/1.1485102 |
0.549 |
|
2002 |
Gross WJ, Vasileska D, Ferry DK. Three-dimensional simulations of ultrasmall metal-oxide-semiconductor field-effect transistors: The role of the discrete impurities on the device terminal characteristics Journal of Applied Physics. 91: 3737-3740. DOI: 10.1063/1.1453510 |
0.594 |
|
2002 |
Vasileska D, Knezevic I, Akis R, Ahmed S, Ferry D. Journal of Computational Electronics. 1: 453-465. DOI: 10.1023/A:1022980703489 |
0.743 |
|
2002 |
Speyer G, Vasileska D, Goodnick S. Journal of Computational Electronics. 1: 359-363. DOI: 10.1023/A:1020747508122 |
0.673 |
|
2002 |
Knezevic I, Vasileska D, He X, Schroder D, Ferry D. Journal of Computational Electronics. 1: 273-277. DOI: 10.1023/A:1020702314057 |
0.724 |
|
2002 |
Knezevic I, Vasileska D, Akis R, Kang J, He X, Schroder DK. Monte Carlo particle-based simulation of FIBMOS: Impact of strong quantum confinement on device performance Physica B: Condensed Matter. 314: 386-390. DOI: 10.1016/S0921-4526(01)01427-2 |
0.651 |
|
2002 |
Vasileska D, Akis R, Knezevic I, Miličič SN, Ahmed SS, Ferry DK. Role of quantization effects in the operation of ultrasmall MOSFETs and SOI device structures Microelectronic Engineering. 63: 233-240. DOI: 10.1016/S0167-9317(02)00630-5 |
0.664 |
|
2002 |
Vasileska D. The role of quantization effects on the operation of 50 nm MOSFET and 250 nm FIBMOS devices Physica Status Solidi (B) Basic Research. 233: 127-133. DOI: 10.1002/1521-3951(200209)233:1<127::Aid-Pssb127>3.0.Co;2-R |
0.481 |
|
2002 |
Vasileska D, Knezevic I, Akis R, Ferry DK. The role of quantization effects on the operation of 50 nm MOSFET and 250 nm FIBMOS dvice 2002 International Conference On Modeling and Simulation of Microsystems - Msm 2002. 556-559. |
0.633 |
|
2002 |
Ahmed SS, Akis R, Vasileska D. Quantum effects in SOI devices 2002 International Conference On Modeling and Simulation of Microsystems - Msm 2002. 518-521. |
0.4 |
|
2001 |
Gross WJ, Vasileska D, Ferry DK. Ultra-small MOSFETs: The importance of the full Coulomb interaction on device characteristics Vlsi Design. 13: 75-78. DOI: 10.1155/2001/78780 |
0.574 |
|
2001 |
Kang J, He X, Vasileska D, Schroder DK. Optimization of FIBMOS through 2D Silvaco ATLAS and 2D Monte Carlo particle-based device simulations Vlsi Design. 13: 251-256. DOI: 10.1155/2001/45747 |
0.462 |
|
2001 |
Akis R, Shifren L, Ferry DK, Vasileska D. The effective potential and its use in simulation Physica Status Solidi (B) Basic Research. 226: 1-8. DOI: 10.1002/1521-3951(200107)226:1<1::Aid-Pssb1>3.0.Co;2-T |
0.625 |
|
2001 |
Speyer G, Vasileska D, Goodnick SM. Efficient Poisson equation solvers for large scale 3D simulations 2001 International Conference On Modeling and Simulation of Microsystems - Msm 2001. 23-26. |
0.557 |
|
2000 |
Gross WJ, Vasileska D, Ferry DK. 3D simulations of ultra-small MOSFETs with real-space treatment of the electron-electron and electron-ion interactions Vlsi Design. 10: 437-452. DOI: 10.1155/2000/48474 |
0.561 |
|
2000 |
Gross WJ, Vasileska D, Ferry DK. Ultrasmall MOSFETs: the importance of the full Coulomb interaction on device characteristics Ieee Transactions On Electron Devices. 47: 1831-1837. DOI: 10.1109/16.870556 |
