| Year |
Citation |
Score |
| 2021 |
Jenkins MA, Holden KEK, Smith SW, Brumbach MT, Henry MD, Weiland C, Woicik JC, Jaszewski ST, Ihlefeld JF, Conley JF. Determination of Hafnium Zirconium Oxide Interfacial Band Alignments Using Internal Photoemission Spectroscopy and X-ray Photoelectron Spectroscopy. Acs Applied Materials & Interfaces. PMID 33749229 DOI: 10.1021/acsami.0c17729 |
0.618 |
|
| 2020 |
Woicik JC, Weiland C, Jaye C, Fischer DA, Rumaiz AK, Shirley EL, Kas JJ, Rehr JJ. Charge-transfer satellites and chemical bonding in photoemission and x-ray absorption of
SrTiO3
and rutile
TiO2
: Experiment and first-principles theory with general application to spectroscopic analysis Physical Review B. 101. DOI: 10.1103/Physrevb.101.245119 |
0.585 |
|
| 2020 |
Woicik JC, Weiland C, Rumaiz AK, Brumbach MT, Ablett JM, Shirley EL, Kas JJ, Rehr JJ. Core hole processes in x-ray absorption and photoemission by resonant Auger-electron spectroscopy and first-principles theory Physical Review B. 101. DOI: 10.1103/Physrevb.101.245105 |
0.631 |
|
| 2019 |
Prakash A, Quackenbush NF, Yun H, Held JT, Wang T, Truttmann T, Ablett JM, Weiland C, Lee TL, Woicik JC, Mkhoyan KA, Jalan B. Separating Electrons and Donors in BaSnO via Band Engineering. Nano Letters. PMID 31702928 DOI: 10.1021/Acs.Nanolett.9B03825 |
0.597 |
|
| 2019 |
Lim ZH, Quackenbush NF, Penn AN, Chrysler M, Bowden M, Zhu Z, Ablett JM, Lee TL, LeBeau JM, Woicik JC, Sushko PV, Chambers SA, Ngai JH. Charge Transfer and Built-in Electric Fields between a Crystalline Oxide and Silicon. Physical Review Letters. 123: 026805. PMID 31386492 DOI: 10.1103/Physrevlett.123.026805 |
0.371 |
|
| 2019 |
Tan Z, Budnick JI, Bouldin CE, Woicik JC, Cheong SW, Cooper AS, Espinosa GP, Fisk Z. Polarization x-ray-absorption near-edge structure study of Pr2-xCexCuO4 single crystals: The nature of Ce doping. Physical Review. B, Condensed Matter. 42: 1037-1040. PMID 9994651 DOI: 10.1103/Physrevb.42.1037 |
0.396 |
|
| 2019 |
Wahila MJ, Lebens-Higgins ZW, Butler KT, Fritsch D, Treharne RE, Palgrave RG, Woicik JC, Morgan BJ, Walsh A, Piper LFJ. Accelerated optimization of transparent, amorphous zinc-tin-oxide thin films for optoelectronic applications Apl Materials. 7: 022509. DOI: 10.1063/1.5053683 |
0.323 |
|
| 2018 |
Cockayne E, Shirley EL, Ravel BD, Woicik JC. Local atomic geometry and Ti 1s near-edge spectra in PbTiO and SrTiO. Physical Review. B. 98. PMID 30984900 DOI: 10.1103/Physrevb.98.014111 |
0.344 |
|
| 2018 |
Young BT, Nguyen CC, Lobach A, Heskett DR, Woicik JC, Lucht BL. Role of binders in solid electrolyte interphase formation in lithium ion batteries studied with hard X-ray photoelectron spectroscopy Journal of Materials Research. 34: 97-106. DOI: 10.1557/Jmr.2018.363 |
0.374 |
|
| 2018 |
Young BT, Heskett DR, Woicik JC, Lucht BL. X-Ray-Induced Changes to Passivation Layers of Lithium-Ion Battery Electrodes Journal of Spectroscopy. 2018: 1-7. DOI: 10.1155/2018/1075902 |
0.414 |
|
| 2018 |
Quackenbush NF, Cockayne E, Ablett JM, Siddons DP, Woicik JC, Rumaiz AK. Accurate band alignment at the amorphous Al2O3/p-Ge(100) interface determined by hard x-ray photoelectron spectroscopy and density functional theory Physical Review Materials. 2. DOI: 10.1103/Physrevmaterials.2.114605 |
0.445 |
|
| 2018 |
Woicik JC, Weiland C, Rumaiz AK, Brumbach M, Quackenbush NF, Ablett JM, Shirley EL. Revealing excitonic processes and chemical bonding in MoS2 by x-ray spectroscopy Physical Review B. 98. DOI: 10.1103/Physrevb.98.115149 |
0.607 |
|
| 2018 |
Woicik JC, Ablett JM, Quackenbush NF, Rumaiz AK, Weiland C, Droubay TC, Chambers SA. Experimental assignment of many-electron excitations in the photoionization of NiO Physical Review B. 97: 245142. DOI: 10.1103/Physrevb.97.245142 |
0.493 |
|
| 2018 |
Weiland C, Jaye C, Quackenbush NF, Gann E, Fu Z, Kirkland JP, Karlin BA, Ravel B, Woicik JC, Fischer DA. NIST HAXPES at NSLS and NSLS-II Synchrotron Radiation News. 31: 23-28. DOI: 10.1080/08940886.2018.1483654 |
0.495 |
|
| 2017 |
Levin I, Krayzman V, Vanderah T, Tomczyk M, Wu H, Tucker M, Playford H, Woicik J, Dennis C, Vilarinho P. Oxygen-storage behavior and local structure in Ti-substituted YMnO3 Journal of Solid State Chemistry. 246: 29-41. DOI: 10.1016/J.Jssc.2016.10.029 |
0.332 |
|
| 2016 |
Yu Y, Ludwig KF, Woicik JC, Gopalan S, Pal UB, Kaspar TC, Basu SN. Effect of Sr Content and Strain on Sr Surface Segregation of La1-xSrxCo0.2Fe0.8O3-δ as Cathode Material for Solid Oxide Fuel Cells. Acs Applied Materials & Interfaces. PMID 27649281 DOI: 10.1021/Acsami.6B07118 |
0.422 |
|
| 2016 |
Zhang L, Guo Y, Hassan VV, Tang K, Foad MA, Woicik JC, Pianetta PA, Robertson J, McIntyre PC. Interface Engineering for Atomic Layer Deposited Alumina Gate Dielectric on SiGe Substrates. Acs Applied Materials & Interfaces. PMID 27345195 DOI: 10.1021/Acsami.6B03331 |
0.582 |
|
| 2016 |
Knorr DB, Tran NT, Gaskell KJ, Orlicki JA, Woicik JC, Jaye C, Fischer DA, Lenhart JL. Synthesis and Characterization of Aminopropyltriethoxysilane-Polydopamine Coatings. Langmuir : the Acs Journal of Surfaces and Colloids. PMID 27055091 DOI: 10.1021/Acs.Langmuir.6B00531 |
0.361 |
|
| 2016 |
Lebens-Higgins Z, Scanlon DO, Paik H, Sallis S, Nie Y, Uchida M, Quackenbush NF, Wahila MJ, Sterbinsky GE, Arena DA, Woicik JC, Schlom DG, Piper LF. Direct Observation of Electrostatically Driven Band Gap Renormalization in a Degenerate Perovskite Transparent Conducting Oxide. Physical Review Letters. 116: 027602. PMID 26824566 DOI: 10.1103/Physrevlett.116.027602 |
0.354 |
|
| 2016 |
Weiland C, Rumaiz AK, Pianetta P, Woicik JC. Recent applications of hard x-ray photoelectron spectroscopy Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 34. DOI: 10.1116/1.4946046 |
0.72 |
|
| 2016 |
Quackenbush NF, Paik H, Wahila MJ, Sallis S, Holtz ME, Huang X, Ganose A, Morgan BJ, Scanlon DO, Gu Y, Xue F, Chen LQ, Sterbinsky GE, Schlueter C, Lee TL, ... Woicik JC, et al. Stability of the M2 phase of vanadium dioxide induced by coherent epitaxial strain Physical Review B - Condensed Matter and Materials Physics. 94. DOI: 10.1103/Physrevb.94.085105 |
0.327 |
|
| 2016 |
Levin I, Krayzman V, Woicik JC, Bridges F, Sterbinsky GE, Usher TM, Jones JL, Torrejon D. Local structure in BaTi O3-BiSc O3 dipole glasses Physical Review B - Condensed Matter and Materials Physics. 93. DOI: 10.1103/Physrevb.93.104106 |
0.38 |
|
| 2016 |
Sahiner MA, Nabizadeh A, Rivella D, Cerqueira L, Hachlica J, Morea R, Gonzalo J, Woicik JC. Subtle local structural variations in oxygen deficient niobium germanate thin film glasses as revealed by x-ray absorption spectroscopy Journal of Physics: Conference Series. 712: 012103. DOI: 10.1088/1742-6596/712/1/012103 |
0.324 |
|
| 2016 |
Walsh LA, Weiland C, McCoy AP, Woicik JC, Lee RTP, Lysaght P, Hughes G. Investigation of the thermal stability of Mo-In0.45Ga0.47As for applications as source/drain contacts Journal of Applied Physics. 120: 135303. DOI: 10.1063/1.4964251 |
0.645 |
|
| 2016 |
Wahila MJ, Butler KT, Lebens-Higgins ZW, Hendon CH, Nandur AS, Treharne RE, Quackenbush NF, Sallis S, Mason K, Paik H, Schlom DG, Woicik JC, Guo J, Arena DA, White BE, et al. Lone-Pair Stabilization in Transparent Amorphous Tin Oxides: A Potential Route to p-Type Conduction Pathways Chemistry of Materials. 28: 4706-4713. DOI: 10.1021/Acs.Chemmater.6B01608 |
0.387 |
|
| 2016 |
Yu Y, Nikiforov AY, Kaspar TC, Woicik JC, Ludwig KF, Gopalan S, Pal UB, Basu SN. Chemical characterization of surface precipitates in La0.7Sr0.3Co0.2Fe0.8O3-δ as cathode material for solid oxide fuel cells Journal of Power Sources. 333: 247-253. DOI: 10.1016/J.Jpowsour.2016.09.166 |
0.42 |
|
| 2016 |
Weiland C, Rumaiz AK, Woicik JC. HAXPES measurements of heterojunction band alignment Springer Series in Surface Sciences. 59: 381-405. DOI: 10.1007/978-3-319-24043-5_15 |
0.571 |
|
| 2015 |
Quackenbush NF, Paik H, Woicik JC, Arena DA, Schlom DG, Piper LFJ. X-Ray Spectroscopy of Ultra-Thin Oxide/Oxide Heteroepitaxial Films: A Case Study of Single-Nanometer VO2/TiO2. Materials (Basel, Switzerland). 8: 5452-5466. PMID 28793516 DOI: 10.3390/Ma8085255 |
0.421 |
|
| 2015 |
Zhang L, Li H, Guo Y, Tang K, Woicik J, Robertson J, McIntyre PC. Selective Passivation of GeO2/Ge Interface Defects in Atomic Layer Deposited High-k MOS Structures. Acs Applied Materials & Interfaces. PMID 26334784 DOI: 10.1021/Acsami.5B06087 |
0.388 |
|
| 2015 |
Young BT, Heskett DR, Nguyen CC, Nie M, Woicik JC, Lucht BL. Hard X-ray Photoelectron Spectroscopy (HAXPES) Investigation of the Silicon Solid Electrolyte Interphase (SEI) in Lithium-Ion Batteries. Acs Applied Materials & Interfaces. PMID 26305165 DOI: 10.1021/Acsami.5B04845 |
0.367 |
|
| 2015 |
Nie M, Demeaux J, Young BT, Heskett DR, Chen Y, Bose A, Woicik JC, Lucht BL. Effect of vinylene carbonate and fluoroethylene carbonate on SEI formation on graphitic anodes in li-ion batteries Journal of the Electrochemical Society. 162: A7008-A7014. DOI: 10.1149/2.0021513Jes |
0.304 |
|
| 2015 |
Wahila MJ, Lebens-Higgins ZW, Quackenbush NF, Nishitani J, Walukiewicz W, Glans PA, Guo JH, Woicik JC, Yu KM, Piper LFJ. Evidence of extreme type-III band offset at buried n -type CdO/p -type SnTe interfaces Physical Review B - Condensed Matter and Materials Physics. 91. DOI: 10.1103/Physrevb.91.205307 |
0.352 |
|
| 2015 |
Woicik JC, Weiland C, Rumaiz AK. Loss for photoemission versus gain for Auger: Direct experimental evidence of crystal-field splitting and charge transfer in photoelectron spectroscopy Physical Review B - Condensed Matter and Materials Physics. 91. DOI: 10.1103/Physrevb.91.201412 |
0.577 |
|
| 2015 |
Laverock J, Kuyyalil J, Chen B, Singh RP, Karlin B, Woicik JC, Balakrishnan G, Smith KE. Enhanced electron correlations at the SrxCa1-xVO3 surface Physical Review B - Condensed Matter and Materials Physics. 91. DOI: 10.1103/Physrevb.91.165123 |
0.415 |
|
| 2015 |
Weiland C, Sterbinsky GE, Rumaiz AK, Hellberg CS, Woicik JC, Zhu S, Schlom DG. Stoichiometry dependence of potential screening at La(1-δ) Al(1+δ) O3/ SrTiO3 interfaces Physical Review B - Condensed Matter and Materials Physics. 91. DOI: 10.1103/Physrevb.91.165103 |
0.603 |
|
| 2015 |
McCoy AP, Bogan J, Walsh L, Byrne C, O'Connor R, Woicik JC, Hughes G. The impact of porosity on the formation of manganese based copper diffusion barrier layers on low-κ dielectric materials Journal of Physics D: Applied Physics. 48. DOI: 10.1088/0022-3727/48/32/325102 |
0.434 |
|
| 2015 |
Krayzman V, Levin I, Woicik JC, Bridges F. Correlated rattling-ion origins of dielectric properties in reentrant dipole glasses BaTiO3-BiScO3 Applied Physics Letters. 107: 192903. DOI: 10.1063/1.4935417 |
0.394 |
|
| 2015 |
Ceylan A, Rumaiz AK, Caliskan D, Ozcan S, Ozbay E, Woicik JC. Effects of rapid thermal annealing on the structural and local atomic properties of ZnO: Ge nanocomposite thin films Journal of Applied Physics. 117. DOI: 10.1063/1.4914522 |
0.49 |
|
| 2015 |
Quackenbush NF, Wangoh L, Scanlon DO, Zhang R, Chung Y, Chen Z, Wen B, Lin Y, Woicik JC, Chernova NA, Ong SP, Whittingham MS, Piper LFJ. Interfacial Effects in ε-LixVOPO4 and Evolution of the Electronic Structure Chemistry of Materials. 27: 8211-8219. DOI: 10.1021/Acs.Chemmater.5B02145 |
0.344 |
|
| 2015 |
Sallis S, Quackenbush NF, Williams DS, Senger M, Woicik JC, White BE, Piper LFJ. Deep subgap feature in amorphous indium gallium zinc oxide: Evidence against reduced indium Physica Status Solidi (a) Applications and Materials Science. 212: 1471-1475. DOI: 10.1002/Pssa.201431806 |
0.333 |
|
| 2014 |
Walsh LA, Hughes G, Weiland C, Woicik JC, Lee RTP, Loh WY, Lysaght P, Hobbs C. Ni-(In,Ga)As alloy formation investigated by hard-X-ray photoelectron spectroscopy and X-ray absorption spectroscopy Physical Review Applied. 2. DOI: 10.1103/Physrevapplied.2.064010 |
0.637 |
|
| 2014 |
Ruzybayev I, Baik SS, Rumaiz AK, Sterbinsky GE, Woicik JC, Choi HJ, Ismat Shah S. Electronic structure of C and N co-doped TiO2: A combined hard x-ray photoemission spectroscopy and density functional theory study Applied Physics Letters. 105. DOI: 10.1063/1.4902994 |
0.394 |
|
| 2014 |
Lin J, Walsh L, Hughes G, Woicik JC, Povey IM, O'Regan TP, Hurley PK. A combined capacitance-voltage and hard x-ray photoelectron spectroscopy characterisation of metal/Al2O3/In0.53Ga 0.47As capacitor structures Journal of Applied Physics. 116. DOI: 10.1063/1.4887517 |
0.35 |
|
| 2014 |
Levin I, Krayzman V, Tucker MG, Woicik JC. Local structure underlying anomalous tetragonal distortions in BiFeO3-PbTiO3 ferroelectrics Applied Physics Letters. 104: 242913. DOI: 10.1063/1.4884946 |
0.368 |
|
| 2014 |
Sallis S, Butler KT, Quackenbush NF, Williams DS, Junda M, Fischer DA, Woicik JC, Podraza NJ, White BE, Walsh A, Piper LFJ. Origin of deep subgap states in amorphous indium gallium zinc oxide: Chemically disordered coordination of oxygen Applied Physics Letters. 104. DOI: 10.1063/1.4883257 |
0.326 |
|
| 2014 |
Wangoh L, Marley PM, Quackenbush NF, Sallis S, Fischer DA, Woicik JC, Banerjee S, Piper LFJ. Electron lone pair distortion facilitated metal-insulator transition in β-Pb0.33V2O5 nanowires Applied Physics Letters. 104. DOI: 10.1063/1.4875747 |
0.328 |
|
| 2014 |
Chen B, Laverock J, Newby D, Su TY, Smith KE, Wu W, Doerrer LH, Quackenbush NF, Sallis S, Piper LFJ, Fischer DA, Woicik JC. Electronic structure of β-NaxV2O5 (x ≈ 0.33) polycrystalline films: Growth, spectroscopy, and theory Journal of Physical Chemistry C. 118: 1081-1094. DOI: 10.1021/Jp410277M |
0.423 |
|
| 2014 |
Woicik JC. Local structure determination in strained-layer semiconductors Surface Science Reports. 69: 38-53. DOI: 10.1016/J.Surfrep.2013.12.002 |
0.422 |
|
| 2014 |
Knorr DB, Williams KS, Baril NF, Weiland C, Andzelm JW, Lenhart JL, Woicik JC, Fischer DA, Tidrow MZ, Bandara SV, Henry NC. Use of 3-aminopropyltriethoxysilane deposited from aqueous solution for surface modification of III-V materials Applied Surface Science. 320: 414-428. DOI: 10.1016/J.Apsusc.2014.09.055 |
0.632 |
|
| 2014 |
Walsh LA, Hurley PK, Lin J, Cockayne E, O'Regan TP, Woicik JC, Hughes G. A spectroscopic method for the evaluation of surface passivation treatments on metal-oxide-semiconductor structures Applied Surface Science. 301: 40-45. DOI: 10.1016/J.Apsusc.2014.01.208 |