0.36 |
|
2000 |
Assad F, Ren Z, Vasileska D, Datta S, Lundstrom M. On the performance limits for Si MOSFETs: a theoretical study Ieee Transactions On Electron Devices. 47: 232-240. DOI: 10.1109/16.817590 |
0.356 |
|
2000 |
Lin L, Aoki N, Nakao K, Ishibashi K, Aoyagi Y, Sugano T, Holmberg N, Vasileska D, Akis R, Bird J, Ferry D, Ochiai Y. Magneto-transport in corrugated quantum wires Physica E: Low-Dimensional Systems and Nanostructures. 7: 750-755. DOI: 10.1016/S1386-9477(00)00051-5 |
0.55 |
|
2000 |
Akis R, Bird JP, Ferry DK, Vasileska D. Nonuniform energy level broadening in open quantum dots: The influence of the closed dot eigenstates on transport Physica E: Low-Dimensional Systems and Nanostructures. 7: 745-749. DOI: 10.1016/S1386-9477(00)00050-3 |
0.528 |
|
2000 |
Akis R, Bird JP, Ferry DK, Vasileska D, Cooper J, Aoyagi Y, Sugano T. Selecting wave function states in open quantum dots Physica E: Low-Dimensional Systems and Nanostructures. 7: 740-744. DOI: 10.1016/S1386-9477(00)00049-7 |
0.52 |
|
2000 |
Khoury M, Gunther A, Miličić S, Rack J, Goodnick S, Vasileska D, Thornton T, Ferry D. Single-electron quantum dots in silicon MOS structures Applied Physics a: Materials Science & Processing. 71: 415-421. DOI: 10.1007/S003390000554 |
0.588 |
|
2000 |
Miličić S, Akis R, Vasileska D, Gunther A, Goodnick S. 3D modeling of discrete impurity effects in silicon quantum dots: energy level spacing and scarring effects Superlattices and Microstructures. 28: 461-467. DOI: 10.1006/Spmi.2000.0949 |
0.565 |
|
2000 |
Miličić S, Badrieh F, Vasileska D, Gunther A, Goodnick S. 3D modeling of silicon quantum dots Superlattices and Microstructures. 27: 377-382. DOI: 10.1006/Spmi.2000.0845 |
0.599 |
|
2000 |
Gunther A, Khoury M, Miličić S, Vasileska D, Thornton T, Goodnick S. Transport in split-gate silicon quantum dots Superlattices and Microstructures. 27: 373-376. DOI: 10.1006/Spmi.2000.0844 |
0.6 |
|
2000 |
Vasileska D, Gross WJ, Ferry DK. Monte Carlo particle-based simulations of deep-submicron n-MOSFETs with real-space treatment of electron-electron and electron-impurity interactions Superlattices and Microstructures. 27: 147-157. DOI: 10.1006/Spmi.1999.0806 |
0.632 |
|
2000 |
Harris J, Vasileska D. Monte-Carlo simulation of GaAs devices using high generality object-oriented code and encapsulated scattering tables 2000 International Conference On Modeling and Simulation of Microsystems - Msm 2000. 400-403. |
0.312 |
|
2000 |
Ferry DK, Akis R, Vasileska D. Quantum effects in MOSFETs: Use of an effective potential in 3D Monte Carlo simulation of ultra-short channel devices Technical Digest - International Electron Devices Meeting. 287-290. |
0.371 |
|
2000 |
Gross WJ, Vasileska D, Ferry DK. 3D simulations of ultra-small MOSFETs: The role of the short range Coulomb interactions and discrete impurities on device terminal characteristics 2000 International Conference On Modeling and Simulation of Microsystems - Msm 2000. 469-472. |
0.309 |
|
1999 |