0.441 |
|
| 2014 |
Sahiner MA, Lysaght PS, Price J, Kirsch PD, Woicik JC, Klump A, Reehil C, Manners WA, Nabizadeh A. Zr-induced structural changes in Hf1−xZr xO2 high-k thin films Applied Physics a: Materials Science and Processing. 117: 93-96. DOI: 10.1007/S00339-013-8208-Z |
0.432 |
|
| 2014 |
Weiland C, Krajewski J, Opila R, Pallem V, Dussarrat C, Woicik JC. Nondestructive compositional depth profiling using variable-kinetic energy hard X-ray photoelectron spectroscopy and maximum entropy regularization Surface and Interface Analysis. 46: 407-417. DOI: 10.1002/Sia.5517 |
0.726 |
|
| 2013 |
Quackenbush NF, Tashman JW, Mundy JA, Sallis S, Paik H, Misra R, Moyer JA, Guo JH, Fischer DA, Woicik JC, Muller DA, Schlom DG, Piper LF. Nature of the metal insulator transition in ultrathin epitaxial vanadium dioxide. Nano Letters. 13: 4857-61. PMID 24000961 DOI: 10.1021/Nl402716D |
0.458 |
|
| 2013 |
Weiland C, Browning R, Karlin BA, Fischer DA, Woicik JC. Note: Alignment/focus dependent core-line sensitivity for quantitative chemical analysis in hard x-ray photoelectron spectroscopy using a hemispherical electron analyzer. The Review of Scientific Instruments. 84: 036106. PMID 23556858 DOI: 10.1063/1.4795406 |
0.609 |
|
| 2013 |
Walsh LA, Hughes G, Lin J, Hurley PK, O'Regan TP, Cockayne E, Woicik JC. Hard x-ray photoelectron spectroscopy and electrical characterization study of the surface potential in metal/Al2O3/GaAs(100) metal-oxide-semiconductor structures Physical Review B - Condensed Matter and Materials Physics. 88. DOI: 10.1103/Physrevb.88.045322 |
0.418 |
|
| 2013 |
Sallis S, Scanlon DO, Chae SC, Quackenbush NF, Fischer DA, Woicik JC, Guo JH, Cheong SW, Piper LFJ. La-doped BaSnO3 - Degenerate perovskite transparent conducting oxide: Evidence from synchrotron x-ray spectroscopy Applied Physics Letters. 103. DOI: 10.1063/1.4816511 |
0.435 |
|
| 2013 |
Levin I, Krayzman V, Woicik JC. Local-structure origins of the sustained Curie temperature in (Ba,Ca)TiO3 ferroelectrics Applied Physics Letters. 102: 162906. DOI: 10.1063/1.4802996 |
0.35 |
|
| 2013 |
Krayzman V, Levin I, Woicik JC, Bridges F, Nelson EJ, Sinclair DC. Ca K-edge X-ray absorption fine structure in BaTiO3-CaTiO 3 solid solutions Journal of Applied Physics. 113. DOI: 10.1063/1.4784226 |
0.537 |
|
| 2013 |
Quackenbush NF, Allen JP, Scanlon DO, Sallis S, Hewlett JA, Nandur AS, Chen B, Smith KE, Weiland C, Fischer DA, Woicik JC, White BE, Watson GW, Piper LFJ. Origin of the bipolar doping behavior of SnO from X-ray spectroscopy and density functional theory Chemistry of Materials. 25: 3114-3123. DOI: 10.1021/Cm401343A |
0.649 |
|
| 2013 |
Weiland C, Rumaiz AK, Lysaght P, Karlin B, Woicik JC, Fischer D. NIST high throughput variable kinetic energy hard X-ray photoelectron spectroscopy facility Journal of Electron Spectroscopy and Related Phenomena. 190: 193-200. DOI: 10.1016/J.Elspec.2013.04.008 |
0.637 |
|
| 2013 |
Cao W, Masnadi M, Eger S, Martinson M, Xiao QF, Hu YF, Baribeau JM, Woicik JC, Hitchcock AP, Urquhart SG. Quantification of strain through linear dichroism in the Si 1s edge X-ray absorption spectra of strained Si1-xGex thin films Applied Surface Science. 265: 358-362. DOI: 10.1016/J.Apsusc.2012.11.012 |
0.447 |
|
| 2012 |
Ablett JM, Wilson CJ, Phuong NM, Koike J, Tokei Z, Sterbinsky GE, Woicik JC. Characterization of chemically vapor deposited manganese barrier layers using X-ray absorption fine structure Japanese Journal of Applied Physics. 51. DOI: 10.1143/Jjap.51.05Eb01 |
0.439 |
|
| 2012 |
Chen YT, Huang J, Price J, Lysaght P, Veksler D, Weiland C, Woicik JC, Bersuker G, Hill R, Oh J, Kirsch PD, Jammy R, Lee JC. III-V gate stack interface improvement to enable high mobility 11nm node CMOS International Symposium On Vlsi Technology, Systems, and Applications, Proceedings. DOI: 10.1109/VLSI-TSA.2012.6210157 |
0.526 |
|
| 2012 |
Barkan S, Saveliev VD, Feng L, Takahashi M, Damron EV, Tull C, Sterbinsky GE, Woicik JC. A very large area (100 mm 2) silicon drift detector for EXAFS applications Ieee Nuclear Science Symposium Conference Record. 569-571. DOI: 10.1109/NSSMIC.2011.6154113 |
0.302 |
|
| 2012 |
Walsh LA, Hughes G, Hurley PK, Lin J, Woicik JC. A combined hard x-ray photoelectron spectroscopy and electrical characterisation study of metal/SiO2/Si(100) metal-oxide- semiconductor structures Applied Physics Letters. 101. DOI: 10.1063/1.4770380 |
0.451 |
|
| 2012 |
Rumaiz AK, Woicik JC, Weiland C, Xie Q, Siddons DP, Jaffari GH, Detavernier C. Band alignment in Ge/GeOx/HfO2/TiO2 heterojunctions as measured by hard x-ray photoelectron spectroscopy Applied Physics Letters. 101. DOI: 10.1063/1.4768947 |
0.643 |
|
| 2012 |
Meirer F, Demenev E, Giubertoni D, Gennaro S, Vanzetti L, Pepponi G, Bersani M, Sahiner MA, Steinhauser G, Foad MA, Woicik JC, Mehta A, Pianetta P. Formation of arsenic rich silicon oxide under plasma immersion ion implantation and laser annealing Aip Conference Proceedings. 1496: 183-188. DOI: 10.1063/1.4766520 |
0.391 |
|
| 2012 |
Lysaght PS, Woicik JC, Sahiner MA, Price J, Weiland C, Kirsch PD. Spectroscopic analysis of Al and N diffusion in HfO 2 Journal of Applied Physics. 112. DOI: 10.1063/1.4754578 |
0.662 |
|
| 2012 |
Weiland C, Lysaght P, Price J, Huang J, Woicik JC. Hard x-ray photoelectron spectroscopy study of As and Ga out-diffusion in In 0.53Ga 0.47As/Al 2O 3 film systems Applied Physics Letters. 101. DOI: 10.1063/1.4745207 |
0.6 |
|
| 2012 |
Gaowei M, Muller EM, Rumaiz AK, Weiland C, Cockayne E, Jordan-Sweet J, Smedley J, Woicik JC. Annealing dependence of diamond-metal Schottky barrier heights probed by hard x-ray photoelectron spectroscopy Applied Physics Letters. 100. DOI: 10.1063/1.4718028 |
0.642 |
|
| 2012 |
Jaffari GH, Rumaiz AK, Woicik JC, Shah SI. Influence of oxygen vacancies on the electronic structure and magnetic properties of NiFe 2O 4 thin films Journal of Applied Physics. 111. DOI: 10.1063/1.4704690 |
0.321 |
|
| 2012 |
Woicik JC, Ludwig KF, Moustakas TD. Composition dependent bilayer atomic ordering in AlxGa1−xN films examined by polarization-dependent extended x-ray absorption fine structure Applied Physics Letters. 100: 162105. DOI: 10.1063/1.4704678 |
0.335 |
|
| 2012 |
Wong-Ng W, Huang Q, Levin I, Woicik JC, Shi X, Yang J, Kaduk JA. Crystal structure and powder diffraction reference pattern of type I clathrate Ba8Ni4Ge42 Powder Diffraction. 27: 25-31. DOI: 10.1017/S0885715612000024 |
0.4 |
|
| 2012 |
Brumbach MT, Woicik JC. HAXPES of protected ITO surfaces at the buried P3HT/ITO interface Surface and Interface Analysis. 44: 1379-1384. DOI: 10.1002/Sia.5072 |
0.426 |
|
| 2012 |
Sahiner MA, Hung PY, Loh W, Lysaght PS, Woicik JC, Guerrero D. Local structural phase determination of Ni silicide thin films using EXAFS Physica Status Solidi (C). 9: 2184-2188. DOI: 10.1002/Pssc.201200250 |
0.402 |
|
| 2012 |
Sahiner MA, Lysaght PS, Woicik JC, Park CS, Huang J, Bersuker G, Taylor W, Kirsch PD, Jammy R. Local structural modifications of the HfO 2 layer in the Al 2O 3 capped high-k dielectric films as probed by EXAFS Physica Status Solidi (a) Applications and Materials Science. 209: 679-682. DOI: 10.1002/Pssa.201100669 |
0.401 |
|
| 2011 |
Levin I, Cockayne E, Krayzman V, Woicik JC, Lee S, Randall CA. Local structure of Ba(Ti,Zr)O3perovskite-like solid solutions and its relation to the band-gap behavior Physical Review B. 83. DOI: 10.1103/Physrevb.83.094122 |
0.392 |
|
| 2011 |
Rumaiz AK, Jaye C, Woicik JC, Wang W, Fischer DA, Jordan-Sweet J, Chien CL. Boron migration due to annealing in CoFeB/MgO/CoFeB interfaces: A combined hard x-ray photoelectron spectroscopy and x-ray absorption studies Applied Physics Letters. 99. DOI: 10.1063/1.3662967 |
0.475 |
|
| 2011 |
Lysaght PS, Woicik JC, Huang J, Oh J, Min BG, Kirsch PD. Process driven oxygen redistribution and control in Si0.7Ge 0.3/HfO2/TaN gate stack film systems Journal of Applied Physics. 110. DOI: 10.1063/1.3651519 |
0.435 |
|
| 2011 |
Brumbach MT, Ohlhausen JA, Zavadil KR, Snow CS, Woicik JC. Activation of erbium films for hydrogen storage Journal of Applied Physics. 109. DOI: 10.1063/1.3590335 |
0.342 |
|
| 2011 |
Reininger R, Woicik JC, Hulbert SL, Fischer DA. NIST NSLS-II spectroscopy beamline optical plan for soft and tender X-ray spectroscopy and microscopy (100 eV to 7.5 keV) Nuclear Instruments and Methods in Physics Research, Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 649: 49-51. DOI: 10.1016/J.Nima.2010.11.172 |
0.432 |
|
| 2010 |
Woicik JC, Ravel B, Fischer DA, Newburgh WJ. Performance of a four-element Si drift detector for X-ray absorption fine-structure spectroscopy: resolution, maximum count rate, and dead-time correction with incorporation into the ATHENA data analysis software. Journal of Synchrotron Radiation. 17: 409-13. PMID 20400841 DOI: 10.1107/S0909049510009064 |
0.328 |
|
| 2010 |
Giubertoni D, Pepponi G, Sahiner MA, Kelty SP, Gennaro S, Bersani M, Kah M, Kirkby KJ, Doherty R, Foad MA, Meirer F, Streli C, Woicik JC, Pianetta P. Deactivation of submelt laser annealed arsenic ultrashallow junctions in silicon during subsequent thermal treatment Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 28: C1B1-C1B5. DOI: 10.1116/1.3242637 |
0.542 |
|
| 2010 |
Lysaght PS, Woicik JC, Sahiner MA, Park CS, Huang J, Bersuker G, Taylor W, Kirsch PD, Jammy R. Synchrotron XPS and EXAFS identification of chemical state and crystal phase changes of HfO2 films doped with Si, N, Al, and La Proceedings of 2010 International Symposium On Vlsi Technology, System and Application, Vlsi-Tsa 2010. 82-83. DOI: 10.1109/VTSA.2010.5488937 |
0.372 |
|
| 2010 |
Woicik JC, Fischer DA, Vescovo E, Arena DA, Starr DE, Wells BO, Fadley CS. International workshop for new opportunities in hard X-ray photoelectron spectroscopy: HAXPES 2009 Synchrotron Radiation News. 23: 19-21. DOI: 10.1080/08940880903547306 |
0.351 |
|
| 2010 |
Tyson TA, Wu T, Woicik JC, Ravel B, Ignatov A, Zhang CL, Qin Z, Zhou T, Cheong S. Temperature-dependent local structure of LaFeAsO1−xFx: Probing the atomic correlations Journal of Applied Physics. 108: 123715. DOI: 10.1063/1.3525999 |
0.376 |
|
| 2010 |
Rumaiz AK, Woicik JC, Carini GA, Siddons DP, Cockayne E, Huey E, Lysaght PS, Fischer DA, Genova V. Band alignment of atomic layer deposited HfO2 on clean and N passivated germanium surfaces Applied Physics Letters. 97. DOI: 10.1063/1.3524262 |
0.394 |
|
| 2010 |
Rumaiz AK, Woicik JC, Wang WG, Jordan-Sweet J, Jaffari GH, Ni C, Xiao JQ, Chien CL. Effects of annealing on the local structure of Fe and Co in CoFeB/MgO/CoFeB tunnel junctions: An extended x-ray-absorption fine structure study Applied Physics Letters. 96. DOI: 10.1063/1.3364137 |
0.443 |
|
| 2010 |
Levin I, Krayzman V, Woicik JC, Tkach A, Vilarinho PM. X-ray absorption fine structure studies of Mn coordination in doped perovskite SrTiO3 Applied Physics Letters. 96: 052904. DOI: 10.1063/1.3298369 |
0.374 |
|
| 2010 |
Reid DP, Stennett MC, Ravel B, Woicik JC, Peng N, Maddrell ER, Hyatt NC. The structure of ion beam amorphised zirconolite studied by grazing angle X-ray absorption spectroscopy Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 268: 1847-1852. DOI: 10.1016/J.Nimb.2010.02.026 |
0.387 |
|
| 2009 |
Warusawithana MP, Cen C, Sleasman CR, Woicik JC, Li Y, Kourkoutis LF, Klug JA, Li H, Ryan P, Wang LP, Bedzyk M, Muller DA, Chen LQ, Levy J, Schlom DG. A ferroelectric oxide made directly on silicon. Science (New York, N.Y.). 324: 367-70. PMID 19372426 DOI: 10.1126/Science.1169678 |
0.328 |
|
| 2009 |
Washington JS, Joseph E, Paesler MA, Lucovsky G, Jordan-Sweet JL, Raoux S, Chen CF, Pyzyna A, Dasaka RK, Schrott A, Lam C, Ravel B, Woicik J. The influence of nitrogen doping on the chemical and local bonding environment of amorphous and crystalline Ge2Sb2Te 5 Materials Research Society Symposium Proceedings. 1160: 163-168. DOI: 10.1557/Proc-1160-H13-08 |
0.303 |
|
| 2009 |
Bersani M, Pepponi G, Giubertoni D, Gennaro S, Sahiner MA, Kelty SP, Kah M, Kirkby KJ, Doherty R, Foad MA, Meirer F, Streli C, Woicik JC, Pianetta P. Characterization of junction activation and deactivation using non-equilibrium annealing: Solid phase epitaxy, spike annealing, laser annealing instructions for Extended Abstracts of the 9th International Workshop On Junction Technology, Iwjt 2009. 64-68. DOI: 10.1109/IWJT.2009.5166221 |
0.418 |
|
| 2009 |
Krayzman V, Levin I, Woicik JC, Proffen T, Vanderah TA, Tucker MG. A combined fit of total scattering and extended X-ray absorption fine structure data for local-structure determination in crystalline materials Journal of Applied Crystallography. 42: 867-877. DOI: 10.1107/S0021889809023541 |
0.388 |
|
| 2009 |
Levin I, Krayzman V, Woicik JC, Karapetrova J, Proffen T, Tucker MG, Reaney IM. Structural changes underlying the diffuse dielectric response inAgNbO3 Physical Review B. 79. DOI: 10.1103/Physrevb.79.104113 |
0.335 |
|
| 2009 |
Rumaiz AK, Woicik JC, Cockayne E, Lin HY, Jaffari GH, Shah SI. Oxygen vacancies in N doped anatase TiO2: Experiment and first-principles calculations Applied Physics Letters. 95. DOI: 10.1063/1.3272272 |
0.337 |
|
| 2008 |
Sahiner MA, Shah W, Aranguren M, Serfass J, Woicik JC. Local Crystal Structure Modifications in Pulsed Laser Deposited Colossal Magnetoresistive Oxide Thin Films Mrs Proceedings. 1118. DOI: 10.1557/Proc-1118-K05-06 |
0.442 |
|
| 2008 |
Lysaght PS, Woicik JC, Sabinen MA, Kirsch PD, Bersuker G, Lee BH, Jammy R. Physical characteristics of HfO2 dielectrics at the physical scaling limit International Symposium On Vlsi Technology, Systems, and Applications, Proceedings. 156-157. DOI: 10.1109/VTSA.2008.4530844 |
0.355 |
|
| 2008 |
Giubertoni D, Pepponi G, Gennaro S, Bersani M, Sahiner MA, Kelty SP, Doherty R, Foad MA, Kah M, Kirkby KJ, Woicik JC, Pianetta P. Correlation of local structure and electrical activation in arsenic ultrashallow junctions in silicon Journal of Applied Physics. 104. DOI: 10.1063/1.3026706 |
0.562 |
|
| 2008 |
Xie CK, Budnick JI, Hines WA, Wells BO, Woicik JC. Strain-induced change in local structure and its effect on the ferromagnetic properties of La0.5Sr0.5CoO3 thin films Applied Physics Letters. 93: 182507. DOI: 10.1063/1.3011031 |