Akis R, Vasileska D, Ferry DK, Bird JP. Zero Field Magnetoresistance Peaks in Open Quantum Dots: Weak Localization or a Fundamental Property? Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 38: 328-331. DOI: 10.1143/Jjap.38.328 |
0.526 |
|
1999 |
Ochiai Y, Lin L, Ishibashi K, Aoyagi Y, Sugano T, Holmberg NL, Bird JP, Vasileska D, Akis R, Ferry DK. Modeling of Electron Transport in Corrugated Quantum Wires Japanese Journal of Applied Physics. 38: 325-327. DOI: 10.1143/Jjap.38.325 |
0.57 |
|
1999 |
Ferry DK, Akis R, Vasileska D, Holmberg N, Badrieh F, Bird JP. Theoretical Considerations of Electron Transport in Single and Multiple Quantum Dots Japanese Journal of Applied Physics. 38: 303-307. DOI: 10.1143/JJAP.38.303 |
0.472 |
|
1999 |
Ferry DK, Akis R, Vasileska D, Holmberg N, Badrieh F, Bird JP. Theoretical Considerations of Electron Transport in Single and Multiple Quantum Dots Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 38: 303-307. DOI: 10.1143/Jjap.38.303 |
0.37 |
|
1999 |
Rack MJ, Hilt LL, Vasileska D, Ferry DK. Remote plasma enhanced chemical vapor deposition SiO[sub 2] in silicon based nanostructures Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 17: 1840. DOI: 10.1116/1.590836 |
0.334 |
|
1999 |
Gross WJ, Vasileska D, Ferry DK. Novel approach for introducing the electron-electron and electron-impurity interactions in particle-based simulations Ieee Electron Device Letters. 20: 463-465. DOI: 10.1109/55.784453 |
0.381 |
|
1999 |
Bird JP, Akis R, Ferry DK, Vasileska D, Cooper J, Aoyagi Y, Sugano T. Lead-Orientation-Dependent Wave Function Scarring in Open Quantum Dots Physical Review Letters. 82: 4691-4694. DOI: 10.1103/PHYSREVLETT.82.4691 |
0.415 |
|
1999 |
Bird JP, Akis R, Ferry DK, Vasileska D, Cooper J, Aoyagi Y, Sugano T. Lead-orientation-dependent wave function scarring in open quantum dots Physical Review Letters. 82: 4691-4694. DOI: 10.1103/Physrevlett.82.4691 |
0.375 |
|
1999 |
Akis R, Ferry DK, Bird JP, Vasileska D. Weak localization in ballistic quantum dots Physical Review B - Condensed Matter and Materials Physics. 60: 2680-2690. DOI: 10.1103/Physrevb.60.2680 |
0.527 |
|
1999 |
Vasileska D, Ferry DK. The influence of space quantization effects on the threshold voltage, inversion layer and total gate capacitances in scaled Si-MOSFETs Nanotechnology. 10: 192-197. DOI: 10.1088/0957-4484/10/2/314 |
0.421 |
|
1999 |
Vasileska D, Formicone G, Ferry DK. Doping dependence of the mobility enhancement in surface-channel strained-Si layers Nanotechnology. 10: 147-152. DOI: 10.1088/0957-4484/10/2/308 |
0.563 |
|
1999 |
Dür M, Gunther AD, Vasileska D, Goodnick SM. Acoustic phonon scattering in silicon quantum dots Nanotechnology. 10: 142-146. DOI: 10.1088/0957-4484/10/2/307 |
0.574 |
|
1999 |
Lin L, Ochiai Y, Ishibashi K, Aoyagi Y, Sugano T, Bird J, Holmberg N, Vasileska D, Akis R, Ferry D. Focused multi-peaks in gated ballistic wires Microelectronic Engineering. 47: 155-157. DOI: 10.1016/S0167-9317(99)00177-X |
0.346 |
|
1999 |
Holmberg N, Vasileska D, Akis R, Ochiai Y, Ferry D. Backscattering of electrons in a periodically corrugated quantum wire modeled with a self-consistent potential Microelectronic Engineering. 47: 151-153. DOI: 10.1016/S0167-9317(99)00176-8 |