0.375 |
|
| 2008 |
Alper Sahiner M, Woicik JC, Kurp T, Serfass J, Aranguren M. Local crystal structural modifications in pulsed laser deposited high-k dielectric thin films on silicon and germanium Materials Science in Semiconductor Processing. 11: 245-249. DOI: 10.1016/J.Mssp.2008.08.003 |
0.412 |
|
| 2008 |
Lysaght PS, Woicik JC, Sahiner MA, Lee B, Jammy R. Incipient amorphous-to-crystalline transition in HfO2 as a function of thickness scaling and anneal temperature Journal of Non-Crystalline Solids. 354: 399-403. DOI: 10.1016/J.Jnoncrysol.2007.07.050 |
0.42 |
|
| 2007 |
Black D, Woicik J, Duff MC, Hunter DB, Burger A, Groza M. X-ray Topography to Characterize Surface Damage on CdZnTe Crystals Mrs Proceedings. 1038. DOI: 10.1557/Proc-1038-O04-03 |
0.35 |
|
| 2007 |
Woicik JC, Yekutiel M, Nelson EJ, Jacobson N, Pfalzer P, Klemm M, Horn S, Kronik L. Chemical bonding and many-body effects in site-specific x-ray photoelectron spectra of corundum V2 O3 Physical Review B - Condensed Matter and Materials Physics. 76. DOI: 10.1103/Physrevb.76.165101 |
0.606 |
|
| 2007 |
Herrera-Gomez A, Woicik JC, Kendelewicz T, Miyano KE, Spicer WE. X-ray standing wave analysis of overlayer-induced substrate relaxation: The clean and Bi-covered (110) GaP surface Physical Review B - Condensed Matter and Materials Physics. 75. DOI: 10.1103/Physrevb.75.165318 |
0.432 |
|
| 2007 |
Woicik JC, Shirley EL, Hellberg CS, Andersen KE, Sambasivan S, Fischer DA, Chapman BD, Stern EA, Ryan P, Ederer DL, Li H. Ferroelectric distortion in SrTiO3 thin films on Si(001) by x-ray absorption fine structure spectroscopy: Experiment and first-principles calculations Physical Review B - Condensed Matter and Materials Physics. 75. DOI: 10.1103/Physrevb.75.140103 |
0.486 |
|
| 2007 |
Lysaght PS, Woicik JC, Alper Sahiner M, Lee B, Jammy R. Characterizing crystalline polymorph transitions in HfO2 by extended x-ray absorption fine-structure spectroscopy Applied Physics Letters. 91: 122910. DOI: 10.1063/1.2789180 |
0.449 |
|
| 2007 |
Alldredge LMB, Woicik JC, Chang W, Kirchoefer SW, Pond JM. Spectroscopic determination of phase in tetragonally strained Ba0.5Sr0.5TiO3 films at room temperature Applied Physics Letters. 91: 052909. DOI: 10.1063/1.2766668 |
0.389 |
|
| 2007 |
Lysaght PS, Barnett J, Bersuker GI, Woicik JC, Fischer DA, Foran B, Tseng H, Jammy R. Chemical analysis of HfO2∕Si (100) film systems exposed to NH3 thermal processing Journal of Applied Physics. 101: 024105. DOI: 10.1063/1.2422746 |
0.485 |
|
| 2007 |
Krayzman V, Levin I, Woicik JC. Local Structure of Displacively Disordered Pyrochlore Dielectrics Chemistry of Materials. 19: 932-936. DOI: 10.1021/Cm062429G |
0.336 |
|
| 2007 |
Sarkar SK, Kababya S, Vega S, Cohen H, Woicik JC, Frenkel AI, Hodes G. Effects of solution pH and surface chemistry on the postdeposition growth of chemical bath deposited PbSe nanocrystalline films Chemistry of Materials. 19: 879-888. DOI: 10.1021/Cm060628U |
0.321 |
|
| 2007 |
Sahiner MA, Woicik JC, Gao P, McKeown P, Croft MC, Gartman M, Benapfla B. Pulsed laser deposition and characterization of Hf-based high-k dielectric thin films Thin Solid Films. 515: 6548-6551. DOI: 10.1016/J.Tsf.2006.11.171 |
0.374 |
|
| 2007 |
Duff MC, Hunter DB, Nuessle P, Black DR, Burdette H, Woicik J, Burger A, Groza M. Synchrotron X-ray Based Characterization of CdZnTe Crystals Journal of Electronic Materials. 36: 1092-1097. DOI: 10.1007/S11664-007-0181-X |
0.4 |
|
| 2006 |
Krayzman V, Levin I, Woicik JC, Yoder D, Fischer DA. Effects of local atomic order on the pre-edge structure in the Ti K x-ray absorption spectra of perovskite CaTi1-x Zrx O3 Physical Review B - Condensed Matter and Materials Physics. 74. DOI: 10.1103/Physrevb.74.224104 |
0.448 |
|
| 2006 |
Black DR, Woicik JC, Erdtmann M, Langdo TA. Imaging defects in strained-silicon thin films by glancing-incidence x-ray topography Applied Physics Letters. 88: 224102. DOI: 10.1063/1.2209411 |
0.424 |
|
| 2006 |
Levin I, Cockayne E, Lufaso MW, Woicik JC, Maslar JE. Local structures and Raman spectra in the Ca(Zr,Ti)O 3 perovskite solid solutions Chemistry of Materials. 18: 854-860. DOI: 10.1021/Cm0523438 |
0.315 |
|
| 2006 |
Ryan P, Rosenberg RA, Keavney DJ, Freeland JW, Woicik JC. Surface order dependent magnetic thin film growth: Fe on GaN(0 0 0 1) Surface Science. 600. DOI: 10.1016/J.Susc.2005.12.024 |
0.338 |
|
| 2005 |
Erdtmann M, Currie MT, Woicik JC, Black D. Optimization of SiGe Graded Buffer Defectivity and Throughput by Means of High Growth Temperature and Pre-Threaded Substrates Mrs Proceedings. 891. DOI: 10.1557/Proc-0891-Ee12-05 |
0.301 |
|
| 2005 |
Woicik JC, Aguirre-Tostada FS, Herrera-Gomez A, Droopad R, Yu Z, Schlom D, Karapetrova E, Zschack P, Pianetta P. X-ray absorption fine-structure determination of interfacial polarization in SrTiO3 thin films grown on Si(001) Physica Scripta T. 620-622. DOI: 10.1238/Physica.Topical.115A00620 |
0.637 |
|
| 2005 |
Li W, Frenkel AI, Woicik JC, Ni C, Shah SI. Dopant location identification inNd3+-dopedTiO2nanoparticles Physical Review B. 72. DOI: 10.1103/Physrevb.72.155315 |
0.412 |
|
| 2005 |
Woicik J. Site-specific X-ray photoelectron spectroscopy using X-ray standing waves Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 547: 227-234. DOI: 10.1016/J.Nima.2005.05.028 |
0.47 |
|
| 2005 |
Sahiner MA, Downey DF, Novak SW, Woicik JC, Arena DA. The local structural characterization of the inactive clusters in B, BF2 and BF3 implanted Si wafers using X-ray techniques Microelectronics Journal. 36: 522-526. DOI: 10.1016/J.Mejo.2005.02.095 |
0.369 |
|
| 2004 |
Sahiner MA, Ansari P, Carroll MS, Magee CW, Novak SW, Woicik JC. Xafs as a direct local structural probe in revealing the effects of c presence in b diffusion in siGe layers Materials Research Society Symposium - Proceedings. 810: 481-487. DOI: 10.1557/Proc-810-C11.10 |
0.405 |
|
| 2004 |
Aguirre-Tostado FS, Herrera-Gómez A, Woicik JC, Droopad R, Yu Z, Schlom DG, Karapetrova J, Zschack P, Pianetta P. Displacive phase transition in SrTiO 3 thin films grown on Si(001) Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 22: 1356-1360. DOI: 10.1116/1.1765657 |
0.593 |
|
| 2004 |
Aguirre-Tostado FS, Herrera-Gómez A, Woicik JC, Droopad R, Yu Z, Schlom DG, Zschack P, Karapetrova E, Pianetta P, Hellberg CS. Elastic anomaly for SrTiO3 thin films grown on Si(001) Physical Review B - Condensed Matter and Materials Physics. 70: 201403-1-201403-4. DOI: 10.1103/Physrevb.70.201403 |
0.612 |
|
| 2004 |
Woicik JC. Site‐specific Valence X‐ray Photoelectron Spectroscopy Synchrotron Radiation News. 17: 48-53. DOI: 10.1080/08940880408603095 |
0.395 |
|
| 2004 |
Woicik J, Aguirre-Tostado F, Herrera-Gomez A, Droopad R, Yu Z, Schlom D, Zschack P, Karapetrova E, Hellberg C. Elastic Anomaly for SrTiO3 Thin Films Grown on Si(001) Microscopy and Microanalysis. 10: 826-827. DOI: 10.1017/S1431927604887233 |
0.339 |
|
| 2003 |
Alper Sahiner M, Magee CW, Downey DF, Arevalo E, Woicik JC. The Role Of Ge In Cluster Formation In B And Bf2 Implanted Si Wafers After Ge Pre-Amorphization Mrs Proceedings. 792. DOI: 10.1557/Proc-792-R7.3 |
0.359 |
|
| 2002 |
Woicik JC, Nelson EJ, Kronik L, Jain M, Chelikowsky JR, Heskett D, Berman LE, Herman GS. Hybridization and bond-orbital components in site-specific X-ray photoelectron spectra of rutile TiO2. Physical Review Letters. 89: 077401. PMID 12190555 DOI: 10.1103/Physrevlett.89.077401 |
0.594 |
|
| 2002 |
Sahiner MA, Novak SW, Woicik JC, Takamura Y, Griffin PB, Plummer JD. The Local Structure of Antimony in High Dose Antimony Implants in Silicon by XAFS and SIMS. Mrs Proceedings. 717. DOI: 10.1557/Proc-717-C3.6 |
0.311 |
|
| 2002 |
Woicik J. X-ray standing-wave investigations of valence electronic structure Acta Crystallographica Section a Foundations of Crystallography. 58: c206-c206. DOI: 10.1107/S0108767302093248 |
0.312 |
|
| 2002 |
Kim CY, Bedzyk M, Nelson EJ, Woicik JC, Berman LE. Site-specific valence-band photoemission study of α − Fe 2 O 3 Physical Review B. 66: 85115. DOI: 10.1103/Physrevb.66.085115 |
0.368 |
|
| 2002 |
Dieng LM, Ignatov AY, Tyson TA, Croft M, Dogan F, Kim C, Woicik JC, Grow J. Observation of changes in the atomic and electronic structure of single-crystalYBa2Cu3O6.6accompanying bromination Physical Review B. 66. DOI: 10.1103/Physrevb.66.014508 |
0.304 |
|
| 2002 |
Nelson EJ, Woicik JC, Pianetta P, Vartanyants IA, Cooper JW. Quadrupole effects in core and valence photoelectron emission from crystalline germanium measured via a spatially modulated x-ray interference field Physical Review B - Condensed Matter and Materials Physics. 65: 1652191-1652199. DOI: 10.1103/Physrevb.65.165219 |
0.697 |
|
| 2001 |
Sahiner MA, Novak SW, Woicik JC, Liu J, Krishnamoorty V. Determining the Ratio of the Precipitated versus Substituted Arsenic by XAFS and SIMS in Heavy Dose Arsenic Implants in Silicon Mrs Proceedings. 669. DOI: 10.1557/Proc-669-J5.8 |
0.345 |
|
| 2001 |
Woicik JC, Nelson EJ, Heskett D, Warner J, Berman LE, Karlin BA, Vartanyants IA, Hasan MZ, Kendelewicz T, Shen ZX, Pianetta P. X-ray standing-wave investigations of valence electronic structure Physical Review B. 64. DOI: 10.1103/PhysRevB.64.125115 |
0.312 |
|
| 2001 |
Woicik JC, Nelson EJ, Heskett D, Warner J, Berman LE, Karlin BA, Vartanyants IA, Hasan MZ, Kendelewicz T, Shen ZX, Pianetta P. X-ray standing-wave investigations of valence electronic structure Physical Review B - Condensed Matter and Materials Physics. 64: 1251151-12511515. DOI: 10.1103/Physrevb.64.125115 |
0.685 |
|
| 2001 |
Woo H, Tyson TA, Croft M, Cheong SW, Woicik JC. Correlations Between the Magnetic and Structural Properties of Ca Doped BiMnO3 Physical Review B. 63: 134412. DOI: 10.1103/Physrevb.63.134412 |
0.418 |
|
| 2001 |
Woicik JC, Nelson EJ, Kendelewicz T, Pianetta P, Jain M, Kronik L, Chelikowsky JR. Partial density of occupied valence states by x-ray standing waves and high-resolution photoelectron spectroscopy Physical Review B - Condensed Matter and Materials Physics. 63: 414031-414034. DOI: 10.1103/Physrevb.63.041403 |
0.704 |
|
| 2000 |
Woicik JC, Nelson EJ, Pianetta P. Direct measurement of valence-charge asymmetry by x-ray standing waves. Physical Review Letters. 84: 773-6. PMID 11017369 DOI: 10.1103/Physrevlett.84.773 |
0.686 |
|
| 2000 |
Gupta JA, Watkins SP, Crozier ED, Woicik JC, Harrison DA, Jiang DT, Pickering IJ, Karlin BA. Layer perfection in ultrathin InAs quantum wells in GaAs(001) Physical Review B - Condensed Matter and Materials Physics. 61: 2073-2084. DOI: 10.1103/Physrevb.61.2073 |
0.382 |
|
| 2000 |
Nelson EJ, Woicik JC, Hong M, Kwo J, Mannaerts JP. Extended x-ray absorption fine-structure measurement of bond-length strain in epitaxial Gd2O3 on GaAs(001) Applied Physics Letters. 76: 2526-2528. DOI: 10.1063/1.126397 |
0.591 |
|
| 1999 |
Nelson E, Woicik J, Pianetta P. Direct measurement of valence charge asymmetry in GaAs using X-ray standing waves. Journal of Synchrotron Radiation. 6: 341-3. PMID 15263301 DOI: 10.1107/S0909049598016537 |
0.647 |
|
| 1999 |
Lee TL, Pillai MR, Woicik JC, Labanda G, Lyman PF, Barnett SA, Bedzyk MJ. Atomic-resolution study of lattice distortions of buried InxGa1-xAs monolayers in GaAs(001) Physical Review B - Condensed Matter and Materials Physics. 60: 13612-13618. DOI: 10.1103/Physrevb.60.13612 |
0.455 |
|
| 1999 |
Herrera-Gómez A, Rousseau PM, Woicik JC, Kendelewicz T, Plummer J, Spicer WE. Lattice compression of Si crystals and crystallographic position of As impurities measured with x-ray standing wave spectroscopy Journal of Applied Physics. 85: 1429-1437. DOI: 10.1063/1.369274 |
0.334 |
|
| 1999 |
Herrera-Gómez A, Rousseau PM, Woicik JC, Kendelewicz T, Plummer J, Spicer WE. Lattice compression of Si crystals and crystallographic position of As impurities measured with x-ray standing wave spectroscopy Journal of Applied Physics. 85: 1429-1437. DOI: 10.1063/1.369274 |
0.453 |
|
| 1998 |
Woicik JC, Cross JO, Bouldin CE, Ravel B, Pellegrino JG, Steiner B, Bompadre SG, Sorensen LB, Miyano KE, Kirkland JP. Diffraction anomalous fine-structure study of strained Ga1-xInxAs on GaAs(001) Physical Review B - Condensed Matter and Materials Physics. 58: R4215-R4218. DOI: 10.1103/Physrevb.58.R4215 |
0.368 |
|
| 1998 |
Pellegrino JG, Armstrong J, Lowney J, DiCamillo B, Woicik JC. Electron beam induced x-ray emission: An in situ probe for composition determination during molecular beam epitaxy growth Applied Physics Letters. 73: 3580-3582. DOI: 10.1063/1.122830 |
0.374 |
|
| 1998 |
Woicik JC, Gupta JA, Watkins SP, Crozier ED. Bond-length strain in buried Ga1−xInxAs thin-alloy films grown coherently on InP(001) Applied Physics Letters. 73: 1269-1271. DOI: 10.1063/1.122371 |
0.367 |
|
| 1998 |
Cheng L, Sturchio NC, Woicik JC, Kemner KM, Lyman PF, Bedzyk MJ. High-resolution structural study of zinc ion incorporation at the calcite cleavage surface Surface Science. 415: L976-L982. DOI: 10.1016/S0039-6028(98)00545-7 |
0.389 |
|
| 1998 |
Gupta J, Woicik J, Watkins S, Miyano K, Pellegrino J, Crozier E. An X-ray standing wave study of ultrathin InAs films in GaAs(001) grown by atomic layer epitaxy Journal of Crystal Growth. 195: 34-40. DOI: 10.1016/S0022-0248(98)00636-8 |
0.439 |
|
| 1997 |
Kemner KM, Harris VG, Elam WT, Feng YC, Laughlin DE, Woicik JC, Lodder JC. Preferential site distribution of dilute Pt and Ta in CoCr-based films: An extended x-ray absorption fine structure study Journal of Applied Physics. 82: 2912-2917. DOI: 10.1063/1.366124 |
0.339 |
|
| 1997 |
Miyano KE, Woicik JC, Robins LH, Bouldin CE, Wickenden DK. Extended x-ray absorption fine structure study of AlxGa(1−x)N films Applied Physics Letters. 70: 2108-2110. DOI: 10.1063/1.118963 |
0.317 |
|
| 1997 |
Woicik JC, Pellegrino JG, Miyano KE. Bond Lengths and Elasticity in Strained-Layer Semiconductors Le Journal De Physique Iv. 7: C2-687-C2-689. DOI: 10.1051/Jp4:1997205 |
0.403 |
|
| 1996 |
Harris VG, Kemner KM, Das BN, Koon NC, Ehrlich AE, Kirkland JP, Woicik JC, Crespo P, Hernando A, Garcia Escorial A. Near-neighbor mixing and bond dilation in mechanically alloyed Cu-Fe. Physical Review. B, Condensed Matter. 54: 6929-6940. PMID 9984312 DOI: 10.1103/Physrevb.54.6929 |