0.397 |
|
1999 |
Pivin DP, Akis R, Andresen A, Bird JP, Vasileska D, Ferry DK. Weakly open quantum dots: magnetotransport spectroscopy and zero-field resistance peaks Microelectronic Engineering. 47: 89-93. DOI: 10.1016/S0167-9317(99)00159-8 |
0.532 |
|
1999 |
Akis R, Vasileska D, Ferry DK, Bird JP. Zero Field Magnetoresistance Peaks in Open Quantum Dots: Weak Localization or a Fundamental Property? Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 38: 328-331. |
0.463 |
|
1998 |
Ferry DK, Formicone G, Vasileska D. Carrier Transport and Velocity Overshoot in Strained Si On Sige Heterostructures Mrs Proceedings. 533. DOI: 10.1557/Proc-533-31 |
0.557 |
|
1998 |
Formicone GF, Vasileska D, Ferry DK. 2D Monte Carlo simulation of hole and electron transport in strained Si Vlsi Design. 6: 167-171. DOI: 10.1155/1998/67849 |
0.529 |
|
1998 |
Vasileska D, Eldridge T, Bordone P, Ferry DK. Quantum transport simulation of the DOS function, self-consistent fields and mobility in MOS inversion layers Vlsi Design. 6: 21-25. DOI: 10.1155/1998/46360 |
0.558 |
|
1998 |
Vasileska D, Gross WJ, Kafedziski V, Ferry DK. Convergence properties of the Bi-CGSTAB method for the solution of the 3D poisson and 3D electron current continuity equations for scaled Si MOSFETs Vlsi Design. 8: 301-305. DOI: 10.1155/1998/21494 |
0.393 |
|
1998 |
Rack MJ, Gunther AD, Khoury M, Vasileska D, Ferry DK, Sidorov M. Compatibility of cobalt and chromium depletion gates with RPECVD upper gate oxide for silicon-based nanostructures Semiconductor Science and Technology. 13: A71-A74. DOI: 10.1088/0268-1242/13/8A/022 |
0.343 |
|
1998 |
Vasileska D, Wybourne MN, Goodnick SM, Gunther AD. 3D simulation of GaAs/AlGaAs quantum dot point contact structures Semiconductor Science and Technology. 13. DOI: 10.1088/0268-1242/13/8A/013 |
0.601 |
|
1998 |
Ochiai Y, Lin L, Yamamoto K, Ishibashi K, Aoyagi Y, Sugano T, Bird JP, Vasileska D, Akis R, Ferry DK. Low-temperature magnetotransport in ballistic quantum dots and wires Semiconductor Science and Technology. 13: A15-A17. DOI: 10.1088/0268-1242/13/8A/006 |
0.521 |
|
1998 |
Ferry D, Akis R, Pivin Jr D, Bird J, Holmberg N, Badrieh F, Vasileska D. Quantum transport in ballistic quantum dots Physica E: Low-Dimensional Systems and Nanostructures. 3: 137-144. DOI: 10.1016/S1386-9477(98)00228-8 |
0.534 |
|
1998 |
Akis R, Vasileska D, Ferry DK, Bird JP, Okubo Y, Ochiai Y, Ishibashi JPK, Aoyagi Y, Sugano T. Stability of regular orbits in ballistic quantum dots Physica B-Condensed Matter. 249: 368-372. DOI: 10.1016/S0921-4526(98)00133-1 |
0.376 |
|
1998 |
Ochiai Y, Okubo Y, Sasaki N, Bird JP, Ishibashi K, Aoyagi Y, Sugano T, Micolich AP, Taylor RP, Newbury R, Vasileska D, Akis R, Ferry DK. Wave Function Scarring And Magnetotransport In Quantum Dots Physica B-Condensed Matter. 249: 353-357. DOI: 10.1016/S0921-4526(98)00130-6 |
0.39 |
|
1998 |
Okubo Y, Sasaki N, Ochiai Y, Bird JP, Ishibashi K, Aoyagi Y, Sugano T, Vasileska D, Akis R, Ferry DK. Periodically recurring wavefunction scarring and magneto-transport in quantum dots Physica B-Condensed Matter. 246: 266-269. DOI: 10.1016/S0921-4526(97)00912-5 |