0.364 |
|
| 1996 |
Woicik JC, Kendelewicz T, Yoshikawa SA, Miyano KE, Herman GS, Cowan PL, Pianetta P, Spicer WE. Surface-sensitive x-ray standing-wave study of Si(111) sqrt(3) x sqrt(3) -Ag. Physical Review. B, Condensed Matter. 53: 15425-15428. PMID 9983362 DOI: 10.1103/Physrevb.53.15425 |
0.607 |
|
| 1996 |
Herrera-Gómez A, Rousseau PM, Materlik G, Kendelewicz T, Woicik JC, Griffin PB, Plummer J, Spicer WE. Evolution of the crystallographic position of As impurities in heavily doped Si crystals as their electrical activity changes Applied Physics Letters. 68: 3090-3092. DOI: 10.1063/1.116432 |
0.321 |
|
| 1996 |
Lee TL, Qian Y, Lyman PF, Woicik JC, Pellegrino JG, Bedzyk MJ. The use of X-ray standing waves and evanescent-wave emission to study buried strained-layer heterostructures Physica B: Condensed Matter. 221: 437-444. DOI: 10.1016/0921-4526(95)00964-7 |
0.374 |
|
| 1995 |
Franklin GE, Tang S, Woicik JC, Bedzyk MJ, Freeman AJ, Golovchenko JA. High-resolution structural study of Bi on Si(001). Physical Review. B, Condensed Matter. 52: R5515-R5518. PMID 9981818 DOI: 10.1103/Physrevb.52.R5515 |
0.44 |
|
| 1995 |
Franklin GE, Bedzyk MJ, Woicik JC, Liu C, Patel JR, Golovchenko JA. Order-to-disorder phase-transition study of Pb on Ge(111). Physical Review. B, Condensed Matter. 51: 2440-2445. PMID 9978998 DOI: 10.1103/Physrevb.51.2440 |
0.366 |
|
| 1995 |
Kendelewicz T, Klepeis JE, Woicik JC, Southworth SH, Mailhiot C, van Schilfgaarde M, Methfessel M, Herrera-Gomez A, Miyano KE. Large-angle bond-rotation relaxation for CdTe(110). Physical Review. B, Condensed Matter. 51: 10774-10778. PMID 9977773 DOI: 10.1103/Physrevb.51.10774 |
0.395 |
|
| 1994 |
Woicik JC, Franklin GE, Liu C, Martinez RE, Hwong I, Bedzyk MJ, Patel JR, Golovchenko JA. Structural determination of the Si(111) sqrt 3 x sqrt 3-Bi surface by x-ray standing waves and scanning tunneling microscopy. Physical Review. B, Condensed Matter. 50: 12246-12249. PMID 9975381 DOI: 10.1103/Physrevb.50.12246 |
0.458 |
|
| 1994 |
Herrera-Gómez A, Kendelewicz T, Woicik JC, Miyano KE, Pianetta P, Southworth S, Cowan PL, Karlin A, Spicer WE. Geometrical structure of the Bi/GaP (110) interface: An x-ray standing wave triangulation study of a nonideal system Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 12: 2473-2477. DOI: 10.1116/1.579196 |
0.532 |
|
| 1994 |
Woicik JC, Franklin GE, Liu C, Martinez RE, Hwong IS, Bedzyk MJ, Patel JR, Golovchenko JA. Structural determination of the Si(111) 3×3-Bi surface by x-ray standing waves and scanning tunneling microscopy Physical Review B. 50: 12246-12249. DOI: 10.1103/PhysRevB.50.12246 |
0.372 |
|
| 1994 |
Karlin B, Woicik J, Cowan P. Performance of InSb/KDP monochromator crystal pair Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 347: 360-363. DOI: 10.1016/0168-9002(94)91910-0 |
0.344 |
|
| 1993 |
Woicik JC, Kendelewicz T, Herrera-Gomez A, Miyano KE, Cowan PL, Bouldin CE, Pianetta P, Spicer WE. In/Si(111)- sqrt 3 x sqrt 3 interface: An unrelaxed T4 geometry. Physical Review Letters. 71: 1204-1207. PMID 10055476 DOI: 10.1103/Physrevlett.71.1204 |
0.568 |
|
| 1993 |
Miyano KE, Woicik JC, Kendelewicz T, Spicer WE, Richter M, Pianetta P. Surface extended x-ray-absorption fine-structure study of the (1 monolayer Sb)/GaP(110) interface. Physical Review. B, Condensed Matter. 47: 6444-6449. PMID 10004610 DOI: 10.1103/Physrevb.47.6444 |
0.589 |
|
| 1993 |
Miyano KE, O'brien WL, Ederer DL, Callcott TA, Jia J, Dong QY, Zhou C, Woicik JC, Mueller DR. Narrow-band synchrotron radiation excitation of soft x-ray emission spectra Materials Research Society Symposium Proceedings. 307: 199-203. DOI: 10.1557/Proc-307-199 |
0.339 |
|
| 1993 |
Kendelewicz T, Woicik JC, Miyano KE, Herrera‐Gomez A, Cowan PL, Pianetta P, Spicer WE. Structure of Sb monolayers on Ge(111)2×1: A combined study using core‐level photoemission, x‐ray standing waves, and surface extended x‐ray absorption fine structure Journal of Vacuum Science & Technology B. 11: 1449-1454. DOI: 10.1116/1.586958 |
0.511 |
|
| 1993 |
Woicik JC, Kendelewicz T, Herrera-Gomez A, Andrews AB, Kim BS, Cowan PL, Miyano KE, Bouldin CE, Karlin BA, Herman GS, Erskine JL, Pianetta P, Spicer WE. Adatom location on the Si(111) 7×7 and Si(111) √3× √3-In surfaces by the x-ray standing wave and photoemission techniques Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 11: 2359-2363. DOI: 10.1116/1.578333 |
0.565 |
|
| 1993 |
Herrera-Gómez A, Kendelewicz T, Woicik JC, Miyano KE, Pianetta P, Southworth S, Cowan PL, Karlin BA, Spicer WE. Determination of the geometrical configuration of Bi on GaAs (110) by x-ray standing wave triangulation Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 11: 2354-2358. DOI: 10.1116/1.578332 |
0.517 |
|
| 1993 |
Kendelewicz T, Woicik JC, Herrera-Gomez A, Miyano KE, Cowan PL, Karlin BA, Pianetta P, Spicer WE. X-ray standing wave study of the Sb/GaAs(110) interface structure Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 11: 2351-2353. DOI: 10.1116/1.578331 |
0.507 |
|
| 1993 |
Herman GS, Woicik JC, Andrews AB, Erskine JL. High-resolution photoelectron spectroscopy study of (√3 × √3)R30°-Ag on Si(111) Surface Science. 290. DOI: 10.1016/0167-2584(93)90897-R |
0.365 |
|
| 1992 |
Woicik JC, Kendelewicz T, Miyano KE, Richter M, Bouldin CE, Pianetta P, Spicer WE. Extended x-ray-absorption fine-structure determination of bond-length conservation at the clean InP(110) surface. Physical Review. B, Condensed Matter. 46: 9869-9872. PMID 10002816 DOI: 10.1103/Physrevb.46.9869 |
0.595 |
|
| 1992 |
Tan Z, Heald SM, Rapposch M, Bouldin CE, Woicik JC. Gold-induced germanium crystallization. Physical Review B. 46: 9505-9510. PMID 10002757 DOI: 10.1103/Physrevb.46.9505 |
0.443 |
|
| 1992 |
Kendelewicz T, Woicik JC, Miyano KE, Herrera-Gomez A, Cowan PL, Karlin BA, Bouldin CE, Pianetta P, Spicer WE. X-ray standing-wave study of monolayers of Sb on GaAs(110). Physical Review. B, Condensed Matter. 46: 7276-7279. PMID 10002452 DOI: 10.1103/Physrevb.46.7276 |
0.611 |
|
| 1992 |
Miyano KE, Kendelewicz T, Woicik JC, Cowan PL, Bouldin CE, Karlin BA, Pianetta P, Spicer WE. Structural characterization of the (1 monolayer Sb)/GaP(110) interface using x-ray standing waves. Physical Review. B, Condensed Matter. 46: 6869-6874. PMID 10002389 DOI: 10.1103/Physrevb.46.6869 |
0.603 |
|
| 1992 |
Terry J, Liu H, Cao R, Woicik JC, Pianetta P, Yang X, Wu J, Richter M, Maluf N, Pease F, Dillon A, Robinson M, George S. A Photoemission Study of Electrochemically Etched Light Emitting Silicon Mrs Proceedings. 259: 421. DOI: 10.1557/Proc-259-421 |
0.612 |
|
| 1992 |
Woicik JC, Kendelewicz T, Cowan PL, Richter M, Karlin BA, Bouldin CE, Miyano KE, Pianetta P, Spicer WE. Extended x-ray absorption fine structure and x-ray standing wave study of the clean lnP(110) surface relaxation Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 10: 2041-2045. DOI: 10.1116/1.578021 |
0.546 |
|
| 1992 |
Stragier H, Cross JO, Rehr JJ, Sorensen LB, Bouldin CE, Woicik JC. Diffraction anomalous fine structure: A new x-ray structural technique Physical Review Letters. 69: 3064-3067. DOI: 10.1103/Physrevlett.69.3064 |