0.378 |
|
1998 |
Vasileska D, Gross WJ, Kafedziski V, Ferry DK. Convergence properties of the Bi-CGSTAB method for the solution of the 3D poisson and 3D electron current continuity equations for scaled Si MOSFETs Vlsi Design. 8: 301-305. |
0.497 |
|
1997 |
Ferry DK, Akis R, Udipi S, Vasileska D, Pivin DP, Connolly KM, Bird JP, Ishibashi K, Aoyagi Y, Sugano T, Ochiai Y. Carrier Transport in Nanodevices Japanese Journal of Applied Physics. 36: 1841-1845. DOI: 10.1143/Jjap.36.1841 |
0.44 |
|
1997 |
Vasileska D, Schroder DK, Ferry DK. Scaled silicon MOSFET's: Degradation of the total gate capacitance Ieee Transactions On Electron Devices. 44: 584-587. DOI: 10.1109/16.563362 |
0.43 |
|
1997 |
Vasileska D, Ferry DK. Scaled silicon MOSFET's: Universal mobility behavior Ieee Transactions On Electron Devices. 44: 577-583. DOI: 10.1109/16.563361 |
0.387 |
|
1997 |
Okubo Y, Ochiai Y, Vasileska D, Akis R, Ferry D, Bird J, Ishibashi K, Aoyagi Y, Sugano T. Stability of regular orbits in ballistic quantum dots Physics Letters A. 236: 120-124. DOI: 10.1016/S0375-9601(97)00674-9 |
0.499 |
|
1997 |
Formicone G, Vasileska D, Ferry D. Transport in the surface channel of strained Si on a relaxed Si1−xGex substrate Solid-State Electronics. 41: 879-885. DOI: 10.1016/S0038-1101(97)00042-7 |
0.373 |
|
1997 |
Formicone GF, Vasileska D, Ferry DK. Modeling of submicron Si1-xGex-based MOSFETs by self-consistent Monte Carlo simulation Physica Status Solidi (B) Basic Research. 204: 531-533. DOI: 10.1002/1521-3951(199711)204:1<531::Aid-Pssb531>3.0.Co;2-6 |
0.542 |
|
1997 |
Ferry DK, Akis R, Udipi S, Vasileska D, Pivin DP, Connolly KM, Bird JP, Ishibashi K, Aoyagi Y, Sugano T, Ochiai Y. Carrier transport in nanodevices Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 36: 1841-1845. |
0.406 |
|
1996 |
Vasileska D. Quantum transport: Silicon inversion layers and InAlAs–InGaAs heterostructures Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 14: 2780. DOI: 10.1116/1.588832 |
0.428 |
|
1996 |
Vasileska D, Bordone P, Eldridge T, Ferry DK. Quantum transport calculations for silicon inversion layers in MOS structures Physica B: Condensed Matter. 227: 333-335. DOI: 10.1016/0921-4526(96)00434-6 |
0.558 |
|
1996 |
Udipi S, Vasileska D, Ferry DK. Numerical modeling of silicon quantum dots Superlattices and Microstructures. 20: 342-347. DOI: 10.1006/Spmi.1996.0087 |
0.534 |
|
1995 |
Vasileska D. Calculation of the average interface field in inversion layers using zero-temperature Green’s function formalism Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 13: 1841. DOI: 10.1116/1.587822 |
0.348 |
|
1993 |
Tsukioka K, Vasileska D, Ferry DK. An ensemble Monte Carlo study of high-field transport in β-SiC Physica B: Physics of Condensed Matter. 185: 466-470. DOI: 10.1016/0921-4526(93)90279-F |
0.519 |
|
1993 |
Zhou JR, Vasileska D, Ferry DK. Modeling of β-SiC MESFETs using hydrodynamic equations Solid State Electronics. 36: 1289-1294. DOI: 10.1016/0038-1101(93)90167-O |
0.584 |
|
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