0.408 |
|
| 1991 |
Woicik JC, Kendelewicz T, Miyano KE, Cowan PL, Bouldin CE, Karlin BA, Pianetta P, Spicer WE. Determination of the Sb/Si(111) interfacial structure by back-reflection x-ray standing waves and surface extended x-ray-absorption fine structure. Physical Review. B, Condensed Matter. 44: 3475-3478. PMID 9999972 DOI: 10.1103/Physrevb.44.3475 |
0.632 |
|
| 1991 |
Woicik JC, Kendelewicz T, Miyano KE, Bouldin CE, Meissner PL, Pianetta P, Spicer WE. Local bonding structure of Sb on Si(111) by surface extended x-ray-absorption fine structure and photoemission. Physical Review. B, Condensed Matter. 43: 4331-4339. PMID 9997786 DOI: 10.1103/Physrevb.43.4331 |
0.602 |
|
| 1991 |
Woicik JC, Bouldin CE, Bell MI, Cross JO, Tweet DJ, Swanson BD, Zhang TM, Sorensen LB, King CA, Hoyt JL, Pianetta P, Gibbons JF. Conservation of bond lengths in strained Ge-Si layers. Physical Review. B, Condensed Matter. 43: 2419-2422. PMID 9997524 DOI: 10.1103/Physrevb.43.2419 |
0.587 |
|
| 1991 |
Woicik JC, Bouldin CE, Cross JO, Sorensen LB, King CA. Extended x-ray absorption fine structure and x-ray diffraction study of strain and bond distortions in epitaxial semiconductor layers Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 9: 2194-2197. DOI: 10.1116/1.585763 |
0.324 |
|
| 1991 |
Kendelewicz T, Woicik JC, Miyano KE, Cowan PL, Karlin BA, Bouldin CE, Pianetta P, Spicer WE. Synchrotron x-ray standing-wave study of Sb on GaAs(110) and InP(110) Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 9: 2290-2293. DOI: 10.1116/1.585735 |
0.547 |
|
| 1991 |
Woicik JC, Kendelewicz T, Bouldin CE, Meissner PL, Miyano KE, Pianetta P, Spicer WE. Structure of the Si(111) ⇃3 X⇃3-Sb interface by surface x-ray absorption fine structure and photoemission Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 9: 1956-1961. DOI: 10.1116/1.577435 |
0.397 |
|
| 1991 |
Richter M, Woicik JC, Pianetta P, Miyano KE, Bouldin CE, Spicer WE, Lindau I, Kendelewicz T. Surface extended x-ray adsorption fine structure studies of the Si(001) 2X1-Sb interface Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 9: 1951-1955. DOI: 10.1116/1.577433 |
0.653 |
|
| 1991 |
Richter M, Woicik JC, Nogami J, Pianetta P, Miyano KE, Baski AA, Kendelewicz T, Bouldin CE, Spicer WE, Quate CF, Lindau I. Erratum: ``Surface extended-x-ray-absorption fine structure and scanning tunneling microscopy of Si(001)2×1-Sb'' [Phys. Rev. Lett. 65, 3417 (1990)] Physical Review Letters. 66: 2836. DOI: 10.1103/Physrevlett.66.2836 |
0.687 |
|
| 1990 |
Richter M, Woicik JC, Nogami J, Pianetta P, Miyano KE, Baski AA, Kendelewicz T, Bouldin CE, Spicer WE, Quate CF, Lindau I. Surface extended-x-ray-absorption fine structure and scanning tunneling microscopy of Si(001)2 x 1-Sb. Physical Review Letters. 65: 3417-3420. PMID 10042866 DOI: 10.1103/Physrevlett.65.3417 |
0.701 |
|
| 1990 |
Miyano KE, Kendelewicz T, Cao R, Spindt CJ, Lindau I, Spicer WE, Woicik JC. Morphology and barrier-height development of Bi/InP(110) interfaces. Physical Review. B, Condensed Matter. 42: 3017-3023. PMID 9995794 DOI: 10.1103/Physrevb.42.3017 |
0.48 |
|
| 1990 |
Meissner PL, Bravman JC, Kendelewicz T, Miyano K, Spicer WE, Woicik JC, Bouldin C. Investigation of Thin Pd-Ge Layer Formation Using Synchrotron Vacuum Ultraviolet Photoemission Spectroscopy Mrs Proceedings. 181: 265. DOI: 10.1557/Proc-181-265 |
0.317 |
|
| 1990 |
Kendelewicz T, Miyano K, Cao R, Pianetta P, Lindau I, Spicer WE, Woicik JC. Semiconductor surface core level shifts by use of selected overlayers Physica Scripta. 41: 1034-1036. DOI: 10.1088/0031-8949/41/6/072 |
0.617 |
|
| 1989 |
Woicik JC, Pianetta P, Sorensen SL, Crasemann B. Photon-energy-sensitive Si L2,3VV Auger satellite. Physical Review. B, Condensed Matter. 39: 6048-6051. PMID 9949027 DOI: 10.1103/Physrevb.39.6048 |
0.494 |
|
| 1989 |
Woicik JC, Pate BB, Pianetta P. Silicon (111) 2 x 1 surface states: K-edge transitions and surface-selective L2,3VV Auger line shape. Physical Review. B, Condensed Matter. 39: 8593-8604. PMID 9947572 DOI: 10.1103/Physrevb.39.8593 |
0.59 |
|
| 1989 |
Kendelewicz T, Miyano K, Cao R, Woicik JC, Lindau I, Spicer WE. Surface core level shifts on InP(110). Use of Sb overlayers Surface Science. 220: L726-L732. DOI: 10.1016/0167-2584(89)90710-X |
0.501 |
|
| 1989 |
Kendelewicz T, Miyano K, Cao R, Woicik JC, Lindau I, Spicer WE. Surface core level shifts on InP(110) Surface Science. 220. DOI: 10.1016/0039-6028(89)90226-4 |
0.481 |
|
| 1988 |
Kendelewicz T, Soukiassian P, List RS, Woicik JC, Pianetta P, Lindau I, Spicer WE. Bonding at the K/Si(100) 2 x 1 interface: A surface extended x-ray-absorption fine-structure study. Physical Review. B, Condensed Matter. 37: 7115-7117. PMID 9943990 DOI: 10.1103/Physrevb.37.7115 |
0.662 |
|
| 1988 |
Kendelewicz T, Woicik JC, List RS, Soukiassian P, Pate BB, Pianetta P, Lindau L, Spicer WE. Summary Abstract: Bonding at the K/Si(100)2 x 1 interface: A surface extended x-ray absorption fine-structure study Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 6: 879-880. DOI: 10.1116/1.575063 |
0.59 |
|
| 1988 |
Cicco AD, Bianconi A, Benfatto M, Marcelli A, Natoli CR, Pianetta P, Woicik J. Orientational disorder in amorphous silicon probed by XANES (X-ray Absorption near Edge Structure) Physica Scripta. 38: 408-411. DOI: 10.1088/0031-8949/38/3/011 |
0.581 |
|
| 1988 |
Woicik JC, List RS, Pate BB, Pianetta P. Splitting of the “white line” 1s absorption edge in crystalline Si, SiGe, and dilute SiGe Solid State Communications. 65: 685-688. DOI: 10.1016/0038-1098(88)90364-X |
0.557 |
|
| 1987 |
Bianconi A, Di Cicco A, Pavel NV, Benfatto M, Marcelli A, Natoli CR, Pianetta P, Woicik J. Multiple-scattering effects in the K-edge x-ray-absorption near-edge structure of crystalline and amorphous silicon. Physical Review. B, Condensed Matter. 36: 6426-6433. PMID 9942352 DOI: 10.1103/Physrevb.36.6426 |
0.514 |
|
| 1987 |
Woicik JC, List RS, Pate BB, Pianetta P. Epitaxial Growth and Band Structure Effects at the Si/Ge(111) Interface Mrs Proceedings. 102: 283. DOI: 10.1557/Proc-102-283 |
0.543 |
|
| 1987 |
List RS, Woicik J, Mahowald PH, Lindau I, Spicer WE. The Si/GaAs(110) heterojunction discontinuity: Amorphous versus crystalline overlayers Journal of Vacuum Science and Technology. 5: 1459-1463. DOI: 10.1116/1.574621 |
0.514 |
|
| 1986 |
Mahowald PH, List RS, Spicer WE, Woicik J, Pianetta P. Erratum: Heterojunction band discontinuity at the Si–Ge interface [J. Vac. Sci. Technol. B 3, 1252 (1985)] Journal of Vacuum Science & Technology B. 4: 45-45. DOI: 10.1116/1.583350 |
0.408 |
|
| 1986 |
Woicik JC, List RS, Pate BB, Pianetta P. The Silicon/Germanium (111) Interface : The Onset Of Epitaxy Le Journal De Physique Colloques. 47. DOI: 10.1051/Jphyscol:1986893 |
0.519 |
|
| 1985 |
Mahowald PH, List RS, Spicer WE, Woicik J, Pianetta P. Heterojunction band discontinuity at the Si–Ge(111) interface Journal of Vacuum Science & Technology B. 3: 1252-1255. DOI: 10.1116/1.583050 |
0.566 |
|
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